JP7781639B2 - 高アスペクト比の孔及び高い孔密度を有するガス分配プレート - Google Patents
高アスペクト比の孔及び高い孔密度を有するガス分配プレートInfo
- Publication number
- JP7781639B2 JP7781639B2 JP2021556710A JP2021556710A JP7781639B2 JP 7781639 B2 JP7781639 B2 JP 7781639B2 JP 2021556710 A JP2021556710 A JP 2021556710A JP 2021556710 A JP2021556710 A JP 2021556710A JP 7781639 B2 JP7781639 B2 JP 7781639B2
- Authority
- JP
- Japan
- Prior art keywords
- diameter
- holes
- plate
- interconnected
- gas distribution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45565—Shower nozzles
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/0008—Soldering, e.g. brazing, or unsoldering specially adapted for particular articles or work
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45544—Atomic layer deposition [ALD] characterized by the apparatus
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Drying Of Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201962824369P | 2019-03-27 | 2019-03-27 | |
| US62/824,369 | 2019-03-27 | ||
| PCT/US2020/020070 WO2020197684A1 (en) | 2019-03-27 | 2020-02-27 | Gas distribution plate with high aspect ratio holes and a high hole density |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2022527694A JP2022527694A (ja) | 2022-06-03 |
| JP2022527694A5 JP2022527694A5 (https=) | 2023-03-08 |
| JP7781639B2 true JP7781639B2 (ja) | 2025-12-08 |
Family
ID=72607016
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021556710A Active JP7781639B2 (ja) | 2019-03-27 | 2020-02-27 | 高アスペクト比の孔及び高い孔密度を有するガス分配プレート |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US11332827B2 (https=) |
| JP (1) | JP7781639B2 (https=) |
| KR (1) | KR102865277B1 (https=) |
| CN (1) | CN113508191B (https=) |
| SG (1) | SG11202108874QA (https=) |
| TW (1) | TWI832986B (https=) |
| WO (1) | WO2020197684A1 (https=) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11371148B2 (en) | 2020-08-24 | 2022-06-28 | Applied Materials, Inc. | Fabricating a recursive flow gas distribution stack using multiple layers |
| US20230234160A1 (en) * | 2022-01-24 | 2023-07-27 | Applied Materials, Inc. | Diffusion bonding of pure metal bodies |
| CN115074704A (zh) * | 2022-07-27 | 2022-09-20 | 拓荆科技(上海)有限公司 | 喷淋装置 |
| US12503759B2 (en) | 2023-03-07 | 2025-12-23 | Rtx Corporation | Chemical vapor infiltration tooling hole modification for optimizing infiltration in ceramic matrix composites |
| US12479775B2 (en) * | 2023-03-07 | 2025-11-25 | Rtx Corporation | Chemical vapor infiltration tooling for optimizing infiltration in ceramic matrix composites |
| KR20250014860A (ko) * | 2023-07-21 | 2025-02-03 | 세메스 주식회사 | 샤워헤드 어셈블리를 포함하는 기판 처리 장치 |
| KR102802229B1 (ko) * | 2024-04-04 | 2025-05-02 | 주식회사 문성엠에스케이 | 반도체 전극(cathode)의 홀 형성 방법 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008031558A (ja) | 2007-10-15 | 2008-02-14 | Tokyo Electron Ltd | ガスシャワーヘッド、処理装置、処理方法及び処理装置のメンテナンス方法 |
| JP2009231558A (ja) | 2008-03-24 | 2009-10-08 | Tokyo Electron Ltd | プラズマ処理装置とガス供給部材およびその製造方法 |
| JP2011086822A (ja) | 2009-10-16 | 2011-04-28 | Mitsubishi Electric Corp | プラズマ処理装置 |
| JP2011129618A (ja) | 2009-12-16 | 2011-06-30 | Fuji Electric Co Ltd | 薄膜形成装置 |
| JP2018190983A (ja) | 2017-05-10 | 2018-11-29 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | チャンバコンポーネント用多層プラズマ腐食防護 |
