JP5237264B2 - シリルエチニル基類を有するアセン−チオフェンの共重合体類を含む電子機器 - Google Patents
シリルエチニル基類を有するアセン−チオフェンの共重合体類を含む電子機器 Download PDFInfo
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- JP5237264B2 JP5237264B2 JP2009506695A JP2009506695A JP5237264B2 JP 5237264 B2 JP5237264 B2 JP 5237264B2 JP 2009506695 A JP2009506695 A JP 2009506695A JP 2009506695 A JP2009506695 A JP 2009506695A JP 5237264 B2 JP5237264 B2 JP 5237264B2
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- carbon atoms
- acene
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- 229920001577 copolymer Polymers 0.000 title claims abstract description 93
- -1 silylethynyl groups Chemical group 0.000 title abstract description 118
- 125000004432 carbon atom Chemical group C* 0.000 claims description 59
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- 125000000217 alkyl group Chemical group 0.000 claims description 46
- 125000003342 alkenyl group Chemical group 0.000 claims description 29
- 125000004404 heteroalkyl group Chemical group 0.000 claims description 29
- 125000003545 alkoxy group Chemical group 0.000 claims description 27
- 125000002768 hydroxyalkyl group Chemical group 0.000 claims description 24
- 125000004001 thioalkyl group Chemical group 0.000 claims description 19
- 239000001257 hydrogen Substances 0.000 claims description 15
- 229910052739 hydrogen Inorganic materials 0.000 claims description 15
- 125000004435 hydrogen atom Chemical class [H]* 0.000 claims description 14
- 125000001424 substituent group Chemical group 0.000 claims description 12
- 125000005582 pentacene group Chemical group 0.000 claims description 4
- 239000004065 semiconductor Substances 0.000 abstract description 89
- 238000000034 method Methods 0.000 abstract description 37
- 239000010410 layer Substances 0.000 description 237
- 239000000463 material Substances 0.000 description 79
- 125000003118 aryl group Chemical group 0.000 description 64
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 59
- 239000000758 substrate Substances 0.000 description 48
- 239000000243 solution Substances 0.000 description 41
- 239000010409 thin film Substances 0.000 description 41
- 229910052757 nitrogen Inorganic materials 0.000 description 40
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 36
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 30
- 239000000203 mixture Substances 0.000 description 26
- HSFWRNGVRCDJHI-UHFFFAOYSA-N alpha-acetylene Natural products C#C HSFWRNGVRCDJHI-UHFFFAOYSA-N 0.000 description 23
- 125000003710 aryl alkyl group Chemical group 0.000 description 23
- 125000002534 ethynyl group Chemical group [H]C#C* 0.000 description 23
