JP5653453B2 - 一体化された過渡過電圧保護を有するボンドパッド - Google Patents
一体化された過渡過電圧保護を有するボンドパッド Download PDFInfo
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- JP5653453B2 JP5653453B2 JP2012548064A JP2012548064A JP5653453B2 JP 5653453 B2 JP5653453 B2 JP 5653453B2 JP 2012548064 A JP2012548064 A JP 2012548064A JP 2012548064 A JP2012548064 A JP 2012548064A JP 5653453 B2 JP5653453 B2 JP 5653453B2
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- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
- H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
- H10D89/711—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using bipolar transistors as protective elements
- H10D89/713—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using bipolar transistors as protective elements including a PNP transistor and a NPN transistor, wherein each of said transistors has its base region coupled to the collector region of the other transistor, e.g. silicon controlled rectifier [SCR] devices
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- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L24/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
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- H10D18/00—Thyristors
- H10D18/251—Lateral thyristors
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- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/113—Isolations within a component, i.e. internal isolations
- H10D62/115—Dielectric isolations, e.g. air gaps
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- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/113—Isolations within a component, i.e. internal isolations
- H10D62/115—Dielectric isolations, e.g. air gaps
- H10D62/116—Dielectric isolations, e.g. air gaps adjoining the input or output regions of field-effect devices, e.g. adjoining source or drain regions
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- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
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- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/124—Shapes, relative sizes or dispositions of the regions of semiconductor bodies or of junctions between the regions
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- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/101—Integrated devices comprising main components and built-in components, e.g. IGBT having built-in freewheel diode
- H10D84/131—Thyristors having built-in components
- H10D84/138—Thyristors having built-in components the built-in components being FETs
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/686,003 | 2010-01-12 | ||
| US12/686,003 US8222698B2 (en) | 2009-06-29 | 2010-01-12 | Bond pad with integrated transient over-voltage protection |
| PCT/US2011/020036 WO2011087925A1 (en) | 2010-01-12 | 2011-01-03 | Bond pad with integrated transient over-voltage protection |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2013517617A JP2013517617A (ja) | 2013-05-16 |
| JP2013517617A5 JP2013517617A5 (enExample) | 2013-06-27 |
| JP5653453B2 true JP5653453B2 (ja) | 2015-01-14 |
Family
ID=43709169
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012548064A Active JP5653453B2 (ja) | 2010-01-12 | 2011-01-03 | 一体化された過渡過電圧保護を有するボンドパッド |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8222698B2 (enExample) |
| JP (1) | JP5653453B2 (enExample) |
| CN (1) | CN102714205B (enExample) |
| WO (1) | WO2011087925A1 (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2957049B2 (ja) | 1991-12-05 | 1999-10-04 | 有限会社吉野精機 | 絞り溝加工用ローラー |
| JP3060290B2 (ja) | 1996-04-30 | 2000-07-10 | 株式会社カネミツ | 板金製プーリとその製造方法 |
Families Citing this family (57)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9520486B2 (en) | 2009-11-04 | 2016-12-13 | Analog Devices, Inc. | Electrostatic protection device |
