JP6080311B2 - 高速スプレーとターゲットとの相互作用による大気圧イオン源 - Google Patents

高速スプレーとターゲットとの相互作用による大気圧イオン源 Download PDF

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JP6080311B2
JP6080311B2 JP2014505727A JP2014505727A JP6080311B2 JP 6080311 B2 JP6080311 B2 JP 6080311B2 JP 2014505727 A JP2014505727 A JP 2014505727A JP 2014505727 A JP2014505727 A JP 2014505727A JP 6080311 B2 JP6080311 B2 JP 6080311B2
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targets
ion source
ions
droplet
droplets
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JP2014515831A5 (enExample
JP2014515831A (ja
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ステヴァン バジク，
ステヴァン バジク，
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マイクロマス ユーケー リミテッド
マイクロマス ユーケー リミテッド
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Priority claimed from GBGB1204937.5A external-priority patent/GB201204937D0/en
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/622—Ion mobility spectrometry
    • G01N27/624—Differential mobility spectrometry [DMS]; Field asymmetric-waveform ion mobility spectrometry [FAIMS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/7273—Desolvation chambers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0404—Capillaries used for transferring samples or ions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/061—Ion deflecting means, e.g. ion gates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/724—Nebulising, aerosol formation or ionisation

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Dispersion Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2014505727A 2011-04-20 2012-04-20 高速スプレーとターゲットとの相互作用による大気圧イオン源 Active JP6080311B2 (ja)

Applications Claiming Priority (9)

Application Number Priority Date Filing Date Title
GBGB1106694.1A GB201106694D0 (en) 2011-04-20 2011-04-20 Atmospheric pressure ion source by interacting high velocity spray with a target
GB1106694.1 2011-04-20
US201161478725P 2011-04-25 2011-04-25
US61/478,725 2011-04-25
GBGB1204937.5A GB201204937D0 (en) 2012-03-21 2012-03-21 Atomspheric pressure ion source by interacting high velocity spray with a target
GB1204937.5 2012-03-21
US201261614734P 2012-03-23 2012-03-23
US61/614,734 2012-03-23
PCT/GB2012/050888 WO2012143737A1 (en) 2011-04-20 2012-04-20 Atmospheric pressure ion source by interacting high velocity spray with a target

Publications (3)

Publication Number Publication Date
JP2014515831A JP2014515831A (ja) 2014-07-03
JP2014515831A5 JP2014515831A5 (enExample) 2015-06-11
JP6080311B2 true JP6080311B2 (ja) 2017-02-15

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JP2014505727A Active JP6080311B2 (ja) 2011-04-20 2012-04-20 高速スプレーとターゲットとの相互作用による大気圧イオン源

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Country Link
US (3) US8809777B2 (enExample)
EP (2) EP2700086B1 (enExample)
JP (1) JP6080311B2 (enExample)
CN (1) CN103597574B (enExample)
CA (1) CA2833675C (enExample)
GB (1) GB2499681B (enExample)
WO (1) WO2012143737A1 (enExample)

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Also Published As

Publication number Publication date
US20150155151A1 (en) 2015-06-04
EP3582251B1 (en) 2020-12-16
US8809777B2 (en) 2014-08-19
EP2700086A1 (en) 2014-02-26
US9082603B2 (en) 2015-07-14
CA2833675C (en) 2019-01-15
EP2700086B1 (en) 2019-09-11
GB201207004D0 (en) 2012-06-06
US20140339420A1 (en) 2014-11-20
EP3582251A1 (en) 2019-12-18
US8921777B2 (en) 2014-12-30
JP2014515831A (ja) 2014-07-03
CA2833675A1 (en) 2012-10-26
WO2012143737A1 (en) 2012-10-26
GB2499681A (en) 2013-08-28
CN103597574B (zh) 2016-09-07
GB2499681B (en) 2016-02-10
US20140151547A1 (en) 2014-06-05
CN103597574A (zh) 2014-02-19

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