JP5666813B2 - 時間幅測定装置 - Google Patents

時間幅測定装置 Download PDF

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JP5666813B2
JP5666813B2 JP2010057508A JP2010057508A JP5666813B2 JP 5666813 B2 JP5666813 B2 JP 5666813B2 JP 2010057508 A JP2010057508 A JP 2010057508A JP 2010057508 A JP2010057508 A JP 2010057508A JP 5666813 B2 JP5666813 B2 JP 5666813B2
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signal
parallel
clock
conversion
time width
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JP2011191178A (ja
JP2011191178A5 (enExample
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宗男 石鉢
宗男 石鉢
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株式会社テセック
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Priority to CN201010267937.7A priority patent/CN102193034B/zh
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JP2010057508A 2010-03-15 2010-03-15 時間幅測定装置 Active JP5666813B2 (ja)

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JP2010057508A JP5666813B2 (ja) 2010-03-15 2010-03-15 時間幅測定装置
CN201010267937.7A CN102193034B (zh) 2010-03-15 2010-08-31 时间宽度测定装置

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JP2010057508A JP5666813B2 (ja) 2010-03-15 2010-03-15 時間幅測定装置

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JP2011191178A JP2011191178A (ja) 2011-09-29
JP2011191178A5 JP2011191178A5 (enExample) 2013-01-31
JP5666813B2 true JP5666813B2 (ja) 2015-02-12

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Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102439465B (zh) * 2011-08-19 2013-11-06 华为技术有限公司 一种信号时序的测试方法及装置
CN105911855B (zh) * 2016-04-06 2019-04-09 北京瑞森新谱科技股份有限公司 一种关于手机直流振动马达起振和停振时间的测量方法
CN107317581B (zh) * 2016-04-26 2021-01-12 华邦电子股份有限公司 具有高分辨率的时间数字转换器
CN109884518A (zh) * 2017-12-06 2019-06-14 爱德万测试公司 测试装置及测试方法
DE102019112447A1 (de) * 2019-05-13 2020-11-19 Jenoptik Optical Systems Gmbh Verfahren und Auswerteeinheit zur Ermittlung eines Zeitpunkts einer Flanke in einem Signal
CN110597748B (zh) * 2019-07-31 2021-09-07 北京航天时代光电科技有限公司 一种基于tlk2711的高速通信接口及数据处理系统
CN112485536A (zh) * 2020-11-13 2021-03-12 苏州华兴源创科技股份有限公司 一种脉冲信号测量方法和装置
CN113641089B (zh) * 2021-10-15 2022-01-21 国开启科量子技术(北京)有限公司 用于测量时间的方法和装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3434131A (en) * 1965-12-13 1969-03-18 Ibm Pulse width sensitive magnetic head with associated binary identification circuit
JPS59182656A (ja) * 1983-03-31 1984-10-17 Fujitsu Ltd フイ−ドバツクを利用するパルス幅変調方式
JPS608771A (ja) * 1983-06-28 1985-01-17 Sony Corp 時間差測定装置
JPS62214367A (ja) * 1986-03-17 1987-09-21 Fujitsu Ltd パルス時間測定回路
JPH0510995A (ja) * 1991-07-03 1993-01-19 Seiko Instr Inc パルス幅測定装置
JPH08189942A (ja) * 1995-01-10 1996-07-23 Alps Electric Co Ltd パルス幅計測装置
CN100334455C (zh) * 2003-04-10 2007-08-29 富士通株式会社 具有自动范围设定功能的脉冲宽度测量装置
US7148910B2 (en) * 2003-11-06 2006-12-12 Eastman Kodak Company High-speed pulse width modulation system and method for linear array spatial light modulators
JP2005149548A (ja) * 2003-11-11 2005-06-09 Sanyo Electric Co Ltd 半導体集積回路
US7379395B2 (en) * 2004-06-30 2008-05-27 Teradyne, Inc. Precise time measurement apparatus and method
US7079577B2 (en) * 2004-09-08 2006-07-18 Atmel Corporation Wide window decoder circuit for dual phase pulse modulation
JP2006329735A (ja) * 2005-05-25 2006-12-07 Agilent Technol Inc 時間間隔測定方法および装置
JP4878127B2 (ja) * 2005-06-10 2012-02-15 株式会社トプコン 時間差測定装置および距離測定装置並びに距離測定方法
CN100430745C (zh) * 2005-08-08 2008-11-05 联华电子股份有限公司 延迟时间测量装置与延迟时间测量方法

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JP2011191178A (ja) 2011-09-29
CN102193034B (zh) 2014-04-02
CN102193034A (zh) 2011-09-21

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