JP7237024B2 - 少なくとも１つの物体の位置を決定するための検出器 - Google Patents

少なくとも１つの物体の位置を決定するための検出器 Download PDF

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Publication number
JP7237024B2
JP7237024B2 JP2019572037A JP2019572037A JP7237024B2 JP 7237024 B2 JP7237024 B2 JP 7237024B2 JP 2019572037 A JP2019572037 A JP 2019572037A JP 2019572037 A JP2019572037 A JP 2019572037A JP 7237024 B2 JP7237024 B2 JP 7237024B2
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longitudinal
detector
sensor
photosensor
positioning
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JP2020525936A (ja
JP2020525936A5 (https=
Inventor
ルンゲンシュミート，クリストフ
ペッコラ，オイリ
シンドラー，パトリク
ゼント，ロベルト
ブルーダー，イングマル
ティール，エルヴィン
イルレ，シュテファン
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トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/46—Indirect determination of position data
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00—Measuring distances in line of sight; Optical rangefinders
    • G01C3/32—Measuring distances in line of sight; Optical rangefinders by focusing the object, e.g. on a ground glass screen
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S11/00—Systems for determining distance or velocity not using reflection or reradiation
    • G01S11/12—Systems for determining distance or velocity not using reflection or reradiation using electromagnetic waves other than radio waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/42—Simultaneous measurement of distance and other co-ordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/497—Means for monitoring or calibrating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements
    • G01S7/4816—Constructional features, e.g. arrangements of optical elements of receivers alone

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
  • Position Input By Displaying (AREA)
JP2019572037A 2017-06-26 2018-06-25 少なくとも１つの物体の位置を決定するための検出器 Active JP7237024B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP17177871.5 2017-06-26
EP17177871 2017-06-26
PCT/EP2018/066942 WO2019002199A1 (en) 2017-06-26 2018-06-25 DETECTOR FOR DETERMINING A POSITION OF AT LEAST ONE OBJECT

Publications (3)

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JP2020525936A JP2020525936A (ja) 2020-08-27
JP2020525936A5 JP2020525936A5 (https=) 2021-08-05
JP7237024B2 true JP7237024B2 (ja) 2023-03-10

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US (1) US11067692B2 (https=)
EP (1) EP3645965B1 (https=)
JP (1) JP7237024B2 (https=)
KR (1) KR102568462B1 (https=)
CN (1) CN110998223B (https=)
WO (1) WO2019002199A1 (https=)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3008485A1 (en) 2013-06-13 2016-04-20 Basf Se Detector for optically detecting at least one object
CN106662636B (zh) 2014-07-08 2020-12-25 巴斯夫欧洲公司 用于确定至少一个对象的位置的检测器
US11125880B2 (en) 2014-12-09 2021-09-21 Basf Se Optical detector
JP6841769B2 (ja) 2015-01-30 2021-03-10 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１個の物体を光学的に検出する検出器
EP3325917B1 (en) 2015-07-17 2020-02-26 trinamiX GmbH Detector for optically detecting at least one object
JP2019523562A (ja) 2016-07-29 2019-08-22 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 光学的検出のための光センサおよび検出器
CN109923372B (zh) 2016-10-25 2021-12-21 特里纳米克斯股份有限公司 采用集成滤波器的红外光学检测器
EP3532864B1 (en) 2016-10-25 2024-08-28 trinamiX GmbH Detector for an optical detection of at least one object
US11860292B2 (en) 2016-11-17 2024-01-02 Trinamix Gmbh Detector and methods for authenticating at least one object
CN109964144B (zh) 2016-11-17 2023-07-18 特里纳米克斯股份有限公司 用于光学探测至少一个对象的检测器
JP2020510820A (ja) 2017-03-16 2020-04-09 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１つの物体を光学的に検出するための検出器
JP2020531848A (ja) 2017-08-28 2020-11-05 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも一つの幾何学情報を決定するためのレンジファインダ
EP3676629B1 (en) 2017-08-28 2023-10-11 trinamiX GmbH Detector for determining a position of at least one object
CN111587384B (zh) 2017-11-17 2024-06-14 特里纳米克斯股份有限公司 用于确定至少一个对象的位置的检测器
CN114636715B (zh) * 2022-03-09 2023-06-16 河南省科学院同位素研究所有限责任公司 基于棚上棚下同步定位的高空钢结构锈蚀定位评估方法

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014510909A (ja) 2011-02-15 2014-05-01 ビーエーエスエフ ソシエタス・ヨーロピア 少なくとも１つの対象物を光学的に検出する検出器
WO2016005893A1 (en) 2014-07-08 2016-01-14 Basf Se Detector for determining a position of at least one object
JP2016510397A (ja) 2012-12-19 2016-04-07 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ １つ以上の物体を光学的に検出するための検出器
WO2016092454A1 (en) 2014-12-09 2016-06-16 Basf Se Optical detector
WO2016092450A1 (en) 2014-12-09 2016-06-16 Basf Se Detector for an optical detection of at least one object
JP2016529473A (ja) 2013-06-13 2016-09-23 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ 少なくとも１つの物体を光学的に検出する検出器
JP2016536594A (ja) 2013-08-19 2016-11-24 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ 少なくとも１つの対象物の位置を求めるための検出器

Family Cites Families (316)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
LU35237A1 (https=) 1956-06-27
US3035176A (en) 1959-11-23 1962-05-15 Packard Bell Electronics Corp Monoscopic range finder
CH388657A (fr) 1963-04-17 1965-02-28 Paillard Sa Dispositif pour détecter le maximum de netteté d'une image
US3562785A (en) 1968-11-20 1971-02-09 Logetronics Inc Image adjusting method
US3564268A (en) 1969-06-27 1971-02-16 Standard Change Makers Inc Document verifier using photovoltaic cell with light sensitive bars
SE407976B (sv) 1973-03-13 1979-04-30 Bofors Ab Forfarande och anordning for malfoljning
JPS5625648B2 (https=) 1973-04-11 1981-06-13
JPS5634842B2 (https=) 1973-10-26 1981-08-13
FR2271590B1 (https=) 1974-01-15 1978-12-01 Thomson Brandt
US4079247A (en) 1975-05-16 1978-03-14 Claude Bricot Optical focussing device
US4256513A (en) 1978-10-19 1981-03-17 Matsushita Electric Industrial Co., Ltd. Photoelectric conversion device
JPS55159445A (en) 1979-05-31 1980-12-11 Ricoh Co Ltd Electrophotographic receptor
EP0020879A1 (en) 1979-06-06 1981-01-07 Erwin Sick GmbH Optik-Elektronik Optical electronic distance sensor
NL187374C (nl) 1981-07-10 1991-09-02 Philips Nv Inrichting voor het detecteren van straling.
