JP6262355B2 - 消去可能prom用の3次元アドレス指定 - Google Patents
消去可能prom用の3次元アドレス指定 Download PDFInfo
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- JP6262355B2 JP6262355B2 JP2016545345A JP2016545345A JP6262355B2 JP 6262355 B2 JP6262355 B2 JP 6262355B2 JP 2016545345 A JP2016545345 A JP 2016545345A JP 2016545345 A JP2016545345 A JP 2016545345A JP 6262355 B2 JP6262355 B2 JP 6262355B2
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- 238000000034 method Methods 0.000 claims description 17
- 238000007639 printing Methods 0.000 claims description 3
- 230000003252 repetitive effect Effects 0.000 claims description 2
- 230000001360 synchronised effect Effects 0.000 claims description 2
- 230000003213 activating effect Effects 0.000 claims 1
- 230000006870 function Effects 0.000 description 5
- 238000003491 array Methods 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/08—Address circuits; Decoders; Word-line control circuits
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/17—Ink jet characterised by ink handling
- B41J2/175—Ink supply systems ; Circuit parts therefor
- B41J2/17503—Ink cartridges
- B41J2/17543—Cartridge presence detection or type identification
- B41J2/17546—Cartridge presence detection or type identification electronically
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/24—Bit-line control circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/24—Accessing extra cells, e.g. dummy cells or redundant cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/26—Accessing multiple arrays
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/04—Arrangements for selecting an address in a digital store using a sequential addressing device, e.g. shift register, counter
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/08—Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/12—Group selection circuits, e.g. for memory block selection, chip selection, array selection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
- H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
- H01L29/42312—Gate electrodes for field effect devices
- H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
- H01L29/4232—Gate electrodes for field effect devices for field-effect transistors with insulated gate
- H01L29/4234—Gate electrodes for transistors with charge trapping gate insulator
- H01L29/42344—Gate electrodes for transistors with charge trapping gate insulator with at least one additional gate, e.g. program gate, erase gate or select gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7841—Field effect transistors with field effect produced by an insulated gate with floating body, e.g. programmable transistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B43/00—EEPROM devices comprising charge-trapping gate insulators
- H10B43/20—EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional arrangements, e.g. with cells on different height levels
- H10B43/23—EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional arrangements, e.g. with cells on different height levels with source and drain on different levels, e.g. with sloping channels
