JP5780761B2 - 光度計を備えた分析システム - Google Patents

光度計を備えた分析システム Download PDF

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Publication number
JP5780761B2
JP5780761B2 JP2010543846A JP2010543846A JP5780761B2 JP 5780761 B2 JP5780761 B2 JP 5780761B2 JP 2010543846 A JP2010543846 A JP 2010543846A JP 2010543846 A JP2010543846 A JP 2010543846A JP 5780761 B2 JP5780761 B2 JP 5780761B2
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JP
Japan
Prior art keywords
light
photometer
reaction vessel
support
light source
Prior art date
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Expired - Fee Related
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JP2010543846A
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English (en)
Japanese (ja)
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JPWO2010073604A1 (ja
Inventor
原田 邦男
邦男 原田
足立 作一郎
作一郎 足立
山崎 功夫
功夫 山崎
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
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Publication date
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Priority to JP2010543846A priority Critical patent/JP5780761B2/ja
Publication of JPWO2010073604A1 publication Critical patent/JPWO2010073604A1/ja
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Publication of JP5780761B2 publication Critical patent/JP5780761B2/ja
Expired - Fee Related legal-status Critical Current
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59Transmissivity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/021Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/10Arrangements of light sources specially adapted for spectrometry or colorimetry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03Cuvette constructions
    • G01N21/0332Cuvette constructions with temperature control
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/062LED's

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Measuring Cells (AREA)
JP2010543846A 2008-12-24 2009-12-22 光度計を備えた分析システム Expired - Fee Related JP5780761B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2010543846A JP5780761B2 (ja) 2008-12-24 2009-12-22 光度計を備えた分析システム

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2008326796 2008-12-24
JP2008326796 2008-12-24
PCT/JP2009/007096 WO2010073604A1 (fr) 2008-12-24 2009-12-22 Photomètre et système d'analyse fourni avec le photomètre
JP2010543846A JP5780761B2 (ja) 2008-12-24 2009-12-22 光度計を備えた分析システム

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2015099779A Division JP6051264B2 (ja) 2008-12-24 2015-05-15 光度計

Publications (2)

Publication Number Publication Date
JPWO2010073604A1 JPWO2010073604A1 (ja) 2012-06-07
JP5780761B2 true JP5780761B2 (ja) 2015-09-16

Family

ID=42287251

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2010543846A Expired - Fee Related JP5780761B2 (ja) 2008-12-24 2009-12-22 光度計を備えた分析システム
JP2015099779A Expired - Fee Related JP6051264B2 (ja) 2008-12-24 2015-05-15 光度計

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2015099779A Expired - Fee Related JP6051264B2 (ja) 2008-12-24 2015-05-15 光度計

Country Status (5)

Country Link
US (1) US8675187B2 (fr)
JP (2) JP5780761B2 (fr)
CN (1) CN102265140B (fr)
DE (1) DE112009003827T5 (fr)
WO (1) WO2010073604A1 (fr)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT510631B1 (de) * 2010-10-20 2013-01-15 Scan Messtechnik Ges M B H Spektrometer
CN103201632A (zh) * 2010-11-18 2013-07-10 株式会社日立高新技术 自动分析装置
JP5481402B2 (ja) * 2011-01-17 2014-04-23 株式会社日立ハイテクノロジーズ 自動分析装置
WO2012099215A1 (fr) * 2011-01-21 2012-07-26 株式会社日立ハイテクノロジーズ Dispositif d'analyse automatique
CN102590168A (zh) * 2012-02-16 2012-07-18 无锡迈通科学仪器有限公司 基于发光二极管的荧光微生物检测仪
JP5957294B2 (ja) * 2012-05-29 2016-07-27 浜松ホトニクス株式会社 プリズム部材、テラヘルツ波分光計測装置、及びテラヘルツ波分光計測方法
JP5946776B2 (ja) * 2013-01-18 2016-07-06 株式会社日立ハイテクノロジーズ 自動分析装置
WO2015029595A1 (fr) * 2013-08-27 2015-03-05 株式会社日立ハイテクノロジーズ Dispositif d'analyse d'acide nucléique et procédé de diagnostic de dispositif
JP6492838B2 (ja) * 2015-03-23 2019-04-03 セイコーエプソン株式会社 分光測定装置、画像形成装置、及び分光測定方法
JP6437390B2 (ja) * 2015-06-30 2018-12-12 株式会社日立ハイテクノロジーズ 自動分析装置
JP6659313B2 (ja) * 2015-11-13 2020-03-04 古野電気株式会社 反応測定ユニットおよび分析装置
US10545162B2 (en) 2016-07-21 2020-01-28 Siemens Healthcare Diagnostics Inc. Alignment system for cuvette segments on clinical chemistry instruments
JP6637407B2 (ja) * 2016-12-27 2020-01-29 株式会社日立ハイテクノロジーズ 自動分析装置
JP7044715B2 (ja) * 2016-12-28 2022-03-30 株式会社Mirai Genomics 分析装置
US11635443B2 (en) 2017-07-14 2023-04-25 Meon Medical Solutions Gmbh & Co Kg Automatic analyzer and method for carrying out chemical, biochemical, and/or immunochemical analyses
US11867710B2 (en) 2017-07-14 2024-01-09 Meon Medical Solutions Gmbh & Co Kg Automatic analyzer and method for carrying out chemical, biochemical and/or immunochemical analyses
CN108152211A (zh) * 2018-01-17 2018-06-12 睿科仪器(厦门)有限公司 一种自动判断样品液体颜色的装置及方法
US12092568B2 (en) 2018-04-23 2024-09-17 Meon Medical Solutions Gmbh & Co Kg Optical measuring unit and optical measuring method for obtaining measurement signals of fluid media
EP3784401A1 (fr) 2018-04-23 2021-03-03 Meon Medical Solutions GmbH & Co. KG Analyseur automatique et procédé de mesure optique pour obtenir des signaux de mesure de milieux liquides
JP7194580B2 (ja) * 2018-12-19 2022-12-22 株式会社トプコン 分光計測装置
EP4022320A4 (fr) * 2019-08-28 2022-11-02 Siemens Healthcare Diagnostics, Inc. Couplage optique de photomètres pour anneau d'incubation double faisant appel à une conception de périscope
JP2023069603A (ja) * 2021-11-08 2023-05-18 株式会社日立ハイテク 生体試料測定装置

