JP6299338B2 - 圧電素子、液体噴射ヘッド、液体噴射装置及びセンサー - Google Patents
圧電素子、液体噴射ヘッド、液体噴射装置及びセンサー Download PDFInfo
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- JP6299338B2 JP6299338B2 JP2014071237A JP2014071237A JP6299338B2 JP 6299338 B2 JP6299338 B2 JP 6299338B2 JP 2014071237 A JP2014071237 A JP 2014071237A JP 2014071237 A JP2014071237 A JP 2014071237A JP 6299338 B2 JP6299338 B2 JP 6299338B2
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- piezoelectric element
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- 239000007788 liquid Substances 0.000 title claims description 32
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 69
- 239000010936 titanium Substances 0.000 claims description 64
- 229910052719 titanium Inorganic materials 0.000 claims description 54
- 229910052742 iron Inorganic materials 0.000 claims description 45
- 238000000034 method Methods 0.000 claims description 36
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 34
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 25
- 229910052797 bismuth Inorganic materials 0.000 claims description 22
- 239000000463 material Substances 0.000 claims description 20
- 229910052697 platinum Inorganic materials 0.000 claims description 16
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 claims description 13
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- 150000004696 coordination complex Chemical class 0.000 description 20
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- 238000005238 degreasing Methods 0.000 description 14
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- 238000001035 drying Methods 0.000 description 13
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- TVMXDCGIABBOFY-UHFFFAOYSA-N octane Chemical compound CCCCCCCC TVMXDCGIABBOFY-UHFFFAOYSA-N 0.000 description 12
- 229910052451 lead zirconate titanate Inorganic materials 0.000 description 11
- 238000000576 coating method Methods 0.000 description 10
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- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 description 9
- 238000004519 manufacturing process Methods 0.000 description 9
- 239000000203 mixture Substances 0.000 description 9
- 229910052760 oxygen Inorganic materials 0.000 description 9
- 238000004544 sputter deposition Methods 0.000 description 9
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 8
- 239000011651 chromium Substances 0.000 description 8
- 238000004891 communication Methods 0.000 description 8
- 229910052726 zirconium Inorganic materials 0.000 description 8
- QTBSBXVTEAMEQO-UHFFFAOYSA-N acetic acid Substances CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 7
- 238000009826 distribution Methods 0.000 description 7
- 238000010438 heat treatment Methods 0.000 description 7
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 6
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- 230000015572 biosynthetic process Effects 0.000 description 6
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- 239000011248 coating agent Substances 0.000 description 6
