JP7154429B2 - 発光ダイオード及びその製作方法 - Google Patents
発光ダイオード及びその製作方法 Download PDFInfo
- Publication number
- JP7154429B2 JP7154429B2 JP2021546032A JP2021546032A JP7154429B2 JP 7154429 B2 JP7154429 B2 JP 7154429B2 JP 2021546032 A JP2021546032 A JP 2021546032A JP 2021546032 A JP2021546032 A JP 2021546032A JP 7154429 B2 JP7154429 B2 JP 7154429B2
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- Prior art keywords
- layer
- light emitting
- light
- emitting diode
- ohmic contact
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- 238000004519 manufacturing process Methods 0.000 title description 10
- 239000004065 semiconductor Substances 0.000 claims description 43
- 239000000758 substrate Substances 0.000 claims description 31
- 229910052751 metal Inorganic materials 0.000 claims description 27
- 239000002184 metal Substances 0.000 claims description 27
- 239000000463 material Substances 0.000 claims description 19
- 238000000034 method Methods 0.000 claims description 19
- 229910045601 alloy Inorganic materials 0.000 claims description 11
- 239000000956 alloy Substances 0.000 claims description 11
- 229910005540 GaP Inorganic materials 0.000 claims description 8
- 238000010030 laminating Methods 0.000 claims description 8
- 229910001218 Gallium arsenide Inorganic materials 0.000 claims description 7
- 229910002065 alloy metal Inorganic materials 0.000 claims description 7
- 229910044991 metal oxide Inorganic materials 0.000 claims description 7
- 150000004706 metal oxides Chemical group 0.000 claims description 7
- 150000004767 nitrides Chemical class 0.000 claims description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 4
- HZXMRANICFIONG-UHFFFAOYSA-N gallium phosphide Chemical compound [Ga]#P HZXMRANICFIONG-UHFFFAOYSA-N 0.000 claims description 4
- 229910002601 GaN Inorganic materials 0.000 claims description 3
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- ORUIBWPALBXDOA-UHFFFAOYSA-L magnesium fluoride Chemical group [F-].[F-].[Mg+2] ORUIBWPALBXDOA-UHFFFAOYSA-L 0.000 claims description 3
- 229910052709 silver Inorganic materials 0.000 claims description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical group [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 2
- 229910001635 magnesium fluoride Inorganic materials 0.000 claims description 2
- 235000012239 silicon dioxide Nutrition 0.000 claims description 2
- 239000000377 silicon dioxide Substances 0.000 claims description 2
- 230000000694 effects Effects 0.000 description 6
- 230000001965 increasing effect Effects 0.000 description 6
- 230000031700 light absorption Effects 0.000 description 5
- 239000004020 conductor Substances 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000000137 annealing Methods 0.000 description 2
- 239000003989 dielectric material Substances 0.000 description 2
- 238000002955 isolation Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 230000005641 tunneling Effects 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
- H01L33/40—Materials therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
- H01L33/40—Materials therefor
- H01L33/405—Reflective materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
- H01L33/0075—Processes for devices with an active region comprising only III-V compounds comprising nitride compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0093—Wafer bonding; Removal of the growth substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table
- H01L33/32—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table containing nitrogen
