JP6167108B2 - 結合ウェハ構造体を劈開させるための固定装置及び劈開方法 - Google Patents
結合ウェハ構造体を劈開させるための固定装置及び劈開方法 Download PDFInfo
- Publication number
- JP6167108B2 JP6167108B2 JP2014539062A JP2014539062A JP6167108B2 JP 6167108 B2 JP6167108 B2 JP 6167108B2 JP 2014539062 A JP2014539062 A JP 2014539062A JP 2014539062 A JP2014539062 A JP 2014539062A JP 6167108 B2 JP6167108 B2 JP 6167108B2
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- clamp
- end surface
- gripping member
- arm
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B43/00—Operations specially adapted for layered products and not otherwise provided for, e.g. repairing; Apparatus therefor
- B32B43/006—Delaminating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B38/00—Ancillary operations in connection with laminating processes
- B32B38/10—Removing layers, or parts of layers, mechanically or chemically
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2301/00—Additional features of adhesives in the form of films or foils
- C09J2301/50—Additional features of adhesives in the form of films or foils characterized by process specific features
- C09J2301/502—Additional features of adhesives in the form of films or foils characterized by process specific features process for debonding adherents
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68381—Details of chemical or physical process used for separating the auxiliary support from a device or wafer
- H01L2221/68386—Separation by peeling
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68381—Details of chemical or physical process used for separating the auxiliary support from a device or wafer
- H01L2221/68386—Separation by peeling
- H01L2221/6839—Separation by peeling using peeling wedge or knife or bar
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10S156/918—Delaminating processes adapted for specified product, e.g. delaminating medical specimen slide
- Y10S156/93—Semiconductive product delaminating, e.g. delaminating emiconductive wafer from underlayer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10S156/934—Apparatus having delaminating means adapted for delaminating a specified article
- Y10S156/941—Means for delaminating semiconductive product
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
- Y10T156/1168—Gripping and pulling work apart during delaminating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
- Y10T156/1168—Gripping and pulling work apart during delaminating
- Y10T156/1179—Gripping and pulling work apart during delaminating with poking during delaminating [e.g., jabbing, etc.]
- Y10T156/1184—Piercing layer during delaminating [e.g., cutting, etc.]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
- Y10T156/1961—Severing delaminating means [e.g., chisel, etc.]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
- Y10T156/1978—Delaminating bending means
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T225/00—Severing by tearing or breaking
- Y10T225/10—Methods
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T225/00—Severing by tearing or breaking
- Y10T225/10—Methods
- Y10T225/12—With preliminary weakening
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T225/00—Severing by tearing or breaking
- Y10T225/30—Breaking or tearing apparatus
- Y10T225/35—Work-parting pullers [bursters]
- Y10T225/357—Relatively movable clamps