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60114743A (ja) * 1983-11-26 1985-06-21 Toshiba Corp 液中測光用プリズムを用いた自動化学分析装置
JPH0875648A (ja) * 1994-06-30 1996-03-22 Opt Kk 流体の光透過量を測定する装置
JPH08114541A (ja) * 1994-10-14 1996-05-07 Hitachi Ltd 自動化学分析装置
JPH10510362A (ja) * 1994-11-30 1998-10-06 ジノサイト リミテッド 血液および他の試料を分析する装置
JP2007155477A (ja) * 2005-12-05 2007-06-21 Fujikura Ltd 表面プラズモン共鳴センサ
JP2007218633A (ja) * 2006-02-14 2007-08-30 Olympus Corp 自動分析装置
JP2007225339A (ja) * 2006-02-21 2007-09-06 Olympus Corp 分析装置
JP2007304103A (ja) * 2007-06-18 2007-11-22 Olympus Corp 分光器およびこれを用いた共焦点光学系、走査型光学顕微鏡
JP2008134128A (ja) * 2006-11-28 2008-06-12 Canon Inc 表面状態検査装置及び表面状態検査方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4935875A (en) * 1987-12-02 1990-06-19 Data Chem, Inc. Chemical analyzer
JP3749321B2 (ja) 1996-10-28 2006-02-22 株式会社日立製作所 自動分析装置
JP4120050B2 (ja) * 1998-07-16 2008-07-16 株式会社ニコン 光学特性検出装置
JP4168543B2 (ja) * 1998-10-08 2008-10-22 株式会社ニコン 光学特性測定ユニット
JP3964291B2 (ja) 2002-09-06 2007-08-22 富士フイルム株式会社 分析機器
JP4086182B2 (ja) 2002-10-09 2008-05-14 オリンパス株式会社 分光器およびこれを用いた共焦点光学系、走査型光学顕微鏡
JP4753645B2 (ja) * 2005-07-11 2011-08-24 ベックマン コールター, インコーポレイテッド 自動分析装置
JP4696934B2 (ja) 2006-01-27 2011-06-08 和光純薬工業株式会社 分析装置
JP4897308B2 (ja) 2006-02-20 2012-03-14 ベックマン コールター, インコーポレイテッド 分析装置

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60114743A (ja) * 1983-11-26 1985-06-21 Toshiba Corp 液中測光用プリズムを用いた自動化学分析装置
JPH0875648A (ja) * 1994-06-30 1996-03-22 Opt Kk 流体の光透過量を測定する装置
JPH08114541A (ja) * 1994-10-14 1996-05-07 Hitachi Ltd 自動化学分析装置
JPH10510362A (ja) * 1994-11-30 1998-10-06 ジノサイト リミテッド 血液および他の試料を分析する装置
JP2007155477A (ja) * 2005-12-05 2007-06-21 Fujikura Ltd 表面プラズモン共鳴センサ
JP2007218633A (ja) * 2006-02-14 2007-08-30 Olympus Corp 自動分析装置
JP2007225339A (ja) * 2006-02-21 2007-09-06 Olympus Corp 分析装置
JP2008134128A (ja) * 2006-11-28 2008-06-12 Canon Inc 表面状態検査装置及び表面状態検査方法
JP2007304103A (ja) * 2007-06-18 2007-11-22 Olympus Corp 分光器およびこれを用いた共焦点光学系、走査型光学顕微鏡

Also Published As

Publication number Publication date
US20110255090A1 (en) 2011-10-20
JPWO2010073604A1 (ja) 2012-06-07
US8675187B2 (en) 2014-03-18
JP2015143720A (ja) 2015-08-06
DE112009003827T5 (de) 2012-06-06
JP6051264B2 (ja) 2016-12-27
CN102265140A (zh) 2011-11-30
CN102265140B (zh) 2014-09-10
WO2010073604A1 (fr) 2010-07-01

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