JPS58175091A (ja) 1982-04-06 1983-10-14 株式会社東芝 セキユリテイ・ストレツド検出装置
US4548886A (en) 1982-06-08 1985-10-22 Canon Kabushiki Kaisha Radiation sensitive organic thin film comprising an azulenium salt
JPS5950579A (ja) 1982-09-16 1984-03-23 Komatsu Ltd 半導体光位置検出器
US4593187A (en) 1982-10-29 1986-06-03 The Perkin-Elmer Corporation Non-imaging illumination incidence angle detection system
ZA839316B (en) 1982-12-16 1984-08-29 Vickers Plc Photoconductive compositions
JPS61245579A (ja) 1984-02-17 1986-10-31 アメリカン　サイアナミド　カンパニ− 半導体装置と製法
US4584704A (en) 1984-03-01 1986-04-22 Bran Ferren Spatial imaging system
US4773751A (en) 1984-03-09 1988-09-27 Minolta Camera Kabushiki Kaisha Infinite level setting device for a distance measuring device
JPS6189501A (ja) 1984-10-08 1986-05-07 Hitachi Ltd 境界面測定装置
GB2165641B (en) 1984-10-13 1988-01-13 Graviner Ltd Measuring distance to a fire
US4602158A (en) 1984-10-26 1986-07-22 Itek Corporation PbS-PbSe IR detector arrays
US4603258A (en) 1984-11-16 1986-07-29 Sri International Photocapacitive detector array
JPS61135280A (ja) 1984-12-06 1986-06-23 Toshiba Corp 三次元撮像素子
EP0187620B1 (de) 1985-01-03 1991-04-17 Ciba-Geigy Ag Dithioketo-pyrrolo-pyrrole, Verfahren zu deren Herstellung und Verwendung
JPS61186804A (ja) 1985-02-11 1986-08-20 ゼロツクス　コーポレーシヨン 光検出装置
NL8501665A (nl) * 1985-06-10 1987-01-02 Philips Nv Optische aftasteenheid met positie- en standdetektiestelsel voor een elektromagnetisch gelagerd objektief.
US4647193A (en) 1985-06-10 1987-03-03 Rca Corporation Optical target ranging apparatus
US4760004A (en) 1986-11-10 1988-07-26 Ciba-Geigy Corporation Thioquinacridones and isothioquinacridones, preparation and use thereof
DE3789505T2 (de) 1987-09-28 1994-10-20 Kobe Steel Ltd Vorrichtung und Verfahren zum Feststellen der Richtung von einfallendem Licht.
US5082363A (en) 1988-02-12 1992-01-21 Omron Tateisi Electronics Co. Optical distance measuring apparatus and method using light projection pulses
CH674596A5 (https=) 1988-02-12 1990-06-15 Sulzer Ag
US4952472A (en) 1988-07-01 1990-08-28 Xerox Corporation Indigoid photoconductor imaging members
JP2687154B2 (ja) 1988-12-23 1997-12-08 株式会社小松製作所 三次元位置計測装置
JPH04240817A (ja) 1991-01-25 1992-08-28 Seiko Epson Corp 光学素子
JPH0815097B2 (ja) 1990-04-17 1996-02-14 エコール・ポリテクニツク・フエデラール・ドウ・ローザンヌ 光電池
DE4211875A1 (de) 1990-10-09 1993-10-14 Zeiss Carl Fa Optischer Abstandssensor
US5375008A (en) 1991-07-17 1994-12-20 Electronic Warfare Associates, Inc. Systems for distinguishing between friendly ground targets and those of a foe
JPH0548833A (ja) 1991-08-07 1993-02-26 Asahi Optical Co Ltd 色収差補正構造
US5227985A (en) 1991-08-19 1993-07-13 University Of Maryland Computer vision system for position monitoring in three dimensions using non-coplanar light sources attached to a monitored object
US5216476A (en) 1991-10-15 1993-06-01 Synectics Corporation Photogrammetric laser system
US5291066A (en) 1991-11-14 1994-03-01 General Electric Company Moisture-proof electrical circuit high density interconnect module and method for making same
US5355241A (en) 1991-12-09 1994-10-11 Kelley Clifford W Identification friend or foe discriminator
AT401829B (de) 1992-02-25 1996-12-27 Oesterr Nationalbank Verfahren zur zustands-, qualitäts- bzw. passerkontrolle von optischen sicherheitsmerkmalenauf wertpapieren, insbesondere banknoten, und vorrichtung zur durchführung des verfahrens
JPH05240640A (ja) 1992-02-26 1993-09-17 Omron Corp 光学式距離測定装置
JP3084468B2 (ja) * 1993-03-31 2000-09-04 セイコーインスツルメンツ株式会社 走査型プローブ顕微鏡
JPH07142761A (ja) 1993-11-18 1995-06-02 Mitsubishi Electric Corp 受光素子ならびに受光素子アレイおよび画像検出装置ならびに画像検出方法
US5589928A (en) 1994-09-01 1996-12-31 The Boeing Company Method and apparatus for measuring distance to a target
JPH08159714A (ja) 1994-11-30 1996-06-21 Omron Corp 位置検出センサ
JPH08292586A (ja) 1995-04-21 1996-11-05 Hodogaya Chem Co Ltd 電子写真用感光体
US6363164B1 (en) 1996-05-13 2002-03-26 Cummins-Allison Corp. Automated document processing system using full image scanning
TW341654B (en) * 1995-05-26 1998-10-01 Burger Joachim Tread depth measuring device
CA2196563A1 (en) 1995-06-07 1996-12-19 Shree K. Nayar Apparatus and methods for determining the three-dimensional shape of an object using active illumination and relative blurring in two images due to defocus