- 238000006243 chemical reaction Methods 0.000 description 21
- 125000000025 triisopropylsilyl group Chemical group C(C)(C)[Si](C(C)C)(C(C)C)* 0.000 description 21
- 125000005843 halogen group Chemical group 0.000 description 19
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 18
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- 229920003026 Acene Polymers 0.000 description 16
- 125000001188 haloalkyl group Chemical group 0.000 description 16
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 15
- 239000011248 coating agent Substances 0.000 description 15
- 238000000576 coating method Methods 0.000 description 15
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- 239000002019 doping agent Substances 0.000 description 14
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- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 12
- 125000001072 heteroaryl group Chemical group 0.000 description 12
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- SLIUAWYAILUBJU-UHFFFAOYSA-N pentacene Chemical compound C1=CC=CC2=CC3=CC4=CC5=CC=CC=C5C=C4C=C3C=C21 SLIUAWYAILUBJU-UHFFFAOYSA-N 0.000 description 12
- 150000003384 small molecules Chemical class 0.000 description 12
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- 238000004519 manufacturing process Methods 0.000 description 10
- FFUAGWLWBBFQJT-UHFFFAOYSA-N hexamethyldisilazane Chemical compound C[Si](C)(C)N[Si](C)(C)C FFUAGWLWBBFQJT-UHFFFAOYSA-N 0.000 description 9
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- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 8
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 8
- 239000000047 product Substances 0.000 description 8
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- 229930192474 thiophene Natural products 0.000 description 7
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- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 6
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 6
- 0 Cc1c(*)c([s]c(C)c2*)c2[s]1 Chemical compound Cc1c(*)c([s]c(C)c2*)c2[s]1 0.000 description 6
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- PQXKHYXIUOZZFA-UHFFFAOYSA-M lithium fluoride Chemical compound [Li+].[F-] PQXKHYXIUOZZFA-UHFFFAOYSA-M 0.000 description 6
- XKBGEWXEAPTVCK-UHFFFAOYSA-M methyltrioctylammonium chloride Chemical compound [Cl-].CCCCCCCC[N+](C)(CCCCCCCC)CCCCCCCC XKBGEWXEAPTVCK-UHFFFAOYSA-M 0.000 description 6
- 239000001301 oxygen Substances 0.000 description 6
- 229920000172 poly(styrenesulfonic acid) Polymers 0.000 description 6
- 239000002244 precipitate Substances 0.000 description 6