| US8432651B2 (en) | 2010-06-09 | 2013-04-30 | Analog Devices, Inc. | Apparatus and method for electronic systems reliability |
| US8368116B2 (en) | 2010-06-09 | 2013-02-05 | Analog Devices, Inc. | Apparatus and method for protecting electronic circuits |
| US8665571B2 (en) | 2011-05-18 | 2014-03-04 | Analog Devices, Inc. | Apparatus and method for integrated circuit protection |
| EP2405466B1 (en) * | 2010-07-05 | 2014-04-23 | ams AG | Symmetric LDMOS transistor and method of production |
| US8416543B2 (en) | 2010-07-08 | 2013-04-09 | Analog Devices, Inc. | Apparatus and method for electronic circuit protection |
| US8553380B2 (en) | 2010-07-08 | 2013-10-08 | Analog Devices, Inc. | Apparatus and method for electronic circuit protection |
| US10199482B2 (en) | 2010-11-29 | 2019-02-05 | Analog Devices, Inc. | Apparatus for electrostatic discharge protection |
| JP5703790B2 (ja) * | 2011-01-31 | 2015-04-22 | 富士通セミコンダクター株式会社 | 半導体装置及びその製造方法 |
| US8466489B2 (en) | 2011-02-04 | 2013-06-18 | Analog Devices, Inc. | Apparatus and method for transient electrical overstress protection |
| US8592860B2 (en) | 2011-02-11 | 2013-11-26 | Analog Devices, Inc. | Apparatus and method for protection of electronic circuits operating under high stress conditions |
| US8680620B2 (en) | 2011-08-04 | 2014-03-25 | Analog Devices, Inc. | Bi-directional blocking voltage protection devices and methods of forming the same |
| US8947841B2 (en) | 2012-02-13 | 2015-02-03 | Analog Devices, Inc. | Protection systems for integrated circuits and methods of forming the same |
| US8829570B2 (en) | 2012-03-09 | 2014-09-09 | Analog Devices, Inc. | Switching device for heterojunction integrated circuits and methods of forming the same |
| US8946822B2 (en) | 2012-03-19 | 2015-02-03 | Analog Devices, Inc. | Apparatus and method for protection of precision mixed-signal electronic circuits |
| US8691655B2 (en) * | 2012-05-15 | 2014-04-08 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method of semiconductor integrated circuit fabrication |
| US8610251B1 (en) | 2012-06-01 | 2013-12-17 | Analog Devices, Inc. | Low voltage protection devices for precision transceivers and methods of forming the same |
| US8637899B2 (en) | 2012-06-08 | 2014-01-28 | Analog Devices, Inc. | Method and apparatus for protection and high voltage isolation of low voltage communication interface terminals |
| US8796729B2 (en) | 2012-11-20 | 2014-08-05 | Analog Devices, Inc. | Junction-isolated blocking voltage devices with integrated protection structures and methods of forming the same |
| US8860080B2 (en) | 2012-12-19 | 2014-10-14 | Analog Devices, Inc. | Interface protection device with integrated supply clamp and method of forming the same |
| US9123540B2 (en) | 2013-01-30 | 2015-09-01 | Analog Devices, Inc. | Apparatus for high speed signal processing interface |
| US9006781B2 (en) | 2012-12-19 | 2015-04-14 | Analog Devices, Inc. | Devices for monolithic data conversion interface protection and methods of forming the same |
| US9275991B2 (en) | 2013-02-13 | 2016-03-01 | Analog Devices, Inc. | Apparatus for transceiver signal isolation and voltage clamp |
| US9147677B2 (en) | 2013-05-16 | 2015-09-29 | Analog Devices Global | Dual-tub junction-isolated voltage clamp devices for protecting low voltage circuitry connected between high voltage interface pins and methods of forming the same |
| US9171832B2 (en) | 2013-05-24 | 2015-10-27 | Analog Devices, Inc. | Analog switch with high bipolar blocking voltage in low voltage CMOS process |
| CN104752423B (zh) | 2013-12-31 | 2018-08-21 | 中芯国际集成电路制造(上海)有限公司 | 一种半导体器件及其制造方法和电子装置 |
| US9318564B2 (en) * | 2014-05-19 | 2016-04-19 | Qualcomm Incorporated | High density static random access memory array having advanced metal patterning |
| US9484739B2 (en) | 2014-09-25 | 2016-11-01 | Analog Devices Global | Overvoltage protection device and method |
