JP6334703B2 - 電子デバイスおよびその使用 - Google Patents
電子デバイスおよびその使用 Download PDFInfo
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- JP6334703B2 JP6334703B2 JP2016534924A JP2016534924A JP6334703B2 JP 6334703 B2 JP6334703 B2 JP 6334703B2 JP 2016534924 A JP2016534924 A JP 2016534924A JP 2016534924 A JP2016534924 A JP 2016534924A JP 6334703 B2 JP6334703 B2 JP 6334703B2
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- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 6
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 4
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- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 description 1
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- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 1
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- GFQYVLUOOAAOGM-UHFFFAOYSA-N zirconium(iv) silicate Chemical compound [Zr+4].[O-][Si]([O-])([O-])[O-] GFQYVLUOOAAOGM-UHFFFAOYSA-N 0.000 description 1
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- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
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- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
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Description
さらにこの顔料22は、上記の電子デバイスを可視の電磁波スペクトルの任意の色に色付けする、すなわちこの電子デバイスの観察者にはこれに対応した色刺激を生起するように好適に構成されている。この顔料22は、上述したように、この顔料22が基質材料20の中に配設されており、またこの放射線を反射する粒子21がこの顔料に用いられてよい。たとえば基質材料20の出発原料は、電子デバイス100の製造の際に、顔料22が設けられるかまたはこれと置換されてよく、ここでこの顔料は、この基質材料の出発原料の中に押し出されてよい。たとえば、場合によっては、システム、放射線を反射する部品(下記参照)、または他の部品と調和して、観察者または使用者に対し、この電子デバイス100が色刺激として青色を生起するように、この顔料はコバルト(Co)を含んでよい。代替として、他の色印象を実現するための他の顔料が選択されてよい。
代替としてまたは追加的に、この電子デバイス100は、たとえば上記の電極3および4を介して、LGAシステムとして形成することができる。「LGA」は、“land-grid-array”(“land”は「コンタクトエリア」(“Kontaktflaeche”)に対する英語表現であり、“grid”は「格子」(“Gitter”、“Raster”、または“Netz”)に対する英語表現であり、“array”は「アレイ」(“Feld”)に対する英語表現である。)の省略形である。LGAシステムでは、電子デバイスあるいは回路の接続端子は、その下面にコンタクトエリア(複数)のチェス板のような領域の形態(“grid array”)で実装されている。これはBGAシステム(“ball grid array”)と類似しており、このBGAシステムは、はんだ粒すなわちはんだボール(“ball”)を電気的接続に利用している。
2 : 反射構造体
3 : 外部電極
4 : 内部電極
5 : 電極領域
6 : 保護層
7 : バリア層
20 : 基質材料
21 : 放射線を反射する粒子
22 : 顔料
50 : 放射線を放出する部品
100 : 電子デバイス
200 : システム
Claims (18)
- 反射構造体(2)が設けられている機能体(1)を有する電子デバイス(100)であって、
前記反射構造体(2)は、前記電子デバイス(100)に当たる外部からの放射線を前記機能体(1)から離れるように反射するように配設および形成されており、
前記電子デバイス(100)は、前記反射構造体(2)上に配設されている保護層(6)を備え、
前記保護層(6)が顔料(22)を含み、当該顔料は、前記電子デバイス(100)の色が、前記電子デバイス(200)が設けられている1つのシステム(200)における前記電子デバイス(100)の周囲の色に合わせるように形成されている、
ことを特徴とする電子デバイス。 - 前記反射構造体(2)の外側表面の材料は電気絶縁性であることを特徴とする、請求項1に記載の電子デバイス。
- 前記機能体(1)は、機能素子としてセラミックを含むことを特徴とする請求項1または2に記載の電子デバイス。
- 前記機能体(1)は、機能素子として非セラミックの半導体材料を含むことを特徴とする請求項1または2に記載の電子デバイス。
- 前記反射構造体(2)は、1μm〜10μmの層厚を有することを特徴とする、請求項1乃至4のいずれか1項に記載の電子デバイス。
- 前記反射構造体(2)は、外部から前記電子デバイス(100)に当たる所定のスペクトル領域の電磁放射線に対し、上記の機能体(1)よりも大きな反射率または反射度を有し、当該所定のスペクトル領域は、可視光のスペクトル領域を含むか、または、可視光のスペクトル領域から成ることを特徴とする、請求項1乃至5のいずれか1項に記載の電子デバイス。
- 前記反射構造体(2)は、前記反射構造体が外部から前記電子デバイス(100)に当たる放射線に対し、R>0.9の反射率または反射度を有するように形成されていることを特徴とする、請求項1乃至6のいずれか1項に記載の電子デバイス。
- 前記電子デバイスは、前記機能体(1)の内部に配設されている、電気的に互いに絶縁された複数の内部電極(4)と、前記機能体(1)の外部に配設されている、複数の外部電極(3)とを備え、
2つの外部電極(3)は、電気的に互いに絶縁されており、かつ互いに絶縁された異なる内部電極(4)と電気的に導通して結合されている、
ことを特徴とする、請求項1乃至7のいずれか1項に記載の電子デバイス。 - 前記反射構造体(2)は、少なくとも部分的に前記複数の外部電極(3)と前記の機能体(1)との間に配設されており、かつ前記複数の外部電極(3)が前記複数の内部電極(4)と電気的に導通して結合されている電極領域(5)において分断されていることを特徴とする、請求項8に記載の電子デバイス。
- 前記反射構造体(2)は、当該反射構造体(2)の基質材料(20)中に配設されている、放射線を反射する複数の粒子(21)を含むことを特徴とする、請求項1乃至9のいずれか1項に記載の電子デバイス。
- 前記保護層(6)は、ガラスまたはエポキシ樹脂から成っているか、またはこれらの材料の1つを含むことを特徴とする、請求項1乃至10のいずれか1項に記載の電子デバイス。
- 前記保護層(6)は10nm〜1μmの層厚を有することを特徴とする、請求項11に記載の電子デバイス。
- 前記電子デバイス(100)は、前記機能体と前記反射構造体(2)との間に配設されているバリア層(7)を備えることを特徴とする、請求項1乃至12のいずれか1項に記載の電子デバイス。
- 前記反射構造体(2)は、前記機能体(1)の周囲に沿って前記機能体(1)を部分的にのみ包囲していることを特徴とする、請求項1乃至13のいずれか1項に記載の電子デバイス。
- 前記反射構造体(2)は、前記機能体(1)の周囲に沿って前記機能体(1)を完全に包囲していることを特徴とする、請求項1乃至12のいずれか1項に記載の電子デバイス。
- 前記電子デバイスは、バリスタ、コンデンサ、PTCデバイス、NTCデバイス、圧電デバイス、フェライトを含むデバイス、または半導体デバイスであることを特徴とする、請求項1乃至15のいずれか1項に記載の電子デバイス。
- 前記電子デバイスは表面実装可能に、および/または裏面実装すなわちフリップチップ実装で形成されていることを特徴とする、請求項1乃至16のいずれか1項に記載の電子デバイス。
- 放射線を放出する部品(50)と、請求項1乃至17のいずれか1項に記載の電子デバイス(100)とを有するシステム(200)であって、前記システム(200)は、前記反射構造体(2)が、前記放射線を放出する部品(50)から放出された放射線を反射するように構成されていることを特徴とするシステム。
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Family Cites Families (26)
Publication number | Priority date | Publication date | Assignee | Title |
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FR2228298B1 (ja) * | 1973-05-03 | 1978-01-06 | Ibm | |
IT1025091B (it) * | 1974-10-22 | 1978-08-10 | Leeds & Northrup Spa | Rivelatore per analizzatore a raggi infrarossi |
US5004339A (en) * | 1979-02-27 | 1991-04-02 | Diffracto Ltd. | Method and apparatus for determining physical characteristics of objects and object surfaces |
JPS6031218A (ja) * | 1983-07-29 | 1985-02-18 | 日本ケミコン株式会社 | リ−ドレス電子部品 |
JPH0310655Y2 (ja) * | 1985-01-11 | 1991-03-15 | ||
JPS639994A (ja) * | 1986-06-30 | 1988-01-16 | 関西日本電気株式会社 | 電子回路装置 |
JPS6469038A (en) * | 1987-09-10 | 1989-03-15 | Matsushita Electronics Corp | Resin-sealed semiconductor device |
JPH0521655A (ja) * | 1990-11-28 | 1993-01-29 | Mitsubishi Electric Corp | 半導体装置および半導体装置用パツケージ |
JPH04105715U (ja) * | 1991-02-19 | 1992-09-11 | 株式会社村田製作所 | 樹脂外装形電子部品 |
JP3378374B2 (ja) * | 1993-09-14 | 2003-02-17 | 株式会社東芝 | 樹脂封止型半導体装置の製造方法、樹脂封止型半導体装置及び封止用樹脂シート |
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AU695731B2 (en) * | 1995-06-21 | 1998-08-20 | Illinois Tool Works Inc. | Infrared shield for capacitors |
JP4576145B2 (ja) * | 2003-09-03 | 2010-11-04 | 住友軽金属工業株式会社 | 高反射プレコートアルミニウム合金板 |
US20050145405A1 (en) * | 2004-01-02 | 2005-07-07 | Chen Chia P. | Electric member having shielding device |
JP2006295104A (ja) * | 2004-07-23 | 2006-10-26 | Semiconductor Energy Lab Co Ltd | 発光素子およびそれを用いた発光装置 |
KR20070039600A (ko) * | 2004-07-26 | 2007-04-12 | 코닌클리즈케 필립스 일렉트로닉스 엔.브이. | 광 보호 수단을 포함하는 칩 및 그 제조 방법 |
JP4720825B2 (ja) * | 2005-04-01 | 2011-07-13 | パナソニック株式会社 | バリスタ |
US7671468B2 (en) * | 2005-09-30 | 2010-03-02 | Tdk Corporation | Light emitting apparatus |
JP4134135B2 (ja) * | 2005-09-30 | 2008-08-13 | Tdk株式会社 | 発光装置 |
KR100821274B1 (ko) * | 2006-07-19 | 2008-04-10 | 조인셋 주식회사 | 칩 세라믹 전자부품 |
WO2009075530A2 (en) | 2007-12-13 | 2009-06-18 | Amoleds Co., Ltd. | Semiconductor and manufacturing method thereof |
JP2010278358A (ja) * | 2009-05-29 | 2010-12-09 | Nitto Denko Corp | フレームレス太陽電池モジュール端部用粘着シール材、フレームレス太陽電池モジュールおよびその端部のシール構造 |
US9450556B2 (en) * | 2009-10-16 | 2016-09-20 | Avx Corporation | Thin film surface mount components |
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DE102012102114B4 (de) * | 2012-03-13 | 2021-09-16 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Strahlungsemittierendes Halbleiterbauteil, Beleuchtungsvorrichtung und Anzeigevorrichtung |
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