- 229910000029 sodium carbonate Inorganic materials 0.000 description 6
- SKRWFPLZQAAQSU-UHFFFAOYSA-N stibanylidynetin;hydrate Chemical compound O.[Sn].[Sb] SKRWFPLZQAAQSU-UHFFFAOYSA-N 0.000 description 6
- 239000000126 substance Substances 0.000 description 6
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- 125000000304 alkynyl group Chemical group 0.000 description 5
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- OGGKVJMNFFSDEV-UHFFFAOYSA-N 3-methyl-n-[4-[4-(n-(3-methylphenyl)anilino)phenyl]phenyl]-n-phenylaniline Chemical compound CC1=CC=CC(N(C=2C=CC=CC=2)C=2C=CC(=CC=2)C=2C=CC(=CC=2)N(C=2C=CC=CC=2)C=2C=C(C)C=CC=2)=C1 OGGKVJMNFFSDEV-UHFFFAOYSA-N 0.000 description 4
- MZRVEZGGRBJDDB-UHFFFAOYSA-N N-Butyllithium Chemical compound [Li]CCCC MZRVEZGGRBJDDB-UHFFFAOYSA-N 0.000 description 4
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- XBDYBAVJXHJMNQ-UHFFFAOYSA-N Tetrahydroanthracene Natural products C1=CC=C2C=C(CCCC3)C3=CC2=C1 XBDYBAVJXHJMNQ-UHFFFAOYSA-N 0.000 description 4
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- 125000000319 biphenyl-4-yl group Chemical group [H]C1=C([H])C([H])=C([H])C([H])=C1C1=C([H])C([H])=C([*])C([H])=C1[H] 0.000 description 3
- IPWKHHSGDUIRAH-UHFFFAOYSA-N bis(pinacolato)diboron Chemical compound O1C(C)(C)C(C)(C)OB1B1OC(C)(C)C(C)(C)O1 IPWKHHSGDUIRAH-UHFFFAOYSA-N 0.000 description 3
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- NXQGGXCHGDYOHB-UHFFFAOYSA-L cyclopenta-1,4-dien-1-yl(diphenyl)phosphane;dichloropalladium;iron(2+) Chemical compound [Fe+2].Cl[Pd]Cl.[CH-]1C=CC(P(C=2C=CC=CC=2)C=2C=CC=CC=2)=C1.[CH-]1C=CC(P(C=2C=CC=CC=2)C=2C=CC=CC=2)=C1 NXQGGXCHGDYOHB-UHFFFAOYSA-L 0.000 description 3
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- VJYJJHQEVLEOFL-UHFFFAOYSA-N thieno[3,2-b]thiophene Chemical compound S1C=CC2=C1C=CS2 VJYJJHQEVLEOFL-UHFFFAOYSA-N 0.000 description 3
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- TXUICONDJPYNPY-UHFFFAOYSA-N (1,10,13-trimethyl-3-oxo-4,5,6,7,8,9,11,12,14,15,16,17-dodecahydrocyclopenta[a]phenanthren-17-yl) heptanoate Chemical compound C1CC2CC(=O)C=C(C)C2(C)C2C1C1CCC(OC(=O)CCCCCC)C1(C)CC2 TXUICONDJPYNPY-UHFFFAOYSA-N 0.000 description 2
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- GKWLILHTTGWKLQ-UHFFFAOYSA-N 2,3-dihydrothieno[3,4-b][1,4]dioxine Chemical compound O1CCOC2=CSC=C21 GKWLILHTTGWKLQ-UHFFFAOYSA-N 0.000 description 2
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- 125000001622 2-naphthyl group Chemical group [H]C1=C([H])C([H])=C2C([H])=C(*)C([H])=C([H])C2=C1[H] 0.000 description 2