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
- H01L33/40—Materials therefor
- H01L33/42—Transparent materials
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/44—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the coatings, e.g. passivation layer or anti-reflective coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/44—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the coatings, e.g. passivation layer or anti-reflective coating
- H01L33/46—Reflective coating, e.g. dielectric Bragg reflector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
- H01L2933/0008—Processes
- H01L2933/0016—Processes relating to electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
- H01L2933/0008—Processes
- H01L2933/0025—Processes relating to coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/58—Optical field-shaping elements
- H01L33/60—Reflective elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/64—Heat extraction or cooling elements
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Led Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/CN2018/123265 WO2020132843A1 (zh) | 2018-12-24 | 2018-12-24 | 一种发光二极管及其制作方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2022508781A JP2022508781A (ja) | 2022-01-19 |
JP7154429B2 true JP7154429B2 (ja) | 2022-10-17 |
Family
ID=69192369
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021546032A Active JP7154429B2 (ja) | 2018-12-24 | 2018-12-24 | 発光ダイオード及びその製作方法 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20210226095A1 (zh) |
EP (1) | EP3905344A4 (zh) |
JP (1) | JP7154429B2 (zh) |
CN (2) | CN110710002B (zh) |
TW (1) | TWI695520B (zh) |
WO (1) | WO2020132843A1 (zh) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113889559B (zh) * | 2020-07-02 | 2024-08-13 | 山东浪潮华光光电子股份有限公司 | 一种高亮度近红外发光二极管及其制备方法 |
WO2022257061A1 (zh) * | 2021-06-10 | 2022-12-15 | 天津三安光电有限公司 | 发光二极管及制作方法 |
CN113299808B (zh) * | 2021-07-05 | 2022-05-17 | 扬州乾照光电有限公司 | 一种led芯片及其制备方法 |
CN113921674B (zh) * | 2021-09-30 | 2024-06-04 | 天津三安光电有限公司 | 发光二极管及发光装置 |
Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001156003A (ja) | 1999-11-29 | 2001-06-08 | Seiwa Electric Mfg Co Ltd | P型窒化ガリウム系半導体の製造方法及びp型窒化ガリウム系半導体を用いた発光素子 |
CN1449060A (zh) | 2002-04-04 | 2003-10-15 | 国联光电科技股份有限公司 | 发光二极管的结构及其制造方法 |
JP2008147672A (ja) | 2006-12-08 | 2008-06-26 | Samsung Electro-Mechanics Co Ltd | 垂直構造led素子及びその製造方法 |
JP2008263015A (ja) | 2007-04-11 | 2008-10-30 | Hitachi Cable Ltd | 半導体発光素子 |
JP2008283096A (ja) | 2007-05-14 | 2008-11-20 | Hitachi Cable Ltd | 半導体発光素子 |
JP2010114337A (ja) | 2008-11-10 | 2010-05-20 | Hitachi Cable Ltd | 発光素子 |
JP2010192709A (ja) | 2009-02-18 | 2010-09-02 | Hitachi Cable Ltd | 発光素子 |
JP2011165800A (ja) | 2010-02-08 | 2011-08-25 | Showa Denko Kk | 発光ダイオード及びその製造方法、並びに発光ダイオードランプ |
JP2014082321A (ja) | 2012-10-16 | 2014-05-08 | Showa Denko Kk | 発光ダイオード、発光ダイオードランプ及び照明装置 |
JP2018032820A (ja) | 2016-08-26 | 2018-03-01 | ローム株式会社 | 半導体発光素子 |
US20180076361A1 (en) | 2015-12-08 | 2018-03-15 | Xiamen Sanan Optoelectronics Technology Co., Ltd. | Fabrication Method of Vertical Light-Emitting Diode |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070267646A1 (en) * | 2004-06-03 | 2007-11-22 | Philips Lumileds Lighting Company, Llc | Light Emitting Device Including a Photonic Crystal and a Luminescent Ceramic |
CN100372137C (zh) * | 2005-05-27 | 2008-02-27 | 晶能光电(江西)有限公司 | 具有上下电极结构的铟镓铝氮发光器件及其制造方法 |