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T225/00—Severing by tearing or breaking
- Y10T225/30—Breaking or tearing apparatus
- Y10T225/393—Web restrainer
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161553447P | 2011-10-31 | 2011-10-31 | |
| US61/553,447 | 2011-10-31 | ||
| PCT/US2012/062194 WO2013066758A1 (en) | 2011-10-31 | 2012-10-26 | Clamping apparatus for cleaving a bonded wafer structure and methods for cleaving |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014532992A JP2014532992A (ja) | 2014-12-08 |
| JP2014532992A5 JP2014532992A5 (enExample) | 2015-12-03 |
| JP6167108B2 true JP6167108B2 (ja) | 2017-07-19 |
Family
ID=47221551
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014539062A Active JP6167108B2 (ja) | 2011-10-31 | 2012-10-26 | 結合ウェハ構造体を劈開させるための固定装置及び劈開方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (3) | US9165802B2 (enExample) |
| EP (1) | EP2774176B1 (enExample) |
| JP (1) | JP6167108B2 (enExample) |
| KR (1) | KR102061359B1 (enExample) |
| CN (1) | CN104025277A (enExample) |
| TW (1) | TWI622119B (enExample) |
| WO (1) | WO2013066758A1 (enExample) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102061359B1 (ko) * | 2011-10-31 | 2019-12-31 | 글로벌웨이퍼스 씨오., 엘티디. | 본딩된 웨이퍼 구조물 절개를 위한 클램핑 장치 및 절개 방법 |
| WO2015113591A1 (de) * | 2014-01-28 | 2015-08-06 | Ev Group E. Thallner Gmbh | Vorrichtung und verfahren zum lösen eines ersten substrats |
| CN104505363A (zh) * | 2014-12-25 | 2015-04-08 | 苏州凯锝微电子有限公司 | 一种晶圆夹持装置 |
| CN104701233B (zh) * | 2015-03-10 | 2017-10-17 | 北京七星华创电子股份有限公司 | 一种盘状物夹持装置 |
| JP6470414B2 (ja) * | 2015-08-11 | 2019-02-13 | 東京応化工業株式会社 | 支持体分離装置及び支持体分離方法 |
| US10272661B2 (en) | 2017-04-17 | 2019-04-30 | Taiwan Semiconductor Manufacturing Company, Ltd. | Pad removal device and method |
| KR102483443B1 (ko) * | 2018-08-14 | 2023-01-04 | 삼성전자주식회사 | 기판 접합 장치 및 이를 구비하는 기판 접합 설비와 이를 이용한 기판의 접합방법 |
| EP3657537A1 (en) * | 2018-11-23 | 2020-05-27 | ATOTECH Deutschland GmbH | End effector for slab formed substrates |
| FR3093715B1 (fr) * | 2019-03-15 | 2021-03-05 | Soitec Silicon On Insulator | Dispositif de maintien pour un ensemble à fracturer |
| FR3093858B1 (fr) * | 2019-03-15 | 2021-03-05 | Soitec Silicon On Insulator | Procédé de transfert d’une couche utile sur un substrat support |
| CN110640324B (zh) * | 2019-09-02 | 2022-06-10 | 中芯集成电路(宁波)有限公司 | 一种晶圆双面制作系统 |
| JP7309191B2 (ja) * | 2019-11-06 | 2023-07-18 | 中村留精密工業株式会社 | ウェハー分割装置 |
| JP7471862B2 (ja) | 2020-02-27 | 2024-04-22 | キオクシア株式会社 | 貼合装置および貼合方法 |
| JP7339905B2 (ja) | 2020-03-13 | 2023-09-06 | キオクシア株式会社 | 貼合装置および貼合方法 |
| US20250180453A1 (en) * | 2023-12-04 | 2025-06-05 | Tokyo Electron Limited | Torsional shear testing for semiconductor surface bonds |
Family Cites Families (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SE369160B (enExample) * | 1972-12-21 | 1974-08-12 | Siporex Int Ab | |
| US5367762A (en) | 1992-12-23 | 1994-11-29 | Advanced Micro Devices, Inc. | Decapping machine for packaged integrated circuits |
| JP3408000B2 (ja) * | 1994-11-28 | 2003-05-19 | 菱電セミコンダクタシステムエンジニアリング株式会社 | ペリクル剥離方法 |
| JPH09263500A (ja) | 1996-01-22 | 1997-10-07 | Komatsu Electron Metals Co Ltd | 貼り合わせsoiウェーハの剥がし治具 |
| US6048411A (en) | 1997-05-12 | 2000-04-11 | Silicon Genesis Corporation | Silicon-on-silicon hybrid wafer assembly |
| JPH115064A (ja) * | 1997-06-16 | 1999-01-12 | Canon Inc | 試料の分離装置及びその方法並びに基板の製造方法 |
