JPH0450536B2 - - Google Patents
Info
- Publication number
- JPH0450536B2 JPH0450536B2 JP58014326A JP1432683A JPH0450536B2 JP H0450536 B2 JPH0450536 B2 JP H0450536B2 JP 58014326 A JP58014326 A JP 58014326A JP 1432683 A JP1432683 A JP 1432683A JP H0450536 B2 JPH0450536 B2 JP H0450536B2
- Authority
- JP
- Japan
- Prior art keywords
- program
- measurement
- test
- integrated circuit
- test pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 39
- 238000005259 measurement Methods 0.000 claims description 19
- 238000012545 processing Methods 0.000 claims description 10
- 238000012546 transfer Methods 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 3
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/316—Testing of analog circuits
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58014326A JPS59141077A (ja) | 1983-01-31 | 1983-01-31 | 集積回路測定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58014326A JPS59141077A (ja) | 1983-01-31 | 1983-01-31 | 集積回路測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59141077A JPS59141077A (ja) | 1984-08-13 |
JPH0450536B2 true JPH0450536B2 (fr) | 1992-08-14 |
Family
ID=11857944
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58014326A Granted JPS59141077A (ja) | 1983-01-31 | 1983-01-31 | 集積回路測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59141077A (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011125530A1 (fr) * | 2010-03-31 | 2011-10-13 | ユニ・チャーム株式会社 | Article absorbant |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06105281B2 (ja) * | 1985-12-20 | 1994-12-21 | 日本電気株式会社 | ダイナミツクエ−ジング装置 |
JPS62247275A (ja) * | 1986-03-31 | 1987-10-28 | Ando Electric Co Ltd | インサ−キツトエミユレ−タのcpu識別回路 |
JPS6326580A (ja) * | 1986-07-18 | 1988-02-04 | Nec Ic Microcomput Syst Ltd | Lsi試験装置 |
-
1983
- 1983-01-31 JP JP58014326A patent/JPS59141077A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011125530A1 (fr) * | 2010-03-31 | 2011-10-13 | ユニ・チャーム株式会社 | Article absorbant |
Also Published As
Publication number | Publication date |
---|---|
JPS59141077A (ja) | 1984-08-13 |
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