- 238000004151 rapid thermal annealing Methods 0.000 description 6
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 6
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 5
- 230000006870 function Effects 0.000 description 5
- 229910052746 lanthanum Inorganic materials 0.000 description 5
- 239000001301 oxygen Substances 0.000 description 5
- 238000000059 patterning Methods 0.000 description 5
- 239000002994 raw material Substances 0.000 description 5
- KBPLFHHGFOOTCA-UHFFFAOYSA-N 1-Octanol Chemical compound CCCCCCCCO KBPLFHHGFOOTCA-UHFFFAOYSA-N 0.000 description 4
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 4
- AMQJEAYHLZJPGS-UHFFFAOYSA-N N-Pentanol Chemical compound CCCCCO AMQJEAYHLZJPGS-UHFFFAOYSA-N 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 4
- DIOQZVSQGTUSAI-UHFFFAOYSA-N decane Chemical compound CCCCCCCCCC DIOQZVSQGTUSAI-UHFFFAOYSA-N 0.000 description 4
- 238000000151 deposition Methods 0.000 description 4
- 239000010931 gold Substances 0.000 description 4
- ZSIAUFGUXNUGDI-UHFFFAOYSA-N hexan-1-ol Chemical compound CCCCCCO ZSIAUFGUXNUGDI-UHFFFAOYSA-N 0.000 description 4
- 229910052745 lead Inorganic materials 0.000 description 4
- HFGPZNIAWCZYJU-UHFFFAOYSA-N lead zirconate titanate Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ti+4].[Zr+4].[Pb+2] HFGPZNIAWCZYJU-UHFFFAOYSA-N 0.000 description 4
- 239000007791 liquid phase Substances 0.000 description 4
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 4
- 238000005192 partition Methods 0.000 description 4
- 229910052700 potassium Inorganic materials 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 239000000377 silicon dioxide Substances 0.000 description 4
- 235000012239 silicon dioxide Nutrition 0.000 description 4
- 239000011734 sodium Substances 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- VXUYXOFXAQZZMF-UHFFFAOYSA-N titanium(IV) isopropoxide Chemical compound CC(C)O[Ti](OC(C)C)(OC(C)C)OC(C)C VXUYXOFXAQZZMF-UHFFFAOYSA-N 0.000 description 4
- 229910001928 zirconium oxide Inorganic materials 0.000 description 4
- SMSVUYQRWYTTLI-UHFFFAOYSA-L 2-ethylhexanoate;iron(2+) Chemical compound [Fe+2].CCCCC(CC)C([O-])=O.CCCCC(CC)C([O-])=O SMSVUYQRWYTTLI-UHFFFAOYSA-L 0.000 description 3
- NJLQUTOLTXWLBV-UHFFFAOYSA-N 2-ethylhexanoic acid titanium Chemical compound [Ti].CCCCC(CC)C(O)=O.CCCCC(CC)C(O)=O.CCCCC(CC)C(O)=O.CCCCC(CC)C(O)=O NJLQUTOLTXWLBV-UHFFFAOYSA-N 0.000 description 3
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 3
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 3
- KQNKJJBFUFKYFX-UHFFFAOYSA-N acetic acid;trihydrate Chemical compound O.O.O.CC(O)=O KQNKJJBFUFKYFX-UHFFFAOYSA-N 0.000 description 3
- 239000000853 adhesive Substances 0.000 description 3
- 230000001070 adhesive effect Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 3
- NUMHJBONQMZPBW-UHFFFAOYSA-K bis(2-ethylhexanoyloxy)bismuthanyl 2-ethylhexanoate Chemical compound [Bi+3].CCCCC(CC)C([O-])=O.CCCCC(CC)C([O-])=O.CCCCC(CC)C([O-])=O NUMHJBONQMZPBW-UHFFFAOYSA-K 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 229940046892 lead acetate Drugs 0.000 description 3