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- VBHGVDQBUYJVAH-UHFFFAOYSA-N 3,6-di(nonyl)thieno[3,2-b]thiophene Chemical compound CCCCCCCCCC1=CSC2=C1SC=C2CCCCCCCCC VBHGVDQBUYJVAH-UHFFFAOYSA-N 0.000 description 2
- ZVFQEOPUXVPSLB-UHFFFAOYSA-N 3-(4-tert-butylphenyl)-4-phenyl-5-(4-phenylphenyl)-1,2,4-triazole Chemical compound C1=CC(C(C)(C)C)=CC=C1C(N1C=2C=CC=CC=2)=NN=C1C1=CC=C(C=2C=CC=CC=2)C=C1 ZVFQEOPUXVPSLB-UHFFFAOYSA-N 0.000 description 2
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- C08G61/12—Macromolecular compounds containing atoms other than carbon in the main chain of the macromolecule
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- C08G61/123—Macromolecular compounds containing atoms other than carbon in the main chain of the macromolecule derived from five- or six-membered heterocyclic compounds, other than imides derived from five-membered heterocyclic compounds
- C08G61/126—Macromolecular compounds containing atoms other than carbon in the main chain of the macromolecule derived from five- or six-membered heterocyclic compounds, other than imides derived from five-membered heterocyclic compounds with a five-membered ring containing one sulfur atom in the ring
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- H10K85/113—Heteroaromatic compounds comprising sulfur or selene, e.g. polythiophene
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- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/466—Lateral bottom-gate IGFETs comprising only a single gate
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- H10K50/00—Organic light-emitting devices
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- Polyoxymethylene Polymers And Polymers With Carbon-To-Carbon Bonds (AREA)
- Electroluminescent Light Sources (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
Description
トリイソプロピルシリルアセチレン(12.32g、67.5mmol)及び乾燥ヘキサン(140mL)を乾燥窒素ブランケット下でオーブン乾燥丸底フラスコ(1L)に添加した。ブチルリチウム(ヘキサン中2.7M、14.5mL、39.2mmol)を、乾燥窒素下で注射器により1滴づつ混合物に添加した。混合物を室温で2時間攪拌した。この無色溶液に、乾燥THF(300mL)及び2,6−ジブロモアントラキノン(5.49g、15.0mmol)を乾燥窒素下で添加した。溶液は、即座に赤色になり、2,6−ジブロモアントラキニノンは、数分で溶解した。混合物を室温で一晩攪拌し、溶液は暗い赤色になった。脱イオン(DI)水(6.0mL)を添加し、色は明るい赤色に変わり、白い沈殿物が現れた。その後、HCI(18mL、10%)水溶液中のスズ(II)塩化物(8.088g、42.6mmol)を添加した。混合物を60℃まで2時間加熱し、次いで室温まで冷却した。回転蒸発により、溶媒を除去した。混合物にDI水(100mL)を添加し、次いでヘキサン(100mL×3)で抽出した。ヘキサン溶液を中性になるまでDI水で洗浄した。それをカラムクロマトグラフィー(シリカゲル/ヘキサン、Rf=0.7)で濃縮し、精製した。明るい黄色の固体(8.55g、収率:82%)が生成物として取得された。1H NMR(400MHz、CDCl3)。δppm8.797〜8.802(d,2H,J=2.0Hz)、8.431〜8.454(d,2H,J=8.8Hz)、7.647〜7.674(dd,2H,J=8.8Hz,J=2.0Hz)、1.259(s,36H)、1.247(s,6H)。
