JPH0140950B2 - - Google Patents
Info
- Publication number
- JPH0140950B2 JPH0140950B2 JP57042539A JP4253982A JPH0140950B2 JP H0140950 B2 JPH0140950 B2 JP H0140950B2 JP 57042539 A JP57042539 A JP 57042539A JP 4253982 A JP4253982 A JP 4253982A JP H0140950 B2 JPH0140950 B2 JP H0140950B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- imaging signal
- imaging
- output
- delayed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
- G01N21/9018—Dirt detection in containers
- G01N21/9027—Dirt detection in containers in containers after filling
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
Landscapes
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57042539A JPS58160853A (ja) | 1982-03-19 | 1982-03-19 | 検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57042539A JPS58160853A (ja) | 1982-03-19 | 1982-03-19 | 検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58160853A JPS58160853A (ja) | 1983-09-24 |
JPH0140950B2 true JPH0140950B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1989-09-01 |
Family
ID=12638869
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57042539A Granted JPS58160853A (ja) | 1982-03-19 | 1982-03-19 | 検査装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58160853A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7267730B2 (ja) * | 2018-12-21 | 2023-05-02 | 東京エレクトロンデバイス株式会社 | 物品計数装置、物品計数方法およびプログラム |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55161486A (en) * | 1979-05-31 | 1980-12-16 | Fuji Electric Co Ltd | Defect detection system |
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1982
- 1982-03-19 JP JP57042539A patent/JPS58160853A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS58160853A (ja) | 1983-09-24 |