DE19526526A1 (de) 1995-07-20 1997-01-23 Bayerische Motoren Werke Ag Vorrichtung zum optischen Abtasten von Meßflächen
WO1997011386A1 (en) 1995-09-21 1997-03-27 Omniplanar, Inc. Method and apparatus for determining position and orientation
JP3364382B2 (ja) 1996-07-12 2003-01-08 株式会社東芝 試料面位置測定装置及び測定方法
JPH10221064A (ja) 1997-02-07 1998-08-21 Nippon Soken Inc 光学式測距装置
DE69832574T2 (de) 1997-07-29 2006-06-14 Nhk Spring Co Ltd Optisches Identifizierungssystem mit cholesterischen Flüssigkristallen
AU8783998A (en) 1997-08-15 1999-03-08 Uniax Corporation Organic diodes with switchable photosensitivity
JPH11230860A (ja) 1998-02-12 1999-08-27 Fujitsu Ltd 光学的薄膜計測方法及び装置並びにこの装置に用いられる光学的薄膜計測妨害光除去装置
JPH11257917A (ja) 1998-03-12 1999-09-24 Omron Corp 反射型光式センサ
US6191881B1 (en) 1998-06-22 2001-02-20 Citizen Watch Co., Ltd. Variable focal length lens panel and fabricating the same
US6266142B1 (en) 1998-09-21 2001-07-24 The Texas A&M University System Noncontact position and orientation measurement system and method
JP3219387B2 (ja) 1999-01-08 2001-10-15 ミノルタ株式会社 撮像装置および該撮像装置を用いた測距装置
US6359211B1 (en) 1999-06-17 2002-03-19 Chemmotif, Inc. Spectral sensitization of nanocrystalline solar cells
US6417836B1 (en) 1999-08-02 2002-07-09 Lucent Technologies Inc. Computer input device having six degrees of freedom for controlling movement of a three-dimensional object
WO2001029576A1 (en) 1999-10-21 2001-04-26 Psc Scanning, Inc. Rangefinder using collected spot spread and insert shadowing
US6785028B1 (en) 1999-11-24 2004-08-31 Ricoh Company, Ltd. Optical scanning device having a temperature compensation unit
DE10002196A1 (de) * 2000-01-19 2001-07-26 Heidelberger Instr Mikrotechni Methode zur Positionsregelung von Drehspiegeln mittels einer optischen Spiegelpositionsbestimmung
PT1849621E (pt) 2000-01-21 2014-06-03 Jds Uniphase Corp Dispositivos de segurança oticamente variáveis
JP4547760B2 (ja) 2000-02-28 2010-09-22 株式会社島津製作所 放射線検出器および放射線撮像装置
US6590224B2 (en) 2000-03-22 2003-07-08 Fuji Photo Film Co., Ltd. Image storage medium and method of manufacturing the same
JP3554929B2 (ja) 2000-05-09 2004-08-18 韓国科学技術院 多方向反射体を用いたハードディスクドライブスライダーの６自由度運動の測定のためのスイングアーム光学系
EP1176646A1 (en) 2000-07-28 2002-01-30 Ecole Polytechnique Féderale de Lausanne (EPFL) Solid state heterojunction and solid state sensitized photovoltaic cell
US7057337B1 (en) 2000-09-06 2006-06-06 Osram Opto Semiconductors Gmbh Patterning of electrodes in OLED devices
US6699728B2 (en) 2000-09-06 2004-03-02 Osram Opto Semiconductors Gmbh Patterning of electrodes in oled devices
DE10146752B4 (de) 2000-09-25 2006-03-23 Leuze Electronic Gmbh & Co Kg Optoelektronische Vorrichtung
JP2002100469A (ja) 2000-09-25 2002-04-05 Pioneer Electronic Corp 有機エレクトロルミネッセンス表示パネル
JP4278080B2 (ja) 2000-09-27 2009-06-10 富士フイルム株式会社 高感度受光素子及びイメージセンサー
AU2002310976B2 (en) 2001-03-23 2007-11-01 Basf Aktiengesellschaft Tert. alkylphenoxy substituted polycyclic compounds
BR0210996A (pt) 2001-06-11 2004-06-08 Univ Princeton Dispositivos fotovoltaicos orgânicos
DE10130763A1 (de) 2001-06-26 2003-01-02 Bosch Gmbh Robert Vorrichtung zur optischen Distanzmessung über einen grossen Messbereich
DE10134132A1 (de) 2001-07-13 2003-01-30 Siemens Ag Vorrichtung und Verfahren zum kontinuierlichen Drucken von organischen Leuchtdioden
US6656611B2 (en) 2001-07-20 2003-12-02 Osram Opto Semiconductors Gmbh Structure-defining material for OLEDs
CA2454690A1 (en) 2001-08-01 2003-02-13 National Research Council Of Canada System and method of light spot position and color detection
NO316632B1 (no) 2001-11-16 2004-03-15 Thin Film Electronics Asa Matriseadresserbart optoelektronisk apparat og elektrodeanordning i samme
JP2003209665A (ja) 2002-01-16 2003-07-25 Fuji Photo Film Co Ltd 画像読取方法および画像記録読取装置
US20030147002A1 (en) 2002-02-06 2003-08-07 Eastman Kodak Company Method and apparatus for a color sequential scannerless range imaging system
JP2003333757A (ja) 2002-05-14 2003-11-21 Sony Corp 電源装置
CH695914A5 (de) 2002-05-17 2006-10-13 Hera Rotterdam Bv Vorrichtung und Verfahren zur optischen Erfassung von Gegenständen.
