JPH0582905B2 - - Google Patents

Info

Publication number
JPH0582905B2
JPH0582905B2 JP60089977A JP8997785A JPH0582905B2 JP H0582905 B2 JPH0582905 B2 JP H0582905B2 JP 60089977 A JP60089977 A JP 60089977A JP 8997785 A JP8997785 A JP 8997785A JP H0582905 B2 JPH0582905 B2 JP H0582905B2
Authority
JP
Japan
Prior art keywords
circuit
output
data
test
supplied
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60089977A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61247984A (ja
Inventor
Takashi Totoki
Makoto Nakamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP60089977A priority Critical patent/JPS61247984A/ja
Publication of JPS61247984A publication Critical patent/JPS61247984A/ja
Publication of JPH0582905B2 publication Critical patent/JPH0582905B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP60089977A 1985-04-26 1985-04-26 テスト回路 Granted JPS61247984A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60089977A JPS61247984A (ja) 1985-04-26 1985-04-26 テスト回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60089977A JPS61247984A (ja) 1985-04-26 1985-04-26 テスト回路

Publications (2)

Publication Number Publication Date
JPS61247984A JPS61247984A (ja) 1986-11-05
JPH0582905B2 true JPH0582905B2 (en, 2012) 1993-11-22

Family

ID=13985728

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60089977A Granted JPS61247984A (ja) 1985-04-26 1985-04-26 テスト回路

Country Status (1)

Country Link
JP (1) JPS61247984A (en, 2012)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR910005615B1 (ko) * 1988-07-18 1991-07-31 삼성전자 주식회사 프로그래머블 순차코오드 인식회로
US5072138A (en) * 1990-08-17 1991-12-10 Sgs-Thomson Microelectronics, Inc. Semiconductor memory with sequential clocked access codes for test mode entry
EP0475588B1 (en) * 1990-08-17 1996-06-26 STMicroelectronics, Inc. A semiconductor memory with inhibited test mode entry during power-up
JPH0779155A (ja) * 1993-09-06 1995-03-20 Mitsubishi Electric Corp 信号選択装置

Also Published As

Publication number Publication date
JPS61247984A (ja) 1986-11-05

Similar Documents

Publication Publication Date Title
US4975641A (en) Integrated circuit and method for testing the integrated circuit
JP2007232626A (ja) テストモード設定回路
JPH0691426B2 (ja) 論理回路装置
US3992635A (en) N scale counter
JPH0582905B2 (en, 2012)
JPS63148180A (ja) ランダムパターン発生用の論理モジユール
JPS6323685B2 (en, 2012)
JPH04212521A (ja) リングカウンタ
JP3493132B2 (ja) モード設定回路
JPH0311125B2 (en, 2012)
JPS6222433B2 (en, 2012)
JP2581318B2 (ja) 半導体集積回路装置
JPH083514B2 (ja) カウンタ・テスト装置
JPS62182937A (ja) テストモ−ド設定回路
JP2533946B2 (ja) 集積回路
JP2901828B2 (ja) 半導体集積回路
JPH05215820A (ja) スキャンパス回路
JP3236235B2 (ja) トグルフリップフロップ
JP3134354B2 (ja) 動作モード設定装置
JPH0690266B2 (ja) 半導体集積回路装置
JP2557703B2 (ja) モード設定回路
JPS6175620A (ja) 論理回路
JPH0614105B2 (ja) テスト回路
JPS59161123A (ja) Ｃｍｏｓ半導体集積回路装置
JPH03105269A (ja) テスト回路

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term