JPH026222B2 - - Google Patents
Info
- Publication number
- JPH026222B2 JPH026222B2 JP56204072A JP20407281A JPH026222B2 JP H026222 B2 JPH026222 B2 JP H026222B2 JP 56204072 A JP56204072 A JP 56204072A JP 20407281 A JP20407281 A JP 20407281A JP H026222 B2 JPH026222 B2 JP H026222B2
- Authority
- JP
- Japan
- Prior art keywords
- defect
- free layer
- oxygen
- support substrate
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/322—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to modify their internal properties, e.g. to produce internal imperfections
- H01L21/3221—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to modify their internal properties, e.g. to produce internal imperfections of silicon bodies, e.g. for gettering
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20407281A JPS58103124A (ja) | 1981-12-16 | 1981-12-16 | 半導体装置の製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20407281A JPS58103124A (ja) | 1981-12-16 | 1981-12-16 | 半導体装置の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58103124A JPS58103124A (ja) | 1983-06-20 |
JPH026222B2 true JPH026222B2 (enrdf_load_stackoverflow) | 1990-02-08 |
Family
ID=16484295
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP20407281A Granted JPS58103124A (ja) | 1981-12-16 | 1981-12-16 | 半導体装置の製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58103124A (enrdf_load_stackoverflow) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6116532A (ja) * | 1984-07-03 | 1986-01-24 | Matsushita Electric Ind Co Ltd | 半導体基板およびその製造方法 |
JPS6194176A (ja) * | 1984-10-15 | 1986-05-13 | N T C Densan Service:Kk | 帳票発行装置 |
JPS62181421A (ja) * | 1986-02-04 | 1987-08-08 | Mitsubishi Electric Corp | シリコンエピタキシヤルウエハの製造方法 |
US4897368A (en) * | 1987-05-21 | 1990-01-30 | Matsushita Electric Industrial Co., Ltd. | Method of fabricating a polycidegate employing nitrogen/oxygen implantation |
JPH02306622A (ja) * | 1989-05-22 | 1990-12-20 | Oki Electric Ind Co Ltd | 半導体装置及びその製造方法 |
JPH11145146A (ja) * | 1997-11-10 | 1999-05-28 | Nec Corp | 半導体基板及びその製造方法 |
US6830986B2 (en) | 2002-01-24 | 2004-12-14 | Matsushita Electric Industrial Co., Ltd. | SOI semiconductor device having gettering layer and method for producing the same |
JP2024134795A (ja) * | 2023-03-22 | 2024-10-04 | 信越半導体株式会社 | エピタキシャルウェーハ及びsoiウェーハ並びにそれらの製造方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5787119A (en) * | 1980-11-19 | 1982-05-31 | Toshiba Corp | Manufacture of semiconductor device |
-
1981
- 1981-12-16 JP JP20407281A patent/JPS58103124A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS58103124A (ja) | 1983-06-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS63142655A (ja) | 埋込みSiO↓2層を含む装置の製造方法 | |
JPH01202828A (ja) | 半導体装置の製造方法 | |
JPH0377329A (ja) | 半導体装置の製造方法 | |
US3909307A (en) | Process for compensating boundary charges in silicon thin layers epitaxially grown on a substrate | |
JPH026222B2 (enrdf_load_stackoverflow) | ||
JPH061786B2 (ja) | 薄膜トランジスタの製造方法 | |
JPS59188925A (ja) | 半導体装置の製造方法 | |
JPH0411736A (ja) | 半導体装置およびその製造方法 | |
JPS63198334A (ja) | 半導体シリコンウエ−ハの製造方法 | |
JPH023539B2 (enrdf_load_stackoverflow) | ||
JP2685384B2 (ja) | 半導体基板の製造法 | |
JPS6149427A (ja) | 半導体装置の製造方法 | |
JP2734034B2 (ja) | シリコン半導体基板の処理方法 | |
JPS6151930A (ja) | 半導体装置の製造方法 | |
JPH04737A (ja) | 半導体装置の製造方法 | |
JPH0443646A (ja) | 半導体装置及びその製造方法 | |
JPH05218051A (ja) | イントリンシックゲッタリング処理方法 | |
JPS63271972A (ja) | 薄膜トランジスタの製法 | |
JPH10214843A (ja) | 半導体基板の製造方法 | |
JPH03196517A (ja) | 半導体装置の製造方法 | |
KR920002463B1 (ko) | 반도체 소자 제조방법 | |
JPH03293718A (ja) | シリコン単結晶基板の処理方法 | |
JPH0516174B2 (enrdf_load_stackoverflow) | ||
JPS6386565A (ja) | 半導体装置の製造方法 | |
JPS61248467A (ja) | 薄膜トランジスタの製造方法 |