- H10B43/27—EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional arrangements, e.g. with cells on different height levels with source and drain on different levels, e.g. with sloping channels the channels comprising vertical portions, e.g. U-shaped channels
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B53/00—Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors
- H10B53/20—Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors characterised by the three-dimensional arrangements, e.g. with cells on different height levels
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Read Only Memory (AREA)
Description
Claims (12)
- 一体化プリントヘッドにおける複数の消去可能なプログラム可能読取り専用メモリ(EPROM)バンクであって、各EPROMバンクがEPROMメモリアレイを構成する、複数のEPROMバンクと、
複数のシフトレジスタであって、各シフトレジスタが、3次元EPROMアドレスを生成するために前記複数のEPROMバンクに接続される、複数のシフトレジスタ
とを備えるプリントヘッド記憶装置であって、
前記3次元EPROMアドレスは、
前記3次元EPROMアドレスの行部分を指定する行選択データ信号と、
前記3次元EPROMアドレスの列部分を指定する列選択データ信号と、
前記複数のEPROMバンクのうちのあるEPROMバンクを指定するバンク選択データ信号であって、前記行選択データ信号及び前記列選択データ信号に関連するバンク選択データ信号
を含み、
前記行選択データ信号は、前記複数のシフトレジスタのうちの第1のシフトレジスタによって生成され、前記列選択データ信号は、前記複数のシフトレジスタのうちの前記第1のシフトレジスタによって生成され、前記バンク選択データ信号は、前記複数のシフトレジスタのうちの第2のシフトレジスタによって生成されることからなる、プリントヘッド記憶装置。 - 前記バンク選択データ信号は、並列3次元EPROMアドレスを生成するために、前記行選択データ及び前記列選択データに関連する前記複数のEPROMバンクのうちの2以上のEPROMバンクを指定することからなる、請求項1の装置。
- 前記複数のシフトレジスタの各々が、対応するデータ信号及び複数の対応する選択信号を含む複数の入力を受け入れることからなる、請求項1または2の装置。
- 前記対応するデータ信号は、対応するシフトレジスタを作動させ、及び、前記3次元EPROMアドレスの行部分及び列部分を指定することからなる、請求項3の装置。
- 前記対応する選択信号は、対応するシフトレジスタをプリチャージして進めることからなる、請求項3または4の装置。
- 前記対応するシフトレジスタは、4つの前記対応する選択信号が一巡すると1段だけ進められる、請求項5の装置。
- 印刷装置における複数の消去可能なプログラム可能読取り専用メモリ(EPROM)バンクであって、各EPROMバンクはEPROMメモリアレイを構成する、複数のEPROMバンクと、
直列データ入力及び複数の並列出力を有する複数のシフトレジスタであって、各シフトレジスタが前記複数のEPROMバンクに接続される、複数のシフトレジスタと、
3次元EPROMアドレスの行部分を指定するための行選択データ信号であって、前記複数のシフトレジスタのうちの第1のシフトレジスタによって生成される行選択データ信号と、
3次元EPROMアドレスの列部分を指定するための列選択データ信号であって、前記第1のシフトレジスタによって生成される列選択データ信号と、
前記3次元EPROMアドレスの一部である、前記複数のEPROMバンクのうちのあるEPROMバンクを指定するためのバンク選択データ信号であって、前記複数のシフトレジスタのうちの第2のシフトレジスタによって生成されるバンク選択データ信号
を有するシステム。 - 前記複数のシフトレジスタの各シフトレジスタは、対応するシフトレジスタに関連する複数のクロックサイクルのうちの1つのクロックサイクルを累積的に表す対応する1組の4つの繰り返し選択信号に同期させられる、請求項7のシステム。
- 前記EPROMバンクの数は、対応するシフトレジスタに関連する前記クロックサイクルの数によって決まる、請求項8のシステム。
- 前記複数のEPROMバンクの各々のEPROMアレイのメモリユニットの行及び列の数は、対応するシフトレジスタに関連する前記クロックサイクルの数によって決まる、請求項8または9のシステム。
- 一体化プリントヘッドの消去可能なプログラム可能読取り専用メモリ(EPROM)メモリユニットを3次元アドレス指定するための方法であって、
複数のシフトレジスタにおいて複数の入力信号を受け取るステップであって、該複数の入力信号は、データ信号と、前記複数のシフトレジスタのうちのあるシフトレジスタをプリチャージして進めるための選択信号とを含む、ステップと、
前記複数のシフトレジスタのうちの第1のシフトレジスタにおいて、3次元EPROMアドレスの行部分を指定する行選択データ信号を生成するステップと、
前記第1のシフトレジスタにおいて、3次元EPROMアドレスの列部分を指定する列選択データ信号を生成するステップと、
前記複数のシフトレジスタのうちの第2のシフトレジスタにおいて、複数のEPROMバンクのうちのあるEPROMバンクを指定するバンク選択信号を生成するステップであって、該バンク選択信号は、前記行選択データ信号及び前記列選択データ信号に関連することからなる、ステップと、
前記行選択データ信号、前記列選択データ信号、及び前記バンク選択信号に基づいて、個々のEPROMメモリユニットを三次元でアドレス指定するステップ
