JP5470456B2 - 点灯検査装置 - Google Patents

点灯検査装置 Download PDF

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Publication number
JP5470456B2
JP5470456B2 JP2012520492A JP2012520492A JP5470456B2 JP 5470456 B2 JP5470456 B2 JP 5470456B2 JP 2012520492 A JP2012520492 A JP 2012520492A JP 2012520492 A JP2012520492 A JP 2012520492A JP 5470456 B2 JP5470456 B2 JP 5470456B2
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JP
Japan
Prior art keywords
lighting
jig
inspection
lighting jig
unit
Prior art date
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Expired - Fee Related
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JP2012520492A
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English (en)
Japanese (ja)
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JPWO2011158902A1 (ja
Inventor
直基 松本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
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Sharp Corp
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Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP2012520492A priority Critical patent/JP5470456B2/ja
Publication of JPWO2011158902A1 publication Critical patent/JPWO2011158902A1/ja
Application granted granted Critical
Publication of JP5470456B2 publication Critical patent/JP5470456B2/ja
Expired - Fee Related legal-status Critical Current
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP2012520492A 2010-06-17 2011-06-16 点灯検査装置 Expired - Fee Related JP5470456B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012520492A JP5470456B2 (ja) 2010-06-17 2011-06-16 点灯検査装置

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2010138593 2010-06-17
JP2010138593 2010-06-17
JP2012520492A JP5470456B2 (ja) 2010-06-17 2011-06-16 点灯検査装置
PCT/JP2011/063801 WO2011158902A1 (fr) 2010-06-17 2011-06-16 Dispositif d'inspection d'éclairage

Publications (2)

Publication Number Publication Date
JPWO2011158902A1 JPWO2011158902A1 (ja) 2013-08-19
JP5470456B2 true JP5470456B2 (ja) 2014-04-16

Family

ID=45348295

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012520492A Expired - Fee Related JP5470456B2 (ja) 2010-06-17 2011-06-16 点灯検査装置

Country Status (3)

Country Link
JP (1) JP5470456B2 (fr)
CN (1) CN102884567B (fr)
WO (1) WO2011158902A1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103240691B (zh) * 2013-04-19 2016-04-20 深圳市华星光电技术有限公司 一种液晶模组测试用夹具组件
CN104166026A (zh) * 2014-08-29 2014-11-26 苏州市吴中区胥口广博模具加工厂 一种小型显示屏点亮测试座
CN109916595B (zh) * 2019-03-27 2021-01-22 京东方科技集团股份有限公司 一种点亮夹具及大视角光学测试装置
CN111077399A (zh) * 2019-12-31 2020-04-28 苏州精濑光电有限公司 一种老化炉

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06161372A (ja) * 1992-11-18 1994-06-07 Sharp Corp ディスプレイパネル検査装置
JP2001074599A (ja) * 1999-08-31 2001-03-23 Soushiyou Tec:Kk フラットパネルディスプレイ又はプローブブロックの支持枠体
JP2005274487A (ja) * 2004-03-26 2005-10-06 Micronics Japan Co Ltd プローブ装置
JP2006119031A (ja) * 2004-10-22 2006-05-11 Micronics Japan Co Ltd パネルの検査装置に用いられる電気的接続装置
JP2007271572A (ja) * 2006-03-31 2007-10-18 Micronics Japan Co Ltd 可動式プローブユニット及び検査装置
JP2009265139A (ja) * 2008-04-22 2009-11-12 Hitachi High-Technologies Corp 液晶パネル検査装置及び液晶パネル検査方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1731203A (zh) * 2005-03-09 2006-02-08 飞而康公司 液晶显示器面板的检查装置及其检查方法
CN2828831Y (zh) * 2005-04-14 2006-10-18 均豪精密工业股份有限公司 液晶面板点灯检测机的自动尺寸调整装置
JP2007025132A (ja) * 2005-07-14 2007-02-01 Sharp Corp 点灯検査装置
JP5137336B2 (ja) * 2006-05-29 2013-02-06 株式会社日本マイクロニクス 可動式プローブユニット機構及び電気検査装置
TWM312850U (en) * 2006-11-21 2007-05-21 All Ring Tech Co Ltd Probe interval automatic adjustment mechanism for laser repairing machine of panel with lighting inspection function
CN101211021B (zh) * 2006-12-27 2010-08-25 富士迈半导体精密工业（上海）有限公司 面板检测装置
CN101140726B (zh) * 2007-10-22 2010-06-09 友达光电股份有限公司 面板点灯测试机及其检测方法
CN201166758Y (zh) * 2008-03-21 2008-12-17 北京京东方光电科技有限公司 检测夹具
JP2009251529A (ja) * 2008-04-10 2009-10-29 Micronics Japan Co Ltd 点灯検査装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06161372A (ja) * 1992-11-18 1994-06-07 Sharp Corp ディスプレイパネル検査装置
JP2001074599A (ja) * 1999-08-31 2001-03-23 Soushiyou Tec:Kk フラットパネルディスプレイ又はプローブブロックの支持枠体
JP2005274487A (ja) * 2004-03-26 2005-10-06 Micronics Japan Co Ltd プローブ装置
JP2006119031A (ja) * 2004-10-22 2006-05-11 Micronics Japan Co Ltd パネルの検査装置に用いられる電気的接続装置
JP2007271572A (ja) * 2006-03-31 2007-10-18 Micronics Japan Co Ltd 可動式プローブユニット及び検査装置
JP2009265139A (ja) * 2008-04-22 2009-11-12 Hitachi High-Technologies Corp 液晶パネル検査装置及び液晶パネル検査方法

Also Published As

Publication number Publication date
CN102884567A (zh) 2013-01-16
CN102884567B (zh) 2015-01-28
JPWO2011158902A1 (ja) 2013-08-19
WO2011158902A1 (fr) 2011-12-22

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