JP5622664B2 - 絞りを有する投影対物系 - Google Patents
絞りを有する投影対物系 Download PDFInfo
- Publication number
- JP5622664B2 JP5622664B2 JP2011126713A JP2011126713A JP5622664B2 JP 5622664 B2 JP5622664 B2 JP 5622664B2 JP 2011126713 A JP2011126713 A JP 2011126713A JP 2011126713 A JP2011126713 A JP 2011126713A JP 5622664 B2 JP5622664 B2 JP 5622664B2
- Authority
- JP
- Japan
- Prior art keywords
- projection objective
- light
- optical element
- stop
- optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000003287 optical effect Effects 0.000 claims description 183
- 238000003384 imaging method Methods 0.000 claims description 84
- 230000005855 radiation Effects 0.000 claims description 74
- 238000005286 illumination Methods 0.000 claims description 31
- 210000001747 pupil Anatomy 0.000 claims description 15
- 239000000758 substrate Substances 0.000 claims description 15
- 238000011144 upstream manufacturing Methods 0.000 claims description 15
- 238000000034 method Methods 0.000 claims description 13
- 101150079532 SLS2 gene Proteins 0.000 claims description 10
- 101150108455 Sil1 gene Proteins 0.000 claims description 10
- 101150017313 sls1 gene Proteins 0.000 claims description 10
- 230000000694 effects Effects 0.000 description 15
- 230000006870 function Effects 0.000 description 14
- 230000004075 alteration Effects 0.000 description 13
- 238000010438 heat treatment Methods 0.000 description 11
- 230000002093 peripheral effect Effects 0.000 description 10
- 238000013461 design Methods 0.000 description 9
- 239000000463 material Substances 0.000 description 8
- 230000005540 biological transmission Effects 0.000 description 7
- 230000008859 change Effects 0.000 description 6
- 239000011248 coating agent Substances 0.000 description 6
- 238000000576 coating method Methods 0.000 description 6
- 230000009467 reduction Effects 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 238000010521 absorption reaction Methods 0.000 description 5
- 230000002411 adverse Effects 0.000 description 5
- 238000012937 correction Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 238000007654 immersion Methods 0.000 description 5
- 238000012634 optical imaging Methods 0.000 description 5
- 238000009826 distribution Methods 0.000 description 4
- 238000001393 microlithography Methods 0.000 description 4
- 230000002457 bidirectional effect Effects 0.000 description 3
- 238000002788 crimping Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 229920002120 photoresistant polymer Polymers 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 230000020169 heat generation Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000007493 shaping process Methods 0.000 description 2
- 239000006117 anti-reflective coating Substances 0.000 description 1
- 230000003667 anti-reflective effect Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 239000000806 elastomer Substances 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 210000000887 face Anatomy 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 230000005499 meniscus Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 230000005405 multipole Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 102220047090 rs6152 Human genes 0.000 description 1
- 230000011218 segmentation Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 230000004304 visual acuity Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
- G03F7/70941—Stray fields and charges, e.g. stray light, scattered light, flare, transmission loss
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/0025—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
- G02B27/0037—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration with diffracting elements
- G02B27/0043—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration with diffracting elements in projection exposure systems, e.g. microlithographic systems
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Environmental & Geological Engineering (AREA)
- Engineering & Computer Science (AREA)
- Atmospheric Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Optics & Photonics (AREA)
