JP2015505164A - 可撓性の基板保持装置、第1の基板を剥離する装置及び方法 - Google Patents
可撓性の基板保持装置、第1の基板を剥離する装置及び方法 Download PDFInfo
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- 239000000758 substrate Substances 0.000 title claims abstract description 355
- 238000000034 method Methods 0.000 title claims abstract description 24
- 238000005452 bending Methods 0.000 claims abstract description 39
- 238000005411 Van der Waals force Methods 0.000 claims description 7
- 238000001953 recrystallisation Methods 0.000 claims description 3
- 235000012431 wafers Nutrition 0.000 description 24
- 230000002093 peripheral effect Effects 0.000 description 22
- 239000002131 composite material Substances 0.000 description 8
- 238000000926 separation method Methods 0.000 description 7
- 238000010438 heat treatment Methods 0.000 description 6
- 125000006850 spacer group Chemical group 0.000 description 6
- 230000004927 fusion Effects 0.000 description 4
- 239000000853 adhesive Substances 0.000 description 3
- 230000001070 adhesive effect Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 230000001154 acute effect Effects 0.000 description 2
- 230000006698 induction Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000007142 ring opening reaction Methods 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 230000032798 delamination Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
- 238000009281 ultraviolet germicidal irradiation Methods 0.000 description 1
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- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/799—Apparatus for disconnecting
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
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- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
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- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge clamping, e.g. clamping ring
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
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- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2457/00—Electrical equipment
- B32B2457/14—Semiconductor wafers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B38/00—Ancillary operations in connection with laminating processes
- B32B38/10—Removing layers, or parts of layers, mechanically or chemically
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- H—ELECTRICITY
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
- Y10T156/1168—Gripping and pulling work apart during delaminating
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
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- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Robotics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Mechanical Engineering (AREA)
Abstract
Description
第1の基板を保持する、前記剥離方向Lで可撓性の第1の基板保持装置と、
第2の基板を保持する第2の基板保持装置と、
特に曲げ力に関して制御されて、第1の基板を曲げながら第1の基板を第2の基板から剥離する剥離手段と、を有している。
第2の基板保持装置による第2の基板の保持、及び前記剥離方向Lで可撓性の第1の基板保持装置による第1の基板の保持のステップと、
第1の基板を曲げながら第1の基板を第2の基板から剥離するステップと、を有している。
2 保持グリップ
3 リング
3o 開口
3u リング周
4 レバー
5 レバー
6 リングオフセット部
7 周方向肩部
7s 端面
8 内側縁部
9 段部
10 固定手段
11 第2の基板
12 接合層
13 第1の基板
13o 表面
13u 周縁
14 作動エレメント
15,15´ 駆動手段
16 ジョイントベアリング
17 斜面
18 基板保持装置
19 スタック
20 フィルムフレーム複合体
21 フィルム
22 フレーム
22d カバー
23 フィルムフレーム
24,24´ 端部
25 スペーサ手段
26 周面区分
27 ベース
27b 底面
28 保持手段
29 保持手段
A 間隔
B リング幅
Di 内径
Da 外径
Dk 直径
H リング高さ
M 間隔
L 剥離方向
I 内側角度
d 厚さ
F1,F2,Fn 駆動力(引張力)
G 対抗力
K1,K2,Kn 剥離モーメント
W,W´ 曲げ角度
Claims (13)
- 第1の基板(13)を第2の基板(11)から剥離する際に第1の基板(13)を保持する可撓性の基板保持装置(1)であって、第1の基板(13)を曲げながら、第2の基板(11)を剥離する剥離手段(1,28)が設けられていることを特徴とする、基板保持装置(1)。
- 以下の特徴、即ち、第1の基板(13)を保持する、剥離方向(L)で可撓性の基板保持装置(1)と、
第2の基板(11)を保持する基板保持装置(18)と、
第1の基板(13)を曲げながら第1の基板(13)を第2の基板(11)から剥離する剥離手段(1,15,15´,16,28)と、を有する、