- -1 magnesium oxide Chemical class 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 229910052758 niobium Inorganic materials 0.000 description 3
- 239000010955 niobium Substances 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 230000003647 oxidation Effects 0.000 description 3
- 238000007254 oxidation reaction Methods 0.000 description 3
- 238000002360 preparation method Methods 0.000 description 3
- 238000007789 sealing Methods 0.000 description 3
- 229910052708 sodium Inorganic materials 0.000 description 3
- 239000002904 solvent Substances 0.000 description 3
- YOBOXHGSEJBUPB-MTOQALJVSA-N (z)-4-hydroxypent-3-en-2-one;zirconium Chemical compound [Zr].C\C(O)=C\C(C)=O.C\C(O)=C\C(C)=O.C\C(O)=C\C(C)=O.C\C(O)=C\C(C)=O YOBOXHGSEJBUPB-MTOQALJVSA-N 0.000 description 2
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 description 2
- FHRAKXJVEOBCBQ-UHFFFAOYSA-L 2-ethylhexanoate;manganese(2+) Chemical compound [Mn+2].CCCCC(CC)C([O-])=O.CCCCC(CC)C([O-])=O FHRAKXJVEOBCBQ-UHFFFAOYSA-L 0.000 description 2
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 description 2
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 2
- 239000002202 Polyethylene glycol Substances 0.000 description 2
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 2
- 239000000443 aerosol Substances 0.000 description 2
- 150000004703 alkoxides Chemical class 0.000 description 2
- 229910052788 barium Inorganic materials 0.000 description 2
- VJFFDDQGMMQGTQ-UHFFFAOYSA-L barium(2+);2-ethylhexanoate Chemical compound [Ba+2].CCCCC(CC)C([O-])=O.CCCCC(CC)C([O-])=O VJFFDDQGMMQGTQ-UHFFFAOYSA-L 0.000 description 2
- 229910002115 bismuth titanate Inorganic materials 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- ZBCBWPMODOFKDW-UHFFFAOYSA-N diethanolamine Chemical compound OCCNCCO ZBCBWPMODOFKDW-UHFFFAOYSA-N 0.000 description 2
- 238000010790 dilution Methods 0.000 description 2
- 239000012895 dilution Substances 0.000 description 2
- NKZSPGSOXYXWQA-UHFFFAOYSA-N dioxido(oxo)titanium;lead(2+) Chemical compound [Pb+2].[O-][Ti]([O-])=O NKZSPGSOXYXWQA-UHFFFAOYSA-N 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 2
- RVLXVXJAKUJOMY-UHFFFAOYSA-N lanthanum;oxonickel Chemical compound [La].[Ni]=O RVLXVXJAKUJOMY-UHFFFAOYSA-N 0.000 description 2
- 238000000608 laser ablation Methods 0.000 description 2
- 229910052744 lithium Inorganic materials 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- WWZKQHOCKIZLMA-UHFFFAOYSA-N octanoic acid Chemical compound CCCCCCCC(O)=O WWZKQHOCKIZLMA-UHFFFAOYSA-N 0.000 description 2
- 239000003960 organic solvent Substances 0.000 description 2
- 150000002902 organometallic compounds Chemical class 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 229920001223 polyethylene glycol Polymers 0.000 description 2
- BITYAPCSNKJESK-UHFFFAOYSA-N potassiosodium Chemical compound [Na].[K] BITYAPCSNKJESK-UHFFFAOYSA-N 0.000 description 2
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 2
- 238000003980 solgel method Methods 0.000 description 2
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 238000001039 wet etching Methods 0.000 description 2
- 239000008096 xylene Substances 0.000 description 2
- QYIGOGBGVKONDY-UHFFFAOYSA-N 1-(2-bromo-5-chlorophenyl)-3-methylpyrazole Chemical compound N1=C(C)C=CN1C1=CC(Cl)=CC=C1Br QYIGOGBGVKONDY-UHFFFAOYSA-N 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 238000000018 DNA microarray Methods 0.000 description 1
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 description 1
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- YPQJHZKJHIBJAP-UHFFFAOYSA-N [K].[Bi] Chemical compound [K].[Bi] YPQJHZKJHIBJAP-UHFFFAOYSA-N 0.000 description 1
- UTBYQPSPFXHANA-UHFFFAOYSA-N [K].[Na].[Li] Chemical compound [K].[Na].[Li] UTBYQPSPFXHANA-UHFFFAOYSA-N 0.000 description 1
- INNSZZHSFSFSGS-UHFFFAOYSA-N acetic acid;titanium Chemical compound [Ti].CC(O)=O.CC(O)=O.CC(O)=O.CC(O)=O INNSZZHSFSFSGS-UHFFFAOYSA-N 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 239000012670 alkaline solution Substances 0.000 description 1
- ITHZDDVSAWDQPZ-UHFFFAOYSA-L barium acetate Chemical compound [Ba+2].CC([O-])=O.CC([O-])=O ITHZDDVSAWDQPZ-UHFFFAOYSA-L 0.000 description 1
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 description 1
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 description 1
- 229910002113 barium titanate Inorganic materials 0.000 description 1
- DJHZYHWLGNJISM-FDGPNNRMSA-L barium(2+);(z)-4-oxopent-2-en-2-olate Chemical compound [Ba+2].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O DJHZYHWLGNJISM-FDGPNNRMSA-L 0.000 description 1
- CPUJSIVIXCTVEI-UHFFFAOYSA-N barium(2+);propan-2-olate Chemical compound [Ba+2].CC(C)[O-].CC(C)[O-] CPUJSIVIXCTVEI-UHFFFAOYSA-N 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- FSAJRXGMUISOIW-UHFFFAOYSA-N bismuth sodium Chemical compound [Na].[Bi] FSAJRXGMUISOIW-UHFFFAOYSA-N 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 239000000872 buffer Substances 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- NPCUWXDZFXSRLT-UHFFFAOYSA-N chromium;2-ethylhexanoic acid Chemical compound [Cr].CCCCC(CC)C(O)=O NPCUWXDZFXSRLT-UHFFFAOYSA-N 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- QAEKNCDIHIGLFI-UHFFFAOYSA-L cobalt(2+);2-ethylhexanoate Chemical compound [Co+2].CCCCC(CC)C([O-])=O.CCCCC(CC)C([O-])=O QAEKNCDIHIGLFI-UHFFFAOYSA-L 0.000 description 1
- JUPWRUDTZGBNEX-UHFFFAOYSA-N cobalt;pentane-2,4-dione Chemical compound [Co].CC(=O)CC(C)=O.CC(=O)CC(C)=O.CC(=O)CC(C)=O JUPWRUDTZGBNEX-UHFFFAOYSA-N 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- KTMLBHVBHVXWKQ-UHFFFAOYSA-N dibismuth dioxido(dioxo)manganese Chemical compound [Bi+3].[Bi+3].[O-][Mn]([O-])(=O)=O.[O-][Mn]([O-])(=O)=O.[O-][Mn]([O-])(=O)=O KTMLBHVBHVXWKQ-UHFFFAOYSA-N 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000002149 energy-dispersive X-ray emission spectroscopy Methods 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000002241 glass-ceramic Substances 0.000 description 1