- Lenses (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Lens Barrels (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102010021539.2A DE102010021539B4 (de) | 2010-05-19 | 2010-05-19 | Projektionsobjektiv mit Blenden |
| DE102010021539.2 | 2010-05-19 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014124134A Division JP5982429B2 (ja) | 2010-05-19 | 2014-06-17 | 絞りを有する投影対物系 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011248366A JP2011248366A (ja) | 2011-12-08 |
| JP2011248366A5 JP2011248366A5 (enExample) | 2013-11-21 |
| JP5622664B2 true JP5622664B2 (ja) | 2014-11-12 |
Family
ID=44900450
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011126713A Expired - Fee Related JP5622664B2 (ja) | 2010-05-19 | 2011-05-19 | 絞りを有する投影対物系 |
| JP2014124134A Expired - Fee Related JP5982429B2 (ja) | 2010-05-19 | 2014-06-17 | 絞りを有する投影対物系 |
| JP2016151327A Expired - Fee Related JP6545644B2 (ja) | 2010-05-19 | 2016-08-01 | 絞りを有する投影対物系 |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014124134A Expired - Fee Related JP5982429B2 (ja) | 2010-05-19 | 2014-06-17 | 絞りを有する投影対物系 |
| JP2016151327A Expired - Fee Related JP6545644B2 (ja) | 2010-05-19 | 2016-08-01 | 絞りを有する投影対物系 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8488104B2 (enExample) |
| JP (3) | JP5622664B2 (enExample) |
| KR (1) | KR101526638B1 (enExample) |
| CN (1) | CN102253464B (enExample) |
| DE (1) | DE102010021539B4 (enExample) |
| TW (3) | TWI631369B (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014209253A (ja) * | 2010-05-19 | 2014-11-06 | カール・ツァイス・エスエムティー・ゲーエムベーハー | 絞りを有する投影対物系 |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101590743B1 (ko) * | 2005-06-02 | 2016-02-01 | 칼 짜이스 에스엠티 게엠베하 | 마이크로리소그래피 투영 대물 렌즈 |
| DE102012206153A1 (de) | 2012-04-16 | 2013-10-17 | Carl Zeiss Smt Gmbh | Optisches System einer mikrolithographischen Projektionsbelichtungsanlage |
| DE102017204619A1 (de) | 2016-04-05 | 2017-10-05 | Carl Zeiss Smt Gmbh | Projektionsbelichtungsverfahren, Projektionsobjektiv und Projektionsbelichtungsanlage für die Mikrolithographie |
| DE102017211902A1 (de) | 2017-07-12 | 2018-08-02 | Carl Zeiss Smt Gmbh | Projektionsobjektiv für eine Projektionsbelichtungsanlage für die Mikrolithographie |
| JP7197354B2 (ja) * | 2018-12-28 | 2022-12-27 | Hoya株式会社 | レンズユニット及びレンズユニットの製造方法 |
| DE102019209884A1 (de) * | 2019-07-04 | 2021-01-07 | Carl Zeiss Smt Gmbh | Blende, optisches system und lithographieanlage |
| DE102021214140A1 (de) * | 2021-12-10 | 2023-06-15 | Carl Zeiss Smt Gmbh | Fassung für eine linse, anordnung, lithographieanlage sowie verfahren |
| EP4540645A1 (de) * | 2022-06-17 | 2025-04-23 | TRUMPF Lasersystems for Semiconductor Manufacturing GmbH | Vorrichtung zum korrigieren eines astigmatismus eines laserstrahls |
| DE102025100345A1 (de) * | 2025-01-08 | 2025-12-04 | Carl Zeiss Smt Gmbh | Verfahren |
Family Cites Families (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4733945A (en) * | 1986-01-15 | 1988-03-29 | The Perkin-Elmer Corporation | Precision lens mounting |
| JPH02136836A (ja) * | 1988-11-18 | 1990-05-25 | Canon Inc | 遮光装置 |
| US6512631B2 (en) * | 1996-07-22 | 2003-01-28 | Kla-Tencor Corporation | Broad-band deep ultraviolet/vacuum ultraviolet catadioptric imaging system |
| DE19733490C1 (de) * | 1997-08-01 | 1999-02-25 | Zeiss Carl Fa | Optik-Fassung mit UV-Kleber und Schutzschicht |
| US6097537A (en) * | 1998-04-07 | 2000-08-01 | Nikon Corporation | Catadioptric optical system |
| US7301605B2 (en) * | 2000-03-03 | 2007-11-27 | Nikon Corporation | Projection exposure apparatus and method, catadioptric optical system and manufacturing method of devices |
| JP2001343582A (ja) * | 2000-05-30 | 2001-12-14 | Nikon Corp | 投影光学系、当該投影光学系を備えた露光装置、及び当該露光装置を用いたマイクロデバイスの製造方法 |
| JP2002083766A (ja) * | 2000-06-19 | 2002-03-22 | Nikon Corp | 投影光学系、該光学系の製造方法、及び前記光学系を備えた投影露光装置 |
| ATE352052T1 (de) * | 2000-08-18 | 2007-02-15 | Nikon Corp | Haltevorrichtung für optisches element |
| US6831282B2 (en) * | 2001-02-09 | 2004-12-14 | Nikon Corporation | Methods and devices for evaluating beam blur in a charged-particle-beam microlithography apparatus |
