JP7107589B2 - チップ電子部品検査用のローラ電極接触子を備えた装置 - Google Patents

チップ電子部品検査用のローラ電極接触子を備えた装置 Download PDF

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Publication number
JP7107589B2
JP7107589B2 JP2020144785A JP2020144785A JP7107589B2 JP 7107589 B2 JP7107589 B2 JP 7107589B2 JP 2020144785 A JP2020144785 A JP 2020144785A JP 2020144785 A JP2020144785 A JP 2020144785A JP 7107589 B2 JP7107589 B2 JP 7107589B2
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Japan
Prior art keywords
chip electronic
electronic component
roller electrode
roller
electrode
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JP2020144785A
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English (en)
Japanese (ja)
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JP2022039650A (ja
Inventor
規与仁 森
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Humo Laboratory Ltd
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Humo Laboratory Ltd
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Publication date
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Priority to JP2020144785A priority Critical patent/JP7107589B2/ja
Priority to TW110129243A priority patent/TWI797708B/zh
Priority to KR1020210113478A priority patent/KR20220029464A/ko
Priority to CN202110994716.8A priority patent/CN114200341A/zh
Publication of JP2022039650A publication Critical patent/JP2022039650A/ja
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Publication of JP7107589B2 publication Critical patent/JP7107589B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G01R31/013—Testing passive components
    • G01R31/016—Testing of capacitors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2837—Characterising or performance testing, e.g. of frequency response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
JP2020144785A 2020-08-28 2020-08-28 チップ電子部品検査用のローラ電極接触子を備えた装置 Active JP7107589B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2020144785A JP7107589B2 (ja) 2020-08-28 2020-08-28 チップ電子部品検査用のローラ電極接触子を備えた装置
TW110129243A TWI797708B (zh) 2020-08-28 2021-08-09 晶片電子零件檢查用之具備滾子電極接觸件的裝置
KR1020210113478A KR20220029464A (ko) 2020-08-28 2021-08-26 칩 전자 부품 검사용의 롤러 전극 접촉자를 구비한 장치
CN202110994716.8A CN114200341A (zh) 2020-08-28 2021-08-27 具备片状电子零件检查用的滚子电极接触件的装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020144785A JP7107589B2 (ja) 2020-08-28 2020-08-28 チップ電子部品検査用のローラ電極接触子を備えた装置

Publications (2)

Publication Number Publication Date
JP2022039650A JP2022039650A (ja) 2022-03-10
JP7107589B2 true JP7107589B2 (ja) 2022-07-27

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2020144785A Active JP7107589B2 (ja) 2020-08-28 2020-08-28 チップ電子部品検査用のローラ電極接触子を備えた装置

Country Status (4)

Country Link
JP (1) JP7107589B2 (ko)
KR (1) KR20220029464A (ko)
CN (1) CN114200341A (ko)
TW (1) TWI797708B (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI800405B (zh) * 2022-06-14 2023-04-21 國巨股份有限公司 測試探針與測試探針固定裝置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006194831A (ja) 2005-01-17 2006-07-27 Humo Laboratory Ltd チップ形電子部品特性検査分類装置
JP2014153364A (ja) 2013-02-07 2014-08-25 Samsung Electro-Mechanics Co Ltd 電子部品検査装置
JP2015213121A (ja) 2014-05-02 2015-11-26 株式会社ヒューモラボラトリー チップ電子部品の電気特性の連続的な検査方法
JP2018056483A (ja) 2016-09-30 2018-04-05 株式会社ヒューモラボラトリー チップ電子部品の電気特性の連続的な検査方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07167635A (ja) * 1993-12-14 1995-07-04 Fuji Photo Film Co Ltd 被研磨部材の表面検出装置及び接触子製造方法及び自動検査研磨装置
US5842579A (en) 1995-11-16 1998-12-01 Electro Scientific Industries, Inc. Electrical circuit component handler
JPH09325172A (ja) * 1996-06-05 1997-12-16 Fujitsu Ltd バーンインボード検査装置及びバーンインボード検査方法
JP3532124B2 (ja) 1999-07-14 2004-05-31 株式会社ヒューモラボラトリー 小型部品供給搬送装置
US6817052B2 (en) * 2001-11-09 2004-11-16 Formfactor, Inc. Apparatuses and methods for cleaning test probes
JP2006029871A (ja) * 2004-07-13 2006-02-02 Murata Mfg Co Ltd 電圧印加機構および電子部品の特性測定装置
US7402994B2 (en) 2004-08-09 2008-07-22 Electro Scientific Industries, Inc. Self-cleaning lower contact
JP2006275579A (ja) * 2005-03-28 2006-10-12 Kyocera Corp 検査基板および検査装置
JP2008169983A (ja) * 2007-01-15 2008-07-24 Nsk Ltd 直動装置およびその点検方法
JP6312200B2 (ja) * 2014-02-07 2018-04-18 株式会社ヒューモラボラトリー チップキャパシタ検査選別装置
TWI748931B (zh) * 2014-05-29 2021-12-11 美商明亮光源能源公司 電力產生系統及關於彼等之方法
US11069891B2 (en) * 2014-09-26 2021-07-20 Positec Power Tools (Suzhou) Co., Ltd. Battery, battery pack and continuous power supply
CN109119257A (zh) * 2018-08-15 2019-01-01 天津大学 自支撑纳米片状铁钴硼超级电容器电极材料的制备方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006194831A (ja) 2005-01-17 2006-07-27 Humo Laboratory Ltd チップ形電子部品特性検査分類装置
JP2014153364A (ja) 2013-02-07 2014-08-25 Samsung Electro-Mechanics Co Ltd 電子部品検査装置
JP2015213121A (ja) 2014-05-02 2015-11-26 株式会社ヒューモラボラトリー チップ電子部品の電気特性の連続的な検査方法
JP2018056483A (ja) 2016-09-30 2018-04-05 株式会社ヒューモラボラトリー チップ電子部品の電気特性の連続的な検査方法

Also Published As

Publication number Publication date
KR20220029464A (ko) 2022-03-08
CN114200341A (zh) 2022-03-18
TW202215582A (zh) 2022-04-16
JP2022039650A (ja) 2022-03-10
TWI797708B (zh) 2023-04-01

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