JPH0450535B2 - - Google Patents

Info

Publication number
JPH0450535B2
JPH0450535B2 JP58086323A JP8632383A JPH0450535B2 JP H0450535 B2 JPH0450535 B2 JP H0450535B2 JP 58086323 A JP58086323 A JP 58086323A JP 8632383 A JP8632383 A JP 8632383A JP H0450535 B2 JPH0450535 B2 JP H0450535B2
Authority
JP
Japan
Prior art keywords
test
section
measurement program
integrated circuit
integrated circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58086323A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59211874A (ja
Inventor
Nobuo Arai
Masao Kishibe
Kazuhiko Matsuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ando Electric Co Ltd
Original Assignee
Ando Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ando Electric Co Ltd filed Critical Ando Electric Co Ltd
Priority to JP58086323A priority Critical patent/JPS59211874A/ja
Publication of JPS59211874A publication Critical patent/JPS59211874A/ja
Publication of JPH0450535B2 publication Critical patent/JPH0450535B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP58086323A 1983-05-17 1983-05-17 集積回路試験装置 Granted JPS59211874A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58086323A JPS59211874A (ja) 1983-05-17 1983-05-17 集積回路試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58086323A JPS59211874A (ja) 1983-05-17 1983-05-17 集積回路試験装置

Publications (2)

Publication Number Publication Date
JPS59211874A JPS59211874A (ja) 1984-11-30
JPH0450535B2 true JPH0450535B2 (fr) 1992-08-14

Family

ID=13883624

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58086323A Granted JPS59211874A (ja) 1983-05-17 1983-05-17 集積回路試験装置

Country Status (1)

Country Link
JP (1) JPS59211874A (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000515662A (ja) * 1996-08-07 2000-11-21 マイクロン、テクノロジー、インコーポレーテッド 欠陥を有する集積回路のテスト時間と修復時間とを最適化するためのシステム

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2765855B2 (ja) * 1988-06-10 1998-06-18 山口日本電気株式会社 半導体装置の検査方法
JPH08114652A (ja) * 1994-10-13 1996-05-07 Nec Corp 半導体集積回路の試験方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000515662A (ja) * 1996-08-07 2000-11-21 マイクロン、テクノロジー、インコーポレーテッド 欠陥を有する集積回路のテスト時間と修復時間とを最適化するためのシステム

Also Published As

Publication number Publication date
JPS59211874A (ja) 1984-11-30

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