| EP0951068A1 (en) | 1998-04-17 | 1999-10-20 | Interuniversitair Micro-Elektronica Centrum Vzw | Method of fabrication of a microstructure having an inside cavity |
| US6672358B2 (en) * | 1998-11-06 | 2004-01-06 | Canon Kabushiki Kaisha | Sample processing system |
| JP3917313B2 (ja) * | 1999-01-26 | 2007-05-23 | ローム株式会社 | 半導体製造品の搬送治具 |
| AU6905000A (en) | 1999-08-10 | 2001-03-05 | Silicon Genesis Corporation | A cleaving process to fabricate multilayered substrates using low implantation doses |
| US6221740B1 (en) | 1999-08-10 | 2001-04-24 | Silicon Genesis Corporation | Substrate cleaving tool and method |
| US6263941B1 (en) | 1999-08-10 | 2001-07-24 | Silicon Genesis Corporation | Nozzle for cleaving substrates |
| US6336787B1 (en) | 1999-10-07 | 2002-01-08 | Mosel Vitelic, Inc. | Method for transferring wafers in a semiconductor tape-peeling apparatus |
| TW508690B (en) | 1999-12-08 | 2002-11-01 | Canon Kk | Composite member separating method, thin film manufacturing method, and composite member separating apparatus |
| US6444082B1 (en) * | 2000-06-22 | 2002-09-03 | International Business Machines Corporation | Apparatus and method for removing a bonded lid from a substrate |
| JP2002050749A (ja) * | 2000-07-31 | 2002-02-15 | Canon Inc | 複合部材の分離方法及び装置 |
| US6491083B2 (en) | 2001-02-06 | 2002-12-10 | Anadigics, Inc. | Wafer demount receptacle for separation of thinned wafer from mounting carrier |
| FR2823373B1 (fr) | 2001-04-10 | 2005-02-04 | Soitec Silicon On Insulator | Dispositif de coupe de couche d'un substrat, et procede associe |
| AT502233B1 (de) | 2001-06-07 | 2007-04-15 | Thallner Erich | Vorrichtung zum lösen eines trägers von einer halbleiterscheibe |
| JP2003288028A (ja) | 2001-12-25 | 2003-10-10 | Canon Inc | 画像表示装置の分解方法、画像表示装置の製造方法、支持体の製造方法、画像表示部の製造方法、加工材料の製造方法、および画像表示装置 |
| FR2834381B1 (fr) | 2002-01-03 | 2004-02-27 | Soitec Silicon On Insulator | Dispositif de coupe de couche d'un substrat, et procede associe |
| TWI223371B (en) * | 2003-03-18 | 2004-11-01 | Taiwan Semiconductor Mfg | Chuck rotating and chuck roller apparatuses |
| JP4364535B2 (ja) | 2003-03-27 | 2009-11-18 | シャープ株式会社 | 半導体装置の製造方法 |
| US7510948B2 (en) | 2003-09-05 | 2009-03-31 | Sumco Corporation | Method for producing SOI wafer |
| JP2006135272A (ja) | 2003-12-01 | 2006-05-25 | Tokyo Ohka Kogyo Co Ltd | 基板のサポートプレート及びサポートプレートの剥離方法 |
| JP4995626B2 (ja) * | 2007-04-27 | 2012-08-08 | 信越化学工業株式会社 | 貼り合わせ基板の製造方法 |
| JP2009154407A (ja) * | 2007-12-27 | 2009-07-16 | Tdk Corp | 剥離装置、剥離方法および情報記録媒体製造方法 |
| JP2010010207A (ja) * | 2008-06-24 | 2010-01-14 | Tokyo Ohka Kogyo Co Ltd | 剥離装置および剥離方法 |
| JP5448860B2 (ja) * | 2010-01-13 | 2014-03-19 | 東京応化工業株式会社 | 分離方法及び分離装置 |
| US8845859B2 (en) | 2011-03-15 | 2014-09-30 | Sunedison Semiconductor Limited (Uen201334164H) | Systems and methods for cleaving a bonded wafer pair |
| KR102061359B1 (ko) | 2011-10-31 | 2019-12-31 | 글로벌웨이퍼스 씨오., 엘티디. | 본딩된 웨이퍼 구조물 절개를 위한 클램핑 장치 및 절개 방법 |
| KR102355643B1 (ko) * | 2011-12-22 | 2022-01-25 | 에베 그룹 에. 탈너 게엠베하 | 가요성 기판 홀더, 제1 기판을 분리하기 위한 장치 및 방법 |
-
2012
- 2012-10-26 KR KR1020147011610A patent/KR102061359B1/ko active Active
- 2012-10-26 JP JP2014539062A patent/JP6167108B2/ja active Active
- 2012-10-26 WO PCT/US2012/062194 patent/WO2013066758A1/en not_active Ceased
- 2012-10-26 EP EP12790726.9A patent/EP2774176B1/en active Active