予備的な実施例1の2,6−ジブロモ−9,10−ビス[(トリイソプロピルシリル)エチニル]アントラセン(5.225g、7.5mmol)、ビス(ピナコラト)ジボロン(4.763g、18.8mmol)、KOAc(2.940g、30.0mmol)、及びCHCl3(100mL)を乾燥窒素下で250mLのフラスコに入れた。懸濁KOAcを有する黄色い溶液を得た。懸濁液を脱気して酸素の痕跡を除去した。次いで[1,1’−ビス(ジフェニルホスフィノ)フェロセン]ジクロロパラジウム(0.205g)を乾燥窒素下で添加した。溶液はオレンジ色に変化した。混合物を70℃で3日間攪拌した後、室温まで冷却した。それをDI水(100mL×3)で洗浄し、MgSO4上で乾燥した。回転蒸発により、溶媒を除去した。カラムクロマトグラフィー(シリカゲル、CHCl3)で固体残基を精製し、エチルアセテートから再結晶させた。オレンジ色の針状結晶が生成物として取得された(3.20g、収率55%)。1H NMR(400MHz、CDCl3)。δppm9.250〜9.254(dd,2H,J=0.8Hz,J=0.8Hz)、8.579〜8.603(dd,2H,J=8.8Hz,J=0.8Hz)、7.901〜7.926(dd,2H,J=8.8Hz,J=1.2Hz)、1.384(s,24H)、1.288(s,36H)、1.279(s,6H)。
250mLのシュレンクフラスコに、2,6−ビス−(4,4,5,5−テトラメチル−1,3,2−ジオキサボロラン−2−イル)−9,10−ビス[(トリイソプロピルシリル)エチニル]アントラセン(1.552g、2.00mmol)、2,5−ジブロモ−3,4−エチレンジオキシチオフェン(0.600g、2.00mmol)、炭酸ナトリウム(1.060g、10.0mmol)、ALIQUAT336(0.241g)、蒸留水(10mL)、及びトルエン(100mL)を充填した。酸素を除去するために、窒素下で、シュレンクラインを使用して混合物を3度脱気した。次いで、乾燥窒素流下でテトラキス(トリフェニルホスフィン)パラジウム(0)(0.025g、0.02mmol)を添加した。もう1度脱気した後、混合物を乾燥窒素下で90℃で46時間攪拌した。共重合体をエンドキャップするために、更に2,6−ビス−(4,4,5,5−テトラメチル−1,3,2−ジオキサボロラン−2−イル)−9,10−ビス[(トリイソプロピルシリル)エチニル]アントラセン(0.015g)を添加し、続いて24時間後にブロモベンゼン(0.5mL)を添加した。溶液を更に24時間攪拌し、室温まで冷却した。トルエン溶液を分離し、DI水(150mL×3)で洗浄した。次いで、それをろ過して固体不純物の痕跡を除去した。ろ液を勢いよく攪拌しながらMeOH(350mL)に添加した。ろ過により、赤色の沈殿物が回収された後、MeOH(ソックレー抽出により)で24時間洗浄した。赤色の固体(1.39g、収率:およそ100%)を生成物として得た。Mw=11,000g/mol。1H NMR(400MHz、CDCl3)。δppm8.91〜9.30(br,2H)、8.49〜8.91(br,2H)、7.75〜8.31(br,2H)、4.19〜4.71(br,4H)、1.12〜1.15(br,42H)。
250mLのシュレンクフラスコに、2,6−ビス−(4,4,5,5−テトラメチル−1,3,2−ジオキサボロラン−2−イル)−9,10−ビス[(トリイソプロピルシリル)エチニル]アントラセン(1.552g、2.00mmol)、2,5−ジブロモ−3−ヘキシルチオフェン(0.652g、2.00mmol)、炭酸ナトリウム(1.060g、10.0mmol)、ALIQUAT336(0.241g)、蒸留水(10mL)、及びトルエン(100mL)を充填した。酸素を除去するために、乾燥窒素下で、シュレンクラインを使用して混合物を3度脱気した。次いで、テトラキス(トリフェニルホスフィン)パラジウム(0)(0.030g、0.02mmol)乾燥窒素流下で添加した。もう1度脱気した後、混合物を乾燥窒素下で90℃で48時間攪拌した。更に2,6−ビス−(4,4,5,5−テトラメチル−1,3,2−ジオキサボロラン−2−イル)−9,10−ビス[(トリイソプロピルシリル)エチニル]アントラセン(0.015g)を添加し、反応物を15時間攪拌し、続いてブロモベンゼン(80μL(マイクロリットル))を添加した。反応混合物を更に24時間攪拌し、室温まで冷却した。赤色のトルエン溶液を分離し、DI水(100mL×4)で洗浄した。その後、それをろ過して固体不純物の痕跡を除去した。ろ液を濃縮し、勢いよく攪拌しながらMeOH(300mL)に添加した。ろ過により、赤色の沈殿物が回収された後、MeOH(ソックレー抽出により)で24時間洗浄した。赤色の固体(1.24g、収率:88%)を生成物として得た。Mw=11,600g/mol。1H NMR(400MHz、CDCl3)。δppm8.89〜9.06(br,1H)、8.78〜8.87(br,1H)、8.62〜8.74(br,2H)、7.88〜8.01(br,1H)、7.74〜7.86(br,1H)、7.52〜7.65(br,1H)、2.82〜3.03(br,2H)、1.69〜1.84(br,2H)、1.08〜1.50(br,48H)、0.71〜0.90(br,3H)。
250mLのシュレンクフラスコに、2,6−ビス−(4,4,5,5−テトラメチル−1,3,2−ジオキサボロラン−2−イル)−9,10−ビス[(トリイソプロピルシリル)エチニル]アントラセン(3.909g、5.04mmol)、2,5−ジブロモ−3,4−ジヘキシルチオフェン(2.121g、5.17mmol)、炭酸ナトリウム(2.65g、25.0mmol)、ALIQUAT336(1.0g)、蒸留水(10mL)、及びトルエン(100mL)を充填した。酸素を除去するために、窒素下で、シュレンクラインを使用して混合物を3度脱気した。次いで、乾燥窒素流下でテトラキス(トリフェニルホスフィン)パラジウム(0)(0.125g、0.10mmol)を添加した。もう1度脱気した後、混合物を乾燥窒素下で90℃で72時間攪拌した。その後、それを室温まで冷却した。赤色のトルエン溶液を分離し、DI水(150mL×3)で洗浄した。その後、それをろ過して固体不純物の痕跡を除去した。ろ液を勢いよく攪拌しながらMeOH(350mL)に添加した。ろ過により、赤色の沈殿物が回収された後、MeOH(ソックレー抽出により)で24時間洗浄した。赤色の固体(3.53g、収率:89%)を生成物として得た。Mw=36,300g/mol。1H NMR(400MHz、CDCl3)。δppm8.81〜8.90(br,2H)、8.61〜8.76(br,2H)、7.71〜7.87(br,2H)、2.68〜3.05(br,4H)、1.46〜1.63(br,4H)、1.09〜1.40(br,54H)、0.69〜0.84(br,6H)。
