CN114200341A - 具备片状电子零件检查用的滚子电极接触件的装置 - Google Patents

具备片状电子零件检查用的滚子电极接触件的装置 Download PDF

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Publication number
CN114200341A
CN114200341A CN202110994716.8A CN202110994716A CN114200341A CN 114200341 A CN114200341 A CN 114200341A CN 202110994716 A CN202110994716 A CN 202110994716A CN 114200341 A CN114200341 A CN 114200341A
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CN
China
Prior art keywords
electronic component
sheet
roller electrode
roller
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202110994716.8A
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English (en)
Chinese (zh)
Inventor
森规与仁
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Humo Laboratory Ltd
Original Assignee
Humo Laboratory Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Humo Laboratory Ltd filed Critical Humo Laboratory Ltd
Publication of CN114200341A publication Critical patent/CN114200341A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G01R31/013—Testing passive components
    • G01R31/016—Testing of capacitors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2837—Characterising or performance testing, e.g. of frequency response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Environmental & Geological Engineering (AREA)
  • Power Engineering (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Specific Conveyance Elements (AREA)
  • Sorting Of Articles (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
CN202110994716.8A 2020-08-28 2021-08-27 具备片状电子零件检查用的滚子电极接触件的装置 Pending CN114200341A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020144785A JP7107589B2 (ja) 2020-08-28 2020-08-28 チップ電子部品検査用のローラ電極接触子を備えた装置
JP2020-144785 2020-08-28

Publications (1)

Publication Number Publication Date
CN114200341A true CN114200341A (zh) 2022-03-18

Family

ID=80498575

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202110994716.8A Pending CN114200341A (zh) 2020-08-28 2021-08-27 具备片状电子零件检查用的滚子电极接触件的装置

Country Status (4)

Country Link
JP (1) JP7107589B2 (ko)
KR (1) KR20220029464A (ko)
CN (1) CN114200341A (ko)
TW (1) TWI797708B (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI800405B (zh) * 2022-06-14 2023-04-21 國巨股份有限公司 測試探針與測試探針固定裝置

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07167635A (ja) * 1993-12-14 1995-07-04 Fuji Photo Film Co Ltd 被研磨部材の表面検出装置及び接触子製造方法及び自動検査研磨装置
US20030092365A1 (en) * 2001-11-09 2003-05-15 Grube Gary W. Apparatuses and methods for cleaning test probes
JP2006029871A (ja) * 2004-07-13 2006-02-02 Murata Mfg Co Ltd 電圧印加機構および電子部品の特性測定装置
JP2006194831A (ja) * 2005-01-17 2006-07-27 Humo Laboratory Ltd チップ形電子部品特性検査分類装置
JP2006275579A (ja) * 2005-03-28 2006-10-12 Kyocera Corp 検査基板および検査装置
JP2008169983A (ja) * 2007-01-15 2008-07-24 Nsk Ltd 直動装置およびその点検方法
CN104826821A (zh) * 2014-02-07 2015-08-12 慧萌高新科技有限公司 片式电子部件检查选别装置
CN105044586A (zh) * 2014-05-02 2015-11-11 慧萌高新科技有限公司 芯片电子部件的电特性的连续检查方法
US20170309912A1 (en) * 2014-09-26 2017-10-26 Positec Power Tools (Suzhou) Co., Ltd. Battery, battery pack and continuous power supply
CN109119257A (zh) * 2018-08-15 2019-01-01 天津大学 自支撑纳米片状铁钴硼超级电容器电极材料的制备方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5842579A (en) 1995-11-16 1998-12-01 Electro Scientific Industries, Inc. Electrical circuit component handler
JPH09325172A (ja) * 1996-06-05 1997-12-16 Fujitsu Ltd バーンインボード検査装置及びバーンインボード検査方法
JP3532124B2 (ja) 1999-07-14 2004-05-31 株式会社ヒューモラボラトリー 小型部品供給搬送装置
US7402994B2 (en) 2004-08-09 2008-07-22 Electro Scientific Industries, Inc. Self-cleaning lower contact
KR101451499B1 (ko) * 2013-02-07 2014-10-17 삼성전기주식회사 전자부품 검사장치
EP3882923A3 (en) * 2014-05-29 2022-06-22 Brilliant Light Power, Inc. Electrical power generation systems and methods regarding same
JP6727651B2 (ja) * 2016-09-30 2020-07-22 株式会社ヒューモラボラトリー チップ電子部品の電気特性の連続的な検査方法

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07167635A (ja) * 1993-12-14 1995-07-04 Fuji Photo Film Co Ltd 被研磨部材の表面検出装置及び接触子製造方法及び自動検査研磨装置
US20030092365A1 (en) * 2001-11-09 2003-05-15 Grube Gary W. Apparatuses and methods for cleaning test probes
JP2006029871A (ja) * 2004-07-13 2006-02-02 Murata Mfg Co Ltd 電圧印加機構および電子部品の特性測定装置
JP2006194831A (ja) * 2005-01-17 2006-07-27 Humo Laboratory Ltd チップ形電子部品特性検査分類装置
JP2006275579A (ja) * 2005-03-28 2006-10-12 Kyocera Corp 検査基板および検査装置
JP2008169983A (ja) * 2007-01-15 2008-07-24 Nsk Ltd 直動装置およびその点検方法
CN104826821A (zh) * 2014-02-07 2015-08-12 慧萌高新科技有限公司 片式电子部件检查选别装置
CN105044586A (zh) * 2014-05-02 2015-11-11 慧萌高新科技有限公司 芯片电子部件的电特性的连续检查方法
US20170309912A1 (en) * 2014-09-26 2017-10-26 Positec Power Tools (Suzhou) Co., Ltd. Battery, battery pack and continuous power supply
CN109119257A (zh) * 2018-08-15 2019-01-01 天津大学 自支撑纳米片状铁钴硼超级电容器电极材料的制备方法

Also Published As

Publication number Publication date
JP7107589B2 (ja) 2022-07-27
TWI797708B (zh) 2023-04-01
TW202215582A (zh) 2022-04-16
JP2022039650A (ja) 2022-03-10
KR20220029464A (ko) 2022-03-08

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