JPH0450536B2 - - Google Patents

Description

[Detailed Description of the Invention] (a) Technical Field of the Invention The present invention provides a method for testing completed integrated circuit units, even if there are different types of integrated circuits, by using a measurement program and a measurement program corresponding to these units. It is about an integrated circuit measurement device that can transfer test patterns.

(b) Purpose of the Invention When testing individual integrated circuits, usually all of the same type are tested together, and when testing other integrated circuits of different types, a different program is used.

However, recently there have been many cases of high-mix, low-volume production, and changing the program for each different product poses a problem in that measurement efficiency decreases.

When measuring many types of integrated circuits, this invention conducts a preliminary test to know the characteristics of the integrated circuit, edits a measurement program based on the results of the preliminary test, and performs a test according to the type of integrated circuit. The present invention provides a measuring device that can perform the following measurements.

(c) Embodiment of the Invention First, FIG. 1 shows a configuration diagram of an embodiment of the invention.

In FIG. 1, a test pattern generator 2 prepares a test pattern for product selection. for example,
If there are three varieties, A=100, B=010, C=
Use a test pattern such as 001. Integrated circuit 1 to be measured using this test pattern
A preliminary test is carried out in the preliminary test measuring section 3, and the type of integrated circuit 1 is selected based on the response to the test pattern.

When the type of integrated circuit 1 is selected by the preliminary test measuring section 3, a code corresponding to the type is selected from the type selection correspondence table 4.

Next, the types of integrated circuits 1 and type selection correspondence table 4,
An example of the compilation table 5 is shown in FIGS. 2 and 3.

Figure 2 is a variety classification correspondence table, and when the variety is A, it becomes HG.

FIG. 3 shows the measurement program/test pattern names P to T in the HG portion of the compilation table 5.

When the measurement program/test pattern names P to T are selected from the compilation table 5, a search is made to see if the names shown on the right side of FIG. 3 exist in the high-speed processing storage sections 6 and 7.
If there is, the measurement program/test pattern editing section 11 sends the information to the measurement section 1 via the measurement start instruction section 12.
Transfer the test signal to 3. If not, it is transferred from the large-capacity storage section 8 to the high-speed processing storage sections 6 and 7.

In this case, if there is free space in the high-speed processing storage units 6 and 7, the data will be transferred from the large-capacity storage unit 8 to this free space according to a command from the transfer processing unit 9, but if there is no free space, it will not be used in the editing table 5. The program is erased according to a command from the unnecessary program processing section 10 to create a free area.

When the measurement is completed, the measurement section 13 sends the measurement result and a measurement end signal to the control section 14.

The control unit 14 records the measurement results and connects the integrated circuit to be measured next to the measurement unit 13.

When the integrated circuit to be next measured is connected to the measuring section 13 by the control section 14, a test pattern is sent to this integrated circuit to select the type.

In this way, even if the types of integrated circuits are different, measurements can be continued while editing the measurement program for each integrated circuit.

If these relationships are shown in a flowchart, the fourth
It will look like the figure.

As shown in Figures 1 to 4, the type of integrated circuit to be measured is selected in a preliminary test using test patterns, and a measurement program/test pattern is selected from Edit Table 5 in accordance with the selection contents and edited. Then, the measurement unit 13 measures each integrated circuit.

(d) Effects of the Invention According to this invention, the type of integrated circuit to be measured is selected through a preliminary test, and the measurement program and test pattern corresponding to the type are edited. It is possible to supply measurement programs and test patterns suitable for each integrated circuit even if the test is not carried out, and it is possible to measure a wide variety of integrated circuits at high speed.

[Brief explanation of the drawing]

FIG. 1 is a configuration diagram of an embodiment according to the present invention, and FIG.
3 is a diagram showing an example of the name of the measurement program/test pattern of compilation table 5. FIG. 4 is a flowchart of FIGS. 1 to 3. 1...Integrated circuit unit, 2...Test pattern generation section, 3...Preliminary test measurement section, 4...Type selection correspondence table, 5...Editing table, 6, 7...High speed processing storage section, 8... Large capacity storage unit, 9...Transfer processing unit, 1
0...Unnecessary program processing section, 11...Measurement program/test pattern editing section, 12...Measurement start instruction section, 13...Measurement section, 14...Control section.

Claims (1)

[Scope of Claims] 1. In the case of testing individual integrated circuits of different types, a test pattern generation unit for selecting the type of integrated circuit, a preliminary test measurement unit using the test pattern signal, and the preliminary test. A product selection correspondence table that displays the relationship between the types of integrated circuits by the measurement unit; an editing table that selects measurement program/test pattern names from the product selection correspondence table; and a high-speed memory that stores the programs selected in the editing table. a processing storage section; and a large-capacity storage section that transfers the program to the high-speed processing storage section when the program is not present in the high-speed processing storage section; Corresponding to the measurement program and
An integrated circuit measuring device characterized in that the test pattern name is selected and edited, and the program selected in the editing is retrieved from a high-speed processing storage unit to test the integrated circuit.