シュレンクフラスコ(250mL)に、2,6−ビス−(4,4,5,5−テトラメチル−1,3,2−ジオキサボロラン−2−イル)−9,10−ビス[(トリイソプロピルシリル)エチニル]アントラセン(0.3888g、0.50mmol)、2,5−ジブロモチオフェン(0.121g、0.50mmol)、炭酸ナトリウム0.265g、2.50mmol)、ALIQUAT336(0.118g)、蒸留水(3mL)、及びトルエン(30mL)を充填した。酸素を除去するために、窒素下で、シュレンクラインを使用して混合物を3度脱気した。その後、乾燥窒素流下でテトラキス(トリフェニルホスフィン)パラジウム(0)(0.016g、0.01mmol)を添加した。もう1度脱気した後、混合物を乾燥窒素下で90℃で48時間攪拌した。それを室温まで冷却した。赤色のトルエン溶液を分離し、DI水(150mL×3)で洗浄した。その後、それをろ過して固体不純物の痕跡を除去した。ろ液を勢いよく攪拌しながらMeOH(200mL)に添加した。ろ過により、赤色の沈殿物が回収された後、MeOH(ソックレー抽出により)で24時間洗浄した。赤色の固体(0.28g、収率:91%)を生成物として得た。Mw=8,500g/mol。1H NMR(400MHz、CDCl3)。δppm8.10〜9.00(br,4H)、7.50〜8.00(br,2H)、7.00〜7.50(br,2H)、0.93〜1.96(br,42H)。
100mLのシュレンクフラスコに、2,6−ビス−(4,4,5,5−テトラメチル−1,3,2−ジオキサボロラン−2−イル)−9,10−ビス[(トリイソプロピルシリル)エチニル]アントラセン(0.233g、0.30mmol)、2,5−ジブロモ−3,6−ジノニルチエノ[3,2−b]チオフェン(0.165g、0.30mmol)、炭酸ナトリウム(0.159g、1.5mmol)、ALIQUAT336(0.096g)、蒸留水(1.5mL)、及びトルエン(30mL)を充填した。酸素を除去するために、乾燥窒素下で、シュレンクラインを使用して混合物を3度脱気した。その後、乾燥窒素流下でテトラキス(トリフェニルホスフィン)パラジウム(0)(0.009g)を添加した。もう1度脱気した後、混合物を乾燥窒素下で90℃で45時間攪拌した。それを室温まで冷却した。赤色のトルエン溶液を分離し、DI水(100mL×3)で洗浄した。その後、それをろ過して固体不純物の痕跡を除去した。ろ液を濃縮し、勢いよく攪拌しながらMeOH(200mL)に添加した。ろ過により、赤色の沈殿物が回収された後、MeOH(ソックレー抽出により)で24時間洗浄した。赤色の固体(0.105g、収率:38%)を生成物として得た。Mw=13,100g/mol。1H NMR(400MHz、CDCl3)。δppm8.78〜8.95(br,2H)、8.54〜8.77(br,2H)、7.70〜7.97(br,2H)、2.58〜3.17(br,4H)、1.68〜2.00(br,4H)、1.03〜1.50(br,66H)、0.68〜0.90(br,6H)。
OTS処理基材の作製:
シリコンウエファーをイソプロパノール中で30分間超音波で洗浄した。乾燥窒素流下で乾燥後、室温で20時間、乾燥窒素下でn−オクタデシルトリクロロシラントルエン溶液(0.1% v/v)にそれらを浸漬した。その後、それらをCHCl3で洗浄し、乾燥窒素下で乾燥し、膜蒸着の前に乾燥窒素中に保管した。
シリコンウエファーをイソプロパノール中で30分間超音波で洗浄した。乾燥窒素流下で乾燥後、乾燥窒素下、室温で20時間、密閉容器内でそれらを1,1,1,3,3,3−ヘキサメチルジシラザン蒸気に暴露した。それらを膜蒸着前に乾燥窒素中に保管した。
ポリ(3,4−エチレンジオキシ−2,5−チオフェン−アルト−9,10−ビス[(トリイソプロピルシリル)エチニル]−2,6−アントラセン)(実施例1)、ポリ(3−ヘキシル−2,5−チオフェン−アルト−9,10−ビス−[(トリイソプロピルシリル)エチニル]−2,6−アントラセン)(実施例2)、ヘプタン溶液(およそ0.4質量%)中のポリ(3,4−ジヘキシルチオフェン−アルト−9,10−ビス[(トリイソプロピルシリル)エチニル]−2,6−アントラセン)(実施例3)及びポリ(2,5−チオフェン−アルト−9,10−ビス[(トリイソプロピルシリル)エチニル]−2,6−アントラセン)中のポリ(3,4−ジヘキシルチオフェン−アルト−9,10−ビス[(トリイソプロピルシリル)エチニル]−2,6−アントラセン)(実施例4)、THF溶液(およそ0.8質量%)中のポリ(3,6−ジノニル−2,5−チエノ[3,2−b]チオフェン−アルト−9,10−ビス[(トリイソプロピルシリル)エチニル]−2,6−アントラセン)(実施例5)を、それぞれシリコンウエファー、OTS処理シリコンウエファー、又はHMDS処理シリコンウエファー上でナイフコーティングした。風乾後、金ソース/ドレイン電極(厚さ60ナノメートル)をポリマーシャドーマスクにより、熱蒸発法を使用してパターン形成した。チャンネル長(L)107マイクロメートル及びチャンネル幅(W)1000マイクロメートルを使用した。
