JP5262293B2 - 光半導体装置 - Google Patents

光半導体装置 Download PDF

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Publication number
JP5262293B2
JP5262293B2 JP2008136918A JP2008136918A JP5262293B2 JP 5262293 B2 JP5262293 B2 JP 5262293B2 JP 2008136918 A JP2008136918 A JP 2008136918A JP 2008136918 A JP2008136918 A JP 2008136918A JP 5262293 B2 JP5262293 B2 JP 5262293B2
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Japan
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layer
optical
type
semiconductor
wavelength
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JP2008136918A
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English (en)
Japanese (ja)
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JP2009283854A (ja
JP2009283854A5 (OSRAM
Inventor
栄太郎 石村
雅晴 中路
栄治 柳生
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2008136918A priority Critical patent/JP5262293B2/ja
Priority to US12/252,621 priority patent/US7928472B2/en
Priority to CN2009100081690A priority patent/CN101593784B/zh
Publication of JP2009283854A publication Critical patent/JP2009283854A/ja
Publication of JP2009283854A5 publication Critical patent/JP2009283854A5/ja
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00Nanooptics, e.g. quantum optics or photonic crystals
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/22Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
    • H10F30/225Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier working in avalanche mode, e.g. avalanche photodiodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/40Optical elements or arrangements
    • H10F77/413Optical elements or arrangements directly associated or integrated with the devices, e.g. back reflectors
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/548Amorphous silicon PV cells

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biophysics (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Light Receiving Elements (AREA)
  • Semiconductor Lasers (AREA)
JP2008136918A 2008-05-26 2008-05-26 光半導体装置 Active JP5262293B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2008136918A JP5262293B2 (ja) 2008-05-26 2008-05-26 光半導体装置
US12/252,621 US7928472B2 (en) 2008-05-26 2008-10-16 Optical semiconductor device with a distributed Bragg reflector layer
CN2009100081690A CN101593784B (zh) 2008-05-26 2009-03-09 光半导体装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008136918A JP5262293B2 (ja) 2008-05-26 2008-05-26 光半導体装置

Publications (3)

Publication Number Publication Date
JP2009283854A JP2009283854A (ja) 2009-12-03
JP2009283854A5 JP2009283854A5 (OSRAM) 2011-03-17
JP5262293B2 true JP5262293B2 (ja) 2013-08-14

Family

ID=41341457

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008136918A Active JP5262293B2 (ja) 2008-05-26 2008-05-26 光半導体装置

Country Status (3)

Country Link
US (1) US7928472B2 (OSRAM)
JP (1) JP5262293B2 (OSRAM)
CN (1) CN101593784B (OSRAM)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5444994B2 (ja) * 2009-09-25 2014-03-19 三菱電機株式会社 半導体受光素子
KR101028314B1 (ko) * 2010-01-29 2011-04-12 엘지이노텍 주식회사 발광 소자 및 그 제조방법
JP2011258809A (ja) * 2010-06-10 2011-12-22 Mitsubishi Electric Corp 半導体受光素子
JP2012174977A (ja) * 2011-02-23 2012-09-10 Sumitomo Electric Ind Ltd 受光素子およびその製造方法
JP6035921B2 (ja) * 2012-07-10 2016-11-30 富士通株式会社 光検出器およびその製造方法
JP5918706B2 (ja) * 2013-02-21 2016-05-18 日本電信電話株式会社 長波長帯面発光レーザ
US9876127B2 (en) 2013-11-22 2018-01-23 Taiwan Semiconductor Manufacturing Company, Ltd. Backside-illuminated photodetector structure and method of making the same
CN109844963B (zh) * 2016-10-28 2022-06-07 三菱电机株式会社 背面入射型受光元件及光模块
CN109461778A (zh) * 2018-10-31 2019-03-12 中国电子科技集团公司第四十四研究所 一种提高背照式光电二极管响应度的结构及制作方法
JP7044048B2 (ja) * 2018-12-19 2022-03-30 日本電信電話株式会社 アバランシェフォトダイオードおよびその製造方法
JP2021114594A (ja) * 2019-08-27 2021-08-05 株式会社東芝 光半導体素子
CN114792738B (zh) * 2021-01-26 2025-04-18 朗美通日本株式会社 半导体光接收元件
CN118738032B (zh) * 2024-09-04 2024-12-10 芯思杰技术(深圳)股份有限公司 光电探测芯片、距离传感器及电子设备

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62282469A (ja) * 1986-05-30 1987-12-08 Nec Corp 半導体受光素子
JPS639163A (ja) * 1986-06-30 1988-01-14 Nec Corp 半導体受光素子
JPH0821727B2 (ja) * 1988-11-18 1996-03-04 日本電気株式会社 アバランシェフォトダイオード
US5212703A (en) 1992-02-18 1993-05-18 Eastman Kodak Company Surface emitting lasers with low resistance bragg reflectors
JP3544352B2 (ja) * 2000-10-30 2004-07-21 日本電気株式会社 半導体受光素子
JP2004327886A (ja) * 2003-04-28 2004-11-18 Nippon Sheet Glass Co Ltd 半導体受光素子
JP2005019599A (ja) 2003-06-25 2005-01-20 Seiko Epson Corp 光素子およびその製造方法、光モジュール、光伝達装置
JP4611066B2 (ja) * 2004-04-13 2011-01-12 三菱電機株式会社 アバランシェフォトダイオード
US7372886B2 (en) 2004-06-07 2008-05-13 Avago Technologies Fiber Ip Pte Ltd High thermal conductivity vertical cavity surface emitting laser (VCSEL)
JP4609430B2 (ja) * 2004-10-25 2011-01-12 三菱電機株式会社 アバランシェフォトダイオード
JP2006253548A (ja) * 2005-03-14 2006-09-21 Mitsubishi Electric Corp 半導体受光素子
JP4985954B2 (ja) * 2006-06-27 2012-07-25 セイコーエプソン株式会社 面発光型半導体レーザ
JP4300245B2 (ja) * 2006-08-25 2009-07-22 キヤノン株式会社 多層膜反射鏡を備えた光学素子、面発光レーザ
JP4985298B2 (ja) 2007-10-10 2012-07-25 三菱電機株式会社 アバランシェフォトダイオード

Also Published As

Publication number Publication date
CN101593784B (zh) 2012-01-11
CN101593784A (zh) 2009-12-02
US7928472B2 (en) 2011-04-19
JP2009283854A (ja) 2009-12-03
US20090289316A1 (en) 2009-11-26

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