CN1653531A (zh) 2002-05-17 2005-08-10 西巴特殊化学品控股有限公司 由五环呫吨鎓染料组成的光学存储介质
US20050122308A1 (en) 2002-05-28 2005-06-09 Matthew Bell Self-contained interactive video display system
EP1376205A1 (fr) 2002-06-21 2004-01-02 Asulab S.A. Moyens de connexion destinés à établir une liaison électrique entre une cellule, notamment à cristaux liquides, et un circuit d'alimentation ou de commande
US20040031519A1 (en) 2002-08-13 2004-02-19 Agfa-Gevaert Nano-porous metal oxide semiconductor spectrally sensitized with metal oxide chalcogenide nano-particles
DE10238994A1 (de) 2002-08-20 2004-02-26 Basf Ag Rylenfarbstoffe
US9177387B2 (en) 2003-02-11 2015-11-03 Sony Computer Entertainment Inc. Method and apparatus for real time motion capture
CN1777859B (zh) 2003-03-12 2010-04-28 平蛙实验室股份公司 确定射线发射单元位置的系统和方法
US6995445B2 (en) 2003-03-14 2006-02-07 The Trustees Of Princeton University Thin film organic position sensitive detectors
EP1464990B8 (de) 2003-03-31 2019-11-13 RUAG Schweiz AG Modulierbarer reflektor
SG115546A1 (en) 2003-06-23 2005-10-28 Affineon Technologies Pte Ltd Computer input device tracking six degrees of freedom
US7132788B2 (en) 2003-09-09 2006-11-07 Osram Opto Semiconductors Gmbh Optimal bank shapes for inkjet printing
JP2005091286A (ja) 2003-09-19 2005-04-07 Nec Corp レーザ測距装置
JP4262566B2 (ja) 2003-10-16 2009-05-13 株式会社日立製作所 車載用撮像装置及びカメラ
JP4578797B2 (ja) 2003-11-10 2010-11-10 パナソニック株式会社 撮像装置
DE10358967B4 (de) 2003-12-15 2006-11-16 Universität Kassel Mikrospiegelarray
JP2005241340A (ja) 2004-02-25 2005-09-08 Sharp Corp マルチ測距装置
DE602005014755D1 (de) * 2004-03-12 2009-07-16 Ingenia Technology Ltd Verfahren und vorrichtungen zur erzeugung authentifizierbarer gegenstände und ihrer nachfolgenden überprüfung
JP2007530978A (ja) 2004-03-29 2007-11-01 エヴォリューション ロボティクス インコーポレイテッド 反射光源を使用する位置推定方法および装置
US7419846B2 (en) 2004-04-13 2008-09-02 The Trustees Of Princeton University Method of fabricating an optoelectronic device having a bulk heterojunction
WO2005106965A1 (en) 2004-05-04 2005-11-10 The University Of Newcastle Research Associates Limited Multicomponent organic solar cells
US7773070B2 (en) 2004-05-21 2010-08-10 Cypress Semiconductor Corporation Optical positioning device using telecentric imaging
US7540978B2 (en) 2004-08-05 2009-06-02 Novaled Ag Use of an organic matrix material for producing an organic semiconductor material, organic semiconductor material and electronic component
CN101006477A (zh) 2004-08-23 2007-07-25 皇家飞利浦电子股份有限公司 对光学鉴别器的位置和方向探测
US7180065B2 (en) 2004-09-30 2007-02-20 Battelle Memorial Institute Infra-red detector and method of making and using same
US7626569B2 (en) 2004-10-25 2009-12-01 Graphics Properties Holdings, Inc. Movable audio/video communication interface system
EP1667246A1 (en) 2004-12-03 2006-06-07 ETeCH AG A multi-colour sensitive device for colour image sensing
US7301608B1 (en) 2005-01-11 2007-11-27 Itt Manufacturing Enterprises, Inc. Photon-counting, non-imaging, direct-detect LADAR
US8228299B1 (en) 2005-01-27 2012-07-24 Singleton Technology, Llc Transaction automation and archival system using electronic contract and disclosure units
EP1703300A1 (de) 2005-03-17 2006-09-20 Leica Geosystems AG Verfahren und System zur Bestimmung von Position und Orientierung eines Objekts
US7196317B1 (en) 2005-03-25 2007-03-27 Virginia Tech Intellectual Properties, Inc. System, device, and method for detecting perturbations
GB0512743D0 (en) 2005-06-17 2005-10-26 Mbda Uk Ltd Range detection
US7933001B2 (en) 2005-07-11 2011-04-26 Kabushiki Kaisha Topcon Geographic data collecting system
JP4977339B2 (ja) 2005-07-11 2012-07-18 株式会社トプコン 地理データ収集装置
DE102005032583A1 (de) 2005-07-11 2007-01-25 Basf Ag Substituierte Rylenderivate
US7911444B2 (en) 2005-08-31 2011-03-22 Microsoft Corporation Input method for surface of interactive display
DE102005043627B4 (de) 2005-09-13 2012-06-14 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Optischer Sensor und Verfahren zur optischen Abstands- und/oder Farbmessung
US20070080925A1 (en) 2005-10-11 2007-04-12 Nokia Corporation Power generating display device
DE102005053995A1 (de) 2005-11-10 2007-05-24 Basf Ag Verwendung von Rylenderivaten als Photosensibilisatoren in Solarzellen
JP2009516313A (ja) 2005-11-11 2009-04-16 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 走査装置において情報キャリアを位置合わせするシステム及び方法
US7489408B2 (en) 2005-11-15 2009-02-10 General Electric Company Optical edge break gage
GB2432723B (en) 2005-11-25 2010-12-08 Seiko Epson Corp Electrochemical cell and method of manufacture
WO2007095061A2 (en) 2006-02-09 2007-08-23 Qd Vision, Inc. Device including semiconductor nanocrystals and a layer including a doped organic material and methods
US7672527B2 (en) 2006-03-06 2010-03-02 Northrop Grumman Corporation Method and apparatus for chromatic correction of Fresnel lenses
US7839547B2 (en) 2006-03-08 2010-11-23 Kabushiki Kaisha Toshiba Optical fiber illumination device and inspection apparatus
DE102006013292A1 (de) 2006-03-23 2007-09-27 Robert Bosch Gmbh Vorrichtung zur optischen Distanzmessung
DE102006013290A1 (de) 2006-03-23 2007-09-27 Robert Bosch Gmbh Vorrichtung zur optischen Distanzmessung sowie Verfahren zum Betrieb einer solchen Vorrichtung
EP1860462A1 (de) 2006-05-23 2007-11-28 Leica Geosystems AG Distanzmessverfahren und Distanzmesser zur Erfassung der räumlichen Abmessung eines Zieles
US8144271B2 (en) 2006-08-03 2012-03-27 Perceptive Pixel Inc. Multi-touch sensing through frustrated total internal reflection
KR100917582B1 (ko) 2006-08-10 2009-09-15 주식회사 엘지화학 비접촉식 좌표입력 시스템용 도광판을 이용한 비접촉식좌표입력 방법
US8781151B2 (en) 2006-09-28 2014-07-15 Sony Computer Entertainment Inc. Object detection using video input combined with tilt angle information
CN101154291B (zh) 2006-09-29 2010-05-12 国际商业机器公司 图像数据压缩方法、图像显示方法及其相应装置
US20080170750A1 (en) 2006-11-01 2008-07-17 Demian Gordon Segment tracking in motion picture
US7511615B2 (en) 2007-01-01 2009-03-31 Intelguard Ltd. Self-operated perimeter intrusion detection system
US20080297487A1 (en) 2007-01-03 2008-12-04 Apple Inc. Display integrated photodiode matrix
DE102007003024A1 (de) 2007-01-20 2008-07-31 Sick Ag Triangulationssensor mit Entfernungsbestimmung aus Lichtfleckposition und -form
JP2010523751A (ja) 2007-04-05 2010-07-15 ビーエーエスエフ ソシエタス・ヨーロピア シリコンおよびゲルマニウムフタロシアニンならびに関連物質の製造
CN101063751A (zh) * 2007-04-06 2007-10-31 中国科学院上海光学精密机械研究所 激光光斑实时监测与光路自动准直的方法和装置
JP2008267898A (ja) 2007-04-18 2008-11-06 Sharp Corp 光位置検出装置および電子機器
WO2008145172A1 (en) 2007-05-25 2008-12-04 Universidad Autónoma de Madrid Tri-tert-butylcarboxyphthalocyanines, uses thereof and a process for their preparation
US7939932B2 (en) 2007-06-20 2011-05-10 Analog Devices, Inc. Packaged chip devices with atomic layer deposition protective films
US8563855B2 (en) 2007-07-23 2013-10-22 Basf Se Tandem photovoltaic cell
DE102007037875A1 (de) 2007-08-10 2009-02-12 Osram Gesellschaft mit beschränkter Haftung Strahlungsemittierende Vorrichtung
JP2009097872A (ja) 2007-10-12 2009-05-07 Sharp Corp 光学式測距センサ、物体検出装置、洗浄便座、および光学式測距センサの製造方法
KR101568436B1 (ko) 2007-10-25 2015-11-11 바스프 에스이 유기 반도체로서 케토피롤
EP2220141A1 (en) 2007-10-29 2010-08-25 Rieke Metals, Inc. Process for preparation of conducting polymers
CN101210805B (zh) * 2007-12-20 2010-06-16 哈尔滨工业大学 基于焦平面成像法的发射模块间同轴度测量方法
JP2009182095A (ja) 2008-01-30 2009-08-13 Fujifilm Corp 光電変換素子及び固体撮像素子
AT506617B1 (de) 2008-02-27 2011-03-15 Isiqiri Interface Tech Gmbh Anzeigefläche und damit kombinierte steuervorrichtung
US20090225319A1 (en) 2008-03-04 2009-09-10 California Institute Of Technology Methods of using optofluidic microscope devices
CN101308091B (zh) * 2008-06-17 2010-09-08 苏州大学 测量光学非线性的4f相位相干成像方法
US20110284756A1 (en) 2008-07-21 2011-11-24 United States of America as repersented by the Administrator of the National Aeronautics and Spac Detector for dual band ultraviolet detection
JP5178393B2 (ja) 2008-08-20 2013-04-10 シャープ株式会社 光学式測距センサおよび電子機器
US8107056B1 (en) 2008-09-17 2012-01-31 University Of Central Florida Research Foundation, Inc. Hybrid optical distance sensor
JP2010081002A (ja) 2008-09-24 2010-04-08 Sanyo Electric Co Ltd 撮像装置
KR101484111B1 (ko) 2008-09-25 2015-01-19 삼성전자주식회사 입체 이미지 센서
US8217261B2 (en) 2008-09-30 2012-07-10 Stion Corporation Thin film sodium species barrier method and structure for cigs based thin film photovoltaic cell
JP5469843B2 (ja) 2008-10-09 2014-04-16 株式会社トプコン レーザ測量装置及び距離測定方法
US9746544B2 (en) 2008-12-03 2017-08-29 Analog Devices, Inc. Position measurement systems using position sensitive detectors
DE102008061218B3 (de) 2008-12-09 2010-06-24 Sick Ag Optoelektronische Sensoreinrichtung
JP4818351B2 (ja) 2008-12-25 2011-11-16 株式会社東芝 画像処理装置及び画像表示装置
US8267781B2 (en) 2009-01-30 2012-09-18 Microsoft Corporation Visual target tracking
JP4846811B2 (ja) 2009-02-03 2011-12-28 シャープ株式会社 光スポット位置検出装置およびそれを含む光デバイス、並びに、その光デバイスを含む電子機器
EP2399305A1 (de) 2009-02-23 2011-12-28 Basf Se Verwendung von triarylamin-derivaten als lochleitende materialien in organischen solarzellen und diese triarylamin-derivate enthaltende organische solarzellen
KR101563914B1 (ko) 2009-03-04 2015-10-28 제록스 코포레이션 구조화 유기 필름
JP5406570B2 (ja) 2009-03-13 2014-02-05 アイシン精機株式会社 色素増感型太陽電池及びその製造方法
US9006994B2 (en) 2009-03-31 2015-04-14 Osram Sylvania Inc. Dual voltage and current control feedback loop for an optical sensor system
CA2758298A1 (en) 2009-04-10 2010-10-14 Ls9, Inc. Production of commercial biodiesel from genetically modified microorganisms
AT508438B1 (de) 2009-04-16 2013-10-15 Isiqiri Interface Tech Gmbh Anzeigefläche und eine damit kombinierte steuervorrichtung für eine datenverarbeitungsanlage
US9071834B2 (en) 2009-04-25 2015-06-30 James Yett Array of individually angled mirrors reflecting disparate color sources toward one or more viewing positions to construct images and visual effects
US20100279458A1 (en) 2009-04-29 2010-11-04 Du Pont Apollo Ltd. Process for making partially transparent photovoltaic modules
CA2762038C (en) 2009-06-01 2017-04-25 Gerd Haeusler Method and device for three-dimensional surface detection with a dynamic reference frame
JP2011027707A (ja) 2009-06-25 2011-02-10 Sharp Corp 人物動作検出装置、遊具装置、人物動作検出方法、ゲーム方法、制御プログラムおよび可読記録媒体
US20120146028A1 (en) 2009-08-20 2012-06-14 Sharp Kabushiki Kaisha Photosensor, semiconductor device, and liquid crystal panel
US9141193B2 (en) 2009-08-31 2015-09-22 Microsoft Technology Licensing, Llc Techniques for using human gestures to control gesture unaware programs
DE102009029372A1 (de) 2009-09-11 2011-03-24 Robert Bosch Gmbh Messvorrichtung zur Messung einer Entfernung zwischen der Messvorrichtung und einem Zielobjekt mit Hilfe optischer Messstrahlung
CN101650173A (zh) 2009-09-11 2010-02-17 武汉理工大学 太阳位置光电传感器
JP2011096329A (ja) 2009-10-30 2011-05-12 Sanyo Electric Co Ltd 光ピックアップ装置
US8287195B2 (en) 2009-11-10 2012-10-16 Dezeeuw Paul Motor controlled macro rail for close-up focus-stacking photography
JP5549204B2 (ja) 2009-12-01 2014-07-16 セイコーエプソン株式会社 光学式位置検出装置、ハンド装置およびタッチパネル
US8389670B2 (en) 2009-12-02 2013-03-05 Basf Se Dithienobenzo-thieno[3,2-B]thiophene-copolymer and its use as high performance solution processable semiconducting polymer
US8491135B2 (en) 2010-01-04 2013-07-23 Microvision, Inc. Interactive projection with gesture recognition
JP5685898B2 (ja) 2010-01-08 2015-03-18 ソニー株式会社 半導体装置、固体撮像装置、およびカメラシステム
CN101769718A (zh) * 2010-01-28 2010-07-07 哈尔滨工业大学 一种激光焦点与微孔同轴共面性检测调整装置及检测方法
DE102010006314A1 (de) 2010-01-29 2011-08-04 EWE-Forschungszentrum für Energietechnologie e. V., 26129 Photovoltaische Mehrfach-Dünnschichtsolarzelle
JP5079826B2 (ja) 2010-02-09 2012-11-21 シャープ株式会社 光学式測距センサおよび電子機器
KR101251020B1 (ko) 2010-03-09 2013-04-03 국립대학법인 울산과학기술대학교 산학협력단 그라펜의 제조 방법, 이를 포함하는 투명 전극, 활성층, 이를 구비한 표시소자, 전자소자, 광전소자, 태양전지 및 염료감응 태양전지
JP5343896B2 (ja) 2010-03-10 2013-11-13 セイコーエプソン株式会社 光学式位置検出装置
US20100283868A1 (en) 2010-03-27 2010-11-11 Lloyd Douglas Clark Apparatus and Method for Application of Selective Digital Photomontage to Motion Pictures
KR101185076B1 (ko) * 2010-05-06 2012-09-21 주식회사 지노이드 반사체용 반사형 광센서
CN101859439A (zh) 2010-05-12 2010-10-13 合肥寰景信息技术有限公司 一种用于人机交互的运动追踪装置及其追踪方法
KR101665567B1 (ko) 2010-05-20 2016-10-12 삼성전자주식회사 3차원 뎁스 영상 시간 보간 방법 및 장치
GB2481366B (en) 2010-06-03 2014-05-28 Sony Comp Entertainment Europe Entertainment device and entertainment methods
WO2012001628A1 (en) 2010-06-29 2012-01-05 Basf Se Photoelectric conversion device comprising hydroxamic acid derivative or salt thereof as additive and process for producing same
TWI431252B (zh) 2010-07-14 2014-03-21 Pixart Imaging Inc 測距裝置及測距方法
DE112010005757T5 (de) 2010-07-23 2013-07-04 Toyota Jidosha Kabushiki Kaisha Abstandsmessvorrichtung und Abstandsmessverfahren
US8743348B2 (en) 2010-09-03 2014-06-03 Pixart Imaging Inc. Optical distance detection system
US8536545B2 (en) 2010-09-09 2013-09-17 California Institute Of Technology Delayed emission detection devices and methods
JP5541023B2 (ja) 2010-09-13 2014-07-09 ソニー株式会社 対物レンズ、光学ピックアップ、光学ドライブ装置
TW201211860A (en) 2010-09-13 2012-03-16 Pixart Imaging Inc Optical touch control apparatus and touch sensing method thereof
IL208568B (en) 2010-10-07 2018-06-28 Elbit Systems Ltd Mapping, discovering and tracking objects in an external arena by using active vision
DE102010042278A1 (de) 2010-10-11 2012-04-12 Siemens Aktiengesellschaft Operationsnavigationssystem mit strukturiertem Licht
CN201897828U (zh) 2010-11-30 2011-07-13 深圳市中钞信达金融科技有限公司 一种票币光谱检测和安全线检测的集成装置
EP2655366B1 (de) 2010-12-22 2015-08-19 Basf Se Napthalinmonoimidderivate und deren verwendung als photosensibilisatoren in solarzellen und photodetektoren
CN102096962A (zh) 2010-12-23 2011-06-15 北京新岸线软件科技有限公司 一种纸币检测方法及装置
JP5550624B2 (ja) 2010-12-24 2014-07-16 三菱電機株式会社 光電変換装置とその製造方法、および光電変換モジュール
US8705805B2 (en) 2011-01-10 2014-04-22 Peter Alexander Forrest Secure portable token and systems and methods for identification and authentication of the same
US9001029B2 (en) 2011-02-15 2015-04-07 Basf Se Detector for optically detecting at least one object
WO2012115593A1 (en) 2011-02-21 2012-08-30 National University Of Singapore Apparatus, system, and method for annotation of media files with sensor data
JP5490309B2 (ja) 2011-03-07 2014-05-14 パナソニック株式会社 撮像装置および測距装置
US8593565B2 (en) 2011-03-25 2013-11-26 Gary S. Shuster Simulated large aperture lens
US8384984B2 (en) 2011-03-28 2013-02-26 Lighting Science Group Corporation MEMS wavelength converting lighting device and associated methods
CN102737435A (zh) 2011-04-11 2012-10-17 北京新岸线数字图像技术有限公司 一种纸币鉴伪方法和装置
US8791901B2 (en) 2011-04-12 2014-07-29 Sony Computer Entertainment, Inc. Object tracking with projected reference patterns
JP5445509B2 (ja) 2011-04-26 2014-03-19 パナソニック株式会社 画像形成装置および画像形成方法ならびに部品実装装置
WO2012152812A1 (en) 2011-05-10 2012-11-15 Basf Se Novel color converters
DE102011076493A1 (de) 2011-05-26 2012-11-29 Hilti Aktiengesellschaft Messeinrichtung zur Distanzmessung
WO2012168395A1 (en) 2011-06-10 2012-12-13 Basf Se Novel color converter
EP2535681B1 (en) 2011-06-17 2016-01-06 Thomson Licensing Device for estimating the depth of elements of a 3D scene