| US9478608B2 (en) | 2014-11-18 | 2016-10-25 | Analog Devices, Inc. | Apparatus and methods for transceiver interface overvoltage clamping |
| US10068894B2 (en) | 2015-01-12 | 2018-09-04 | Analog Devices, Inc. | Low leakage bidirectional clamps and methods of forming the same |
| US10181719B2 (en) | 2015-03-16 | 2019-01-15 | Analog Devices Global | Overvoltage blocking protection device |
| US9673187B2 (en) | 2015-04-07 | 2017-06-06 | Analog Devices, Inc. | High speed interface protection apparatus |
| US10158029B2 (en) | 2016-02-23 | 2018-12-18 | Analog Devices, Inc. | Apparatus and methods for robust overstress protection in compound semiconductor circuit applications |
| US10199369B2 (en) | 2016-03-04 | 2019-02-05 | Analog Devices, Inc. | Apparatus and methods for actively-controlled transient overstress protection with false condition shutdown |
| CN105789332B (zh) * | 2016-04-25 | 2019-02-26 | 矽力杰半导体技术(杭州)有限公司 | 整流器件、整流器件的制造方法及esd保护器件 |
| US9831233B2 (en) | 2016-04-29 | 2017-11-28 | Analog Devices Global | Apparatuses for communication systems transceiver interfaces |
| US10177566B2 (en) | 2016-06-21 | 2019-01-08 | Analog Devices, Inc. | Apparatus and methods for actively-controlled trigger and latch release thyristor |
| US10734806B2 (en) | 2016-07-21 | 2020-08-04 | Analog Devices, Inc. | High voltage clamps with transient activation and activation release control |
| US10861845B2 (en) | 2016-12-06 | 2020-12-08 | Analog Devices, Inc. | Active interface resistance modulation switch |
| US10319714B2 (en) | 2017-01-24 | 2019-06-11 | Analog Devices, Inc. | Drain-extended metal-oxide-semiconductor bipolar switch for electrical overstress protection |
| US10404059B2 (en) | 2017-02-09 | 2019-09-03 | Analog Devices, Inc. | Distributed switches to suppress transient electrical overstress-induced latch-up |
| US10249609B2 (en) | 2017-08-10 | 2019-04-02 | Analog Devices, Inc. | Apparatuses for communication systems transceiver interfaces |
| US10608431B2 (en) | 2017-10-26 | 2020-03-31 | Analog Devices, Inc. | Silicon controlled rectifier dynamic triggering and shutdown via control signal amplification |
| US10581423B1 (en) | 2018-08-17 | 2020-03-03 | Analog Devices Global Unlimited Company | Fault tolerant low leakage switch |
| US11094688B2 (en) | 2018-08-23 | 2021-08-17 | Analog Devices International Unlimited Company | Isolation architecture |
| US10700056B2 (en) | 2018-09-07 | 2020-06-30 | Analog Devices, Inc. | Apparatus for automotive and communication systems transceiver interfaces |
| US11387648B2 (en) | 2019-01-10 | 2022-07-12 | Analog Devices International Unlimited Company | Electrical overstress protection with low leakage current for high voltage tolerant high speed interfaces |
| US11004849B2 (en) | 2019-03-06 | 2021-05-11 | Analog Devices, Inc. | Distributed electrical overstress protection for large density and high data rate communication applications |
| US11469717B2 (en) | 2019-05-03 | 2022-10-11 | Analog Devices International Unlimited Company | Microwave amplifiers tolerant to electrical overstress |
| DE102020111863A1 (de) | 2019-05-03 | 2020-11-05 | Analog Devices International Unlimited Company | Gegen elektrische Überlastung tolerante Mikrowellenverstärker |
| CN119855223A (zh) | 2019-09-09 | 2025-04-18 | 亚德诺半导体国际无限责任公司 | 配置用于栅极电介质监控的半导体器件 |
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| JP2957049B2 (ja) | 1991-12-05 | 1999-10-04 | 有限会社吉野精機 | 絞り溝加工用ローラー |
| JP3060290B2 (ja) | 1996-04-30 | 2000-07-10 | 株式会社カネミツ | 板金製プーリとその製造方法 |
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| WO2011087925A1 (en) | 2011-07-21 |
| US20100327343A1 (en) | 2010-12-30 |
| CN102714205A (zh) | 2012-10-03 |
| US8222698B2 (en) | 2012-07-17 |
| CN102714205B (zh) | 2015-12-16 |
| JP2013517617A (ja) | 2013-05-16 |
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