JP6463394B2 - 質量分析装置 - Google Patents
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- H01J49/0409—Sample holders or containers
- H01J49/0418—Sample holders or containers for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/64—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/2806—Means for preparing replicas of specimens, e.g. for microscopal analysis
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/2813—Producing thin layers of samples on a substrate, e.g. smearing, spinning-on
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/622—Ion mobility spectrometry
- G01N27/623—Ion mobility spectrometry combined with mass spectrometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
- G01N33/50—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing
- G01N33/68—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing involving proteins, peptides or amino acids
- G01N33/6803—General methods of protein analysis not limited to specific proteins or families of proteins
- G01N33/6848—Methods of protein analysis involving mass spectrometry
- G01N33/6851—Methods of protein analysis involving laser desorption ionisation mass spectrometry
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0004—Imaging particle spectrometry
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
- H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
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- H01J49/26—Mass spectrometers or separator tubes
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- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
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Description
図15に示すように、第1の変形例に係る試料支持体2Aは、基板21に枠体22が設けられておらず、基板21の一面21aに粘着テープTが直接貼り付けられている点で、試料支持体2と主に相違する。粘着テープTは、粘着面Taが基板21の一面21aに対向し、且つ、基板21の外縁よりも外側に延在する部分を有するように、一面21aの外縁部に貼り付けられている。これにより、図15に示すように、粘着面Taを基板21の外縁及び試料台1の載置面1aに貼り付けることができる。その結果、試料支持体2Aは、粘着テープTによって試料台1に対して固定される。試料支持体2Aによれば、例えば表面に凹凸を有する試料10の質量分析を行う場合等において、試料10に対する基板21の追従性を向上させることができる。
図16に示すように、第2の変形例に係る試料支持体2Bは、基板21の外縁よりも外側に延在する部分を有する枠体122を備える点で、試料支持体2と主に相違する。このような枠体122により、試料支持体2Bを持ち運ぶ際等において、基板21の端部の破損を適切に抑制することができる。さらに、図16に示すように、枠体122において基板21の外縁よりも外側に延在する部分には、ネジ30を挿通させるための挿通孔122aが設けられている。この場合、例えば挿通孔122aに対応する位置にネジ孔1bを有する試料台1Aを用いることで、ネジ留めによって試料支持体2Bを試料台1Aに確実に固定することができる。具体的には、挿通孔122a及びネジ孔1bにネジ30を挿通させることで、試料支持体2Bを試料台1Aに固定することができる。
図17に示すように、第3の変形例に係る試料支持体2Cは、基板21の他面21bの外縁部に設けられ、一面21aから他面21bに向かう方向を向く粘着面24aを有する粘着層24を備える点で、試料支持体2と主に相違する。粘着層24は、例えば測定対象の試料10の厚みに応じて予め設定された厚さを有する両面テープ等である。例えば、粘着層24の一方の粘着面24bは、予め基板21の他面21bの外縁部に貼り付けられており、粘着層24の他方の粘着面24aは、試料支持体2Cを試料台1に固定する際に、載置面1aに貼り付けられる。試料支持体2Cによれば、試料支持体2Cを試料台1に固定する構成を単純化することができる。
Claims (2)
- 一面から他面にかけて貫通する複数の貫通孔が設けられた基板と、導電性材料からなり、少なくとも前記一面において前記貫通孔が設けられていない部分を覆う導電層と、を備える試料支持体であって、前記他面側に配置されたイメージング質量分析の対象となる薄膜状の試料を毛細管現象によって前記複数の貫通孔を介して前記他面から前記一面に移動させるための領域として機能する実効領域を有する前記試料支持体を用いて質量分析を行うための質量分析装置であって、
前記基板の厚み方向から見て前記試料が前記実効領域と重なり、且つ、前記基板の前記他面が前記試料に対向するように、前記試料及び前記試料支持体が載置される試料台と、
前記実効領域を予め定められた移動幅及び移動方向に従って2次元走査することにより、照射位置を変えながら前記一面にレーザを照射するレーザ照射部と、
前記レーザの照射によりイオン化された前記試料を前記照射位置毎に検出する検出部と、を備える、質量分析装置。 - 導電性材料からなり、一面から他面にかけて貫通する複数の貫通孔が設けられた基板を備える試料支持体であって、前記他面側に配置されたイメージング質量分析の対象となる薄膜状の試料を毛細管現象によって前記複数の貫通孔を介して前記他面から前記一面に移動させるための領域として機能する実効領域を有する前記試料支持体を用いて質量分析を行うための質量分析装置であって、
前記基板の厚み方向から見て前記試料が前記実効領域と重なり、且つ、前記基板の前記他面が前記試料に対向するように、前記試料及び前記試料支持体が載置される試料台と、
前記実効領域を予め定められた移動幅及び移動方向に従って2次元走査することにより、照射位置を変えながら前記一面にレーザを照射するレーザ照射部と、
前記レーザの照射によりイオン化された前記試料を前記照射位置毎に検出する検出部と、を備える、質量分析装置。
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EP (3) | EP3214436B1 (ja) |
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JP6983520B2 (ja) * | 2017-03-08 | 2021-12-17 | 浜松ホトニクス株式会社 | 質量分析装置及び質量分析方法 |
JP6535150B1 (ja) | 2017-09-21 | 2019-06-26 | 浜松ホトニクス株式会社 | 試料支持体 |
JP6899295B2 (ja) * | 2017-09-21 | 2021-07-07 | 浜松ホトニクス株式会社 | レーザ脱離イオン化法及び質量分析方法 |
EP3686591A4 (en) | 2017-09-21 | 2021-06-23 | Hamamatsu Photonics K.K. | SAMPLE CARRIERS |
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