EP2725617A4 (en) 2011-06-24 2015-02-25 Boly Media Comm Shenzhen Co HYBRID MULTISPECTIVE LIGHT-SENSITIVE PIXEL GROUP, LIGHT-SENSITIVE DEVICE AND LIGHT-SENSITIVE SYSTEM
DE112012002943T5 (de) 2011-07-13 2014-04-30 Faro Technologies Inc. Vorrichtung und Verfahren unter Verwendung eines räumlichen Lichtmodulators zum Ermitteln von 3D-Koordinaten eines Objekts
EP2735542A4 (en) 2011-07-22 2015-04-08 Unist Academy Ind Res Corp GRAPHIC FILM, TRANSPARENT ELECTRODE THEREOF, ACTIVE LAYER, DISPLAY DEVICE, ELECTRONIC DEVICE, OPTOELECTRONIC DEVICE, BATTERY, SOLAR CELL AND COLOR-SENSITIZED SOLAR CELL THEREWITH
JP5791571B2 (ja) 2011-08-02 2015-10-07 キヤノン株式会社 撮像素子及び撮像装置
JP6296980B2 (ja) 2011-09-02 2018-03-20 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ ジケトピロロピロールオリゴマー、及びジケトピロロピロールオリゴマーを含む組成物
CN102435136A (zh) 2011-09-20 2012-05-02 浙江师范大学 空间相移装置及应用该装置的干涉测量装置、相位校正装置
FR2980599B1 (fr) 2011-09-27 2014-05-09 Isorg Surface imprimee interactive
CN102506754B (zh) 2011-11-09 2013-11-06 西安工业大学 物体表面形貌与颜色同时测量的共聚焦测量装置及其使用方法
JP5681954B2 (ja) 2011-11-30 2015-03-11 パナソニックＩｐマネジメント株式会社 撮像装置及び撮像システム
AT512350B1 (de) 2011-12-20 2017-06-15 Isiqiri Interface Tech Gmbh Computeranlage und steuerungsverfahren dafür
AU2011265572A1 (en) 2011-12-23 2013-07-11 Canon Kabushiki Kaisha Structured light system for robust geometry acquisition
WO2013118037A1 (en) 2012-02-10 2013-08-15 Koninklijke Philips N.V. A lighting assembly, a color conversion element, a lamp and a luminaire
AT512461B1 (de) 2012-02-10 2018-02-15 Isiqiri Interface Tech Gmbh Vorrichtung für die eingabe von informationen an eine datenverarbeitungsanlage
US8804101B2 (en) 2012-03-16 2014-08-12 Advanced Scientific Concepts, Inc. Personal LADAR sensor
DE102012204572A1 (de) 2012-03-22 2013-09-26 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung und Anordnung mit einer derartigen Positionsmesseinrichtung
CN104254576A (zh) 2012-03-30 2014-12-31 巴斯夫欧洲公司 用于染料敏化太阳能电池的具有氟化抗衡阴离子的喹啉*染料
US9505877B2 (en) 2012-04-02 2016-11-29 Basf Se Phenanthro[9,10-B]furan polymers and small molecules for electronic applications
WO2013156101A1 (en) 2012-04-18 2013-10-24 Sony Corporation Method and optical system for determining a depth map of an image
CN102645167A (zh) * 2012-05-04 2012-08-22 中国科学院长春光学精密机械与物理研究所 绝对位移测量装置
DE102012208308A1 (de) 2012-05-18 2013-11-21 Robert Bosch Gmbh Optisches Entfernungsmessgerät mit Kalibriereinrichtung zum Berücksichtigen von Übersprechen
WO2013181215A1 (en) 2012-05-30 2013-12-05 Massachusetts Institute Of Technology Devices comprising graphene and a conductive polymer and related systems and methods
JP6207606B2 (ja) 2012-07-23 2017-10-04 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ ジチエノベンゾフランポリマーおよび電子的な応用のための小分子
US20140066656A1 (en) 2012-09-04 2014-03-06 Basf Se Spiro compounds and their use in organic electronics applications and devices
DE202012009070U1 (de) 2012-09-21 2012-11-12 Balluff Gmbh Optoelektronischer Sensor und Empfangselement
KR20140058208A (ko) 2012-11-06 2014-05-14 삼성전자주식회사 이미지 센서
US9212948B2 (en) 2012-11-07 2015-12-15 The Trustees Of Columbia University In The City Of New York Lossless hyperspectral imaging
KR101984701B1 (ko) 2012-11-13 2019-05-31 삼성전자주식회사 전기습윤 렌즈 어레이를 포함하는 3차원 영상 디스플레이 장치 및 3차원 영상 획득 장치
EP2928940B1 (en) 2012-12-04 2021-03-03 CLAP Co., Ltd. Functionalized benzodithiophene polymers for electronic application
TWI456430B (zh) 2012-12-07 2014-10-11 Pixart Imaging Inc 手勢判斷裝置、其操作方法與手勢判斷方法
CN103106411A (zh) 2012-12-13 2013-05-15 徐玉文 一种网球动作捕捉和解析方法
WO2014097489A1 (ja) 2012-12-21 2014-06-26 グローリー株式会社 スペクトルセンサ
JP2016513077A (ja) 2013-01-15 2016-05-12 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ トリアンギュレンオリゴマー及びポリマー並びにそれらを正孔伝導性材料として用いる使用
US20150372046A1 (en) 2013-01-25 2015-12-24 University Of Florida Research Foundation, Inc. A NOVEL IR IMAGE SENSOR USING A SOLUTION-PROCESSED PbS PHOTODETECTOR
WO2014123522A1 (en) 2013-02-06 2014-08-14 Empire Technology Development Llc Thermo-optic tunable spectrometer
JP6371829B2 (ja) * 2013-03-14 2018-08-08 バクスター・インターナショナル・インコーポレイテッドＢａｘｔｅｒ Ｉｎｔｅｒｎａｔｉｏｎａｌ Ｉｎｃｏｒｐ０Ｒａｔｅｄ 画像マルチチャネル光検出による光学画像装置
US20140347442A1 (en) 2013-05-23 2014-11-27 Yibing M. WANG Rgbz pixel arrays, imaging devices, controllers & methods
WO2014147525A2 (en) 2013-03-18 2014-09-25 Basf Se Perylenemonoimide and naphthalenemonoimide derivatives and their use in dye-sensitized solar cells
EP3008421A1 (en) 2013-06-13 2016-04-20 Basf Se Detector for optically detecting an orientation of at least one object
DE102014108353A1 (de) 2013-06-13 2014-12-18 Werth Messtechnik Gmbh Verfahren und Vorrichtung zur Bestimmung von Geometrien an Messobjekten mittels eines kombinierten Sensorsystems
US9143674B2 (en) 2013-06-13 2015-09-22 Mitutoyo Corporation Machine vision inspection system and method for performing high-speed focus height measurement operations
JP6400087B2 (ja) 2013-06-13 2018-10-03 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ 光学検出器及び当該光学検出器の製造方法
EP2813324B1 (en) 2013-06-13 2016-04-06 Stanley Works (Europe) GmbH Hand tool having an electronic identification device