ヒューレット・パッカード半導体パラメータ分析機(Hewlett Packard Semiconductor Parameter Analyzer)(モデル4145A、ヒューレット・パッカード社(Hewlett Packard Corporation)、カリフォルニア州パロアルト(Palo Alto)から入手可能)を使用して、ドレイン電圧(Vd)を−40Vに維持する一方、ゲート電圧(Vg)を+10V〜−40Vまで掃引することによって、薄膜トランジスタを周囲条件下で特性化した。Id 1/2−Vgへの線状適合のトレースは、飽和移動度及び閾値電圧(Vt)の抽出を可能にした。Id−Vgへの線状適合のトレースは、電流オン/オフ率を算出できるようにした。
薄膜光電池の作製
3つの薄膜光電池は、以下のように、25ohm/squareの抵抗を有するITO/ガラス基材をシン・フィルム・デバイシーズ(Thin Film Devaices)(カリフォルニア州アナハイム(Anaheim))から入手し、石鹸溶液、脱イオン水、アセトン、次いでイソプロパノール中で、続けて超音波で洗浄して作製された。洗浄された基材を窒素ガス流中で乾燥した。
キースレー(Keithley)マルチメーター、モデル197A(オハイオ州クリーブランド(Cleveland))を使用して、光電流測定を行った。光源は、3M 9200オーバーヘッドプロジェクターであった。3M 9200プロジェクターランプの出力密度は、約40〜60mW/cm2であった。光電池を、プロジェクターランプから約2cmの距離から暴露した。最初に、ショートが発生していないことを確認するために、アノードとカソードとの間の電気抵抗を最初に測定した。測定された電気抵抗は、実施例6については、1,000MΩ(106Ω)を上回り、実施例7については、30MΩを上回り、実施例8については、20MΩを上回った。プロジェクターランプに暴露したとき、実施例6については、光電流密度は、約8μA/cm2、であり、実施例7については、光電流密度は、2μA/cm2であり、実施例8については、光電流密度は、約70μA/cm2であった。
[1]
式Iのアセン−チオフェンの共重合体を備える電子機器であって、
Acは、2〜5の縮合ベンゼン環を有するアセンの基であり、Acは、アルキル、アルコキシ、チオアルキル、アリール、アラルキル、ハロ、ハロアルキル、ヒドロキシアルキル、ヘテロアルキル、アルケニル、又はその組み合わせから選択される置換基で任意に置換することができ、
R a はそれぞれ、水素、アルキル、アルコキシ、アルケニル、アリール、ヘテロアリール、アラルキル、ヘテロアラルキル、ヘテロアルキル、又はヒドロキシアルキルから独立して選択され、
Qは、式II、III、IV、又はVの二価基であり、
nは、4以上の整数である、電子機器。
[2]
Acが、ナフタレン、アントラセン、テトラセン、又はペンタセンから選択される、項目1に記載の電子機器。
[3]
各Eが、式−C≡C−Si(R a ) 3 のシリルエチニル基である、式−Ac(E) 2 −の二価基は、1,4−ビス(シリルエチニル)ナフタレン−2,6−ジイル、1,4−ビス(シリルエチニル)ナフタレン−2,7−ジイル、9,10−ビス(シリルエチニル)アントラセン−2,6−ジイル、9,10−ビス(シリルエチニル)アントラセン−2,7−ジイル、2,6−ビス(シリルエチニル)アントラセン−9,10−ジイル、2,7−ビス(シリルエチニル)アントラセン−9,10−ジイル、6,13−ビス(シリルエチニル)ペンタセン−2,9−ジイル、6,13−ビス(シリルエチニル)ペンタセン−2,10−ジイル、2,9−ビス(シリルエチニル)ペンタセン−6,13−ジイル、又は2,10−ビス(シリルエチニル)ペンタセン−6,13−ジイルから選択される、項目1に記載の電子機器。
[4]
式−Ac(E) 2 −の前記二価基が、1,4−ビス(シリルエチニル)ナフタレン−2,6−ジイル、9,10−ビス(シリルエチニル)アントラセン−2,6−ジイル、又は6,13−ビス(シリルエチニル)ペンタセン−2,9−ジイルから選択される、項目3に記載の電子機器。
[5]
式Iの前記共重合体が、半導体層に存在する、項目1に記載の電子機器。
[6]
前記電子機器が、有機薄膜トランジスタを備える、項目5に記載の電子機器。
[7]
式Iの前記共重合体が、第1の電極と第2の電極との間の層に存在する、項目1に記載の電子機器。
[8]
前記電子機器が、光電池である、項目7に記載の電子機器。
[9]
電子機器が、有機エレクトロルミネセント素子を備え、式Iの前記共重合体が、該有機エレクトロルミネセント素子内の正孔輸送層に存在する、項目7に記載の電子機器。
[10]
前記電子機器が、有機エレクトロルミネセント素子を備え、式Iの前記共重合体が、該有機エレクトロルミネセント素子内の発光層に存在する、項目7に記載の電子機器。
[11]
電子機器を作製する方法であって、式Iのアセン−チオフェン共重合体を備える共重合体層を提供する工程を含み、
Acは、2から5の縮合ベンゼン環を有するアセンの基であり、Acは、アルキル、アルコキシ、チオアルキル、アリール、アラルキル、ハロ、ハロアルキル、ヒドロキシアルキル、ヘテロアルキル、アルケニル、又はその組み合わせから選択される置換基で任意に置換することができ、
R a はそれぞれ、水素、アルキル、アルコキシ、アルケニル、アリール、ヘテロアリール、アラルキル、ヘテロアラルキル、ヘテロアルキル、又はヒドロキシアルキルから独立して選択され、
Qは、式II、III、IV、又はVの二価基であり、
nは、4以上の整数である、方法。
[12]
前記共重合体層を提供する工程が、
前記アセン−チオフェン共重合体及び溶媒を含むコーティング溶液を調製する工程であって、該アセン−チオフェン共重合体は、該コーティング溶液の重量に基づき、少なくとも0.05重量%の量で存在する、工程と、
前記コーティング溶液から溶液層を形成する工程と、
該溶液層から少なくともいくらかの該溶媒を除去する工程と、を含む、項目11に記載の方法。
[13]
前記共重合体層に隣接する第1の層を提供する工程を更に備え、該第1の層が、導電層又は誘電体層を含む、項目11に記載の方法。
[14]
電子機器が、有機薄膜トランジスタであり、前記方法が、
