JPH0315742A - ガス検出装置 - Google Patents

ガス検出装置

Info

Publication number
JPH0315742A
JPH0315742A JP1343580A JP34358089A JPH0315742A JP H0315742 A JPH0315742 A JP H0315742A JP 1343580 A JP1343580 A JP 1343580A JP 34358089 A JP34358089 A JP 34358089A JP H0315742 A JPH0315742 A JP H0315742A
Authority
JP
Japan
Prior art keywords
laser
wavelength
wavelengths
light
methane
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1343580A
Other languages
English (en)
Japanese (ja)
Inventor
Haruo Nagai
治男 永井
Kiyoji Uehara
上原　喜代治
Masafumi Aizawa
相沢　允文
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP1343580A priority Critical patent/JPH0315742A/ja
Priority to US07/492,784 priority patent/US5015099A/en
Priority to FR9003777A priority patent/FR2644892A1/fr
Publication of JPH0315742A publication Critical patent/JPH0315742A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G01N2021/394—DIAL method

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP1343580A 1989-03-23 1989-12-29 ガス検出装置 Pending JPH0315742A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP1343580A JPH0315742A (ja) 1989-03-23 1989-12-29 ガス検出装置
US07/492,784 US5015099A (en) 1989-03-23 1990-03-12 Differential absorption laser radar gas detection apparatus having tunable wavelength single mode semiconductor laser source
FR9003777A FR2644892A1 (fr) 1989-03-23 1990-03-23 Appareil de detection de gaz par absorption lumineuse

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP1-71492 1989-03-23
JP7149289 1989-03-23
JP1343580A JPH0315742A (ja) 1989-03-23 1989-12-29 ガス検出装置

Publications (1)

Publication Number Publication Date
JPH0315742A true JPH0315742A (ja) 1991-01-24

Family

ID=26412593

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1343580A Pending JPH0315742A (ja) 1989-03-23 1989-12-29 ガス検出装置

Country Status (3)

Country Link
US (1) US5015099A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPH0315742A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
FR (1) FR2644892A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002181705A (ja) * 2000-12-14 2002-06-26 Japan Science & Technology Corp 分光計測装置
JP2002257726A (ja) * 2001-02-27 2002-09-11 Sunx Ltd 光電センサ
JP2008539422A (ja) * 2005-04-28 2008-11-13 ハネウェル・インターナショナル・インコーポレーテッド 移動するシート製品中の選んだ成分を測定するセンサ及び方法
JP2008298638A (ja) * 2007-05-31 2008-12-11 Hitachi Cable Ltd 光式ガス濃度検出方法及び光式ガス濃度検出装置
JP2010164365A (ja) * 2009-01-14 2010-07-29 General Packer Co Ltd ガス濃度測定方法及びガス濃度測定装置
JP2012247235A (ja) * 2011-05-26 2012-12-13 Topcon Corp 植物用センサ装置
CN104089880A (zh) * 2014-07-11 2014-10-08 宇星科技发展(深圳)有限公司 多通道激光气体分析仪
WO2016031750A1 (ja) * 2014-08-29 2016-03-03 国立大学法人東北大学 濃度測定方法
JP2017125859A (ja) * 2017-03-16 2017-07-20 株式会社Ihi 濃度測定装置及び濃度測定方法
JP2023086777A (ja) * 2017-06-09 2023-06-22 キャリア コーポレイション 室内空気の品質の検出および監視を備えたチャンバレス煙検出器

