JP6576328B2 - 操作の認識のための導電性ポリマーを含む層構造およびその生成のためのプロセス - Google Patents
操作の認識のための導電性ポリマーを含む層構造およびその生成のためのプロセス Download PDFInfo
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- JP6576328B2 JP6576328B2 JP2016505734A JP2016505734A JP6576328B2 JP 6576328 B2 JP6576328 B2 JP 6576328B2 JP 2016505734 A JP2016505734 A JP 2016505734A JP 2016505734 A JP2016505734 A JP 2016505734A JP 6576328 B2 JP6576328 B2 JP 6576328B2
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- B42D25/00—Information-bearing cards or sheet-like structures characterised by identification or security features; Manufacture thereof
- B42D25/20—Information-bearing cards or sheet-like structures characterised by identification or security features; Manufacture thereof characterised by a particular use or purpose
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- B42D—BOOKS; BOOK COVERS; LOOSE LEAVES; PRINTED MATTER CHARACTERISED BY IDENTIFICATION OR SECURITY FEATURES; PRINTED MATTER OF SPECIAL FORMAT OR STYLE NOT OTHERWISE PROVIDED FOR; DEVICES FOR USE THEREWITH AND NOT OTHERWISE PROVIDED FOR; MOVABLE-STRIP WRITING OR READING APPARATUS
- B42D25/00—Information-bearing cards or sheet-like structures characterised by identification or security features; Manufacture thereof
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- G06Q30/00—Commerce
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- G06Q30/0185—Product, service or business identity fraud
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- H—ELECTRICITY
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
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- H—ELECTRICITY
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
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- H—ELECTRICITY
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
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Description
a)第1の基板層であって、第1の表面および第2の表面を有しかつ誘電体として構成された第1の基板層、
b)第1の基板層の少なくとも第1の表面上で第1の基板層に少なくとも部分的に重なる第1の導電層、
を備える層構造であって、
第1の導電層が、導電性ポリマーを含み、
第1の導電層が、少なくとも1つの第1の部分領域および少なくとも1つのさらなる部分領域を有し、
少なくとも1つの第1の部分領域が、少なくとも1つのさらなる部分領域に対するより高い基板層に対する結合強さを有する、層構造である。
c)第2の表面上の基板層に少なくとも部分的に重なるさらなる導電層、
d)層構造の少なくとも一部、好ましくは層構造全体を囲繞するプラスチックのフィルム
の少なくとも1つを含む。
i)第1の基板層が第1の表面および第2の表面を有する、第1の基板層の供給、
ii)第1の導電性組成物が導電性ポリマーを含む、導電層の少なくとも1つの第1の部分領域を形成するための第1の基板層の第1の表面または第2の表面の少なくとも一部への第1の導電性組成物の適用、
iii)さらなる導電性組成物が導電性ポリマーを含む、導電層の少なくとも1つのさらなる部分領域を形成するための、基板層の第1の表面、第1の部分領域または両方からなる群から選択される領域の少なくとも一部へのさらなる導電性組成物の適用、
iv)導電層を形成するための少なくとも1つの第1の部分領域の少なくとも一部のさらなる導電性組成物との接触、
を含む層構造であって、
少なくとも1つの第1の部分領域が、少なくとも1つのさらなる部分領域に対するより高い基板層に対する結合強さを有する、層構造の生成のためのプロセスも提供する。
v)さらなる導電層を形成するための基板層の第2の表面の少なくとも一部への第3の導電性組成物の適用、
vi)第3の導電層を形成するためのさらなる基板層の少なくとも一部への第3の導電性組成物の適用、
vii)少なくとも1つの接触領域における第1の導電層とさらなる導電層との間の接触の生成
の少なくとも1つが、ステップii)の前または後に実行される。
v)a)少なくとも第1の基板層を通る穴の形成、
v)b)第1の導電層およびさらなる導電層の少なくとも1つの第1の部分領域が導電性組成物によって電気的に接続されるように、穴の少なくとも一部内へのさらなる導電性組成物の導入
を含む。
a.本発明による層構造または層構造の生成のためのプロセスによって生成される層構造の供給、
b.第1の導電層[直接または間接的に]およびさらなる導電層または両方[直接または間接的に]からなる群から選択される層の少なくとも1つの測定ユニットへの電気的接触、
c.層構造の電気的パラメータの判定、
d.ステップcの結果の基準値との比較
を含む、層構造の情報の判定のためのプロセスも提供する。
測定方法
1)設定値の判定のための抵抗測定
マルチメータ(Voltcraft LCR 4080)を、抵抗測定運転モードに設定してばね接点を備えた2つの測定用リード線を層構造の接触領域(16、28)に置き抵抗測定結果を読み取る。
2)実測値の判定のための比較測定および設定値との比較
結合強さの判定は、Erichsen 58675 Hemerの接着力試験器の手段によって実行する。第1の部分領域およびさらなる部分領域の他の層に対する結合強さの全てのデータを、直径14mmのMefidollyで測定した。この文脈における工程は、これに関してハンドブックに記述された通りであった。
第1の、さらなるまたは第3の導電性組成物の組成物の例:
A)Heraeus Precious Metals GmbH&Co.KGから市販されているClevios(商標) F 010
B)10gのポリウレタン水性分散液(Bayderm Finish 85UDN、Lanxess)、4gのジメチルスルホキシド、0.2gの界面活性剤(Dynol 604、Air Products GmbH)、0.15gのシラン(Silquest A−187、Momentive Performance Materials Inc.)および25gのイソプロピルアルコールを、60gのPEDOT:PSS水性分散液(Clevios(商標) P,Heraeus Precious Metals GmbH&Co.KG)に撹拌しながら加えた。
C)Clevios(商標) S V4、市販のHeraeus Precious Metals GmbH&Co.KGのPEDOT:PSSを基材とするスクリーン印刷ペースト
D)100gのPEDOT:PSS水性分散液(Clevios(商標) PH 1000、Heraeus Precious Metals GmbH&Co.KG)を、撹拌しながら、10wt%強度のアンモニア水溶液でpH5に調整する。次いで25gのポリアクリル酸塩水性分散液(Acronal S728、BASF)および5gのエチレングリコールを加える。
実施形態1:第1の実施形態は、以下の層
a)第1の基板層であって、第1の表面および第2の表面を有しかつ誘電体として構成される第1の基板層、
b)第1の基板層の少なくとも第1の表面上で第1の基板層に少なくとも部分的に重なる第1の導電層、
を備える層構造であって、
第1の導電層が、導電性ポリマーを含み、
第1の導電層が、少なくとも1つの第1の部分領域および少なくとも1つのさらなる部分領域を備え、
少なくとも1つの第1の部分領域が、少なくとも1つのさらなる部分領域に対するより高い基板層に対する結合強さを有する、層構造である。
c)第2の表面上で基板層に少なくとも部分的に重なるさらなる導電層、
の少なくとも1つを備える、実施形態1に従う層構造。
d)層構造の少なくとも一部に重なるプラスチックのフィルム、
の少なくとも1つを備える、実施形態1または2に従う層構造。
例の下で上述した配合の、
−第1の部分領域は、第1の導電層8およびさらなる導電層14の両方に関して例Bに相当し、
−第2の部分領域は、第1の導電層8およびさらなる導電層14の両方に関して例Aに相当し、
−第3の導電層は、例Cまたは例Dに相当する。
4 基板層の第1の表面
6 基板層の第2の表面
8 第1の導電層
10 層構造
12 穴
14 さらなる導電層
16 第1の接触領域
17 接点
18 第1の部分領域
20 さらなる部分領域
21 間隙
22 さらなる基板層
24 電気的接触
26 第3の基板層
28 さらなる接触領域
29 接点
30 第3の導電層
32 第1のステップi)
34 第2のステップii)
36 第3のステップiii)
37 第4のステップiv)
38 第5のステップv)a)
39 第6のステップvi)
40 第7のステップv)b)
41 第8のステップ
42 第1の導電性組成物
44 さらなる導電性組成物
46 第3の導電性組成物
50 プラスチックのフィルム
52 接着層
60 コンデンサ
62 陽極/第1のコンデンサ極板
64 陰極/第2のコンデンサ極板
66 マイクロコントローラ
68 コイル
70 第1の接触
71 第2の接触
72 電気回路
78 貫通縁部
80 第1の領域/第1の抵抗
81 第2の領域/第2の抵抗
82 第3の領域/第3の抵抗
83 第4の領域/第4の抵抗
84 第5の領域/第5の抵抗
85 第6の領域/第6の抵抗
90 保護層
92 設定抵抗Rset
94 実抵抗Ractual
96 設定静電容量Cset
97 実静電容量Cactual
98 個人化領域
100 対象物
120 測定ユニット
130 凹部
140 密封材料
Claims (29)
- 以下の層、
a)第1の基板層(2)であって、第1の表面(4)および第2の表面(6)を有しかつ誘電体として構成された、第1の基板層(2)、
b)少なくとも前記第1の基板層(2)の第1の表面(4)上で少なくとも部分的に前記第1の基板層(2)に重なる第1の導電層(8)
を備える層構造(10)であって、
前記第1の導電層(8)がポリチオフェンである導電性ポリマーを含み、
前記第1の導電層(8)が、少なくとも1つの第1の部分領域(18)および少なくとも1つのさらなる部分領域(20)を有し、
(a) 前記少なくとも1つの第1の部分領域(18)の少なくとも一部分が、前記第1の基板層(2)の第1の表面(4)に重なり、前記少なくとも1つの第1の部分領域(18)が、前記少なくとも1つのさらなる部分領域(20)に対するよりも高い前記第1の基板層(2)に対する結合強さを有し、または、
(b) 前記少なくとも1つの第1の部分領域(18)の少なくとも一部分と、前記少なくとも1つのさらなる部分領域(20)の少なくとも一部分とが、前記第1の基板層(2)の第1の表面(4)に重なり、前記第1の基板層(2)に対する前記少なくとも1つの第1の部分領域(18)の結合強さが、前記第1の基板層(2)に対する前記少なくとも1つのさらなる部分領域(20)の結合強さと異なる、層構造(10)。 - 前記層構造(10)が、以下のさらなる層、
c)前記第2の表面(6)上で少なくとも部分的に前記基板層(2)に重なる第2の導電層(14)、
d)前記層構造(10)の少なくとも一部に重なるプラスチックのフィルム(50)
のうちの少なくとも1つを備える、請求項1に記載の層構造(10)。 - 前記第2の導電層(14)が、前記基板層(2)の前記第2の表面(6)側で前記第2の表面(6)の平面内または外に少なくとも部分的に配置され、
少なくとも第1の接触領域(16)において前記第1の導電層(8)および前記第2の導電層(14)が、前記基板層(2)を通して電気的接触(24)によって電気的に接続される、請求項1〜2のいずれか一項に記載の層構造(10)。 - 前記第1の接触領域(16)における前記第2の導電層(14)との前記第1の導電層(8)の前記電気的接触(24)が、壊れやすい、請求項3に記載の層構造(10)。
- 前記電気的接触(24)が、機械的作用によって破壊される、請求項4に記載の層構造(10)。
- 前記第1の接触領域(16)において前記第1の導電層(8)の前記少なくとも1つのさらなる部分領域(20)の少なくとも一部が、前記少なくとも1つの第2の導電層(14)と接触する、請求項3〜5のいずれか一項に記載の層構造(10)。
- 第2の基板層(22)が、少なくとも部分的に前記第1の導電層(8)または前記第2の導電層(14)に重なる、請求項1〜6のいずれか一項に記載の層構造(10)。
- 第3の導電層(30)が、前記第1の導電層(8)または前記第2の導電層(14)に接続される、請求項3〜7のいずれか一項に記載の層構造(10)。
- 前記層構造(10)が、少なくとも1つの第2の接触領域(28)を有する、請求項3〜8のいずれか一項に記載の層構造(10)。
- 第1の接触領域(16)が、少なくとも1つの第1の部分領域(20)の少なくとも一部を介して少なくとも1つの第2の接触領域(28)に接続される、請求項9に記載の層構造(10)。
- 前記第1の導電層(8)または第2の導電層(14)の少なくとも一部が、コンデンサ(60)に接続され得る、請求項1〜10のいずれか一項に記載の層構造(10)。
- 第2の導電層(14)、第3の導電層(30)、接触(24)またはこれらのうちの少なくとも2つからなる群から選択される領域の少なくとも1つが、導電性ポリマーを含む、請求項1〜11のいずれか一項に記載の層構造(10)。
- 前記第1の導電層(8)、第2の導電層(14)、第3の導電層(30)、接触(24)またはこれらのうちの少なくとも2つからなる群から選択される領域の少なくとも1つが、2Ωから40kΩの範囲の電気抵抗を有する、請求項1〜12のいずれか一項に記載の層構造(10)。
- 前記第1の基板層(2)、第2の基板層(22)、第3の基板層(26)またはこれらのうちの少なくとも2つの組み合わせからなる群から選択される層の少なくとも1つが、ポリマー、ガラス、セラミックまたはこれらのうちの少なくとも2つの組み合わせからなる群から選択される物質を含む、請求項1〜13のいずれか一項に記載の層構造(10)。
- 前記第1の基板層(2)、第2の基板層(22)、第3の基板層(26)またはこれらのうちの少なくとも2つの組み合わせからなる群から選択される層の少なくとも1つが、1MΩより大きい電気抵抗を有する、請求項1〜14のいずれか一項に記載の層構造(10)。
- プロセスステップ、
i)第1の基板層(2)が、第1の表面(4)および第2の表面(6)を有する、前記第1の基板層(2)の供給、
ii)導電層(8)の少なくとも1つの第1の部分領域(18)を形成するための前記第1の表面(4)の少なくとも一部への第1の導電性組成物(42)の適用であって、前記第1の導電性組成物(42)はポリチオフェンである導電性ポリマーを含む、適用、
iii)前記導電層(8)の少なくとも1つのさらなる部分領域(20)を形成するための、前記基板層の前記第1の表面(4)、前記第1の部分領域(18)または両方からなる群から選択される領域の少なくとも一部への第2の導電性組成物(44)の適用であって、前記第2の導電性組成物(44)がポリチオフェンである導電性ポリマーを含む、適用
iv)第1の導電層(8)を形成するための前記第2の導電性組成物(44)との前記少なくとも1つの第1の部分領域(18)の少なくとも一部の接触、
を含む、層構造(10)の製造のためのプロセスであって、
(a) 前記少なくとも1つの第1の部分領域(18)の少なくとも一部分が、前記第1の基板層(2)の第1の表面(4)に重なり、前記少なくとも1つの第1の部分領域(18)が、前記少なくとも1つのさらなる部分領域(20)に対するよりも高い前記基板層(2)に対する結合強さを有し、または、
(b) 前記少なくとも1つの第1の部分領域(18)の少なくとも一部分と、前記少なくとも1つのさらなる部分領域(20)の少なくとも一部分とが、前記第1の基板層(2)の第1の表面(4)に重なり、前記第1の基板層(2)に対する前記少なくとも1つの第1の部分領域(18)の結合強さが、前記第1の基板層(2)に対する前記少なくとも1つのさらなる部分領域(20)の結合強さと異なる、プロセス。 - 以下のステップ、
v)第2の導電層(14)を形成するための前記基板層(2)の前記第2の表面(6)の少なくとも一部への第3の導電性組成物(46)の適用、
vi)第3の導電層(30)を形成するための第2の基板層(22)の少なくとも一部への第3の導電性組成物(46)の適用、
vii)少なくとも1つの接触領域(16、28)における前記第1の導電層(8)と前記第2の導電層(14)との間の接触(24)の生成
のうちの少なくとも1つが、ステップii)の前または後に実行される、請求項16に記載のプロセス。 - ステップvii)における接触(24)の生成が、以下のステップ、
vii)a)少なくとも前記第1の基板層(2)を通る穴(12)の形成、
vii)b)第1の導電層(14)および第2の導電層(14)の少なくとも1つの第1の部分領域(18)が前記導電性組成物(44)によって電気的に接続されるように、前記穴(12)内の少なくとも一部への前記第2の導電性組成物(44)の導入、
を含む、請求項17に記載のプロセス。 - 前記第1の導電層(8)または前記第2の導電層(14)が、導電性組成物(40、44、46)によって第3の導電層(30)を介してさらなる基板層(22、26)に接続される、請求項17〜18のいずれか一項に記載のプロセス。
- 前記基板層(2)が、誘電体である、請求項16〜19のいずれか一項に記載のプロセス。
- 前記第1の導電層(8)、第2の導電層(14)、第3の導電層(30)またはこれらのうちの少なくとも2つからなる群から選択される領域の少なくとも1つが、2Ωから40kΩの範囲の電気抵抗を有する、請求項16〜20のいずれか一項に記載のプロセス。
- 基板層(2、22、26)のうちの少なくとも1つが、紙、セラミック、ポリマーまたはこれらのうちの少なくとも2つの組み合わせからなる群から選択される物質を含む、請求項16〜21のいずれか一項に記載のプロセス。
- 基板層(2、22、26)が、領域において1MΩより大きい電気抵抗を有する、請求項16〜22のいずれか一項に記載のプロセス。
- 請求項16〜23のいずれか一項に従って取得可能な層構造(10)。
- 請求項1〜15、24のいずれか一項に記載の層構造(10)を含む対象物(100)。
- 請求項16〜23のいずれか一項のプロセスを含む、層構造(10)を含む対象物(100)の製造方法。
- ステップ、
a.請求項1〜15のいずれか一項に記載の層構造(10)または請求項16〜23のいずれか一項に記載のプロセスに従って生成された層構造(10)の供給、
b.第1の導電層(8)および第2の導電層(14)または両方からなる群から選択される層の少なくとも1つの電気的接触、
c.前記層構造(10)の電気的パラメータの判定、
d.ステップc.からの結果の基準値との比較、
を含む、対象物(100)の層構造(10)の情報の判定のための方法。 - 前記供給が、対象物(100)への接続によって達成される、請求項27に記載の方法。
- 前記情報が、原本と偽造との間の差別化に対して寄与する、請求項27〜28のいずれか一項に記載の方法。
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PCT/EP2014/000857 WO2014161651A1 (en) | 2013-04-02 | 2014-03-31 | Layered structure with conductive polymer for recognition of manipulation and process for the production thereof |
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US20160042268A1 (en) | 2016-02-11 |
CN105324249A (zh) | 2016-02-10 |
KR20150139871A (ko) | 2015-12-14 |
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TW201507878A (zh) | 2015-03-01 |
WO2014161651A1 (en) | 2014-10-09 |
TWI635966B (zh) | 2018-09-21 |
DE102013005486A1 (de) | 2014-10-02 |
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