ゲート電極、
ゲート誘電体層、
前記共重合体層を含む半導体層、
ソース電極とドレイン電極とを含む層、の順で多層を配列する工程を更に含み、該ソース電極及び該ドレイン電極が、互いに分離し、該半導体層が、該ドレイン電極及び該ソース電極の双方に接触する、項目11に記載の方法。
[15]
電子機器が、有機薄膜トランジスタであり、前記方法が、
ゲート電極、
ゲート誘電体層、
ソース電極及びドレイン電極を含む層であって、該ソース電極及び該ドレイン電極が互いに分離する層と、
前記ソース電極及び前記ドレイン電極の双方に接触する半導体層であって、前記共重合体層を含む半導体層、の順で多層を配列する工程を更に含む、項目11に記載の方法。
[16]
第1の電極と第2の電極との間に前記共重合体層を配置する工程を更に含む、項目11に記載の方法。
[17]
前記電子機器が、光電池を備え、前記方法は、アノードとカソードとの間に前記共重合体層を配置する工程を更に含む、項目11に記載の方法。
[18]
電子機器が、有機エレクトロルミネセント素子を備え、前記方法が、アノードとカソードとの間に前記共重合体層を配置する工程を更に含む、項目11に記載の方法。
[19]
前記有機エレクトロルミネセント素子が、前記共重合体層を含む正孔輸送層を備える、項目18に記載の方法。
[20]
前記有機エレクトロルミネセント素子が、前記共重合体層を含む発光層を備える、項目18に記載の方法。
[21]
各Eが、式−C≡C−Si(R a ) 3 のシリルエチニル基である、式−Ac(E) 2 −の二価基が、1,4−ビス(シリルエチニル)ナフタレン−2,6−ジイル、1,4−ビス(シリルエチニル)ナフタレン−2,7−ジイル、9,10−ビス(シリルエチニル)アントラセン−2,6−ジイル、9,10−ビス(シリルエチニル)アントラセン−2,7−ジイル、2,6−ビス(シリルエチニル)アントラセン−9,10−ジイル、2,7−ビス(シリルエチニル)アントラセン−9,10−ジイル、6,13−ビス(シリルエチニル)ペンタセン−2,9−ジイル、6,13−ビス(シリルエチニル)ペンタセン−2,10−ジイル、2,9−ビス(シリルエチニル)ペンタセン−6,13−ジイル、又は2,10−ビス(シリルエチニル)ペンタセン−6,13−ジイルから選択される、項目10に記載の電子機器。
Claims (1)
- 式Iのアセン−チオフェン共重合体を備える電子機器であって、
Acは、アントラセン又はペンタセンの基であり、Acは、1〜10の炭素原子を有するアルキル、1〜10の炭素原子を有するアルコキシ、1〜10の炭素原子を有するチオアルキル、1〜10の炭素原子を有するヒドロキシアルキル、1〜10の炭素原子を有するヘテロアルキル、2〜10の炭素原子を有するアルケニル、又はその組み合わせから選択される置換基で置換されていてもよく、
Raはそれぞれ、水素、1〜6の炭素原子を有するアルキル、1〜6の炭素原子を有するアルコキシ、2〜6の炭素原子を有するアルケニル、1〜6の炭素原子を有するヘテロアルキル、又は1〜6の炭素原子を有するヒドロキシアルキルから独立して選択され、
Qは、式II、III、又はVの二価基であり、
nは、4以上の整数である、電子機器。
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US11/379,662 US7495251B2 (en) | 2006-04-21 | 2006-04-21 | Electronic devices containing acene-thiophene copolymers with silylethynyl groups |
US11/379,662 | 2006-04-21 | ||
PCT/US2007/066622 WO2007124286A1 (en) | 2006-04-21 | 2007-04-13 | Electronic devices containing acene-thiophene copolymers with silylethynyl groups |
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JP2009534853A JP2009534853A (ja) | 2009-09-24 |
JP2009534853A5 JP2009534853A5 (ja) | 2010-05-06 |
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EP (1) | EP2011157B1 (ja) |
JP (1) | JP5237264B2 (ja) |
CN (1) | CN101427381B (ja) |
AT (1) | ATE459104T1 (ja) |
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2007
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- 2007-04-13 EP EP07760639A patent/EP2011157B1/en not_active Not-in-force
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DE602007004969D1 (de) | 2010-04-08 |
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EP2011157A1 (en) | 2009-01-07 |
ATE459104T1 (de) | 2010-03-15 |
US20070249087A1 (en) | 2007-10-25 |
CN101427381A (zh) | 2009-05-06 |
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