を含む方法。 - 前記複数のシフトレジスタのそれぞれのシフトレジスタは、前記複数のEPROMバンクのそれぞれのEPROMバンクに接続される、請求項11の方法。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US2014/014014 WO2015116129A1 (en) | 2014-01-31 | 2014-01-31 | Three-dimensional addressing for erasable programmable read only memory |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2017507404A JP2017507404A (ja) | 2017-03-16 |
JP6262355B2 true JP6262355B2 (ja) | 2018-01-17 |
Family
ID=53757530
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016545345A Active JP6262355B2 (ja) | 2014-01-31 | 2014-01-31 | 消去可能prom用の3次元アドレス指定 |
Country Status (19)
Country | Link |
---|---|
US (3) | US9773556B2 (ja) |
EP (4) | EP3236471A3 (ja) |
JP (1) | JP6262355B2 (ja) |
KR (1) | KR101942164B1 (ja) |
CN (2) | CN111326202A (ja) |
AU (2) | AU2014380279B2 (ja) |
BR (1) | BR112016017343B1 (ja) |
CA (1) | CA2938125C (ja) |
DK (1) | DK3100273T3 (ja) |
ES (1) | ES2784236T3 (ja) |
HU (1) | HUE048477T2 (ja) |
MX (1) | MX367147B (ja) |
PH (1) | PH12016501490A1 (ja) |
PL (1) | PL3100273T3 (ja) |
PT (1) | PT3100273T (ja) |
RU (1) | RU2640631C1 (ja) |
SG (1) | SG11201605665VA (ja) |
WO (1) | WO2015116129A1 (ja) |
ZA (1) | ZA201605059B (ja) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
MX2019003858A (es) | 2016-10-06 | 2019-06-10 | Hewlett Packard Development Co | Se?ales de control de entrada propagadas sobre trayectorias de se?al. |
EP3554843B1 (en) * | 2017-01-31 | 2022-01-19 | Hewlett-Packard Development Company, L.P. | Disposing memory banks and select register |
JP6832441B2 (ja) | 2017-01-31 | 2021-02-24 | ヒューレット−パッカード デベロップメント カンパニー エル.ピー.Hewlett‐Packard Development Company, L.P. | メモリバンク内のメモリユニットに対するアクセス |
MX2019008960A (es) | 2017-07-06 | 2019-10-07 | Hewlett Packard Development Co | Selectores para boquillas y elementos de memoria. |
DE112017007727T5 (de) | 2017-07-06 | 2020-03-19 | Hewlett-Packard Development Company, L.P. | Decoder für speicher von fluidausstossvorrichtungen |
WO2019009903A1 (en) | 2017-07-06 | 2019-01-10 | Hewlett-Packard Development Company, L.P. | DATA LINES FOR FLUID EJECTION DEVICES |
MX2021008895A (es) | 2019-02-06 | 2021-08-19 | Hewlett Packard Development Co | Componente de impresion de comunicacion. |
JP7146101B2 (ja) | 2019-02-06 | 2022-10-03 | ヒューレット-パッカード デベロップメント カンパニー エル.ピー. | メモリ回路を備えた印刷コンポーネント |
MX2021009129A (es) | 2019-02-06 | 2021-09-10 | Hewlett Packard Development Co | Memorias de matrices de fluidos. |
US11787173B2 (en) | 2019-02-06 | 2023-10-17 | Hewlett-Packard Development Company, L.P. | Print component with memory circuit |
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-
2014
- 2014-01-31 JP JP2016545345A patent/JP6262355B2/ja active Active
- 2014-01-31 KR KR1020167020956A patent/KR101942164B1/ko active IP Right Grant
- 2014-01-31 EP EP17169580.2A patent/EP3236471A3/en not_active Ceased
- 2014-01-31 CA CA2938125A patent/CA2938125C/en active Active
- 2014-01-31 ES ES14881146T patent/ES2784236T3/es active Active
- 2014-01-31 CN CN202010089674.9A patent/CN111326202A/zh active Pending
- 2014-01-31 EP EP17184129.9A patent/EP3258469B1/en active Active
- 2014-01-31 MX MX2016009841A patent/MX367147B/es active IP Right Grant
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