- 2012-10-26 CN CN201280053782.4A patent/CN104025277A/zh active Pending
- 2012-10-29 US US13/663,038 patent/US9165802B2/en active Active
- 2012-10-29 US US13/663,073 patent/US9159596B2/en active Active
- 2012-10-31 TW TW101140405A patent/TWI622119B/zh active
-
2015
- 2015-09-04 US US14/845,327 patent/US9925755B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US9165802B2 (en) | 2015-10-20 |
| EP2774176A1 (en) | 2014-09-10 |
| CN104025277A (zh) | 2014-09-03 |
| WO2013066758A1 (en) | 2013-05-10 |
| US20130105539A1 (en) | 2013-05-02 |
| JP2014532992A (ja) | 2014-12-08 |
| KR20140085477A (ko) | 2014-07-07 |
| US9159596B2 (en) | 2015-10-13 |
| KR102061359B1 (ko) | 2019-12-31 |
| TWI622119B (zh) | 2018-04-21 |
| TW201324676A (zh) | 2013-06-16 |
| US20130105538A1 (en) | 2013-05-02 |
| EP2774176B1 (en) | 2016-08-10 |
| US9925755B2 (en) | 2018-03-27 |
| US20150375495A1 (en) | 2015-12-31 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP6167108B2 (ja) | 結合ウェハ構造体を劈開させるための固定装置及び劈開方法 | |
| KR101239282B1 (ko) | 캐리어 기판으로부터 가역적으로 장착된 디바이스 웨이퍼를 제거하는 장치 및 방법 | |
| US9827757B2 (en) | Methods of transferring device wafers or layers between carrier substrates and other surfaces | |
| TW201139147A (en) | Process for fabricating a multilayer structure with trimming using thermo-mechanical effects | |
| JP2014532992A5 (enExample) | ||
| EP2434533A1 (fr) | Procédé de collage par adhésion moléculaire avec réduction de désalignement de type overlay | |
| TWI648810B (zh) | 用於薄晶圓轉移的裝置及方法 | |
| JP2003521393A (ja) | 特にシリコン材の板材を二枚のウエハに分離する方法と装置 | |
| JP2015505164A (ja) | 可撓性の基板保持装置、第1の基板を剥離する装置及び方法 | |
| TW201005812A (en) | A method of assembling wafers by molecular bonding | |
| TW201241955A (en) | Apparatus and a method for direct wafer bonding | |
| JP5912117B2 (ja) | ポリマー基板上に、膜、例えば単結晶膜を形成する方法 | |
| US20120186741A1 (en) | Apparatus for wafer-to-wafer bonding | |
| JP3656254B2 (ja) | 接着ウエーハの剥離方法及び剥離装置 | |
| US9321636B2 (en) | Method for producing a substrate holder | |
| WO2014049414A1 (en) | Direct bonding process | |
| TW202127566A (zh) | 用於切割半導體結構之具有彈簧構件之切割系統及切割該等結構之方法 | |
| EP3772747B1 (fr) | Outil de positionnement | |
| JP6469070B2 (ja) | 第1の基板を第2の基板から剥離する方法および可撓性の基板保持装置の使用 | |
| TW201935519A (zh) | 可分離結構及應用所述結構之分離方法 | |
| TW201201993A (en) | Resin material removing method and apparatus thereof | |
| JP2008053595A (ja) | 半導体ウエハとその製造方法 | |
| JP2012160660A (ja) | 半導体ウエーハブレーキング装置及び方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20151014 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20151014 |
|
| RD04 | Notification of resignation of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7424 Effective date: 20160216 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20160916 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20160927 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20161220 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20170530 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20170626 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 6167108 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313113 |
|
| S531 | Written request for registration of change of domicile |
Free format text: JAPANESE INTERMEDIATE CODE: R313531 |
|
| S533 | Written request for registration of change of name |
Free format text: JAPANESE INTERMEDIATE CODE: R313533 |
|
| R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |