JP5525104B2 - 電子銃および電子ビーム装置 - Google Patents
電子銃および電子ビーム装置 Download PDFInfo
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- 229910052785 arsenic Inorganic materials 0.000 description 1
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- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Substances BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 description 1
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- 229910052747 lanthanoid Inorganic materials 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
- H01J1/02—Main electrodes
- H01J1/13—Solid thermionic cathodes
- H01J1/14—Solid thermionic cathodes characterised by the material
- H01J1/148—Solid thermionic cathodes characterised by the material with compounds having metallic conductive properties, e.g. lanthanum boride, as an emissive material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
- H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
- H01J29/48—Electron guns
- H01J29/485—Construction of the gun or of parts thereof
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
- H01J1/02—Main electrodes
- H01J1/13—Solid thermionic cathodes
- H01J1/20—Cathodes heated indirectly by an electric current; Cathodes heated by electron or ion bombardment
- H01J1/26—Supports for the emissive material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/06—Electron sources; Electron guns
- H01J37/065—Construction of guns or parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/06—Electron sources; Electron guns
- H01J37/07—Eliminating deleterious effects due to thermal effects or electric or magnetic fields
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/06—Electron sources; Electron guns
- H01J37/075—Electron guns using thermionic emission from cathodes heated by particle bombardment or by irradiation, e.g. by laser
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
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- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Electron Sources, Ion Sources (AREA)
- Electron Beam Exposure (AREA)
Description
図1は、実施形態に係る電子銃100の構成を示す図である。この例では、電子銃100は、光加熱方式を採用している。
ここで、単一のスポット(点状)ビームを用いるのであれば、電子銃陰極104の先端を尖らせたものを採用することもできる。このような形状の陰極は、走査型電子顕微鏡(SEM)のような電子ビーム検査装置にも好適である。本明細書では、電子ビーム露光装置、電子顕微鏡などの電子ビーム検査装置を総称して電子ビーム装置という。
図10には、上述した電子銃100を利用した電子ビーム露光装置の概略構成が示してある。鏡筒204は密閉状の円筒であり、上部に電子銃室201が仕切り壁202によって仕切り形成されている。鏡筒204の内部には、電子銃100から引き出された電子ビーム205を偏向、整形、収束などをするために、コイル、磁気レンズなどをから構成される、ビーム制御部として機能するレンズ・偏向光学系203が配置されている。そして、鏡筒204の下方には、ターゲット室210が配置されており、ここに描画される基板(ウェハ)であるターゲット206が載置されている。
本実施形態の電子銃は、マルチコラム電子ビーム露光装置に好適に適用できる。このマルチコラム電子ビーム露光装置は、たとえば略15mmから略50mm程度の太さの単一コラムエレメントを、2次元的に数十本以上(たとえば30本から250本以上)という数で複数個並べ、1枚のウェハ上に電子ビームを複数照射するマルチコラム群を構成する。このような構成によって、高速露光処理が可能となる。
上述のように、電子銃の加熱に光を用いることが好適である。図12は、本実施形態の光加熱式の電子銃と、その電子銃の制御部の構成図である。
Claims (5)
- 加熱されることによって電子を放出する柱形の電子銃陰極と、
先端の電子銃陰極保持部において前記電子銃陰極の底面および側面を覆い電子銃陰極を保持するとともに、電気伝導性を有し、加熱された状態で前記電子銃陰極と反応し難い材料で構成され、前記電子銃陰極保持部に向かって全体が先細り突き出る円錐台状の形状を有する保持具と、
を含み、
前記電子銃陰極は四角柱状であり、前記保持具は先端部に前記電子銃陰極を保持する円筒状の凹部を有し、この円筒状の凹部に四角柱状の電子銃陰極を挿入することで、前記保持具に前記電子銃陰極を保持するとともに、
前記電子銃陰極は、その先端に四角形の平坦面を有し、先端部が露出して前記保持具から突出しており、前記先端部に電界を印加することにより前記先端の平坦面から電子を前方に向けて放出することを特徴とする電子銃。 - 請求項1に記載の電子銃において、
前記電子銃陰極は、LaB6またはCeB6を含む6硼素化ランタノイド化合物の中から1種類を選択した材料からなることを特徴とする電子銃。 - 請求項1に記載の電子銃において、
前記保持具は、レニウムで構成されることを特徴とする電子銃。 - 請求項1に記載の電子銃において、
前記保持具の前記電子銃陰極を保持する先端側と反対の基部側で光導波路と結合され、前記電子銃陰極は、前記光導波路を介し供給される光によって前記保持具を介し加熱されることを特徴とする電子銃。 - 電子銃と、電子銃から電子を引き出すとともに方向付けをするビーム制御部と、このビーム制御部からの電子が照射されるターゲットを保持するターゲット保持部を有する電子ビーム装置であって、
前記電子銃は、
加熱されることによって電子を放出する柱形の電子銃陰極と、
先端の電子銃陰極保持部において前記電子銃陰極の底面および側面を覆い電子銃陰極を保持するとともに、電気伝導性を有し、加熱された状態で前記電子銃陰極と反応し難い材料で構成され、前記電子銃陰極保持部に向かって全体が先細り突き出る円錐台状の形状を有する保持具と、
を含み、
前記電子銃陰極は四角柱状であり、前記保持具は先端部に前記電子銃陰極を保持する円筒状の凹部を有し、この円筒状の凹部に四角柱状の電子銃陰極を挿入することで、前記保持具に前記電子銃陰極を保持するとともに、
前記電子銃陰極は、その先端に四角形の平坦面を有し、先端部が露出して前記保持具から突出しており、前記先端部に電界を印加することにより前記先端の平坦面から電子を前方に向けて放出すること特徴とする電子ビーム装置。
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PCT/JP2011/054377 WO2012114521A1 (ja) | 2011-02-25 | 2011-02-25 | 電子銃および電子ビーム装置 |
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JP2013074440A Division JP5709922B2 (ja) | 2013-03-29 | 2013-03-29 | 電子銃および電子ビーム装置 |
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JP5525104B2 true JP5525104B2 (ja) | 2014-06-18 |
JPWO2012114521A1 JPWO2012114521A1 (ja) | 2014-07-07 |
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Country | Link |
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US (1) | US9070527B2 (ja) |
EP (1) | EP2680294B1 (ja) |
JP (1) | JP5525104B2 (ja) |
KR (1) | KR20140044310A (ja) |
CN (1) | CN103392216B (ja) |
WO (1) | WO2012114521A1 (ja) |
Cited By (2)
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WO2021215330A1 (ja) | 2020-04-21 | 2021-10-28 | デンカ株式会社 | 電子源及びその製造方法、並びにエミッター及びこれを備える装置 |
WO2021215335A1 (ja) | 2020-04-21 | 2021-10-28 | デンカ株式会社 | 電子源及びその製造方法、並びにエミッター及びこれを備える装置 |
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JP6420998B2 (ja) * | 2014-09-03 | 2018-11-07 | 株式会社ニューフレアテクノロジー | 電子銃装置 |
JP6937310B2 (ja) * | 2016-09-06 | 2021-09-22 | 株式会社日立ハイテク | 電子源および電子線照射装置 |
US10141155B2 (en) * | 2016-12-20 | 2018-11-27 | Kla-Tencor Corporation | Electron beam emitters with ruthenium coating |
CN107068528B (zh) * | 2016-12-28 | 2018-08-24 | 中国电子科技集团公司第十八研究所 | 电子束聚焦线圈在焊接真空室内的电子枪保护装置 |
JP6636472B2 (ja) | 2017-02-28 | 2020-01-29 | 株式会社日立ハイテクノロジーズ | 電子源およびそれを用いた電子線装置 |
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Also Published As
Publication number | Publication date |
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JPWO2012114521A1 (ja) | 2014-07-07 |
EP2680294A4 (en) | 2014-10-08 |
CN103392216B (zh) | 2016-10-05 |
US9070527B2 (en) | 2015-06-30 |
WO2012114521A1 (ja) | 2012-08-30 |
EP2680294B1 (en) | 2015-09-09 |
EP2680294A1 (en) | 2014-01-01 |
US20140055025A1 (en) | 2014-02-27 |
KR20140044310A (ko) | 2014-04-14 |
CN103392216A (zh) | 2013-11-13 |
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