JP7256675B2 - 低誘電膜の形成方法及び半導体素子の形成方法 - Google Patents
低誘電膜の形成方法及び半導体素子の形成方法 Download PDFInfo
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- JP7256675B2 JP7256675B2 JP2019078428A JP2019078428A JP7256675B2 JP 7256675 B2 JP7256675 B2 JP 7256675B2 JP 2019078428 A JP2019078428 A JP 2019078428A JP 2019078428 A JP2019078428 A JP 2019078428A JP 7256675 B2 JP7256675 B2 JP 7256675B2
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| CN118007094A (zh) * | 2015-06-16 | 2024-05-10 | 弗萨姆材料美国有限责任公司 | 卤硅烷化合物和组合物以及用于使用其沉积含硅膜的方法 |
| KR102830540B1 (ko) * | 2021-07-29 | 2025-07-07 | 삼성전자주식회사 | 반도체 장치 |
| JP7437362B2 (ja) * | 2021-09-28 | 2024-02-22 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置、基板処理方法及びプログラム |
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- 2019-04-12 CN CN201910292773.4A patent/CN110416061B/zh active Active
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| KR20190124509A (ko) | 2019-11-05 |
| US10861695B2 (en) | 2020-12-08 |
| EP3561860A1 (en) | 2019-10-30 |
| KR102541454B1 (ko) | 2023-06-09 |
| CN110416061B (zh) | 2024-04-30 |
| CN110416061A (zh) | 2019-11-05 |
| SG10201903205RA (en) | 2019-11-28 |
| US20190333754A1 (en) | 2019-10-31 |
| JP2019192907A (ja) | 2019-10-31 |
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