DE102007020291A1 (de) * | 2007-01-31 | 2008-08-07 | Osram Opto Semiconductors Gmbh | Optoelektronischer Halbleiterchip und Verfahren zur Herstellung einer Kontaktstruktur für einen derartigen Chip |
US8212273B2 (en) * | 2007-07-19 | 2012-07-03 | Photonstar Led Limited | Vertical LED with conductive vias |
JP4985260B2 (ja) * | 2007-09-18 | 2012-07-25 | 日立電線株式会社 | 発光装置 |
US8368100B2 (en) * | 2007-11-14 | 2013-02-05 | Cree, Inc. | Semiconductor light emitting diodes having reflective structures and methods of fabricating same |
US9589792B2 (en) * | 2012-11-26 | 2017-03-07 | Soraa, Inc. | High quality group-III metal nitride crystals, methods of making, and methods of use |
KR100999726B1 (ko) * | 2009-05-04 | 2010-12-08 | 엘지이노텍 주식회사 | 발광소자 및 그 제조방법 |
KR101125025B1 (ko) * | 2010-07-23 | 2012-03-27 | 엘지이노텍 주식회사 | 발광소자 및 그 제조방법 |
US8802461B2 (en) * | 2011-03-22 | 2014-08-12 | Micron Technology, Inc. | Vertical light emitting devices with nickel silicide bonding and methods of manufacturing |
JP5949294B2 (ja) * | 2011-08-31 | 2016-07-06 | 日亜化学工業株式会社 | 半導体発光素子 |
US20180130926A1 (en) * | 2015-02-17 | 2018-05-10 | Genesis Photonics Inc. | Light emitting diode |
CN104638078B (zh) * | 2015-03-05 | 2017-05-10 | 天津三安光电有限公司 | 发光二极管及其制作方法 |
US10950747B2 (en) * | 2015-07-01 | 2021-03-16 | Sensor Electronic Technology, Inc. | Heterostructure for an optoelectronic device |
KR101890691B1 (ko) * | 2016-03-09 | 2018-09-28 | 유태경 | 반도체 발광 소자 |
JP6608352B2 (ja) * | 2016-12-20 | 2019-11-20 | Dowaエレクトロニクス株式会社 | 半導体発光素子およびその製造方法 |
TWI620352B (zh) * | 2017-01-20 | 2018-04-01 | 大光能源科技有限公司 | 覆晶發光二極體及其製造方法 |
-
2018
- 2018-12-24 EP EP18944919.2A patent/EP3905344A4/en active Pending
- 2018-12-24 WO PCT/CN2018/123265 patent/WO2020132843A1/zh unknown
- 2018-12-24 CN CN201880035523.6A patent/CN110710002B/zh active Active
- 2018-12-24 JP JP2021546032A patent/JP7154429B2/ja active Active
- 2018-12-24 CN CN202310753897.4A patent/CN116825925A/zh active Pending
-
2019
- 2019-05-08 TW TW108115851A patent/TWI695520B/zh active
-
2021
- 2021-04-09 US US17/226,082 patent/US20210226095A1/en active Pending
Patent Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001156003A (ja) | 1999-11-29 | 2001-06-08 | Seiwa Electric Mfg Co Ltd | P型窒化ガリウム系半導体の製造方法及びp型窒化ガリウム系半導体を用いた発光素子 |
CN1449060A (zh) | 2002-04-04 | 2003-10-15 | 国联光电科技股份有限公司 | 发光二极管的结构及其制造方法 |
JP2008147672A (ja) | 2006-12-08 | 2008-06-26 | Samsung Electro-Mechanics Co Ltd | 垂直構造led素子及びその製造方法 |
JP2008263015A (ja) | 2007-04-11 | 2008-10-30 | Hitachi Cable Ltd | 半導体発光素子 |
JP2008283096A (ja) | 2007-05-14 | 2008-11-20 | Hitachi Cable Ltd | 半導体発光素子 |
JP2010114337A (ja) | 2008-11-10 | 2010-05-20 | Hitachi Cable Ltd | 発光素子 |
JP2010192709A (ja) | 2009-02-18 | 2010-09-02 | Hitachi Cable Ltd | 発光素子 |
JP2011165800A (ja) | 2010-02-08 | 2011-08-25 | Showa Denko Kk | 発光ダイオード及びその製造方法、並びに発光ダイオードランプ |
JP2014082321A (ja) | 2012-10-16 | 2014-05-08 | Showa Denko Kk | 発光ダイオード、発光ダイオードランプ及び照明装置 |
US20180076361A1 (en) | 2015-12-08 | 2018-03-15 | Xiamen Sanan Optoelectronics Technology Co., Ltd. | Fabrication Method of Vertical Light-Emitting Diode |
JP2018032820A (ja) | 2016-08-26 | 2018-03-01 | ローム株式会社 | 半導体発光素子 |
Also Published As
Publication number | Publication date |
---|---|
CN110710002A (zh) | 2020-01-17 |
TWI695520B (zh) | 2020-06-01 |
US20210226095A1 (en) | 2021-07-22 |
CN116825925A (zh) | 2023-09-29 |
WO2020132843A1 (zh) | 2020-07-02 |
EP3905344A1 (en) | 2021-11-03 |
TW202025514A (zh) | 2020-07-01 |
JP2022508781A (ja) | 2022-01-19 |
CN110710002B (zh) | 2023-06-30 |
EP3905344A4 (en) | 2022-08-03 |
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