JPH0413737B2 - - Google Patents

Info

Publication number
JPH0413737B2
JPH0413737B2 JP57091237A JP9123782A JPH0413737B2 JP H0413737 B2 JPH0413737 B2 JP H0413737B2 JP 57091237 A JP57091237 A JP 57091237A JP 9123782 A JP9123782 A JP 9123782A JP H0413737 B2 JPH0413737 B2 JP H0413737B2
Authority
JP
Japan
Prior art keywords
circuit
output
signal
integrated circuit
floating state
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57091237A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58208857A (ja
Inventor
Tsuneo Funabashi
Kazuhiko Iwasaki
Hideo Nakamura
Shozo Satake
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP57091237A priority Critical patent/JPS58208857A/ja
Publication of JPS58208857A publication Critical patent/JPS58208857A/ja
Publication of JPH0413737B2 publication Critical patent/JPH0413737B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2221Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP57091237A 1982-05-31 1982-05-31 テスト機能を有する回路装置 Granted JPS58208857A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57091237A JPS58208857A (ja) 1982-05-31 1982-05-31 テスト機能を有する回路装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57091237A JPS58208857A (ja) 1982-05-31 1982-05-31 テスト機能を有する回路装置

Publications (2)

Publication Number Publication Date
JPS58208857A JPS58208857A (ja) 1983-12-05
JPH0413737B2 true JPH0413737B2 (enrdf_load_stackoverflow) 1992-03-10

Family

ID=14020807

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57091237A Granted JPS58208857A (ja) 1982-05-31 1982-05-31 テスト機能を有する回路装置

Country Status (1)

Country Link
JP (1) JPS58208857A (enrdf_load_stackoverflow)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5412375A (en) * 1977-06-25 1979-01-30 Yoshitomi Pharmaceut Ind Ltd Derivative of pseudomonic acid

Also Published As

Publication number Publication date
JPS58208857A (ja) 1983-12-05

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