JP6502093B2 - 利得を伴って赤外線放射を検出する方法および装置 - Google Patents
利得を伴って赤外線放射を検出する方法および装置 Download PDFInfo
- Publication number
- JP6502093B2 JP6502093B2 JP2014519228A JP2014519228A JP6502093B2 JP 6502093 B2 JP6502093 B2 JP 6502093B2 JP 2014519228 A JP2014519228 A JP 2014519228A JP 2014519228 A JP2014519228 A JP 2014519228A JP 6502093 B2 JP6502093 B2 JP 6502093B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- electrode
- ito
- aluminum
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title claims description 30
- 230000005855 radiation Effects 0.000 title claims description 9
- 230000000903 blocking effect Effects 0.000 claims description 92
- 230000005641 tunneling Effects 0.000 claims description 53
- 239000000463 material Substances 0.000 claims description 47
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 44
- 239000011777 magnesium Substances 0.000 claims description 39
- ZOKIJILZFXPFTO-UHFFFAOYSA-N 4-methyl-n-[4-[1-[4-(4-methyl-n-(4-methylphenyl)anilino)phenyl]cyclohexyl]phenyl]-n-(4-methylphenyl)aniline Chemical compound C1=CC(C)=CC=C1N(C=1C=CC(=CC=1)C1(CCCCC1)C=1C=CC(=CC=1)N(C=1C=CC(C)=CC=1)C=1C=CC(C)=CC=1)C1=CC=C(C)C=C1 ZOKIJILZFXPFTO-UHFFFAOYSA-N 0.000 claims description 38
- JAONJTDQXUSBGG-UHFFFAOYSA-N dialuminum;dizinc;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Al+3].[Al+3].[Zn+2].[Zn+2] JAONJTDQXUSBGG-UHFFFAOYSA-N 0.000 claims description 32
- TVIVIEFSHFOWTE-UHFFFAOYSA-K tri(quinolin-8-yloxy)alumane Chemical compound [Al+3].C1=CN=C2C([O-])=CC=CC2=C1.C1=CN=C2C([O-])=CC=CC2=C1.C1=CN=C2C([O-])=CC=CC2=C1 TVIVIEFSHFOWTE-UHFFFAOYSA-K 0.000 claims description 30
- 229910052709 silver Inorganic materials 0.000 claims description 24
- 239000004332 silver Substances 0.000 claims description 24
- 229910052782 aluminium Inorganic materials 0.000 claims description 23
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 22
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 claims description 21
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 21
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 claims description 21
- 229910052791 calcium Inorganic materials 0.000 claims description 21
- 239000011575 calcium Substances 0.000 claims description 21
- 239000002041 carbon nanotube Substances 0.000 claims description 21
- 229910021393 carbon nanotube Inorganic materials 0.000 claims description 21
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 21
- 229910052737 gold Inorganic materials 0.000 claims description 21
- 239000010931 gold Substances 0.000 claims description 21
- 229910052749 magnesium Inorganic materials 0.000 claims description 21
- 239000000758 substrate Substances 0.000 claims description 21
- 239000002042 Silver nanowire Substances 0.000 claims description 20
- PQXKHYXIUOZZFA-UHFFFAOYSA-M lithium fluoride Chemical compound [Li+].[F-] PQXKHYXIUOZZFA-UHFFFAOYSA-M 0.000 claims description 19
- YBNMDCCMCLUHBL-UHFFFAOYSA-N (2,5-dioxopyrrolidin-1-yl) 4-pyren-1-ylbutanoate Chemical class C=1C=C(C2=C34)C=CC3=CC=CC4=CC=C2C=1CCCC(=O)ON1C(=O)CCC1=O YBNMDCCMCLUHBL-UHFFFAOYSA-N 0.000 claims description 18
- 239000002096 quantum dot Substances 0.000 claims description 15
- ZMKRXXDBXFWSQZ-UHFFFAOYSA-N tris(2,4,6-trimethyl-6-pyridin-3-ylcyclohexa-2,4-dien-1-yl)borane Chemical compound CC1=CC(C)=CC(C)(C=2C=NC=CC=2)C1B(C1C(C=C(C)C=C1C)(C)C=1C=NC=CC=1)C1C(C)=CC(C)=CC1(C)C1=CC=CN=C1 ZMKRXXDBXFWSQZ-UHFFFAOYSA-N 0.000 claims description 14
- -1 aluminum tin oxide Chemical compound 0.000 claims description 13
- DHDHJYNTEFLIHY-UHFFFAOYSA-N 4,7-diphenyl-1,10-phenanthroline Chemical compound C1=CC=CC=C1C1=CC=NC2=C1C=CC1=C(C=3C=CC=CC=3)C=CN=C21 DHDHJYNTEFLIHY-UHFFFAOYSA-N 0.000 claims description 11
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical group [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 claims description 11
- XCAUINMIESBTBL-UHFFFAOYSA-N lead(ii) sulfide Chemical compound [Pb]=S XCAUINMIESBTBL-UHFFFAOYSA-N 0.000 claims description 11
- DETFWTCLAIIJRZ-UHFFFAOYSA-N triphenyl-(4-triphenylsilylphenyl)silane Chemical compound C1=CC=CC=C1[Si](C=1C=CC(=CC=1)[Si](C=1C=CC=CC=1)(C=1C=CC=CC=1)C=1C=CC=CC=1)(C=1C=CC=CC=1)C1=CC=CC=C1 DETFWTCLAIIJRZ-UHFFFAOYSA-N 0.000 claims description 11
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 claims description 11
- 229910052949 galena Inorganic materials 0.000 claims description 9
- XLOMVQKBTHCTTD-UHFFFAOYSA-N zinc oxide Inorganic materials [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 9
- 239000011787 zinc oxide Substances 0.000 claims description 9
- 229910001218 Gallium arsenide Inorganic materials 0.000 claims description 8
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 claims description 8
- 229910000673 Indium arsenide Inorganic materials 0.000 claims description 8
- 229910010413 TiO 2 Inorganic materials 0.000 claims description 8
- 229910052732 germanium Inorganic materials 0.000 claims description 8
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 claims description 8
- 229910052710 silicon Inorganic materials 0.000 claims description 8
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 claims description 6
- 239000011521 glass Substances 0.000 claims description 6
- 238000004519 manufacturing process Methods 0.000 claims description 6
- 230000008901 benefit Effects 0.000 claims description 5
- MZYHMUONCNKCHE-UHFFFAOYSA-N naphthalene-1,2,3,4-tetracarboxylic acid Chemical compound C1=CC=CC2=C(C(O)=O)C(C(=O)O)=C(C(O)=O)C(C(O)=O)=C21 MZYHMUONCNKCHE-UHFFFAOYSA-N 0.000 claims description 3
- RIKNNBBGYSDYAX-UHFFFAOYSA-N 2-[1-[2-(4-methyl-n-(4-methylphenyl)anilino)phenyl]cyclohexyl]-n,n-bis(4-methylphenyl)aniline Chemical compound C1=CC(C)=CC=C1N(C=1C(=CC=CC=1)C1(CCCCC1)C=1C(=CC=CC=1)N(C=1C=CC(C)=CC=1)C=1C=CC(C)=CC=1)C1=CC=C(C)C=C1 RIKNNBBGYSDYAX-UHFFFAOYSA-N 0.000 claims 2
- 239000004305 biphenyl Substances 0.000 claims 1
- 239000002159 nanocrystal Substances 0.000 description 15
- 230000015572 biosynthetic process Effects 0.000 description 6
- YTVNOVQHSGMMOV-UHFFFAOYSA-N naphthalenetetracarboxylic dianhydride Chemical compound C1=CC(C(=O)OC2=O)=C3C2=CC=C2C(=O)OC(=O)C1=C32 YTVNOVQHSGMMOV-UHFFFAOYSA-N 0.000 description 6
- 239000000969 carrier Substances 0.000 description 5
- 238000004770 highest occupied molecular orbital Methods 0.000 description 5
- 238000004768 lowest unoccupied molecular orbital Methods 0.000 description 5
- VQGHOUODWALEFC-UHFFFAOYSA-N 2-phenylpyridine Chemical compound C1=CC=CC=C1C1=CC=CC=N1 VQGHOUODWALEFC-UHFFFAOYSA-N 0.000 description 3
- 238000000862 absorption spectrum Methods 0.000 description 3
- 229920000109 alkoxy-substituted poly(p-phenylene vinylene) Polymers 0.000 description 3
- 150000004985 diamines Chemical class 0.000 description 3
- 230000005525 hole transport Effects 0.000 description 3
- 238000005286 illumination Methods 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000002329 infrared spectrum Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 238000001429 visible spectrum Methods 0.000 description 2
- STTGYIUESPWXOW-UHFFFAOYSA-N 2,9-dimethyl-4,7-diphenyl-1,10-phenanthroline Chemical compound C=12C=CC3=C(C=4C=CC=CC=4)C=C(C)N=C3C2=NC(C)=CC=1C1=CC=CC=C1 STTGYIUESPWXOW-UHFFFAOYSA-N 0.000 description 1
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 description 1
- 239000007983 Tris buffer Substances 0.000 description 1
- 238000002835 absorbance Methods 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002070 nanowire Substances 0.000 description 1
- 230000004297 night vision Effects 0.000 description 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
- SIOXPEMLGUPBBT-UHFFFAOYSA-M picolinate Chemical compound [O-]C(=O)C1=CC=CC=N1 SIOXPEMLGUPBBT-UHFFFAOYSA-M 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/60—OLEDs integrated with inorganic light-sensitive elements, e.g. with inorganic solar cells or inorganic photodiodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022466—Electrodes made of transparent conductive layers, e.g. TCO, ITO layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022466—Electrodes made of transparent conductive layers, e.g. TCO, ITO layers
- H01L31/022475—Electrodes made of transparent conductive layers, e.g. TCO, ITO layers composed of indium tin oxide [ITO]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022466—Electrodes made of transparent conductive layers, e.g. TCO, ITO layers
- H01L31/022491—Electrodes made of transparent conductive layers, e.g. TCO, ITO layers composed of a thin transparent metal layer, e.g. gold
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
- H01L31/035209—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions comprising a quantum structures
- H01L31/035218—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions comprising a quantum structures the quantum structure being quantum dots
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/09—Devices sensitive to infrared, visible or ultraviolet radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/12—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto
- H01L31/14—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto the light source or sources being controlled by the semiconductor device sensitive to radiation, e.g. image converters, image amplifiers or image storage devices
- H01L31/141—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto the light source or sources being controlled by the semiconductor device sensitive to radiation, e.g. image converters, image amplifiers or image storage devices the semiconductor device sensitive to radiation being without a potential-jump barrier or surface barrier
- H01L31/143—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto the light source or sources being controlled by the semiconductor device sensitive to radiation, e.g. image converters, image amplifiers or image storage devices the semiconductor device sensitive to radiation being without a potential-jump barrier or surface barrier the light source being a semiconductor device with at least one potential-jump barrier or surface barrier, e.g. light emitting diode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1804—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic Table
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1804—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic Table
- H01L31/1808—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic Table including only Ge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/184—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof the active layers comprising only AIIIBV compounds, e.g. GaAs, InP
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/33—Transforming infrared radiation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/10—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation comprising heterojunctions between organic semiconductors and inorganic semiconductors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/80—Constructional details
- H10K30/81—Electrodes
- H10K30/82—Transparent electrodes, e.g. indium tin oxide [ITO] electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K65/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element and at least one organic radiation-sensitive element, e.g. organic opto-couplers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/20—Carbon compounds, e.g. carbon nanotubes or fullerenes
- H10K85/211—Fullerenes, e.g. C60
- H10K85/215—Fullerenes, e.g. C60 comprising substituents, e.g. PCBM
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/30—Coordination compounds
- H10K85/311—Phthalocyanine
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/30—Coordination compounds
- H10K85/341—Transition metal complexes, e.g. Ru(II)polypyridine complexes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L2031/0344—Organic materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/10—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation comprising heterojunctions between organic semiconductors and inorganic semiconductors
- H10K30/15—Sensitised wide-bandgap semiconductor devices, e.g. dye-sensitised TiO2
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K39/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic radiation-sensitive element covered by group H10K30/00
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/14—Carrier transporting layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/60—Organic compounds having low molecular weight
- H10K85/631—Amine compounds having at least two aryl rest on at least one amine-nitrogen atom, e.g. triphenylamine
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electromagnetism (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Optics & Photonics (AREA)
- Sustainable Development (AREA)
- Life Sciences & Earth Sciences (AREA)
- Signal Processing (AREA)
- Multimedia (AREA)
- Nanotechnology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Light Receiving Elements (AREA)
- Electroluminescent Light Sources (AREA)
- Photo Coupler, Interrupter, Optical-To-Optical Conversion Devices (AREA)
Description
本出願は、2011年6月30日に提出され、その開示が参照により図、表、または図面を含めて全面的にこの出願に含まれている米国仮特許出願第61/503,317号明細書の利益を主張する。
光検知器をガラス基板上に作成した。この光検知器は、ITOの第1電極、第1電極上のZnOのホール・ブロッキング層、ホール・ブロッキング層上のPbS量子ドットの光感知層、光感知層上のTAPC/MoO3スタックの電子ブロッキング/トンネル層、および電子ブロッキング/トンネル層上の第2電極を含んでいる。このPbS量子ドットの光感知層は、図1Aに示した吸光度スペクトルをもっている。この光検知器は、図3Bに示したJ−V特性曲線(暗黒および1240nmにおける0.302W/cm2のIR照射に関する)を示した。また、この光検知器は、印加電圧の関数として、それぞれ図4Aおよび4Bに示した利得および検出能を示した。
Claims (33)
- 有利得光検知器において、
第1電極、
前記第1電極上の光感知層、
前記光感知層上の電子ブロッキング及びトンネル層、および
前記電子ブロッキング及びトンネル層上の第2電極
を含んでおり、
前記第1電極が陽極であり、かつ、前記第2電極が陰極であり、
前記電子ブロッキング及びトンネル層が、バルク・トラップ・サイトを具え、
前記電子ブロッキング及びトンネル層が、1,1−ビス[(ジ−4−トリルアミノ)フェニル]シクロヘキサン(TAPC)層及びMoO3層で構成された1つのスタック層であることを特徴とする有利得光検知器。 - 請求項1に記載の有利得光検知器において、前記光感知層が0.7μm〜14μm(両端を含む)の範囲の波長をもつ光子を感知することを特徴とする有利得光検知器。
- 請求項2に記載の有利得光検知器において、前記光感知層が少なくとも0.4μm〜0.7μm未満の波長をもつ光子を感知しないことを特徴とする有利得光検知器。
- 請求項1に記載の有利得光検知器において、前記光感知層がPbS量子ドットまたはPbSe量子ドットを含むことを特徴とする有利得光検知器。
- 請求項1に記載の有利得光検知器において、前記光感知層がPbS量子ドットを含むことを特徴とする有利得光検知器。
- 請求項1に記載の有利得光検知器において、前記光感知層がPbS量子ドット、PbSe量子ドット、PCTDA、SnPc、SnPc:C60、AlPcCl、AlPcCl:C60、TiOPc、TiOPc:C60、PbSe、PbS、InAs、InGaAs、Si、Ge、およびGaAsにより構成されるグループから選択される少なくとも1つの材料を含むことを特徴とする有利得光検知器。
- 請求項1に記載の有利得光検知器において、前記第1電極がインジウム・スズ酸化物(ITO)、インジウム亜鉛酸化物(IZO)、アルミニウム・スズ酸化物(ATO)、アルミニウム亜鉛酸化物(AZO)、銀、カルシウム、マグネシウム、金、アルミニウム、カーボン・ナノチューブ、銀ナノワイヤ、LiF層及びAl層及びITO層、Ag層及びITO層、並びにCsCO3層及びITO層により構成されるグループから選択される少なくとも1つの材料を含むことを特徴とする有利得光検知器。
- 請求項1に記載の有利得光検知器において、前記第2電極がインジウム・スズ酸化物(ITO)、インジウム亜鉛酸化物(IZO)、アルミニウム・スズ酸化物(ATO)、アルミニウム亜鉛酸化物(AZO)、銀、カルシウム、マグネシウム、金、アルミニウム、カーボン・ナノチューブ、銀ナノワイヤ、LiF層及びAl層及びITO層、Ag層及びITO層、並びにCsCO3層及びITO層により構成されるグループから選択される少なくとも1つの材料を含むことを特徴とする有利得光検知器。
- 請求項1に記載の有利得光検知器において、前記第1電極がインジウム・スズ酸化物(ITO)、インジウム亜鉛酸化物(IZO)、アルミニウム・スズ酸化物(ATO)、アルミニウム亜鉛酸化物(AZO)、銀、カルシウム、マグネシウム、金、アルミニウム、カーボン・ナノチューブ、銀ナノワイヤ、LiF層及びAl層及びITO層、Ag層及びITO層、並びにCsCO3層及びITO層により構成されるグループから選択される少なくとも1つの材料を含み、かつ、前記第2電極がインジウム・スズ酸化物(ITO)、インジウム亜鉛酸化物(IZO)、アルミニウム・スズ酸化物(ATO)、アルミニウム亜鉛酸化物(AZO)、銀、カルシウム、マグネシウム、金、アルミニウム、カーボン・ナノチューブ、銀ナノワイヤ、LiF層及びAl層及びITO層、Ag層及びITO層、並びにCsCO3層及びITO層により構成されるグループから選択される少なくとも1つの材料を含むことを特徴とする有利得光検知器。
- 請求項1に記載の有利得光検知器において、前記TAPC層が前記光感知層と直接接触し、かつ、前記MoO3層が前記第2電極と直接接触することを特徴とする有利得光検知器。
- 請求項1に記載の有利得光検知器において、前記TAPC層が0nmよりも大きく100nm以下の厚さをもち、かつ、前記MoO3層が0nmよりも大きく100nm以下の厚さをもつことを特徴とする有利得光検知器。
- 請求項1に記載の有利得光検知器において、さらに、前記第1電極の上、前記光感知層の下にホール・ブロッキング層を含むことを特徴とする有利得光検知器。
- 請求項12に記載の有利得光検知器において、前記ホール・ブロッキング層がZnO、ナフタリン・テトラカルボン酸無水物(NTCDA)、2,9−ジメチル−4,7−ジフェニルl−1,10−フェナントロリン(BCP)、p−ビス(トリフェニルシリル)ベンゼン(UGH2)、4,7−ジフェニル−1,10−フェナントロリン(BPhen)、トリス−(8−ヒドロキシ・キノリン)アルミニウム(Alq3)、3,5’−N,N’−ジカルバゾールベンゼン(mCP)、C60、トリス[3−(3−ピリジル)−メシチル]ボラン(3TPYMB)、およびTiO2により構成されるグループから選択される少なくとも1つの材料を含むことを特徴とする有利得光検知器。
- 請求項1に記載の有利得光検知器において、さらに、前記第1電極の下にガラス基板を含むことを特徴とする有利得光検知器。
- 請求項1に記載の有利得光検知器において、前記TAPC層が前記光感知層と直接接触しており、前記MoO3層が前記第2電極と直接接触しており、かつ、前記光感知層がPbS量子ドットを含むことを特徴とする有利得光検知器。
- 請求項15に記載の有利得光検知器において、さらに、前記第1電極の上、前記光感知層の下にホール・ブロッキング層を含むことを特徴とする有利得光検知器。
- 有利得光検知器を製造する方法において、
第1電極を形成すること、
前記第1電極の上に光感知層を形成すること、
前記光感知層のうえに電子ブロッキング及びトンネル層を形成すること、
前記電子ブロッキング及びトンネル層の上に第2電極を形成すること
を含んでおり、
前記第1電極が陽極であり、かつ、前記第2電極が陰極であり、
前記電子ブロッキング及びトンネル層が、バルク・トラップ・サイトを具え、
前記電子ブロッキング及びトンネル層を形成することが、TAPC層及びMoO3層で構成された1つのスタック層を形成することを含むことを特徴とする方法。 - 請求項17に記載の方法において、前記光感知層が0.7μm〜14μm(両端を含む)の範囲の波長をもつ光子を感知することを特徴とする方法。
- 請求項18に記載の方法において、前記光感知層が少なくとも0.4μm〜0.7μm未満の波長をもつ光子を感知しないことを特徴とする方法。
- 請求項17に記載の方法において、前記光感知層がPbS量子ドットまたはPbSe量子ドットを含むことを特徴とする方法。
- 請求項17に記載の方法において、前記光感知層がPbS量子ドットを含むことを特徴とする方法。
- 請求項17に記載の方法において、前記光感知層がPbS量子ドット、PbSe量子ドット、PCTDA、SnPc、SnPc:C60、AlPcCl、AlPcCl:C60、TiOPc、TiOPc:C60、PbSe、PbS、InAs、InGaAs、Si、Ge、およびGaAsにより構成されるグループから選択される少なくとも1つの材料を含むことを特徴とする方法。
- 請求項17に記載の方法において、前記第1電極がインジウム・スズ酸化物(ITO)、インジウム亜鉛酸化物(IZO)、アルミニウム・スズ酸化物(ATO)、アルミニウム亜鉛酸化物(AZO)、銀、カルシウム、マグネシウム、金、アルミニウム、カーボン・ナノチューブ、銀ナノワイヤ、LiF層及びAl層及びITO層、Ag層及びITO層、並びにCsCO3層及びITO層により構成されるグループから選択される少なくとも1つの材料を含むことを特徴とする方法。
- 請求項17に記載の方法において、前記第2電極がインジウム・スズ酸化物(ITO)、インジウム亜鉛酸化物(IZO)、アルミニウム・スズ酸化物(ATO)、アルミニウム亜鉛酸化物(AZO)、銀、カルシウム、マグネシウム、金、アルミニウム、カーボン・ナノチューブ、銀ナノワイヤ、LiF層及びAl層及びITO層、Ag層及びITO層、並びにCsCO3層及びITO層により構成されるグループから選択される少なくとも1つの材料を含むことを特徴とする方法。
- 請求項17に記載の方法において、前記第1電極がインジウム・スズ酸化物(ITO)、インジウム亜鉛酸化物(IZO)、アルミニウム・スズ酸化物(ATO)、アルミニウム亜鉛酸化物(AZO)、銀、カルシウム、マグネシウム、金、アルミニウム、カーボン・ナノチューブ、銀ナノワイヤ、LiF層及びAl層及びITO層、Ag層及びITO層、並びにCsCO3層及びITO層により構成されるグループから選択される少なくとも1つの材料を含み、かつ、前記第2電極がインジウム・スズ酸化物(ITO)、インジウム亜鉛酸化物(IZO)、アルミニウム・スズ酸化物(ATO)、アルミニウム亜鉛酸化物(AZO)、銀、カルシウム、マグネシウム、金、アルミニウム、カーボン・ナノチューブ、銀ナノワイヤ、LiF層及びAl層及びITO層、Ag層及びITO層、並びにCsCO3層及びITO層により構成されるグループから選択される少なくとも1つの材料を含むことを特徴とする方法。
- 請求項17に記載の方法において、前記TAPC層が前記光感知層と直接接触するように形成され、かつ、前記第2電極が前記MoO3層と直接接触するように形成されることを特徴とする方法。
- 請求項17に記載の方法において、前記TAPC層が0nmよりも大きく100nm以下の厚さをもち、かつ、前記MoO3層が0nmよりも大きく100nm以下の厚さをもつことを特徴とする方法。
- 請求項17に記載の方法において、さらに、前記第1電極の上、前記光感知層の下にホール・ブロッキング層を形成するステップを含むことを特徴とする方法。
- 請求項28に記載の方法において、前記ホール・ブロッキング層がZnO、ナフタリン・テトラカルボン酸無水物(NTCDA)、2,9−ジメチル−4,7−ジフェニルl−1,10−フェナントロリン(BCP)、p−ビス(トリフェニルシリル)ベンゼン(UGH2)、4,7−ジフェニル−1,10−フェナントロリン(BPhen)、トリス−(8−ヒドロキシ・キノリン)アルミニウム(Alq3)、3,5’−N,N’−ジカルバゾールベンゼン(mCP)、C60、トリス[3−(3−ピリジル)−メシチル]ボラン(3TPYMB)、およびTiO2により構成されるグループから選択される少なくとも1つの材料を含むことを特徴とする方法。
- 請求項17に記載の方法において、さらに、前記第1電極を形成することがガラス基板の上に前記第1電極を形成することを含むことを特徴とする方法。
- 請求項17に記載の方法において、前記TAPC層が前記光感知層と直接接触するように形成され、前記第2電極が前記MoO3層と直接接触するように形成され、かつ、前記光感知層がPbS量子ドットを含むことを特徴とする方法。
- 請求項31に記載の方法において、さらに、前記第1電極の上、前記光感知層の下にホール・ブロッキング層を形成するステップを含むことを特徴とする方法。
- 有利得光検知器を使用してIR照射を検知する方法において、
IR照射が入射するように有利得光検知器を設けることを含み、
前記有利得光検知器が、
第1電極、
前記第1電極の上のIR光感知層、
前記IR光感知層の上の電子ブロッキング及びトンネル層、および
前記電子ブロッキング及びトンネル層の上の第2電極
を含んでおり、
前記第1電極が陽極であり、かつ、前記第2電極が陰極であり、
前記電子ブロッキング及びトンネル層が、バルク・トラップ・サイトを具え、
前記電子ブロッキング及びトンネル層が、1,1−ビス[(ジ−4−トリルアミノ)フェニル]シクロヘキサン(TAPC)層及びMoO3層で構成された1つのスタック層であることを特徴とする方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201161503317P | 2011-06-30 | 2011-06-30 | |
US61/503,317 | 2011-06-30 | ||
PCT/US2012/045272 WO2013003850A2 (en) | 2011-06-30 | 2012-07-02 | A method and apparatus for detecting infrared radiation with gain |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2017093969A Division JP6513733B2 (ja) | 2011-06-30 | 2017-05-10 | 利得を伴って赤外線放射を検出する方法および装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2014521214A JP2014521214A (ja) | 2014-08-25 |
JP6502093B2 true JP6502093B2 (ja) | 2019-04-17 |
Family
ID=47424832
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014519228A Expired - Fee Related JP6502093B2 (ja) | 2011-06-30 | 2012-07-02 | 利得を伴って赤外線放射を検出する方法および装置 |
JP2017093969A Expired - Fee Related JP6513733B2 (ja) | 2011-06-30 | 2017-05-10 | 利得を伴って赤外線放射を検出する方法および装置 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2017093969A Expired - Fee Related JP6513733B2 (ja) | 2011-06-30 | 2017-05-10 | 利得を伴って赤外線放射を検出する方法および装置 |
Country Status (11)
Country | Link |
---|---|
US (2) | US10134815B2 (ja) |
EP (1) | EP2727154B1 (ja) |
JP (2) | JP6502093B2 (ja) |
KR (1) | KR102059208B1 (ja) |
CN (1) | CN103733355B (ja) |
AU (1) | AU2012275060A1 (ja) |
BR (1) | BR112013033122A2 (ja) |
CA (1) | CA2840498A1 (ja) |
MX (1) | MX2013015214A (ja) |
RU (1) | RU2014102650A (ja) |
WO (1) | WO2013003850A2 (ja) |
Families Citing this family (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SG175565A1 (en) | 2006-09-29 | 2011-11-28 | Univ Florida | Method and apparatus for infrared detection and display |
US8498695B2 (en) | 2006-12-22 | 2013-07-30 | Novadaq Technologies Inc. | Imaging system with a single color image sensor for simultaneous fluorescence and color video endoscopy |
US9349970B2 (en) | 2009-09-29 | 2016-05-24 | Research Triangle Institute | Quantum dot-fullerene junction based photodetectors |
US9054262B2 (en) | 2009-09-29 | 2015-06-09 | Research Triangle Institute | Integrated optical upconversion devices and related methods |
BR112012029738A2 (pt) | 2010-05-24 | 2016-08-09 | Nanoholdings Llc | método e aparelho para fornecer uma camada de bloqueio de carga em um dispositivo de conversão ascendente de infravermelho |
BR112013033122A2 (pt) | 2011-06-30 | 2017-01-24 | Nanoholdings Llc | método e aparelho para detectar radiação infravermelha com ganho |
US20140178247A1 (en) | 2012-09-27 | 2014-06-26 | Rhodia Operations | Process for making silver nanostructures and copolymer useful in such process |
KR20150109450A (ko) * | 2013-01-25 | 2015-10-01 | 유니버시티 오브 플로리다 리서치 파운데이션, 아이엔씨. | 용액 처리된 pbs 광검출기를 이용한 신규 ir 이미지 센서 |
RU2523097C1 (ru) * | 2013-02-26 | 2014-07-20 | Гариф Газизович Акчурин | Сверхширокополосный вакуумный туннельный фотодиод для детектирования ультрафиолетового, видимого и инфракрасного оптического излучения и способ для его реализации |
US20160254101A1 (en) * | 2013-04-12 | 2016-09-01 | Stephen R. Forrest | Organic photosensitive devices with exciton-blocking charge carrier filters |
CN103399058B (zh) * | 2013-08-22 | 2015-01-21 | 武汉大学 | 一种高灵敏富勒烯光电化学探针及其制备方法 |
JP2015195333A (ja) * | 2014-03-19 | 2015-11-05 | 株式会社東芝 | 有機光電変換素子および撮像装置 |
EP3155668B1 (en) | 2014-06-16 | 2021-02-17 | B.G. Negev Technologies & Applications Ltd., at Ben-Gurion University | Swir to visible image up-conversion integrated device |
US10749058B2 (en) | 2015-06-11 | 2020-08-18 | University Of Florida Research Foundation, Incorporated | Monodisperse, IR-absorbing nanoparticles and related methods and devices |
EP3582264B1 (en) * | 2015-07-08 | 2020-10-07 | Panasonic Intellectual Property Management Co., Ltd. | Imaging device |
CN113648067A (zh) | 2015-11-13 | 2021-11-16 | 史赛克欧洲运营有限公司 | 用于目标的照明和成像的系统和方法 |
US10980420B2 (en) | 2016-01-26 | 2021-04-20 | Stryker European Operations Limited | Configurable platform |
US11127909B2 (en) | 2016-03-24 | 2021-09-21 | Sony Corporation | Photoelectric conversion element, measuring method of the same, solid-state imaging device, electronic device, and solar cell |
EP3469420A4 (en) | 2016-06-14 | 2020-02-12 | Novadaq Technologies ULC | ADAPTIVE IMAGING METHODS AND SYSTEMS FOR IMPROVING LOW LIGHT SIGNALS IN MEDICAL VISUALIZATION |
US10090466B2 (en) | 2016-07-21 | 2018-10-02 | Massachusetts Institute Of Technology | Far-infrared detection using Weyl semimetals |
US10547015B2 (en) | 2016-12-02 | 2020-01-28 | The Research Foundation For The State University Of New York | Fabrication method for fused multi-layer amorphous selenium sensor |
FR3059829B1 (fr) * | 2016-12-05 | 2019-05-31 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Photodetecteur infrarouge |
KR101930879B1 (ko) * | 2016-12-14 | 2018-12-19 | 실리콘 디스플레이 (주) | 적외선 이미지 센서 |
TWI615611B (zh) * | 2016-12-20 | 2018-02-21 | 氣體偵測器 | |
JP6931705B2 (ja) | 2017-02-10 | 2021-09-08 | ノバダック テクノロジーズ ユーエルシー | オープンフィールドハンドヘルド蛍光イメージングシステムおよび方法 |
CN109713008A (zh) * | 2017-10-26 | 2019-05-03 | 苏州大学 | 一种近红外-可见光上转换器件及其制备方法 |
CN108831905B (zh) * | 2018-05-28 | 2021-07-09 | 东南大学 | 一种基于半导体量子点的红外探测-可见光显示集成系统、制备方法及成像方法 |
CN109037372B (zh) * | 2018-07-20 | 2019-12-24 | 大连民族大学 | 一种基于氧化钼微米带/p型Si的多波段光响应器件及其制备方法 |
CN109728122B (zh) * | 2019-01-03 | 2020-11-20 | 吉林大学 | 一种基于FTO/TiO2/MoO3异质结的紫外探测器及其制备方法 |
CN110265561A (zh) * | 2019-06-17 | 2019-09-20 | 深圳扑浪创新科技有限公司 | 一种纯量子点上转换发光器件及其制备方法 |
CN110400862B (zh) * | 2019-07-29 | 2021-04-02 | 中国科学院长春光学精密机械与物理研究所 | 一种红外热辐射光源及红外传感器 |
TW202135334A (zh) * | 2020-02-13 | 2021-09-16 | 日商富士軟片股份有限公司 | 光檢測元件及影像感測器 |
CN111628093B (zh) * | 2020-05-13 | 2021-06-29 | 电子科技大学 | 一种高效率有机上转换器件 |
JP7492858B2 (ja) * | 2020-05-15 | 2024-05-30 | シャープ株式会社 | 画像形成装置 |
CN118039713B (zh) * | 2024-04-09 | 2024-08-02 | 中山大学 | 一种基于Sn掺杂PbSe量子点的中红外焦平面探测器制备方法 |
Family Cites Families (213)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57139976A (en) | 1981-02-23 | 1982-08-30 | Omron Tateisi Electronics Co | Light emitting/receiving device |
JPS58215081A (ja) | 1982-06-08 | 1983-12-14 | Mitsui Toatsu Chem Inc | アモルフアスシリコン太陽電池 |
DE3379441D1 (en) | 1982-09-23 | 1989-04-20 | Secr Defence Brit | Infrared detectors |
JPS6030163A (ja) | 1983-07-28 | 1985-02-15 | Fuji Electric Corp Res & Dev Ltd | 薄膜太陽電池モジユ−ル |
JPS61149831A (ja) | 1984-12-24 | 1986-07-08 | Matsushita Electric Works Ltd | 赤外線検知装置 |
US4778692A (en) | 1985-02-20 | 1988-10-18 | Canon Kabushiki Kaisha | Process for forming deposited film |
EP0219711A1 (de) | 1985-10-08 | 1987-04-29 | Heimann GmbH | Infrarotdetektor |
JPH0797657B2 (ja) | 1986-10-01 | 1995-10-18 | 株式会社小松製作所 | 光メモリ |
US4885211A (en) | 1987-02-11 | 1989-12-05 | Eastman Kodak Company | Electroluminescent device with improved cathode |
JPS6412583A (en) | 1987-07-07 | 1989-01-17 | Toshiba Corp | Photodetector |
JPH0216421A (ja) | 1988-07-04 | 1990-01-19 | Matsushita Electric Ind Co Ltd | 光検出器 |
JP2717583B2 (ja) | 1988-11-04 | 1998-02-18 | キヤノン株式会社 | 積層型光起電力素子 |
JPH0379693A (ja) | 1989-04-28 | 1991-04-04 | Quantex Corp | 光学的アップコンバーションのための高性能光ルミネセント材料及びそれを作る方法 |
US5122905A (en) | 1989-06-20 | 1992-06-16 | The Dow Chemical Company | Relective polymeric body |
US5121398A (en) | 1989-09-26 | 1992-06-09 | Excel Technology, Inc. | Broadly tunable, high repetition rate solid state lasers and uses thereof |
US5315129A (en) | 1990-08-20 | 1994-05-24 | University Of Southern California | Organic optoelectronic devices and methods |
DE69231734T2 (de) | 1991-01-16 | 2001-09-20 | Japan Found Cancer | Geerbte und somatische mutationen des apc-gens bei menschlichem colorectal-krebs |
SE468188B (sv) | 1991-04-08 | 1992-11-16 | Stiftelsen Inst Foer Mikroelek | Metod foer inkoppling av straalning i en infraroeddetektor, jaemte anordning |
US5270092A (en) | 1991-08-08 | 1993-12-14 | The Regents, University Of California | Gas filled panel insulation |
JPH05186702A (ja) | 1992-01-13 | 1993-07-27 | Fuji Xerox Co Ltd | ジハロゲン化スズフタロシアニンとハロゲン化ガリウムフタロシアニンとの混合結晶およびそれを用いた電子写真感光体 |
JPH06326350A (ja) | 1993-05-12 | 1994-11-25 | Nichia Chem Ind Ltd | 赤外可視変換素子 |
JP3405608B2 (ja) | 1993-09-17 | 2003-05-12 | 株式会社東芝 | 有機el素子 |
JPH07122762A (ja) | 1993-10-22 | 1995-05-12 | Asahi Chem Ind Co Ltd | 薄膜光起電力装置 |
US5389788A (en) | 1993-12-13 | 1995-02-14 | Hughes Aircraft Company | Infrared transducer and goggles incorporating the same |
JPH07271067A (ja) * | 1994-03-30 | 1995-10-20 | Mita Ind Co Ltd | 積層型電子写真感光体 |
JPH087096A (ja) | 1994-06-20 | 1996-01-12 | Fujitsu General Ltd | 動画認識システム |
FR2729757A1 (fr) | 1995-01-20 | 1996-07-26 | Sofradir | Dispositif de detection d'ondes electromagnetiques, et notamment de rayonnements infra-rouges |
US5710428A (en) | 1995-08-10 | 1998-01-20 | Samsung Electronics Co., Ltd. | Infrared focal plane array detecting apparatus having light emitting devices and infrared camera adopting the same |
US5811834A (en) | 1996-01-29 | 1998-09-22 | Toyo Ink Manufacturing Co., Ltd. | Light-emitting material for organo-electroluminescence device and organo-electroluminescence device for which the light-emitting material is adapted |
JPH1065200A (ja) | 1996-08-15 | 1998-03-06 | Yokogawa Electric Corp | 赤外受光素子 |
US6211529B1 (en) | 1996-08-27 | 2001-04-03 | California Institute Of Technology | Infrared radiation-detecting device |
US5853497A (en) | 1996-12-12 | 1998-12-29 | Hughes Electronics Corporation | High efficiency multi-junction solar cells |
JPH10242493A (ja) | 1997-02-28 | 1998-09-11 | Mitsubishi Heavy Ind Ltd | 太陽電池 |
US6337492B1 (en) | 1997-07-11 | 2002-01-08 | Emagin Corporation | Serially-connected organic light emitting diode stack having conductors sandwiching each light emitting layer |
EP1051762A1 (en) | 1998-02-02 | 2000-11-15 | Uniax Corporation | X-y addressable electric microswitch arrays and sensor matrices employing them |
US5965875A (en) | 1998-04-24 | 1999-10-12 | Foveon, Inc. | Color separation in an active pixel cell imaging array using a triple-well structure |
JPH11329736A (ja) | 1998-05-20 | 1999-11-30 | Futaba Corp | 光変調鏡 |
EP1048084A4 (en) | 1998-08-19 | 2001-05-09 | Univ Princeton | ORGANIC OPTOELECTRONIC LIGHT SENSITIVE DEVICE |
US6140646A (en) | 1998-12-17 | 2000-10-31 | Sarnoff Corporation | Direct view infrared MEMS structure |
JP2000277265A (ja) | 1999-03-25 | 2000-10-06 | Agency Of Ind Science & Technol | 有機空間光変調素子 |
JP2000349365A (ja) | 1999-06-07 | 2000-12-15 | Futaba Corp | 光電流増倍素子 |
JP2001006876A (ja) | 1999-06-25 | 2001-01-12 | Futaba Corp | 光−光変換素子 |
JP4107354B2 (ja) | 1999-07-15 | 2008-06-25 | 独立行政法人科学技術振興機構 | ミリ波・遠赤外光検出器 |
US6512385B1 (en) | 1999-07-26 | 2003-01-28 | Paul Pfaff | Method for testing a device under test including the interference of two beams |
JP3950594B2 (ja) | 1999-09-03 | 2007-08-01 | ローム株式会社 | 表示装置 |
US6509574B2 (en) | 1999-12-02 | 2003-01-21 | Texas Instruments Incorporated | Optocouplers having integrated organic light-emitting diodes |
US20020066904A1 (en) | 1999-12-03 | 2002-06-06 | Han-Tzong Yuan | Solid-state relay having integrated organic light-emitting diodes |
AUPQ897600A0 (en) | 2000-07-25 | 2000-08-17 | Liddiard, Kevin | Active or self-biasing micro-bolometer infrared detector |
US6579629B1 (en) | 2000-08-11 | 2003-06-17 | Eastman Kodak Company | Cathode layer in organic light-emitting diode devices |
GB0024804D0 (en) | 2000-10-10 | 2000-11-22 | Microemissive Displays Ltd | An optoelectronic device |
US6828045B1 (en) | 2003-06-13 | 2004-12-07 | Idemitsu Kosan Co., Ltd. | Organic electroluminescence element and production method thereof |
DE10101995A1 (de) | 2001-01-18 | 2002-07-25 | Philips Corp Intellectual Pty | Schaltungsanordnung und Verfahren zum Schützen mindestens einer Chipanordnung vor Manipulation und/oder vor Mißbrauch |
JP2002340668A (ja) | 2001-05-18 | 2002-11-27 | Denso Corp | サーモパイル式赤外線センサおよびその検査方法 |
WO2002099896A1 (en) | 2001-06-05 | 2002-12-12 | State University Of New York | Infrared radiation imager |
JP2003083809A (ja) | 2001-09-10 | 2003-03-19 | Hamamatsu Photonics Kk | 赤外可視変換部材及び赤外線検出装置。 |
US20030052365A1 (en) | 2001-09-18 | 2003-03-20 | Samir Chaudhry | Structure and fabrication method for capacitors integratible with vertical replacement gate transistors |
US7348946B2 (en) | 2001-12-31 | 2008-03-25 | Intel Corporation | Energy sensing light emitting diode display |
US7436038B2 (en) | 2002-02-05 | 2008-10-14 | E-Phocus, Inc | Visible/near infrared image sensor array |
US7378124B2 (en) | 2002-03-01 | 2008-05-27 | John James Daniels | Organic and inorganic light active devices and methods for making the same |
JP3933591B2 (ja) | 2002-03-26 | 2007-06-20 | 淳二 城戸 | 有機エレクトロルミネッセント素子 |
US6951694B2 (en) | 2002-03-29 | 2005-10-04 | The University Of Southern California | Organic light emitting devices with electron blocking layers |
AU2003218452C1 (en) | 2002-03-29 | 2009-07-23 | Massachusetts Institute Of Technology | Light emitting device including semiconductor nanocrystals |
EP1367659B1 (en) | 2002-05-21 | 2012-09-05 | Semiconductor Energy Laboratory Co., Ltd. | Organic field effect transistor |
TWI272874B (en) | 2002-08-09 | 2007-02-01 | Semiconductor Energy Lab | Organic electroluminescent device |
US20040031965A1 (en) * | 2002-08-16 | 2004-02-19 | Forrest Stephen R. | Organic photonic integrated circuit using an organic photodetector and a transparent organic light emitting device |
US20050126628A1 (en) | 2002-09-05 | 2005-06-16 | Nanosys, Inc. | Nanostructure and nanocomposite based compositions and photovoltaic devices |
US7119359B2 (en) | 2002-12-05 | 2006-10-10 | Research Foundation Of The City University Of New York | Photodetectors and optically pumped emitters based on III-nitride multiple-quantum-well structures |
US7052351B2 (en) | 2002-12-31 | 2006-05-30 | Eastman Kodak Company | Using hole- or electron-blocking layers in color OLEDS |
JP2003178887A (ja) | 2003-01-06 | 2003-06-27 | Canon Inc | 電界発光素子用電極材料の選択方法 |
EP1447860A1 (en) | 2003-02-17 | 2004-08-18 | Rijksuniversiteit Groningen | Organic material photodiode |
US6869699B2 (en) * | 2003-03-18 | 2005-03-22 | Eastman Kodak Company | P-type materials and mixtures for electronic devices |
WO2004095144A1 (ja) | 2003-04-24 | 2004-11-04 | Sharp Kabushiki Kaisha | 電子写真感光体、電子写真画像形成方法および電子写真装置 |
US20040222306A1 (en) | 2003-05-08 | 2004-11-11 | Anthony Fajarillo | Methods, systems and apparatus for displaying bonsai trees |
US6914315B2 (en) | 2003-05-28 | 2005-07-05 | Vtera Technology Inc. | GaN-based heterostructure photodiode |
KR101118810B1 (ko) | 2003-06-12 | 2012-03-20 | 시리카 코포레이션 | 자유 캐리어의 정상 상태 비평형 분포 및 이를 이용한 광자에너지 상승 변환 |
US7053412B2 (en) | 2003-06-27 | 2006-05-30 | The Trustees Of Princeton University And Universal Display Corporation | Grey scale bistable display |
US7148463B2 (en) | 2003-07-16 | 2006-12-12 | Triquint Semiconductor, Inc. | Increased responsivity photodetector |
US7381953B1 (en) | 2003-07-25 | 2008-06-03 | Public Service Solutions, Inc. | Infrared imaging device |
US6906326B2 (en) | 2003-07-25 | 2005-06-14 | Bae Systems Information And Elecronic Systems Integration Inc. | Quantum dot infrared photodetector focal plane array |
WO2005017973A2 (en) | 2003-08-18 | 2005-02-24 | Nanosource, Inc. | Semiconductor avalanche photodetector with vacuum or gaseous gap electron acceleration region |
EP1513171A1 (en) | 2003-09-05 | 2005-03-09 | Sony International (Europe) GmbH | Tandem dye-sensitised solar cell and method of its production |
US6881502B2 (en) | 2003-09-24 | 2005-04-19 | Eastman Kodak Company | Blue organic electroluminescent devices having a non-hole-blocking layer |
US8884845B2 (en) | 2003-10-28 | 2014-11-11 | Semiconductor Energy Laboratory Co., Ltd. | Display device and telecommunication system |
US20080138797A1 (en) | 2003-11-13 | 2008-06-12 | Hunt William D | Detection Systems and Methods |
US6972431B2 (en) | 2003-11-26 | 2005-12-06 | Trustees Of Princeton University | Multilayer organic photodetectors with improved performance |
US7125635B2 (en) | 2003-12-23 | 2006-10-24 | Xerox Corporation | Imaging members |
CA2551123A1 (en) | 2004-01-20 | 2005-07-28 | Cyrium Technologies Incorporated | Solar cell with epitaxially grown quantum dot material |
US6943425B2 (en) | 2004-01-23 | 2005-09-13 | Intevac, Inc. | Wavelength extension for backthinned silicon image arrays |
GB0401578D0 (en) | 2004-01-24 | 2004-02-25 | Koninkl Philips Electronics Nv | Phototransistor |
US7151339B2 (en) | 2004-01-30 | 2006-12-19 | Universal Display Corporation | OLED efficiency by utilization of different doping concentrations within the device emissive layer |
JP2005266537A (ja) | 2004-03-19 | 2005-09-29 | Stanley Electric Co Ltd | 赤外線透過フィルタ及び該赤外線透過フィルタを具備する赤外線投光器 |
JP2005277113A (ja) | 2004-03-25 | 2005-10-06 | Sanyo Electric Co Ltd | 積層型太陽電池モジュール |
US20050228277A1 (en) | 2004-04-05 | 2005-10-13 | Siemens Medical Solutions Usa, Inc. | System and method for 2D partial beamforming arrays with configurable sub-array elements |
US7773139B2 (en) | 2004-04-16 | 2010-08-10 | Apple Inc. | Image sensor with photosensitive thin film transistors |
WO2005101530A1 (en) | 2004-04-19 | 2005-10-27 | Edward Sargent | Optically-regulated optical emission using colloidal quantum dot nanocrystals |
US7773404B2 (en) | 2005-01-07 | 2010-08-10 | Invisage Technologies, Inc. | Quantum dot optical devices with enhanced gain and sensitivity and methods of making same |
JP2006013103A (ja) | 2004-06-25 | 2006-01-12 | Sony Corp | 有機電界発光素子 |
US20060014044A1 (en) | 2004-07-14 | 2006-01-19 | Au Optronics Corporation | Organic light-emitting display with multiple light-emitting modules |
US7300731B2 (en) | 2004-08-10 | 2007-11-27 | E.I. Du Pont De Nemours And Company | Spatially-doped charge transport layers |
KR20060018583A (ko) | 2004-08-25 | 2006-03-02 | 삼성전자주식회사 | 반도체 나노결정을 함유하는 백색 발광 유·무기하이브리드 전기 발광 소자 |
US8026510B2 (en) | 2004-10-20 | 2011-09-27 | Dai Nippon Printing Co., Ltd. | Organic electronic device and method for producing the same |
JP2006128437A (ja) | 2004-10-29 | 2006-05-18 | Sony Corp | 有機電界発光素子および表示装置 |
KR100678291B1 (ko) | 2004-11-11 | 2007-02-02 | 삼성전자주식회사 | 나노입자를 이용한 수광소자 |
US7402831B2 (en) | 2004-12-09 | 2008-07-22 | 3M Innovative Properties Company | Adapting short-wavelength LED's for polychromatic, broadband, or “white” emission |
US7279705B2 (en) | 2005-01-14 | 2007-10-09 | Au Optronics Corp. | Organic light-emitting device |
TWI278252B (en) | 2005-04-04 | 2007-04-01 | Au Optronics Corp | Organic light-emitting display device |
US20060157806A1 (en) | 2005-01-18 | 2006-07-20 | Omnivision Technologies, Inc. | Multilayered semiconductor susbtrate and image sensor formed thereon for improved infrared response |
US7811479B2 (en) | 2005-02-07 | 2010-10-12 | The Trustees Of The University Of Pennsylvania | Polymer-nanocrystal quantum dot composites and optoelectronic devices |
US8115093B2 (en) | 2005-02-15 | 2012-02-14 | General Electric Company | Layer-to-layer interconnects for photoelectric devices and methods of fabricating the same |
KR100624307B1 (ko) | 2005-02-23 | 2006-09-19 | 제일모직주식회사 | 표시장치용 저반사율의 휘도 향상 다층 광학필름 및 이를이용한 유기발광다이오드 표시장치 |
JP4839632B2 (ja) | 2005-02-25 | 2011-12-21 | ソニー株式会社 | 撮像装置 |
US7208738B2 (en) | 2005-02-28 | 2007-04-24 | Sundar Natarajan Yoganandan | Light source utilizing an infrared sensor to maintain brightness and color of an LED device |
KR20070110049A (ko) | 2005-03-04 | 2007-11-15 | 마츠시다 덴코 가부시키가이샤 | 적층형 유기태양전지 |
JP4567495B2 (ja) | 2005-03-11 | 2010-10-20 | 株式会社リコー | 光波長変換素子 |
TWI305431B (en) | 2005-04-06 | 2009-01-11 | Au Optronics Corp | Organic light emitting diode display |
ES2297972A1 (es) | 2005-05-30 | 2008-05-01 | Universidad Politecnica De Madrid | Fotodetector de infrarrojos de banda intermedia y puntos cuanticos. |
US20090084436A1 (en) | 2005-06-02 | 2009-04-02 | The Regents Of The University Of California | Effective organic solar cells based on triplet materials |
WO2006132128A1 (ja) | 2005-06-06 | 2006-12-14 | Sharp Kabushiki Kaisha | 正孔注入輸送層用塗液、正孔注入輸送層の製造方法、有機エレクトロルミネセンス素子、及び、その製造方法 |
KR20070000262A (ko) | 2005-06-27 | 2007-01-02 | 삼성전자주식회사 | Mg-Ag 단일 박막층을 사용한 음극 전극 형성 단계를 포함하는 유기발광소자의 제조 방법 및 이에 의해 제조된 유기발광소자 |
US7247850B2 (en) | 2005-08-05 | 2007-07-24 | Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of National Defence Of Her Majesty's Canadian Government | Infrared imager |
DE102005037290A1 (de) | 2005-08-08 | 2007-02-22 | Siemens Ag | Flachbilddetektor |
WO2007017475A1 (de) | 2005-08-08 | 2007-02-15 | Siemens Aktiengesellschaft | Organischer photodetektor mit erhöhter empfindlichkeit, sowie verwendung eines triarylmin-fluoren-polymers als zwischenschicht in einem photodetektor |
KR100720100B1 (ko) | 2005-08-23 | 2007-05-18 | 한양대학교 산학협력단 | 다중 이종 헤테로 구조의 정공속박층을 가지는유기발광소자 및 그 제조방법 |
EP1929531B1 (en) | 2005-08-25 | 2012-03-28 | Edward Sargent | Quantum dot optical devices with enhanced gain and sensitivity |
CN100424897C (zh) | 2005-09-28 | 2008-10-08 | 中国科学院上海技术物理研究所 | 氮化镓基红外-可见波长转换探测器 |
KR100691567B1 (ko) | 2005-10-18 | 2007-03-09 | 신코엠 주식회사 | 유기 전계 발광다이오드 디스플레이 패널의 구동회로 및이를 이용한 디스차아지 방법 |
US8013240B2 (en) | 2005-11-02 | 2011-09-06 | The Trustees Of Princeton University | Organic photovoltaic cells utilizing ultrathin sensitizing layer |
US7947897B2 (en) * | 2005-11-02 | 2011-05-24 | The Trustees Of Princeton University | Organic photovoltaic cells utilizing ultrathin sensitizing layer |
US8021763B2 (en) | 2005-11-23 | 2011-09-20 | The Trustees Of Princeton University | Phosphorescent OLED with interlayer |
WO2007066556A1 (en) | 2005-12-05 | 2007-06-14 | Semiconductor Energy Laboratory Co., Ltd. | Organometallic complex and light-emitting element, light-emitting device and electronic device using the same |
US7414294B2 (en) | 2005-12-16 | 2008-08-19 | The Trustees Of Princeton University | Intermediate-band photosensitive device with quantum dots having tunneling barrier embedded in organic matrix |
DE602006001930D1 (de) | 2005-12-23 | 2008-09-04 | Novaled Ag | tur von organischen Schichten |
KR101288304B1 (ko) | 2006-01-27 | 2013-07-18 | 삼성디스플레이 주식회사 | 유기 발광 화합물 및 이를 구비한 유기 발광 소자 |
WO2008060642A2 (en) | 2006-02-10 | 2008-05-22 | The Research Foundation Of State University Of New York | High density coupling of quantum dots to carbon nanotube surface for efficient photodetection |
US20080230120A1 (en) | 2006-02-13 | 2008-09-25 | Solexant Corp. | Photovoltaic device with nanostructured layers |
EP1989745A1 (en) | 2006-02-17 | 2008-11-12 | Solexant Corporation | Nanostructured electroluminescent device and display |
CN101421664B (zh) | 2006-03-02 | 2011-08-31 | 化合物光子学公司 | 光寻址空间光调制器以及方法 |
WO2007099880A1 (en) | 2006-03-03 | 2007-09-07 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting material, light emitting element, light emitting device and electronic device |
AU2007314229A1 (en) | 2006-03-23 | 2008-05-08 | Solexant Corp. | Photovoltaic device containing nanoparticle sensitized carbon nanotubes |
US8247801B2 (en) | 2006-03-31 | 2012-08-21 | Imec | Organic semi-conductor photo-detecting device |
WO2007131126A2 (en) | 2006-05-03 | 2007-11-15 | Rochester Institute Of Technology | Multi-junction, photovoltaic devices with nanostructured spectral enhancements and methods thereof |
JP2008016831A (ja) | 2006-06-09 | 2008-01-24 | Sumitomo Chemical Co Ltd | 光−光変換デバイス |
WO2008105792A2 (en) | 2006-06-24 | 2008-09-04 | Qd Vision, Inc. | Methods for depositing nanomaterial, methods for fabricating a device, methods for fabricating an array of devices and compositions |
TWI312531B (en) | 2006-06-30 | 2009-07-21 | Nat Taiwan Universit | Photoelectric device and fabrication method thereof |
US7955889B1 (en) | 2006-07-11 | 2011-06-07 | The Trustees Of Princeton University | Organic photosensitive cells grown on rough electrode with nano-scale morphology control |
SG175565A1 (en) * | 2006-09-29 | 2011-11-28 | Univ Florida | Method and apparatus for infrared detection and display |
US8080824B2 (en) | 2006-11-15 | 2011-12-20 | Academia Sinica | Suppressing recombination in an electronic device |
TW200847449A (en) | 2006-12-06 | 2008-12-01 | Solexant Corp | Nanophotovoltaic device with improved quantum efficiency |
US7799990B2 (en) | 2007-03-12 | 2010-09-21 | Northwestern University | Electron-blocking layer / hole-transport layer for organic photovoltaics and applications of same |
US20100044676A1 (en) | 2008-04-18 | 2010-02-25 | Invisage Technologies, Inc. | Photodetectors and Photovoltaics Based on Semiconductor Nanocrystals |
EP2432015A1 (en) | 2007-04-18 | 2012-03-21 | Invisage Technologies, Inc. | Materials, systems and methods for optoelectronic devices |
WO2009002551A1 (en) | 2007-06-26 | 2008-12-31 | Qd Vision, Inc. | Photovoltaic devices including quantum dot down-conversion materials useful for solar cells and materials including quantum dots |
KR100838088B1 (ko) | 2007-07-03 | 2008-06-16 | 삼성에스디아이 주식회사 | 유기 발광 소자 |
EP2174329B1 (de) | 2007-07-23 | 2011-02-09 | Basf Se | Photovoltaische tandem-zelle |
DE102007043648A1 (de) | 2007-09-13 | 2009-03-19 | Siemens Ag | Organischer Photodetektor zur Detektion infraroter Strahlung, Verfahren zur Herstellung dazu und Verwendung |
AU2008334276B2 (en) | 2007-12-13 | 2014-03-20 | Merck Patent Gmbh | Photovoltaic cells comprising group IV-VI semiconductor core-shell nanocrystals |
US8552358B2 (en) * | 2007-12-18 | 2013-10-08 | Marek T. Michalewicz | Quantum tunneling photodetector array including electrode nano wires |
JP5162271B2 (ja) | 2008-02-15 | 2013-03-13 | Agcテクノグラス株式会社 | 光学多層膜付きガラス部材とその製造方法 |
KR20090089073A (ko) | 2008-02-18 | 2009-08-21 | 삼성모바일디스플레이주식회사 | 실란일아민계 화합물 및 이를 포함한 유기막을 구비한 유기발광 소자 |
US20090208776A1 (en) | 2008-02-19 | 2009-08-20 | General Electric Company | Organic optoelectronic device and method for manufacturing the same |
US20090214967A1 (en) | 2008-02-26 | 2009-08-27 | Fuji Xerox Co., Ltd. | Electrophotographic photoreceptor, and image forming apparatus and process cartridge using the same |
US20090217967A1 (en) | 2008-02-29 | 2009-09-03 | International Business Machines Corporation | Porous silicon quantum dot photodetector |
JP5108806B2 (ja) | 2008-03-07 | 2012-12-26 | 富士フイルム株式会社 | 光電変換素子及び撮像素子 |
US20110011456A1 (en) | 2008-03-19 | 2011-01-20 | Liyuan Han | Photosensitizer and solar cell using the same |
KR101995370B1 (ko) | 2008-04-03 | 2019-07-02 | 삼성 리서치 아메리카 인코포레이티드 | 양자점들을 포함하는 발광 소자 |
JP4533939B2 (ja) | 2008-04-10 | 2010-09-01 | 三菱重工業株式会社 | 赤外線検出素子、赤外線検出装置及び赤外線検出素子の製造方法 |
US7821807B2 (en) | 2008-04-17 | 2010-10-26 | Epir Technologies, Inc. | Nonequilibrium photodetectors with single carrier species barriers |
JP2009272528A (ja) | 2008-05-09 | 2009-11-19 | Fujifilm Corp | 光電変換素子,光電変換素子の製造方法及び固体撮像素子 |
US8362517B2 (en) | 2008-06-11 | 2013-01-29 | Plextronics, Inc. | Encapsulation for organic optoelectronic devices |
JP5258037B2 (ja) | 2008-09-08 | 2013-08-07 | 国立大学法人京都大学 | 光電変換素子、その製造方法、及び太陽電池 |
US20100059097A1 (en) | 2008-09-08 | 2010-03-11 | Mcdonald Mark | Bifacial multijunction solar cell |
JP2010067802A (ja) | 2008-09-11 | 2010-03-25 | Seiko Epson Corp | 光電変換装置、電子機器、光電変換装置の製造方法および電子機器の製造方法 |
JP2010087205A (ja) | 2008-09-30 | 2010-04-15 | Kaneka Corp | 多接合型薄膜光電変換装置 |
EP2345096B1 (en) | 2008-10-28 | 2018-10-17 | The Regents of the University of Michigan | Stacked white oled having separate red, green and blue sub-elements |
TWI407610B (zh) | 2008-11-28 | 2013-09-01 | Univ Nat Chiao Tung | Infrared light distance sensing device for organic semiconductors |
KR101584990B1 (ko) | 2008-12-01 | 2016-01-13 | 엘지디스플레이 주식회사 | 백색 유기 발광 소자 및 이의 제조 방법 |
US7968215B2 (en) | 2008-12-09 | 2011-06-28 | Global Oled Technology Llc | OLED device with cyclobutene electron injection materials |
US8618727B2 (en) | 2008-12-19 | 2013-12-31 | Koninklijke Philips N.V. | Transparent organic light emitting diode |
JP2012515438A (ja) | 2009-01-12 | 2012-07-05 | ザ リージェンツ オブ ザ ユニヴァシティ オブ ミシガン | 電子/正孔励起阻止層を用いた有機太陽電池の開路電圧の向上 |
US8563850B2 (en) | 2009-03-16 | 2013-10-22 | Stion Corporation | Tandem photovoltaic cell and method using three glass substrate configuration |
DE102009018647A1 (de) | 2009-04-23 | 2010-10-28 | Osram Opto Semiconductors Gmbh | Strahlungsemittierende Vorrichtung |
JP2010263030A (ja) | 2009-05-01 | 2010-11-18 | Japan Advanced Institute Of Science & Technology Hokuriku | 有機el素子 |
GB2470006B (en) | 2009-05-05 | 2012-05-23 | Cambridge Display Tech Ltd | Device and method of forming a device |
TWI380490B (en) | 2009-05-05 | 2012-12-21 | Univ Nat Chiao Tung | Organic photosensitive photoelectric device |
GB0909818D0 (en) | 2009-06-08 | 2009-07-22 | Isis Innovation | Device |
WO2010142575A2 (en) | 2009-06-11 | 2010-12-16 | Oerlikon Solar Ag, Trübbach | Tandem solar cell integrated in a double insulating glass window for building integrated photovoltaic applications |
JP2011098948A (ja) * | 2009-06-25 | 2011-05-19 | Yamagata Promotional Organization For Industrial Technology | ビピリジン誘導体及びそれを含む有機エレクトロルミネッセンス素子 |
US9496315B2 (en) | 2009-08-26 | 2016-11-15 | Universal Display Corporation | Top-gate bottom-contact organic transistor |
JP2011065927A (ja) | 2009-09-18 | 2011-03-31 | Toshiba Corp | 発光装置 |
WO2011033974A1 (ja) | 2009-09-18 | 2011-03-24 | コニカミノルタホールディングス株式会社 | タンデム型有機光電変換素子、および太陽電池 |
US20110073835A1 (en) | 2009-09-29 | 2011-03-31 | Xiaofan Ren | Semiconductor nanocrystal film |
WO2011041407A1 (en) | 2009-09-29 | 2011-04-07 | Research Triangle Institute, International | Quantum dot-fullerene junction optoelectronic devices |
US9054262B2 (en) | 2009-09-29 | 2015-06-09 | Research Triangle Institute | Integrated optical upconversion devices and related methods |
KR101608903B1 (ko) | 2009-11-16 | 2016-04-20 | 삼성전자주식회사 | 적외선 이미지 센서 |
WO2011066396A2 (en) * | 2009-11-24 | 2011-06-03 | University Of Florida Research Foundation, Inc. | Method and apparatus for sensing infrared radiation |
CN101794834B (zh) | 2009-12-14 | 2013-06-12 | 湖南共创光伏科技有限公司 | 设有上转换荧光材料膜层的高效太阳能薄膜电池及其膜层制备方法 |
BR112012029738A2 (pt) | 2010-05-24 | 2016-08-09 | Nanoholdings Llc | método e aparelho para fornecer uma camada de bloqueio de carga em um dispositivo de conversão ascendente de infravermelho |
CN101872793B (zh) | 2010-07-02 | 2013-06-05 | 福建钧石能源有限公司 | 叠层太阳能电池及其制造方法 |
US9082922B2 (en) | 2010-08-18 | 2015-07-14 | Dayan Ban | Organic/inorganic hybrid optical amplifier with wavelength conversion |
WO2012071107A1 (en) | 2010-11-23 | 2012-05-31 | Qd Vision, Inc. | Device including semiconductor nanocrystals & method |
MX2013005780A (es) | 2010-11-23 | 2013-06-28 | Nanoholdings Llc | Fotodetectores infrarrojos con alta capacidad de deteccion en voltaje de accionamiento bajo. |
KR101890748B1 (ko) | 2011-02-01 | 2018-08-23 | 삼성전자주식회사 | 멀티 스택 씨모스(cmos) 이미지 센서의 화소 및 그 제조방법 |
SG192277A1 (en) | 2011-02-28 | 2013-09-30 | Univ Florida | Photodetector and upconversion device with gain (ec) |
RU2013139232A (ru) | 2011-02-28 | 2015-04-10 | Юниверсити Оф Флорида Рисеч Фаундэйшн, Инк. | Устройства преобразования с повышением частоты, содержащие широкополосный поглотитель |
US20140060613A1 (en) | 2011-04-05 | 2014-03-06 | Nanoholdings, Llc | Method and apparatus for integrating an infrared (ir) photovoltaic cell on a thin film photovoltaic cell |
WO2012170456A2 (en) | 2011-06-06 | 2012-12-13 | University Of Florida Research Foundation, Inc. | Infrared imaging device integrating an ir up-conversion device with a cmos image sensor |
US9437835B2 (en) | 2011-06-06 | 2016-09-06 | University Of Florida Research Foundation, Inc. | Transparent infrared-to-visible up-conversion device |
WO2012168192A2 (en) | 2011-06-07 | 2012-12-13 | Bayer Intellectual Property Gmbh | Synthesis of highly fluorescing semiconducting core-shell nanoparticles based on ib, iib, iiia, via elements of the periodic classification. |
WO2012178071A2 (en) | 2011-06-23 | 2012-12-27 | Brown University | Device and methods for temperature and humidity measurements using a nanocomposite film sensor |
BR112013033122A2 (pt) | 2011-06-30 | 2017-01-24 | Nanoholdings Llc | método e aparelho para detectar radiação infravermelha com ganho |
JP5853486B2 (ja) | 2011-08-18 | 2016-02-09 | ソニー株式会社 | 撮像装置および撮像表示システム |
EP2599898A1 (en) | 2011-12-01 | 2013-06-05 | Bayer Intellectual Property GmbH | Continuous synthesis of high quantum yield InP/ZnS nanocrystals |
KR20150109450A (ko) | 2013-01-25 | 2015-10-01 | 유니버시티 오브 플로리다 리서치 파운데이션, 아이엔씨. | 용액 처리된 pbs 광검출기를 이용한 신규 ir 이미지 센서 |
-
2012
- 2012-07-02 BR BR112013033122A patent/BR112013033122A2/pt not_active IP Right Cessation
- 2012-07-02 EP EP12804913.7A patent/EP2727154B1/en active Active
- 2012-07-02 JP JP2014519228A patent/JP6502093B2/ja not_active Expired - Fee Related
- 2012-07-02 CA CA2840498A patent/CA2840498A1/en not_active Abandoned
- 2012-07-02 US US14/129,225 patent/US10134815B2/en not_active Expired - Fee Related
- 2012-07-02 AU AU2012275060A patent/AU2012275060A1/en not_active Abandoned
- 2012-07-02 MX MX2013015214A patent/MX2013015214A/es not_active Application Discontinuation
- 2012-07-02 RU RU2014102650/28A patent/RU2014102650A/ru not_active Application Discontinuation
- 2012-07-02 WO PCT/US2012/045272 patent/WO2013003850A2/en active Application Filing
- 2012-07-02 CN CN201280031610.7A patent/CN103733355B/zh not_active Expired - Fee Related
- 2012-07-02 KR KR1020147002758A patent/KR102059208B1/ko active IP Right Grant
-
2017
- 2017-01-03 US US15/397,656 patent/US20170117335A1/en not_active Abandoned
- 2017-05-10 JP JP2017093969A patent/JP6513733B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CA2840498A1 (en) | 2013-01-03 |
MX2013015214A (es) | 2014-03-21 |
JP6513733B2 (ja) | 2019-05-15 |
KR20140064767A (ko) | 2014-05-28 |
KR102059208B1 (ko) | 2020-02-07 |
EP2727154A2 (en) | 2014-05-07 |
BR112013033122A2 (pt) | 2017-01-24 |
JP2014521214A (ja) | 2014-08-25 |
JP2017175149A (ja) | 2017-09-28 |
EP2727154B1 (en) | 2019-09-18 |
AU2012275060A1 (en) | 2014-01-30 |
US20170117335A1 (en) | 2017-04-27 |
WO2013003850A3 (en) | 2013-04-11 |
EP2727154A4 (en) | 2015-03-04 |
US20140217284A1 (en) | 2014-08-07 |
CN103733355B (zh) | 2017-02-08 |
WO2013003850A2 (en) | 2013-01-03 |
CN103733355A (zh) | 2014-04-16 |
RU2014102650A (ru) | 2015-08-10 |
WO2013003850A8 (en) | 2013-05-16 |
US10134815B2 (en) | 2018-11-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6513733B2 (ja) | 利得を伴って赤外線放射を検出する方法および装置 | |
KR102031996B1 (ko) | Cmos 이미지 센서를 갖는 ir 업 컨버전 디바이스를 집적한 적외선 이미징 디바이스 | |
US9997571B2 (en) | Method and apparatus for providing a charge blocking layer on an infrared up-conversion device | |
US20150372046A1 (en) | A NOVEL IR IMAGE SENSOR USING A SOLUTION-PROCESSED PbS PHOTODETECTOR | |
US9437835B2 (en) | Transparent infrared-to-visible up-conversion device | |
US9190458B2 (en) | Method and apparatus for providing a window with an at least partially transparent one side emitting OLED lighting and an IR sensitive photovoltaic panel |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20150529 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20160216 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20160217 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20160513 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20160714 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20170110 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20170510 |
|
A911 | Transfer to examiner for re-examination before appeal (zenchi) |
Free format text: JAPANESE INTERMEDIATE CODE: A911 Effective date: 20170704 |
|
A912 | Re-examination (zenchi) completed and case transferred to appeal board |
Free format text: JAPANESE INTERMEDIATE CODE: A912 Effective date: 20170825 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20180627 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20180727 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20180817 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20181211 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20190320 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 6502093 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
LAPS | Cancellation because of no payment of annual fees |