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JPH0518896A (ja) * 1990-02-22 1993-01-26 Heinrich Hertz Inst Nachrichtentech Berlin Gmbh 小さな吸光量の検出用測定方法
US5202570A (en) * 1990-03-27 1993-04-13 Tokyo Gas Co., Ltd. Gas detection device
US5239185A (en) * 1990-06-22 1993-08-24 Hitachi, Ltd. Method and equipment for measuring absorptance of light scattering materials using plural wavelengths of light
GB9015800D0 (en) * 1990-07-18 1990-09-05 Secretary Trade Ind Brit Optical long-path monitoring apparatus
US5149983A (en) * 1990-09-07 1992-09-22 Chlean Plants & Engineering Establishment Method and apparatus for measuring the concentration of at least one material in a fluid medium mixed materials
US5200629A (en) * 1990-10-12 1993-04-06 Chlean Plants & Engineering Establishment Method and system for changing the concentration of one material in a fluid medium of mixed materials
DE4104785A1 (de) * 1991-02-14 1992-08-20 Zentralinstitut Fuer Optik Und Verfahren zum nachweis gasfoermiger substanzen
DE4300853C2 (de) * 1993-01-15 2003-09-04 Daimler Chrysler Ag Verfahren zur spektroskopischen Bestimmung des Stickstoffoxidgehalts
US5384640A (en) * 1993-01-19 1995-01-24 Gaztech International Corporation Gas sample chamber for use with a source of coherent radiation
FR2747192B1 (fr) * 1996-04-04 1998-04-30 Commissariat Energie Atomique Dispositif de detection de gaz a distance comportant un microlaser
US5991324A (en) * 1998-03-11 1999-11-23 Cymer, Inc. Reliable. modular, production quality narrow-band KRF excimer laser
US6040914A (en) * 1997-06-10 2000-03-21 New Focus, Inc. Simple, low cost, laser absorption sensor system
US5978391A (en) 1997-07-18 1999-11-02 Cymer, Inc. Wavelength reference for excimer laser
US6330261B1 (en) 1997-07-18 2001-12-11 Cymer, Inc. Reliable, modular, production quality narrow-band high rep rate ArF excimer laser
US5930000A (en) * 1998-02-11 1999-07-27 Monitor Labs, Inc. Line-locked diode laser for gas spectroscopy
US6184981B1 (en) * 1998-07-28 2001-02-06 Textron Systems Corporation Speckle mitigation for coherent detection employing a wide band signal
US6103532A (en) * 1998-08-14 2000-08-15 Tokheim Corporation Vapor recovery system utilizing a fiber-optic sensor to detect hydrocarbon emissions
DE19932354B4 (de) * 1999-07-10 2004-04-22 Gkss-Forschungszentrum Geesthacht Gmbh Verfahren und Vorrichtung zum Fernnachweis von Kohlenwasserstoffen im untergrund- oder bodennahen Bereich der Atmosphäre
US6876450B2 (en) * 2001-01-30 2005-04-05 Anritsu Corporation Laser absorption spectral diffraction type gas detector and method for gas detection using laser absorption spectral diffraction
US6680778B2 (en) * 2001-11-08 2004-01-20 Michele Hinnrichs Gas leak detector
GB0228890D0 (en) 2002-12-11 2003-01-15 Qinetiq Ltd Laser radar apparatus
WO2005001431A2 (en) * 2003-02-25 2005-01-06 Ceyx Technologies, Inc. Apparatus and method for chemical and biological agent sensing
DE10316685A1 (de) * 2003-04-10 2004-10-28 Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG Vorichtung zur photometrischen Messung der Konzentration einer chemischen Substanz in einer Meßlösung
US20040263852A1 (en) * 2003-06-03 2004-12-30 Lasen, Inc. Aerial leak detector
US7132657B2 (en) * 2004-02-09 2006-11-07 Sensor Electronics Corporation Infrared gas detector
US7067812B2 (en) * 2004-10-27 2006-06-27 The Aerospace Corporation Multispectral selective reflective Lidar
US7075653B1 (en) 2005-04-29 2006-07-11 Heath Consultants Incorporated Method and apparatus for laser-based remote methane leak detection
EP1793220B1 (en) * 2005-12-01 2009-08-26 Pergam-Suisse Ag Mobile remote detection of fluids by a laser
US7859668B2 (en) 2005-12-15 2010-12-28 Honeywell International Inc. Apparatus and method for illuminator-independent color measurements
US8017927B2 (en) * 2005-12-16 2011-09-13 Honeywell International Inc. Apparatus, system, and method for print quality measurements using multiple adjustable sensors
US7573575B2 (en) 2005-12-29 2009-08-11 Honeywell International Inc. System and method for color measurements or other spectral measurements of a material
US7688447B2 (en) 2005-12-29 2010-03-30 Honeywell International Inc. Color sensor
JP4657956B2 (ja) * 2006-03-14 2011-03-23 三菱電機株式会社 差分吸収ライダ装置
US7675619B2 (en) * 2007-11-14 2010-03-09 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Micro-LiDAR velocity, temperature, density, concentration sensor
JP2009129955A (ja) * 2007-11-20 2009-06-11 Epson Toyocom Corp 光学系及び原子発振器
US7592608B2 (en) * 2008-01-22 2009-09-22 Honeywell International Inc. Apparatus and method for measuring and/or controlling ultraviolet-activated materials in a paper-making process
US8049892B2 (en) * 2008-01-22 2011-11-01 Honeywell International Inc. Apparatus and method for camera-based color measurements
JP4392850B1 (ja) * 2008-07-22 2010-01-06 三井造船株式会社 赤外線吸収検査装置および赤外線吸収検査方法
US8269971B1 (en) * 2009-11-12 2012-09-18 Exelis, Inc. System and method for simultaneous detection of a gas using a mode-locked based transmitter
US8401809B2 (en) 2010-07-12 2013-03-19 Honeywell International Inc. System and method for adjusting an on-line appearance sensor system
CN103344607B (zh) * 2013-07-04 2015-07-29 太原理工大学 Tdlas中激光波长检测控制装置及其控制方法
US10267729B2 (en) * 2014-05-09 2019-04-23 Kairos Aerospace Inc. Systems and methods for detecting gas leaks
WO2016080532A1 (ja) * 2014-11-23 2016-05-26 株式会社フジキン 光学的ガス濃度測定方法及び該方法によるガス濃度モニター方法
US10458904B2 (en) 2015-09-28 2019-10-29 Ball Aerospace & Technologies Corp. Differential absorption lidar
US10215691B2 (en) * 2016-11-15 2019-02-26 Infineon Technologies Ag Radar spectroscopy based gas sensor
US10852438B2 (en) * 2017-08-21 2020-12-01 Caterpillar Inc. LIDAR waveform classification
WO2019233837A1 (en) * 2018-06-04 2019-12-12 Merck Patent Gmbh Calibration device for an optical detector and setting device for setting calibration points for the calibration device
US10921245B2 (en) 2018-06-08 2021-02-16 Ball Aerospace & Technologies Corp. Method and systems for remote emission detection and rate determination
CA3172188A1 (en) * 2020-04-07 2021-10-14 Jiri Vicenik Method for remote detection of gaseous substances in the atmosphere by the dial system with two lasers and a remote detector
CN115598659B (zh) * 2022-10-12 2024-08-06 山东国耀量子雷达科技有限公司 一种单光子甲烷浓度分布探测雷达