| DE10127227A1 (de) * | 2001-05-22 | 2002-12-05 | Zeiss Carl | Katadioptrisches Reduktionsobjektiv |
| EP1430346A1 (en) * | 2001-09-20 | 2004-06-23 | Carl Zeiss SMT AG | Catadioptric reduction lens |
| JP2003270506A (ja) * | 2002-03-15 | 2003-09-25 | Fuji Photo Optical Co Ltd | 光学機器および遮光方法 |
| US20030234918A1 (en) * | 2002-06-20 | 2003-12-25 | Nikon Corporation | Adjustable soft mounts in kinematic lens mounting system |
| TWI249082B (en) | 2002-08-23 | 2006-02-11 | Nikon Corp | Projection optical system and method for photolithography and exposure apparatus and method using same |
| US7081278B2 (en) * | 2002-09-25 | 2006-07-25 | Asml Holdings N.V. | Method for protection of adhesives used to secure optics from ultra-violet light |
| JP2004152833A (ja) * | 2002-10-29 | 2004-05-27 | Nikon Corp | 極端紫外線光学鏡筒、極端紫外線反射光学素子、露光装置及び極端紫外線光学系の検査方法 |
| JP2004157348A (ja) * | 2002-11-07 | 2004-06-03 | Chinontec Kk | 投射レンズ装置及びプロジェクタ装置 |
| EP1565769A1 (en) * | 2002-11-21 | 2005-08-24 | Carl Zeiss SMT AG | Projection lens with non- round diaphragm for microlithography |
| JP4717813B2 (ja) | 2003-09-12 | 2011-07-06 | カール・ツァイス・エスエムティー・ゲーエムベーハー | マイクロリソグラフィ投影露光設備のための照明系 |
| GB0321918D0 (en) * | 2003-09-19 | 2003-10-22 | Aoti Operating Co Inc | Focusing system and method |
| KR20170129271A (ko) | 2004-05-17 | 2017-11-24 | 칼 짜이스 에스엠티 게엠베하 | 중간이미지를 갖는 카타디옵트릭 투사 대물렌즈 |
| JP2006119244A (ja) * | 2004-10-20 | 2006-05-11 | Canon Inc | 反射屈折型投影光学系及び当該反射屈折型投影光学系を有する露光装置、デバイス製造方法 |
| JP2006133442A (ja) * | 2004-11-05 | 2006-05-25 | Nikon Corp | レンズ鏡筒およびこれを備えるカメラ |
| TWI308644B (en) * | 2004-12-23 | 2009-04-11 | Zeiss Carl Smt Ag | Hochaperturiges objektiv mlt obskurierter pupille |
| KR101590743B1 (ko) * | 2005-06-02 | 2016-02-01 | 칼 짜이스 에스엠티 게엠베하 | 마이크로리소그래피 투영 대물 렌즈 |
| JP4827481B2 (ja) * | 2005-09-30 | 2011-11-30 | オリンパスメディカルシステムズ株式会社 | 内視鏡 |
| JP2007159836A (ja) * | 2005-12-14 | 2007-06-28 | Pentax Corp | 内視鏡の対物レンズ部 |
| US7715016B2 (en) * | 2005-12-15 | 2010-05-11 | Chung Shan Institute Of Science And Technology | Image invariant optical speckle capturing device and method |
| DE102006045075A1 (de) * | 2006-09-21 | 2008-04-03 | Carl Zeiss Smt Ag | Steuerbares optisches Element |
| DE102010021539B4 (de) * | 2010-05-19 | 2014-10-09 | Carl Zeiss Smt Gmbh | Projektionsobjektiv mit Blenden |
-
2010
- 2010-05-19 DE DE102010021539.2A patent/DE102010021539B4/de not_active Expired - Fee Related
-
2011
- 2011-05-13 US US13/107,011 patent/US8488104B2/en active Active
- 2011-05-19 TW TW107100662A patent/TWI631369B/zh not_active IP Right Cessation
- 2011-05-19 TW TW104117760A patent/TWI615630B/zh not_active IP Right Cessation
- 2011-05-19 JP JP2011126713A patent/JP5622664B2/ja not_active Expired - Fee Related
- 2011-05-19 TW TW100117553A patent/TWI490539B/zh not_active IP Right Cessation
- 2011-05-19 KR KR1020110047417A patent/KR101526638B1/ko not_active Expired - Fee Related
- 2011-05-19 CN CN201110130001.4A patent/CN102253464B/zh active Active
-
2014
- 2014-06-17 JP JP2014124134A patent/JP5982429B2/ja not_active Expired - Fee Related
-
2016
- 2016-08-01 JP JP2016151327A patent/JP6545644B2/ja not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014209253A (ja) * | 2010-05-19 | 2014-11-06 | カール・ツァイス・エスエムティー・ゲーエムベーハー | 絞りを有する投影対物系 |
| JP2016212436A (ja) * | 2010-05-19 | 2016-12-15 | カール・ツァイス・エスエムティー・ゲーエムベーハー | 絞りを有する投影対物系 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2011248366A (ja) | 2011-12-08 |
| US8488104B2 (en) | 2013-07-16 |
| CN102253464B (zh) | 2014-04-02 |
| TW201812384A (zh) | 2018-04-01 |
| CN102253464A (zh) | 2011-11-23 |
| TW201534965A (zh) | 2015-09-16 |
| KR20110127620A (ko) | 2011-11-25 |
| TW201219826A (en) | 2012-05-16 |
| TWI615630B (zh) | 2018-02-21 |
| JP6545644B2 (ja) | 2019-07-17 |
| JP2014209253A (ja) | 2014-11-06 |
| JP5982429B2 (ja) | 2016-08-31 |
| DE102010021539B4 (de) | 2014-10-09 |
| TWI631369B (zh) | 2018-08-01 |
| JP2016212436A (ja) | 2016-12-15 |
| TWI490539B (zh) | 2015-07-01 |
| KR101526638B1 (ko) | 2015-06-19 |
| DE102010021539A1 (de) | 2011-11-24 |
| KR101526638B9 (ko) | 2025-01-08 |
| US20110285979A1 (en) | 2011-11-24 |
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