EP2818493A1 (en) 2013-06-25 2014-12-31 Basf Se Near infrared absorbing polymers for electronic applications
US20160155575A1 (en) 2013-07-25 2016-06-02 Basf Se Methine dyes with large organic counter anion for dye sensitized solar cells
JP6494205B2 (ja) * 2013-07-31 2019-04-03 キヤノン株式会社 波面計測方法、形状計測方法、光学素子の製造方法、光学機器の製造方法、プログラム、波面計測装置
BR112016002446A2 (pt) 2013-08-05 2017-08-01 Basf Se composto de naftalenobenzimidazol cianado, mistura de compostos de naftalenobenzimidazol cianado, conversor de cor, uso de um conversor de cor, dispositivo de luminosidade, e, dispositivo para produção de energia elétrica mediante iluminação
EP3036503B1 (en) 2013-08-19 2019-08-07 Basf Se Optical detector
WO2015024851A1 (en) 2013-08-23 2015-02-26 Basf Se New absorber for organic heterojunction solar cells
KR102251681B1 (ko) 2013-08-23 2021-05-14 바스프 에스이 말단 헤테로아릴시아노비닐렌 기를 갖는 화합물 및 이의 유기 태양 전지에서의 용도
CN112876504A (zh) 2013-09-03 2021-06-01 巴斯夫欧洲公司 无定形材料及其用途
AT515132A1 (de) 2013-12-04 2015-06-15 Isiqiri Interface Tech Gmbh Optische Eingabefläche
JP6315964B2 (ja) 2013-12-10 2018-04-25 オプテックス株式会社 能動型物体検出センサ
EP3084353A1 (en) 2013-12-18 2016-10-26 Basf Se Target device for use in optical detection of an object
WO2015159192A1 (en) 2014-04-15 2015-10-22 Basf Se Process for the production of a solid dye-sensitized solar cell or a perovskite solar cell
AU2015248479A1 (en) 2014-04-17 2016-09-15 Basf Se Verification device, verification system and method for verifying the identity of an article
KR20160146718A (ko) 2014-04-22 2016-12-21 바스프 에스이 적어도 하나의 물체를 광학적으로 검출하기 위한 검출기
EP2937399A1 (en) 2014-04-22 2015-10-28 Basf Se Hole-transport materials for organic solar cells or organic optical sensors
US9919999B2 (en) 2014-05-09 2018-03-20 Basf Se Cyanated perylene compounds
US10054429B2 (en) 2014-05-18 2018-08-21 Adom, Advanced Optical Technologies Ltd. System for tomography and/or topography measurements of a layered objects
US9864470B2 (en) 2014-05-30 2018-01-09 Flatfrog Laboratories Ab Enhanced interaction touch system
US20170123593A1 (en) 2014-06-16 2017-05-04 Basf Se Detector for determining a position of at least one object
EP3195376A1 (en) 2014-09-18 2017-07-26 Basf Se Thermo-compression bonding of thermoelectric materials
WO2016051323A1 (en) 2014-09-29 2016-04-07 Basf Se Detector for optically determining a position of at least one object
CN105678123B (zh) 2014-11-18 2019-03-08 联发科技（新加坡）私人有限公司 一种设备解锁方法及装置
EP3224246B1 (en) 2014-11-26 2022-01-12 Basf Se 4-oxoquinoline compounds
US11125880B2 (en) 2014-12-09 2021-09-21 Basf Se Optical detector
KR20170092577A (ko) 2014-12-09 2017-08-11 바스프 에스이 광 검출기
WO2016092452A1 (en) 2014-12-09 2016-06-16 Basf Se Optical detector
JP6841769B2 (ja) 2015-01-30 2021-03-10 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１個の物体を光学的に検出する検出器
EP3265844A1 (en) 2015-03-05 2018-01-10 Basf Se Detector for an optical detection of at least one object
WO2016146725A1 (en) 2015-03-17 2016-09-22 Basf Se Optical data reader
CN107533126A (zh) 2015-04-22 2018-01-02 特里纳米克斯股份有限公司 用于至少一个对象的光学检测的检测器
EP3325917B1 (en) 2015-07-17 2020-02-26 trinamiX GmbH Detector for optically detecting at least one object
CN108140666A (zh) 2015-08-10 2018-06-08 特里纳米克斯股份有限公司 用于至少一个对象的光学检测的有机检测器
KR102539263B1 (ko) 2015-09-14 2023-06-05 트리나미엑스 게엠베하 적어도 하나의 물체의 적어도 하나의 이미지를 기록하는 카메라
KR20180086198A (ko) 2015-11-25 2018-07-30 트리나미엑스 게엠베하 적어도 하나의 물체를 광학적으로 검출하기 위한 검출기
US20180356501A1 (en) 2015-12-03 2018-12-13 Trinamix Gmbh Detector for optically detecting at least one object
US20190157470A1 (en) 2016-04-06 2019-05-23 Trinamix Gmbh Detector for optically detecting at least one object
WO2017174491A1 (en) 2016-04-06 2017-10-12 Trinamix Gmbh Detector for an optical detection of at least one object
KR20180136952A (ko) 2016-04-19 2018-12-26 트리나미엑스 게엠베하 적어도 하나의 물체를 광학적으로 검출하기 위한 검출기
KR20190002488A (ko) 2016-04-28 2019-01-08 트리나미엑스 게엠베하 적어도 하나의 물체를 광학적으로 검출하기 위한 검출기
JP2019523562A (ja) 2016-07-29 2019-08-22 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 光学的検出のための光センサおよび検出器
KR20190033543A (ko) 2016-07-29 2019-03-29 트리나미엑스 게엠베하 적어도 하나의 물체의 광학적 검출을 위한 검출기
CN109923372B (zh) 2016-10-25 2021-12-21 特里纳米克斯股份有限公司 采用集成滤波器的红外光学检测器
CN106839976B (zh) * 2016-12-22 2020-05-12 歌尔科技有限公司 一种检测镜头中心的方法及装置

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014510909A (ja) 2011-02-15 2014-05-01 ビーエーエスエフ ソシエタス・ヨーロピア 少なくとも１つの対象物を光学的に検出する検出器
JP2016510397A (ja) 2012-12-19 2016-04-07 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ １つ以上の物体を光学的に検出するための検出器
JP2016529473A (ja) 2013-06-13 2016-09-23 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ 少なくとも１つの物体を光学的に検出する検出器
JP2016536594A (ja) 2013-08-19 2016-11-24 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ 少なくとも１つの対象物の位置を求めるための検出器
WO2016005893A1 (en) 2014-07-08 2016-01-14 Basf Se Detector for determining a position of at least one object
WO2016092454A1 (en) 2014-12-09 2016-06-16 Basf Se Optical detector
WO2016092450A1 (en) 2014-12-09 2016-06-16 Basf Se Detector for an optical detection of at least one object

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