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US4489239A (en) * 1982-09-24 1984-12-18 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Portable remote laser sensor for methane leak detection
DE3334264A1 (de) * 1982-09-25 1984-04-05 Showa Denko K.K., Tokyo Verfahren und messgeraet zum messen der methan-konzentration in einem gasgemisch
JPS61222289A (ja) * 1985-03-28 1986-10-02 Tokyo Gas Co Ltd レ−ザ装置
JPS6298235A (ja) * 1985-10-25 1987-05-07 Tokyo Gas Co Ltd 気体の分布量測定方法
JPH0815225B2 (ja) * 1986-06-09 1996-02-14 東京瓦斯株式会社 ２波長発振レ−ザ装置
JPS62291982A (ja) * 1986-06-11 1987-12-18 Nippon Telegr & Teleph Corp <Ntt> 光パルス波長制御器
GB2197531B (en) * 1986-11-08 1991-02-06 Stc Plc Distributed feedback laser
JPH01254841A (ja) * 1988-04-05 1989-10-11 Fujitsu Ltd ガスセンサの信号処理方法
JPH01307640A (ja) * 1988-06-06 1989-12-12 Nkk Corp ガス検知装置
JPH01307639A (ja) * 1988-06-06 1989-12-12 Nkk Corp ガス検知装置
FR2639773B1 (fr) * 1988-11-25 1994-05-13 Alcatel Nv Laser a semi-conducteur accordable

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002181705A (ja) * 2000-12-14 2002-06-26 Japan Science & Technology Corp 分光計測装置
JP2002257726A (ja) * 2001-02-27 2002-09-11 Sunx Ltd 光電センサ
JP2008539422A (ja) * 2005-04-28 2008-11-13 ハネウェル・インターナショナル・インコーポレーテッド 移動するシート製品中の選んだ成分を測定するセンサ及び方法
JP2008298638A (ja) * 2007-05-31 2008-12-11 Hitachi Cable Ltd 光式ガス濃度検出方法及び光式ガス濃度検出装置
JP2010164365A (ja) * 2009-01-14 2010-07-29 General Packer Co Ltd ガス濃度測定方法及びガス濃度測定装置
JP2012247235A (ja) * 2011-05-26 2012-12-13 Topcon Corp 植物用センサ装置
CN104089880A (zh) * 2014-07-11 2014-10-08 宇星科技发展(深圳)有限公司 多通道激光气体分析仪
WO2016031750A1 (ja) * 2014-08-29 2016-03-03 国立大学法人東北大学 濃度測定方法
KR20170047309A (ko) * 2014-08-29 2017-05-04 고쿠리츠다이가쿠호진 도호쿠다이가쿠 농도 측정방법
JPWO2016031750A1 (ja) * 2014-08-29 2017-06-15 国立大学法人東北大学 濃度測定方法
US10241034B2 (en) 2014-08-29 2019-03-26 Tohoku University Concentration measuring method
TWI671517B (zh) * 2014-08-29 2019-09-11 國立大學法人東北大學 濃度測定方法
KR20210083400A (ko) * 2014-08-29 2021-07-06 가부시키가이샤 후지킨 농도 측정방법
JP2017125859A (ja) * 2017-03-16 2017-07-20 株式会社Ihi 濃度測定装置及び濃度測定方法
JP2023086777A (ja) * 2017-06-09 2023-06-22 キャリア コーポレイション 室内空気の品質の検出および監視を備えたチャンバレス煙検出器

Also Published As

Publication number Publication date
US5015099A (en) 1991-05-14
FR2644892A1 (fr) 1990-09-28
FR2644892B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1994-11-10

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