JP5536650B2 - 自己干渉蛍光顕微鏡検査のためのシステムと方法、及び、それに関連するコンピュータがアクセス可能な媒体 - Google Patents

自己干渉蛍光顕微鏡検査のためのシステムと方法、及び、それに関連するコンピュータがアクセス可能な媒体 Download PDF

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JP5536650B2
JP5536650B2 JP2010523165A JP2010523165A JP5536650B2 JP 5536650 B2 JP5536650 B2 JP 5536650B2 JP 2010523165 A JP2010523165 A JP 2010523165A JP 2010523165 A JP2010523165 A JP 2010523165A JP 5536650 B2 JP5536650 B2 JP 5536650B2
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JP2010538326A (ja
JP2010538326A5 (enExample
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コナー リー エバンス
ボアー ヨハネス エフ． デ
グルート マタイス デ
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
JP2010523165A 2007-08-31 2008-08-29 自己干渉蛍光顕微鏡検査のためのシステムと方法、及び、それに関連するコンピュータがアクセス可能な媒体 Expired - Fee Related JP5536650B2 (ja)

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US96939607P 2007-08-31 2007-08-31
US60/969,396 2007-08-31
PCT/US2008/074863 WO2009029843A1 (en) 2007-08-31 2008-08-29 System and method for self-interference fluoresence microscopy, and computer-accessible medium associated therewith

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JP2010538326A JP2010538326A (ja) 2010-12-09
JP2010538326A5 JP2010538326A5 (enExample) 2011-10-13
JP5536650B2 true JP5536650B2 (ja) 2014-07-02

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US (1) US8040608B2 (enExample)
EP (1) EP2191254B1 (enExample)
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IT201600117339A1 (it) * 2016-11-21 2018-05-21 Crestoptics S P A Apparato a super-risoluzione spaziale per l’analisi in fluorescenza del fondo dell’occhio
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