Family Cites Families (77)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4780169A (en) * | 1987-05-11 | 1988-10-25 | Tegal Corporation | Non-uniform gas inlet for dry etching apparatus |
| JPH05175135A (ja) * | 1991-10-03 | 1993-07-13 | Ulvac Japan Ltd | 光cvd装置 |
| US5439524A (en) * | 1993-04-05 | 1995-08-08 | Vlsi Technology, Inc. | Plasma processing apparatus |
| US5415753A (en) * | 1993-07-22 | 1995-05-16 | Materials Research Corporation | Stationary aperture plate for reactive sputter deposition |
| KR950020993A (ko) | 1993-12-22 | 1995-07-26 | 김광호 | 반도체 제조장치 |
| JP3468859B2 (ja) * | 1994-08-16 | 2003-11-17 | 富士通株式会社 | 気相処理装置及び気相処理方法 |
| US5792269A (en) * | 1995-10-31 | 1998-08-11 | Applied Materials, Inc. | Gas distribution for CVD systems |
| US5819434A (en) * | 1996-04-25 | 1998-10-13 | Applied Materials, Inc. | Etch enhancement using an improved gas distribution plate |
| US6209480B1 (en) * | 1996-07-10 | 2001-04-03 | Mehrdad M. Moslehi | Hermetically-sealed inductively-coupled plasma source structure and method of use |
| US5781693A (en) * | 1996-07-24 | 1998-07-14 | Applied Materials, Inc. | Gas introduction showerhead for an RTP chamber with upper and lower transparent plates and gas flow therebetween |
| US6388381B2 (en) * | 1996-09-10 | 2002-05-14 | The Regents Of The University Of California | Constricted glow discharge plasma source |
| US6140773A (en) * | 1996-09-10 | 2000-10-31 | The Regents Of The University Of California | Automated control of linear constricted plasma source array |
| EP0854210B1 (en) * | 1996-12-19 | 2002-03-27 | Toshiba Ceramics Co., Ltd. | Vapor deposition apparatus for forming thin film |
| US6051286A (en) * | 1997-02-12 | 2000-04-18 | Applied Materials, Inc. | High temperature, high deposition rate process and apparatus for depositing titanium layers |
| US6024799A (en) * | 1997-07-11 | 2000-02-15 | Applied Materials, Inc. | Chemical vapor deposition manifold |
| US6080446A (en) * | 1997-08-21 | 2000-06-27 | Anelva Corporation | Method of depositing titanium nitride thin film and CVD deposition apparatus |
| US6098568A (en) * | 1997-12-01 | 2000-08-08 | Applied Materials, Inc. | Mixed frequency CVD apparatus |
| US6041734A (en) * | 1997-12-01 | 2000-03-28 | Applied Materials, Inc. | Use of an asymmetric waveform to control ion bombardment during substrate processing |
| US7004107B1 (en) * | 1997-12-01 | 2006-02-28 | Applied Materials Inc. | Method and apparatus for monitoring and adjusting chamber impedance |
| US6079356A (en) * | 1997-12-02 | 2000-06-27 | Applied Materials, Inc. | Reactor optimized for chemical vapor deposition of titanium |
| US6106625A (en) * | 1997-12-02 | 2000-08-22 | Applied Materials, Inc. | Reactor useful for chemical vapor deposition of titanium nitride |
| US6050506A (en) * | 1998-02-13 | 2000-04-18 | Applied Materials, Inc. | Pattern of apertures in a showerhead for chemical vapor deposition |
| US6454860B2 (en) * | 1998-10-27 | 2002-09-24 | Applied Materials, Inc. | Deposition reactor having vaporizing, mixing and cleaning capabilities |
| US6250250B1 (en) * | 1999-03-18 | 2001-06-26 | Yuri Maishev | Multiple-cell source of uniform plasma |
| US6565661B1 (en) * | 1999-06-04 | 2003-05-20 | Simplus Systems Corporation | High flow conductance and high thermal conductance showerhead system and method |
| JP4487338B2 (ja) * | 1999-08-31 | 2010-06-23 | 東京エレクトロン株式会社 | 成膜処理装置及び成膜処理方法 |
| DE10060002B4 (de) * | 1999-12-07 | 2016-01-28 | Komatsu Ltd. | Vorrichtung zur Oberflächenbehandlung |
| US6381021B1 (en) * | 2000-06-22 | 2002-04-30 | Applied Materials, Inc. | Method and apparatus for measuring reflectivity of deposited films |
| US6461435B1 (en) * | 2000-06-22 | 2002-10-08 | Applied Materials, Inc. | Showerhead with reduced contact area |
| KR100756107B1 (ko) * | 2001-02-09 | 2007-09-05 | 동경 엘렉트론 주식회사 | 성막 장치 |
| US6761796B2 (en) * | 2001-04-06 | 2004-07-13 | Axcelis Technologies, Inc. | Method and apparatus for micro-jet enabled, low-energy ion generation transport in plasma processing |
| SG104976A1 (en) * | 2001-07-13 | 2004-07-30 | Asml Us Inc | Modular injector and exhaust assembly |
| US6793733B2 (en) * | 2002-01-25 | 2004-09-21 | Applied Materials Inc. | Gas distribution showerhead |
| US7008484B2 (en) * | 2002-05-06 | 2006-03-07 | Applied Materials Inc. | Method and apparatus for deposition of low dielectric constant materials |
| JP2003324072A (ja) * | 2002-05-07 | 2003-11-14 | Nec Electronics Corp | 半導体製造装置 |
| US6821347B2 (en) * | 2002-07-08 | 2004-11-23 | Micron Technology, Inc. | Apparatus and method for depositing materials onto microelectronic workpieces |
| US6884296B2 (en) * | 2002-08-23 | 2005-04-26 | Micron Technology, Inc. | Reactors having gas distributors and methods for depositing materials onto micro-device workpieces |
| JP4260450B2 (ja) * | 2002-09-20 | 2009-04-30 | 東京エレクトロン株式会社 | 真空処理装置における静電チャックの製造方法 |
| CA2471987C (en) * | 2002-10-07 | 2008-09-02 | Sekisui Chemical Co., Ltd. | Plasma surface processing apparatus |
| US7270713B2 (en) * | 2003-01-07 | 2007-09-18 | Applied Materials, Inc. | Tunable gas distribution plate assembly |
| US6942753B2 (en) * | 2003-04-16 | 2005-09-13 | Applied Materials, Inc. | Gas distribution plate assembly for large area plasma enhanced chemical vapor deposition |
| US8580076B2 (en) * | 2003-05-22 | 2013-11-12 | Lam Research Corporation | Plasma apparatus, gas distribution assembly for a plasma apparatus and processes therewith |
| US7581511B2 (en) * | 2003-10-10 | 2009-09-01 | Micron Technology, Inc. | Apparatus and methods for manufacturing microfeatures on workpieces using plasma vapor processes |
| US20060054280A1 (en) * | 2004-02-23 | 2006-03-16 | Jang Geun-Ha | Apparatus of manufacturing display substrate and showerhead assembly equipped therein |
| US20050223986A1 (en) * | 2004-04-12 | 2005-10-13 | Choi Soo Y | Gas diffusion shower head design for large area plasma enhanced chemical vapor deposition |
| US7785672B2 (en) * | 2004-04-20 | 2010-08-31 | Applied Materials, Inc. | Method of controlling the film properties of PECVD-deposited thin films |
| US8083853B2 (en) * | 2004-05-12 | 2011-12-27 | Applied Materials, Inc. | Plasma uniformity control by gas diffuser hole design |
| US8074599B2 (en) * | 2004-05-12 | 2011-12-13 | Applied Materials, Inc. | Plasma uniformity control by gas diffuser curvature |
| US8328939B2 (en) * | 2004-05-12 | 2012-12-11 | Applied Materials, Inc. | Diffuser plate with slit valve compensation |
| US7622005B2 (en) * | 2004-05-26 | 2009-11-24 | Applied Materials, Inc. | Uniformity control for low flow process and chamber to chamber matching |
| KR101063737B1 (ko) * | 2004-07-09 | 2011-09-08 | 주성엔지니어링(주) | 기판 제조장비의 샤워헤드 |
| US7429410B2 (en) * | 2004-09-20 | 2008-09-30 | Applied Materials, Inc. | Diffuser gravity support |
| US20060228490A1 (en) * | 2005-04-07 | 2006-10-12 | Applied Materials, Inc. | Gas distribution uniformity improvement by baffle plate with multi-size holes for large size PECVD systems |
| KR100599056B1 (ko) | 2005-07-21 | 2006-07-12 | 삼성전자주식회사 | 포토레지스트 제거 장치 및 방법 |
| AU2007230338B2 (en) * | 2006-03-24 | 2011-04-07 | Mitsubishi Heavy Industries, Ltd. | Electrode and vacuum processing apparatus |
| US8702866B2 (en) * | 2006-12-18 | 2014-04-22 | Lam Research Corporation | Showerhead electrode assembly with gas flow modification for extended electrode life |
| CN100577866C (zh) | 2007-02-27 | 2010-01-06 | 中微半导体设备(上海)有限公司 | 应用于等离子体反应室中的气体喷头组件、其制造方法及其翻新再利用的方法 |
| US20080302303A1 (en) * | 2007-06-07 | 2008-12-11 | Applied Materials, Inc. | Methods and apparatus for depositing a uniform silicon film with flow gradient designs |
| US8142606B2 (en) * | 2007-06-07 | 2012-03-27 | Applied Materials, Inc. | Apparatus for depositing a uniform silicon film and methods for manufacturing the same |
| CN101802254B (zh) * | 2007-10-11 | 2013-11-27 | 瓦伦斯处理设备公司 | 化学气相沉积反应器 |
| US20090155488A1 (en) * | 2007-12-18 | 2009-06-18 | Asm Japan K.K. | Shower plate electrode for plasma cvd reactor |
| US8876024B2 (en) * | 2008-01-10 | 2014-11-04 | Applied Materials, Inc. | Heated showerhead assembly |
| US8702867B2 (en) * | 2008-07-08 | 2014-04-22 | Jusung Engineering Co., Ltd. | Gas distribution plate and substrate treating apparatus including the same |
| TWI385272B (zh) * | 2009-09-25 | 2013-02-11 | Ind Tech Res Inst | 氣體分佈板及其裝置 |
| EP2360292B1 (en) * | 2010-02-08 | 2012-03-28 | Roth & Rau AG | Parallel plate reactor for uniform thin film deposition with reduced tool foot-print |
| US20120097330A1 (en) * | 2010-10-20 | 2012-04-26 | Applied Materials, Inc. | Dual delivery chamber design |
| SG192967A1 (en) * | 2011-03-04 | 2013-09-30 | Novellus Systems Inc | Hybrid ceramic showerhead |
| JP5955062B2 (ja) * | 2011-04-25 | 2016-07-20 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| US8960235B2 (en) * | 2011-10-28 | 2015-02-24 | Applied Materials, Inc. | Gas dispersion apparatus |
| CN103903946B (zh) * | 2012-12-26 | 2017-11-17 | 中微半导体设备(上海)有限公司 | 一种用于等离子反应器的气体喷淋头 |
| US9484190B2 (en) * | 2014-01-25 | 2016-11-01 | Yuri Glukhoy | Showerhead-cooler system of a semiconductor-processing chamber for semiconductor wafers of large area |
| US10100408B2 (en) * | 2014-03-03 | 2018-10-16 | Applied Materials, Inc. | Edge hump reduction faceplate by plasma modulation |
| US10077497B2 (en) * | 2014-05-30 | 2018-09-18 | Lam Research Corporation | Hollow cathode discharge (HCD) suppressing capacitively coupled plasma electrode and gas distribution faceplate |
| JP6868616B2 (ja) | 2015-10-08 | 2021-05-12 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 背面でのプラズマ点火が低減されたシャワーヘッド |
| US10358722B2 (en) * | 2015-12-14 | 2019-07-23 | Lam Research Corporation | Showerhead assembly |
| KR20170121775A (ko) * | 2016-04-25 | 2017-11-03 | 삼성디스플레이 주식회사 | 화학 기상 증착 장치 |
| US20180340257A1 (en) * | 2017-05-25 | 2018-11-29 | Applied Materials, Inc. | Diffuser for uniformity improvement in display pecvd applications |
-
2020
- 2020-02-26 US US16/802,293 patent/US11332827B2/en active Active
- 2020-02-27 SG SG11202108874Q patent/SG11202108874QA/en unknown
- 2020-02-27 KR KR1020217033028A patent/KR102865277B1/ko active Active
- 2020-02-27 WO PCT/US2020/020070 patent/WO2020197684A1/en not_active Ceased
- 2020-02-27 CN CN202080017675.0A patent/CN113508191B/zh active Active
- 2020-02-27 JP JP2021556710A patent/JP7781639B2/ja active Active
- 2020-03-09 TW TW109107594A patent/TWI832986B/zh active
-
2022
- 2022-05-16 US US17/745,156 patent/US20220380898A1/en not_active Abandoned
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008031558A (ja) | 2007-10-15 | 2008-02-14 | Tokyo Electron Ltd | ガスシャワーヘッド、処理装置、処理方法及び処理装置のメンテナンス方法 |
| JP2009231558A (ja) | 2008-03-24 | 2009-10-08 | Tokyo Electron Ltd | プラズマ処理装置とガス供給部材およびその製造方法 |
| JP2011086822A (ja) | 2009-10-16 | 2011-04-28 | Mitsubishi Electric Corp | プラズマ処理装置 |
| JP2011129618A (ja) | 2009-12-16 | 2011-06-30 | Fuji Electric Co Ltd | 薄膜形成装置 |
| JP2018190983A (ja) | 2017-05-10 | 2018-11-29 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | チャンバコンポーネント用多層プラズマ腐食防護 |
Also Published As
| Publication number | Publication date |
|---|---|
| US11332827B2 (en) | 2022-05-17 |
| KR102865277B1 (ko) | 2025-09-25 |
| WO2020197684A1 (en) | 2020-10-01 |
| TWI832986B (zh) | 2024-02-21 |
| CN113508191B (zh) | 2024-06-11 |
| TW202039088A (zh) | 2020-11-01 |
| KR20210133302A (ko) | 2021-11-05 |
| US20220380898A1 (en) | 2022-12-01 |
| CN113508191A (zh) | 2021-10-15 |
| SG11202108874QA (en) | 2021-10-28 |
| JP2022527694A (ja) | 2022-06-03 |
| US20200308703A1 (en) | 2020-10-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP7781639B2 (ja) | 高アスペクト比の孔及び高い孔密度を有するガス分配プレート | |
| KR20200116161A (ko) | 세라믹 베이스플레이트들을 갖는 멀티-플레이트 정전 척들 | |
| TWI744323B (zh) | 具有不同的加熱器跡線材料之層疊式加熱器 | |
| CN113439330A (zh) | 具有陶瓷单体的静电卡盘 | |
| CN111433902A (zh) | 向下游室传送自由基和前体气体以实现远程等离子体膜沉积的有改进的孔图案的集成喷头 | |
| JP7743509B2 (ja) | 真のラジカル処理のためのリモートプラズマアーキテクチャ | |
| US11133211B2 (en) | Ceramic baseplate with channels having non-square corners | |
| KR20180016300A (ko) | 부분적으로 그물 형상이고 부분적으로 거의 그물 형상인 실리콘 카바이드 cvd | |
| TW202439865A (zh) | 用於斜面蝕刻器的下電漿排除區域環 | |
| CN115315776A (zh) | 具有斜向流动路径的气体分配面板 | |
| TW202336801A (zh) | 具有用於自由基物種輸送的孔尺寸之噴淋頭 | |
| JP2025522636A (ja) | 基板処理システム用の改善された台座 | |
| CN114008734A (zh) | 在传送衬底期间使用真空 | |
| WO2019191428A1 (en) | Mems-based coriolis mass flow controller | |
| JP7680361B2 (ja) | 処理チャンバ用の多孔性シャワーヘッド | |
| CN115769354A (zh) | 用于高效率传热的单块式基座 | |
| TWI855024B (zh) | 在原子層沉積(ald)基板處理腔室中調變膜性質用之支座及具有該支座之系統 | |
| TW202511528A (zh) | 基板處理系統的多孔噴淋頭 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20230227 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20230227 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20240213 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20240326 |
|
| A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20240625 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20240826 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20241119 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20250214 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20250430 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20250901 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20251028 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20251126 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 7781639 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |