JP6417137B2 - コンデンサの絶縁抵抗測定装置 - Google Patents

コンデンサの絶縁抵抗測定装置 Download PDF

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Publication number
JP6417137B2
JP6417137B2 JP2014144508A JP2014144508A JP6417137B2 JP 6417137 B2 JP6417137 B2 JP 6417137B2 JP 2014144508 A JP2014144508 A JP 2014144508A JP 2014144508 A JP2014144508 A JP 2014144508A JP 6417137 B2 JP6417137 B2 JP 6417137B2
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Japan
Prior art keywords
capacitor
resistor
voltage
insulation resistance
current
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JP2014144508A
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English (en)
Japanese (ja)
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JP2016020842A (ja
Inventor
義徳 久保
義徳 久保
教文 河村
教文 河村
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Humo Laboratory Ltd
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Humo Laboratory Ltd
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Priority to JP2014144508A priority Critical patent/JP6417137B2/ja
Priority to TW104119590A priority patent/TWI647458B/zh
Priority to KR1020150097755A priority patent/KR102369138B1/ko
Priority to CN201510410320.9A priority patent/CN105319443B/zh
Publication of JP2016020842A publication Critical patent/JP2016020842A/ja
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Publication of JP6417137B2 publication Critical patent/JP6417137B2/ja
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  • Measurement Of Resistance Or Impedance (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
JP2014144508A 2014-07-14 2014-07-14 コンデンサの絶縁抵抗測定装置 Active JP6417137B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2014144508A JP6417137B2 (ja) 2014-07-14 2014-07-14 コンデンサの絶縁抵抗測定装置
TW104119590A TWI647458B (zh) 2014-07-14 2015-06-17 Capacitor insulation resistance measuring device
KR1020150097755A KR102369138B1 (ko) 2014-07-14 2015-07-09 콘덴서의 절연 저항 측정 장치
CN201510410320.9A CN105319443B (zh) 2014-07-14 2015-07-14 电容器的绝缘电阻测定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014144508A JP6417137B2 (ja) 2014-07-14 2014-07-14 コンデンサの絶縁抵抗測定装置

Publications (2)

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JP2016020842A JP2016020842A (ja) 2016-02-04
JP6417137B2 true JP6417137B2 (ja) 2018-10-31

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JP2014144508A Active JP6417137B2 (ja) 2014-07-14 2014-07-14 コンデンサの絶縁抵抗測定装置

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JP (1) JP6417137B2 (zh)
KR (1) KR102369138B1 (zh)
CN (1) CN105319443B (zh)
TW (1) TWI647458B (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10782348B2 (en) * 2017-03-10 2020-09-22 Keithley Instruments, Llc Automatic device detection and connection verification
CN114441905A (zh) * 2021-12-17 2022-05-06 浙江八达电子仪表有限公司时通电气分公司 一种用于电力二次设备绝缘检测的装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1073189A (en) * 1963-12-19 1967-06-21 Electronic Instr Ltd Improvements in and relating to electrical measuring and like instruments
US4378521A (en) * 1981-10-15 1983-03-29 General Dynamics, Pomona Division Active zener diode substitute circuit
JP2841345B2 (ja) * 1990-03-05 1998-12-24 マルコン電子株式会社 コンデンサの直流電圧印加試験回路
JP3259370B2 (ja) * 1992-10-19 2002-02-25 株式会社村田製作所 コンデンサの絶縁抵抗測定装置
JPH08262076A (ja) * 1995-03-27 1996-10-11 Murata Mfg Co Ltd コンデンサの絶縁抵抗測定装置
JP3391310B2 (ja) * 1999-09-22 2003-03-31 株式会社村田製作所 容量性電子部品の絶縁抵抗測定装置
JP2005094543A (ja) * 2003-09-19 2005-04-07 Yokogawa Electric Corp 反転増幅器の駆動不良検出回路、及び過負荷検出装置
JP4746489B2 (ja) * 2006-06-28 2011-08-10 株式会社リコー 半導体測定装置
JP2008191064A (ja) * 2007-02-07 2008-08-21 Produce:Kk アクティブプローブを備えた電気特性検査装置
US8054085B2 (en) * 2008-03-31 2011-11-08 Electro Scientific Industries, Inc. Programmable gain trans-impedance amplifier overload recovery circuit
CN202351315U (zh) * 2011-11-30 2012-07-25 深圳市隆芯微电子有限公司 一种电压值的测定电路
CN110837021A (zh) 2012-07-10 2020-02-25 慧萌高新科技有限公司 片状电子部件的检查方法以及检查装置
CN103293386B (zh) * 2013-05-31 2015-11-04 湖北三江航天红峰控制有限公司 一种绝缘电阻的测试装置及方法

Also Published As

Publication number Publication date
CN105319443B (zh) 2019-12-10
TW201606318A (zh) 2016-02-16
KR20160008470A (ko) 2016-01-22
CN105319443A (zh) 2016-02-10
TWI647458B (zh) 2019-01-11
KR102369138B1 (ko) 2022-02-28
JP2016020842A (ja) 2016-02-04

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