第1の基板(13)を第2の基板(11)から剥離方向(L)で剥離する装置。 - 前記基板保持装置(1)は剥離方向(L)で弾性的に変形可能である、請求項2記載の装置。
- 前記剥離手段(1,15,15´,16,28)によって、特に前記基板保持装置(18)の周囲に作用する少なくとも1つの引張力(F1,F2,Fn)と、該引張力(F1,F2,Fn)に抗して、特に前記基板保持装置の周囲に作用する少なくとも1つの対抗力(G)とを、剥離前線に沿った剥離モーメント(L1,L2,Ln)を発生させるために加えることができる、請求項2又は3記載の装置。
- 前記基板保持装置(18)は、特に第2の基板(11)を全面的に収容する剛性的な基板保持装置(18)として形成されている、請求項2から4までのいずれか1項記載の装置。
- 前記基板保持装置(1)は、調節可能な直径(Dk)を有する、特に開いたリング(3)として形成されている、請求項1記載の基板保持装置。
- 特にばね弾性的に戻る周方向肩部(7)を備えた、特に前記リング全周(3u)にわたって延在する保持手段(9)を有している、請求項1又は6記載の基板保持装置。
- 第1の基板(13)をほぼ完全に側方から取り囲むように形成されている、請求項1又は6又は7記載の基板保持装置。
- 第1の基板を第2の基板から剥離方向(L)で剥離する方法であって、以下のステップ、特に以下の経過、即ち、
基板保持装置による第2の基板の保持、及び前記剥離方向(L)で可撓性の基板保持装置による第1の基板の保持のステップと、
第2の基板を曲げながら第1の基板を第2の基板から剥離するステップと、を有する第1の基板を第2の基板から剥離方向(L)で剥離する方法。 - ファンデルワールス力によるボンディング後、第1の基板及び/又は第2の基板の再結晶温度以上の温度への第1の基板及び第2の基板の加熱前に、第1の基板の剥離を行う、請求項9記載の方法。
- 第1の基板と第2の基板との間のボンディング力が0.2J/m2よりも大きい場合に、好適には0.4J/m2よりも大きい場合に、さらに好適には0.8J/m2よりも大きい場合に前記剥離を行う、請求項9又は10記載の方法。
- 第1の基板を第2の基板から剥離する際に、第1の基板を保持するために使用する、可撓性の基板保持装置の使用。
- 特に専らファンデルワールス力によって第2の基板に接合された第1の基板を、第2の基板から剥離するために使用する、前記可撓性の基板保持装置の使用。
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Application Number | Priority Date | Filing Date | Title |
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PCT/EP2011/073851 WO2013091714A1 (de) | 2011-12-22 | 2011-12-22 | Biegsame substrathalterung, vorrichtung und verfahren zum lösen eines ersten substrats |
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JP2016247465A Division JP6469070B2 (ja) | 2016-12-21 | 2016-12-21 | 第1の基板を第2の基板から剥離する方法および可撓性の基板保持装置の使用 |
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US (1) | US9806054B2 (ja) |
EP (1) | EP2795669B1 (ja) |
JP (1) | JP2015505164A (ja) |
KR (4) | KR102355643B1 (ja) |
CN (1) | CN103999205B (ja) |
SG (1) | SG2014013007A (ja) |
TW (1) | TWI585922B (ja) |
WO (1) | WO2013091714A1 (ja) |
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WO2012139627A1 (de) | 2011-04-11 | 2012-10-18 | Ev Group E. Thallner Gmbh | Biegsame trägerhalterung, vorrichtung und verfahren zum lösen eines trägersubstrats |
KR102061359B1 (ko) | 2011-10-31 | 2019-12-31 | 글로벌웨이퍼스 씨오., 엘티디. | 본딩된 웨이퍼 구조물 절개를 위한 클램핑 장치 및 절개 방법 |
AT519840B1 (de) | 2014-01-28 | 2019-04-15 | Ev Group E Thallner Gmbh | Vorrichtung und Verfahren zum Lösen eines ersten Substrats |
CN105990123B (zh) * | 2015-02-27 | 2019-05-28 | 中芯国际集成电路制造(上海)有限公司 | 晶圆减薄方法 |
CN107533996B (zh) | 2015-04-10 | 2021-02-23 | Ev 集团 E·索尔纳有限责任公司 | 衬底固持器和用于接合两个衬底的方法 |
CN105047589B (zh) * | 2015-07-08 | 2018-05-29 | 浙江中纳晶微电子科技有限公司 | 晶圆解键合装置 |
EP3382744A1 (de) | 2016-02-16 | 2018-10-03 | EV Group E. Thallner GmbH | Vorrichtung zum bonden von substraten |
US10656078B2 (en) | 2016-02-17 | 2020-05-19 | Ev Group E. Thallner Gmbh | Metrology device and metrology method |
TWI594888B (zh) * | 2016-12-12 | 2017-08-11 | 台灣格雷蒙股份有限公司 | 剝離可撓性基板的方法 |
US10954122B2 (en) | 2017-03-16 | 2021-03-23 | Ev Group E. Thallner Gmbh | Method for bonding of at least three substrates |
US11227779B2 (en) * | 2017-09-12 | 2022-01-18 | Asm Technology Singapore Pte Ltd | Apparatus and method for processing a semiconductor device |
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CN103999205B (zh) | 2017-12-01 |
KR102355643B1 (ko) | 2022-01-25 |
EP2795669A1 (de) | 2014-10-29 |
CN103999205A (zh) | 2014-08-20 |
EP2795669B1 (de) | 2020-06-17 |
US9806054B2 (en) | 2017-10-31 |
KR20140113908A (ko) | 2014-09-25 |
TW201327748A (zh) | 2013-07-01 |
SG2014013007A (en) | 2014-06-27 |
KR20190131610A (ko) | 2019-11-26 |
KR102249658B1 (ko) | 2021-05-10 |
TWI585922B (zh) | 2017-06-01 |
KR20200019772A (ko) | 2020-02-24 |
US20150096689A1 (en) | 2015-04-09 |
WO2013091714A1 (de) | 2013-06-27 |
KR20210021403A (ko) | 2021-02-25 |
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