JP7730686B2 - 光照射装置 - Google Patents
光照射装置Info
- Publication number
- JP7730686B2 JP7730686B2 JP2021131048A JP2021131048A JP7730686B2 JP 7730686 B2 JP7730686 B2 JP 7730686B2 JP 2021131048 A JP2021131048 A JP 2021131048A JP 2021131048 A JP2021131048 A JP 2021131048A JP 7730686 B2 JP7730686 B2 JP 7730686B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- mirror
- light source
- irradiation device
- optical path
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
- G02B27/1086—Beam splitting or combining systems operating by diffraction only
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
- G02B19/0047—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0229—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using masks, aperture plates, spatial light modulators or spatial filters, e.g. reflective filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0237—Adjustable, e.g. focussing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
- G02B17/0605—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors
- G02B17/0621—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors off-axis or unobscured systems in which not all of the mirrors share a common axis of rotational symmetry, e.g. at least one of the mirrors is warped, tilted or decentered with respect to the other elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
- G02B17/0626—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using three curved mirrors
- G02B17/0636—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using three curved mirrors off-axis or unobscured systems in which all of the mirrors share a common axis of rotational symmetry
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
- G02B17/0668—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror having non-imaging properties
- G02B17/0673—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror having non-imaging properties for light condensing, e.g. for use with a light emitter
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
- H10P74/20—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by the properties tested or measured, e.g. structural or electrical properties
- H10P74/203—Structural properties, e.g. testing or measuring thicknesses, line widths, warpage, bond strengths or physical defects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
- G01B2210/56—Measuring geometric parameters of semiconductor structures, e.g. profile, critical dimensions or trench depth
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/4233—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive element [DOE] contributing to a non-imaging application
- G02B27/4244—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive element [DOE] contributing to a non-imaging application in wavelength selecting devices
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Non-Portable Lighting Devices Or Systems Thereof (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
10:光照射部
11:白色光源
12:角度調整手段
13:回折格子
14:ピンホールマスク
15:光路変換ミラー
16:第一の集光ミラー
16a:集光面
17:第二の集光ミラー
17a:集光面
18:第三の集光ミラー
18a:集光面
19:反射ミラー
100:制御手段
H:ピンホール
L0:白色光
Lb:青色光
Lg:緑色光
Lr:赤色光
Claims (5)
- 白色光を複数の波長に分光して照射する光照射装置であって、
白色光源と、該白色光源が発した白色光を分光する回折格子と、該回折格子によって分光された複数の波長の光から特定の波長の光を選別する光選別手段とを含み構成され、
該光選別手段は、該回折格子によって分光された複数の波長の光から、特定の波長の光を通過させることにより選別する手段であり、該回折格子によって分光された複数の波長の光を反射する第一の集光ミラーと、該第一の集光ミラーと同じ焦点距離を有し焦点を対称の中心として点対称の位置に配設される第二の集光ミラーと、該第二の集光ミラーの焦点に位置付けられ光路を変更する光路変換ミラーと、該光路変換ミラーで光路が変換された複数の波長の光を選別して通過させる手段とを含む光照射装置。 - 該光路変換ミラーの後に第三の集光ミラーを備え、該第三の集光ミラーの焦点が該光路変換ミラーで光路が変換された複数の波長の光を選別して通過させる手段に位置付けられる請求項1に記載の光照射装置。
- 該光路変換ミラーで光路が変換された複数の波長の光を選別して通過させる手段は、ピンホールマスクである請求項1又は2に記載の光照射装置。
- 該光路変換ミラーは、ガルバノスキャナー、レゾナントスキャナー、ポリゴンミラーのいずれかを含む請求項1から3のいずれかに記載の光照射装置。
- 該白色光源は、SLD光源、ASE光源、LED光源、スーパーコンティニウム光源、ハロゲン光源、キセノン光源、水銀光源、メタルハライド光源のいずれかである請求項1から4のいずれかに記載の光照射装置。
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021131048A JP7730686B2 (ja) | 2021-08-11 | 2021-08-11 | 光照射装置 |
| TW111126303A TW202306683A (zh) | 2021-08-11 | 2022-07-13 | 光照射裝置 |
| US17/813,997 US12085727B2 (en) | 2021-08-11 | 2022-07-21 | Light irradiation apparatus |
| KR1020220095756A KR20230024208A (ko) | 2021-08-11 | 2022-08-02 | 광 조사 장치 |
| DE102022208121.8A DE102022208121A1 (de) | 2021-08-11 | 2022-08-04 | Lichtbestrahlungsvorrichtung |
| CN202210947829.7A CN115704962A (zh) | 2021-08-11 | 2022-08-05 | 光照射装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021131048A JP7730686B2 (ja) | 2021-08-11 | 2021-08-11 | 光照射装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2023025742A JP2023025742A (ja) | 2023-02-24 |
| JP7730686B2 true JP7730686B2 (ja) | 2025-08-28 |
Family
ID=85040014
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021131048A Active JP7730686B2 (ja) | 2021-08-11 | 2021-08-11 | 光照射装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US12085727B2 (ja) |
| JP (1) | JP7730686B2 (ja) |
| KR (1) | KR20230024208A (ja) |
| CN (1) | CN115704962A (ja) |
| DE (1) | DE102022208121A1 (ja) |
| TW (1) | TW202306683A (ja) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4225233A (en) | 1978-02-02 | 1980-09-30 | The Trustees Of Boston University | Rapid scan spectrophotometer |
| JP2007205784A (ja) | 2006-01-31 | 2007-08-16 | Yokogawa Electric Corp | 光スペクトラムアナライザ |
Family Cites Families (37)
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| US4120586A (en) * | 1977-01-28 | 1978-10-17 | Baxter Travenol Laboratories, Inc. | Method and means for aligning focusing mirrors in an optical spectrometer |
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| EP0403228B1 (en) * | 1989-06-16 | 1995-08-23 | FISONS plc | Optical system for spectral analysis |
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-
2021
- 2021-08-11 JP JP2021131048A patent/JP7730686B2/ja active Active
-
2022
- 2022-07-13 TW TW111126303A patent/TW202306683A/zh unknown
- 2022-07-21 US US17/813,997 patent/US12085727B2/en active Active
- 2022-08-02 KR KR1020220095756A patent/KR20230024208A/ko active Pending
- 2022-08-04 DE DE102022208121.8A patent/DE102022208121A1/de active Pending
- 2022-08-05 CN CN202210947829.7A patent/CN115704962A/zh active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4225233A (en) | 1978-02-02 | 1980-09-30 | The Trustees Of Boston University | Rapid scan spectrophotometer |
| JP2007205784A (ja) | 2006-01-31 | 2007-08-16 | Yokogawa Electric Corp | 光スペクトラムアナライザ |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20230024208A (ko) | 2023-02-20 |
| JP2023025742A (ja) | 2023-02-24 |
| US20230048701A1 (en) | 2023-02-16 |
| US12085727B2 (en) | 2024-09-10 |
| TW202306683A (zh) | 2023-02-16 |
| DE102022208121A1 (de) | 2023-02-16 |
| CN115704962A (zh) | 2023-02-17 |
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