- IXQWNVPHFNLUGD-UHFFFAOYSA-N iron titanium Chemical compound [Ti].[Fe] IXQWNVPHFNLUGD-UHFFFAOYSA-N 0.000 description 1
- PVFSDGKDKFSOTB-UHFFFAOYSA-K iron(3+);triacetate Chemical compound [Fe+3].CC([O-])=O.CC([O-])=O.CC([O-])=O PVFSDGKDKFSOTB-UHFFFAOYSA-K 0.000 description 1
- LZKLAOYSENRNKR-LNTINUHCSA-N iron;(z)-4-oxoniumylidenepent-2-en-2-olate Chemical compound [Fe].C\C(O)=C\C(C)=O.C\C(O)=C\C(C)=O.C\C(O)=C\C(C)=O LZKLAOYSENRNKR-LNTINUHCSA-N 0.000 description 1
- 239000011254 layer-forming composition Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- 239000000395 magnesium oxide Substances 0.000 description 1
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 1
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 1
- 229940071125 manganese acetate Drugs 0.000 description 1
- UOGMEBQRZBEZQT-UHFFFAOYSA-L manganese(2+);diacetate Chemical compound [Mn+2].CC([O-])=O.CC([O-])=O UOGMEBQRZBEZQT-UHFFFAOYSA-L 0.000 description 1
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 229910000480 nickel oxide Inorganic materials 0.000 description 1
- 229910000484 niobium oxide Inorganic materials 0.000 description 1
- URLJKFSTXLNXLG-UHFFFAOYSA-N niobium(5+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Nb+5].[Nb+5] URLJKFSTXLNXLG-UHFFFAOYSA-N 0.000 description 1
- 229910000510 noble metal Inorganic materials 0.000 description 1
- ZBSCCQXBYNSKPV-UHFFFAOYSA-N oxolead;oxomagnesium;2,4,5-trioxa-1$l^{5},3$l^{5}-diniobabicyclo[1.1.1]pentane 1,3-dioxide Chemical compound [Mg]=O.[Pb]=O.[Pb]=O.[Pb]=O.O1[Nb]2(=O)O[Nb]1(=O)O2 ZBSCCQXBYNSKPV-UHFFFAOYSA-N 0.000 description 1
- GNRSAWUEBMWBQH-UHFFFAOYSA-N oxonickel Chemical compound [Ni]=O GNRSAWUEBMWBQH-UHFFFAOYSA-N 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000004038 photonic crystal Substances 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 239000002096 quantum dot Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000000992 sputter etching Methods 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- 239000002562 thickening agent Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/135—Nozzles
- B41J2/14—Structure thereof only for on-demand ink jet heads
- B41J2/14201—Structure of print heads with piezoelectric elements
- B41J2/14233—Structure of print heads with piezoelectric elements of film type, deformed by bending and disposed on a diaphragm
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/704—Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings
- H10N30/706—Piezoelectric or electrostrictive devices based on piezoelectric or electrostrictive films or coatings characterised by the underlying bases, e.g. substrates
- H10N30/708—Intermediate layers, e.g. barrier, adhesion or growth control buffer layers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
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Description
図1は、本発明の実施形態1に係る液体噴射ヘッドの一例であるインクジェット式記録ヘッドの分解斜視図であり、図2は、図1の平面図である。また、図3(a)は、図2のA−A′線に準ずる断面図であり、図3(b)は、図3(a)のB−B′線に準ずる断面図である。
<基板の準備>
まず、単結晶シリコン基板上に弾性膜51として二酸化シリコン膜を熱酸化にて厚さ1170nmで形成した。次に、二酸化シリコン膜上にスパッタ法にて厚さ285nmのジルコニウム膜を形成し、熱酸化することで絶縁体膜52として厚さ400nmの酸化ジルコニウム膜を形成した。その後、酸化ジルコニウム膜上にスパッタ法にて厚さ20nmのチタン膜を形成し、熱酸化することで密着層56として酸化チタン膜を形成した。次に、酸化チタン膜上に、スパッタ法により600℃で厚さ130nmの白金膜(Pt)からなり、(111)面に優先配向している第1電極60を形成して電極付き基板とした。
2−エチルヘキサン酸ビスマス、2−エチルヘキサン酸鉄、2−エチルヘキサン酸チタンのn−オクタン溶液(いずれも0.5mol/L)を、各元素がモル比でBi:Fe:Tiのモル比が、120:60:40となるように混合して、Bi、Fe及びTiを含む原料溶液(以下、「BFT原料溶液」という)を調製し、n−オクタンで希釈を行いシード層の前駆体溶液(以下、「BFT前駆体溶液」という)とした。なお、BFT原料溶液に対するn−オクタンの希釈割合は、BFT原料溶液:n−オクタンで1:7とした。このBFT前駆体溶液を用いることにより、Biと、Fe及びTiとのモル比(Bi/(Fe+Ti))が1.2、FeとTiとのモル比(Fe/Ti)が1.5となる組成を有するシード層65が後述する手順により形成される。
Bi、Ba、Fe、Ti及びMnを含むペロブスカイト構造を有する複合酸化物からなる圧電体膜72を形成するために、2−エチルヘキサン酸ビスマス、2−エチルヘキサン酸バリウム、2−エチルヘキサン酸鉄、2−エチルヘキサン酸チタン及び2−エチルヘキサン酸マンガンの各n−オクタン溶液を混合し、Bi:Ba:Fe:Ti:Mnのモル比が、Bi:Ba:Fe:Ti:Mn=75:25:71.25:25:3.75となるように混合して、Bi、Ba、Fe、Ti及びMnを含む圧電体層の前駆体溶液(以下、「BFM―BT前駆体溶液」という)を調製した(BFM:BT=75:25)。
前記BFT前駆体溶液を上記電極付き基板上に滴下し、3000rpmで前記電極付き基板を回転させてスピンコートすることによりシード層前駆体膜を形成した(シード層前駆体溶液塗布工程)。次に、180℃のホットプレート上で4分間加熱した後、350℃で4分間加熱した(シード層乾燥工程及びシード層脱脂工程)。次に、RTA装置を使用し、700℃で5分間焼成した(シード層焼成工程)。以上の工程により、Bi、Fe及びTiを含むペロブスカイト構造を有する複合酸化物(以下、「BFT」とも言う)からなり、膜状で厚さ15nmのシード層65を形成した。
次に、前記BFM―BT前駆体溶液を前記電極付き基板上に滴下し、3000rpmで前記電極付き基板を回転させてスピンコートすることにより圧電体層前駆体膜を形成した(塗布工程)。次に、180℃のホットプレート上で4分間加熱した後、350℃で4分間加熱した(乾燥工程及び脱脂工程)。この塗布工程、乾燥工程及び脱脂工程からなる工程を2回繰り返した後に、RTA装置を使用し、750℃で5分間酸素雰囲気中で焼成を行った(焼成工程)。次いで、上記塗布工程、乾燥工程、脱脂工程及び焼成工程からなる上記工程の組み合わせを同様に組み合わせた工程を6回繰り返し、計12回の塗布により、Bi、Ba、Fe、Ti及びMnを含むペロブスカイト構造を有する複合酸化物(以下、「BFM―BT」とも言う)であって、全体で厚さ900nmの12層の圧電体膜72からなる圧電体層70を形成した。
次に、圧電体層70上にスパッタ法により厚さ50nmのイリジウム膜を形成し、フォトリソグラフィーにより、所望のサイズにパターニングを行い、第2電極80を作製した。これにより、第1電極60、シード層65、圧電体層70及び第2電極80を具備する圧電素子300を作製した。
第1電極を構成する白金膜を厚さ50nmとした以外は、サンプル1と同様の手法により圧電素子を作製した。
第1電極を構成する白金膜を厚さ50nmとし、シード層を島状で厚さ10nmとした以外は、サンプル2と同様の手法により圧電素子を作製した。
シード層を厚さ8nmの島状とした以外は、サンプル2と同様の手法により圧電素子を作製した。
第1電極を構成する白金膜を330℃で厚さ130nmで形成した以外は、サンプル3と同様の手法により圧電素子を作製した。
以下のPZT前駆体溶液を用いて厚さ630nmの圧電体層を形成した以外は、サンプル3と同様の手法により圧電素子を作製した。
第1電極を構成する白金膜を室温で形成した以外は、サンプル1と同様の手法により圧電素子を作製した。
シード層を設けないで圧電体層を形成した以外はサンプル1と同様にした。
シード層を厚さ30nmの膜状とした以外は、サンプル1と同様にした。
Bruker AXS社製の「D8 Discover WithGADDS;微小領域X線回折装置」を用い、X線源にCuKα線を使用し、室温で、第2電極を形成する前にサンプル1〜8のX線回折チャートを求めた。図8に、サンプル1〜3の圧電体層のX線回折パターンを示し、図9に、サンプル4〜6の圧電体層のX線回折パターンを示す。図10に、サンプル7、8、9の圧電体層のX線回折パターンを示す。
サンプル1〜5、7〜9の圧電素子を具備する液体噴射ヘッドを作製し、45Vのパルス波形による電圧印加を行った場合の圧電素子(CAV)の変位量を求めた。変位量は、サンプル9の変位を1とした場合の変位割合として表し、表1に示した。
この結果、サンプル1〜5の圧電素子では、サンプル9と比較して変位量が向上することがわかった。
サンプル6の圧電素子について、厚さ方向の断面を、EFTEM(energy-filterring transmission electron microscope、エネルギーフィルタリング透過型電子顕微鏡)を用いて観察した。得られたEFTEM−BF(Bright Field)像を図11に示す。また、図11の第1電極60近傍の拡大写真を図12に示す。
以上、本発明の一実施形態について説明したが、本発明は上述したものに限定されるものではない。例えば、流路形成基板10として、シリコン単結晶基板を例示したが、特にこれに限定されず、例えば、SOI基板、ガラス等の材料を用いるようにしてもよい。
Claims (8)
- 第1電極と、前記第1電極にシード層を介して設けられた圧電体層と、前記圧電体層に設けられた第2電極とを備えた圧電素子であって、
前記シード層は、ペロブスカイト構造を有してAサイトがビスマスを含み、Bサイトが鉄及びチタンを含む(100)面に優先配向している複合酸化物を含み、
前記圧電体層は、ペロブスカイト構造を有して(100)面に優先配向している圧電材料を含み、
前記シード層の厚さは、20nm未満であり、かつ前記Bサイトの鉄とチタンとのモル比(鉄/チタン)は、9/11以上、3.0以下の範囲にあることを特徴とする圧電素子。 - 前記シード層は、島状に設けられていることを特徴とする請求項1に記載の圧電素子。
- 前記シード層の占有率は30%以上である、請求項1又は2に記載の圧電素子。
- 前記第1電極は、(111)面に優先配向している白金を含み、前記(111)面に由来するX線回折法による回折ピークの半値幅が10度以下であることを特徴とする請求項1〜3の何れか一項に記載の圧電素子。
- 前記Aサイトのビスマスと、前記Bサイトの鉄及びチタンとのモル比(ビスマス/(鉄及びチタン))は、1.0以上、1.4以下の範囲にあることを特徴とする請求項1〜4の何れか一項に記載の圧電素子。
- 請求項1〜5の何れか一項に記載の圧電素子を具備することを特徴とする液体噴射ヘッド。
- 請求項6に記載の液体噴射ヘッドを具備することを特徴とする液体噴射装置。
- 請求項1〜5の何れか一項に記載の圧電素子を具備することを特徴とするセンサー。
Priority Applications (3)
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FR3045036B1 (fr) * | 2015-12-15 | 2017-12-22 | Commissariat Energie Atomique | Procede de preparation d'une solution sol-gel utilisable pour la preparation d'une ceramique de titanate de baryum dope par du hafnium et/ou par au moins un element lanthanide |
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JP6714827B2 (ja) * | 2016-02-25 | 2020-07-01 | セイコーエプソン株式会社 | 圧電デバイス及び液体噴射ヘッド |
JP6635862B2 (ja) * | 2016-04-13 | 2020-01-29 | Jx金属株式会社 | BiFeO3系焼結体からなるスパッタリングターゲット及びその製造方法 |
JP2018129402A (ja) * | 2017-02-08 | 2018-08-16 | セイコーエプソン株式会社 | 圧電素子及びその製造方法 |
JP6953810B2 (ja) * | 2017-06-09 | 2021-10-27 | セイコーエプソン株式会社 | 圧電素子、及び圧電素子応用デバイス |
JP7067085B2 (ja) * | 2018-01-29 | 2022-05-16 | セイコーエプソン株式会社 | 圧電素子及び液体吐出ヘッド |
JP2019161098A (ja) * | 2018-03-15 | 2019-09-19 | セイコーエプソン株式会社 | 圧電素子及び液体吐出ヘッド |
JP7142875B2 (ja) * | 2018-06-20 | 2022-09-28 | キヤノン株式会社 | 配向性圧電体膜、およびその製造方法、並びに、液体吐出ヘッド |
JP7124669B2 (ja) * | 2018-11-22 | 2022-08-24 | セイコーエプソン株式会社 | 圧電デバイスおよび電子機器 |
JP7286999B2 (ja) * | 2019-02-26 | 2023-06-06 | セイコーエプソン株式会社 | 圧電素子、液体吐出ヘッド、およびプリンター |
JP7331424B2 (ja) * | 2019-04-10 | 2023-08-23 | セイコーエプソン株式会社 | 圧電素子、液体吐出ヘッド、およびプリンター |
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US7530676B2 (en) * | 2004-03-05 | 2009-05-12 | Panasonic Corporation | Piezoelectric element, inkjet head, angular velocity sensor, methods for manufacturing them and inkjet recording device |
JP2005340428A (ja) | 2004-05-26 | 2005-12-08 | Seiko Epson Corp | 圧電体素子及びその製造方法 |
JP5187489B2 (ja) * | 2007-09-20 | 2013-04-24 | セイコーエプソン株式会社 | アクチュエータ装置の製造方法及び液体噴射ヘッドの製造方法 |
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JP5710153B2 (ja) | 2010-05-11 | 2015-04-30 | 日本信号株式会社 | 圧電素子の製造方法 |
JP2012000873A (ja) * | 2010-06-17 | 2012-01-05 | Seiko Epson Corp | 液体噴射ヘッドの製造方法 |
JP5429492B2 (ja) | 2010-06-22 | 2014-02-26 | セイコーエプソン株式会社 | 液体噴射ヘッド、液体噴射装置、圧電素子及びアクチュエーター装置 |
CN102529373B (zh) * | 2010-12-10 | 2015-06-03 | 精工爱普生株式会社 | 液体喷射头、液体喷射装置、压电元件以及压电陶瓷 |
JP5773134B2 (ja) * | 2011-03-22 | 2015-09-02 | セイコーエプソン株式会社 | 圧電素子の製造方法、圧電素子、液体噴射ヘッド及び液体噴射装置 |
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JP6060485B2 (ja) * | 2012-01-19 | 2017-01-18 | セイコーエプソン株式会社 | 圧電素子、液体噴射ヘッド、液体噴射装置、強誘電体デバイス、焦電体デバイス、及び、圧電体デバイス |
JP6015892B2 (ja) * | 2012-02-13 | 2016-10-26 | セイコーエプソン株式会社 | 圧電素子、液体噴射ヘッド、液体噴射装置、超音波デバイス及びセンサー |
JP6037123B2 (ja) * | 2013-01-30 | 2016-11-30 | セイコーエプソン株式会社 | 液体噴射ヘッド、液体噴射装置、圧電素子及びセンサー |
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