JP5154741B2 - 雑音特性表示方法 - Google Patents
雑音特性表示方法 Download PDFInfo
- Publication number
- JP5154741B2 JP5154741B2 JP2005154746A JP2005154746A JP5154741B2 JP 5154741 B2 JP5154741 B2 JP 5154741B2 JP 2005154746 A JP2005154746 A JP 2005154746A JP 2005154746 A JP2005154746 A JP 2005154746A JP 5154741 B2 JP5154741 B2 JP 5154741B2
- Authority
- JP
- Japan
- Prior art keywords
- frequency
- noise characteristic
- time
- frame
- spectrum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title claims description 16
- 238000001228 spectrum Methods 0.000 claims description 36
- 238000005259 measurement Methods 0.000 claims description 18
- 239000003550 marker Substances 0.000 description 6
- 238000004891 communication Methods 0.000 description 4
- 230000010354 integration Effects 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000002123 temporal effect Effects 0.000 description 2
- 230000001052 transient effect Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000011002 quantification Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/16—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
Description
8 小ピーク(スプリアス)
10 スペクトラム波形
12 スペクトログラム波形
14 斑点パターン(スプリアス)
16 マーカ
18 第1時間マーカ
20 第2時間マーカ
22 アナログ・ダウン・コンバータ
24 アナログ・デジタル変換回路
26 デジタル・ダウン・コンバータ
28 高速フーリエ変換演算ブロック
30 メモリ
70 雑音特性波形
72 雑音特性波形のピーク
74 マーカ
76 雑音特性パターン
78 斑点パターン
fp 基準周波数
Fo オフセット周波数
Fr 雑音特性の周波数分解能
Claims (2)
- 基準周波数が過渡的に変化する被測定信号から時間領域データを生成し、所定時間毎に所定数の上記時間領域データを1フレームとして演算で変換することにより、上記フレーム毎の被測定スペクトラムを生成するステップと、
上記フレーム毎の上記被測定スペクトラムを記憶するステップと、
記憶された上記フレーム毎の上記被測定スペクトラムについてそれぞれ上記基準周波数を定めるステップと、
上記フレーム毎に、上記基準周波数からの複数のオフセット周波数毎の上記被測定スペクトラムの電力を所定周波数幅について積分した積分値をそれぞれ算出するステップと、
上記フレームに対応させて、複数の上記オフセット周波数と、複数の上記オフセット周波数にそれぞれ対応する上記積分値とを用いて雑音特性を表示するステップと
を具える雑音特性表示方法。 - 上記積分値を上記所定周波数幅で除算した除算値を算出するステップと、
上記基準周波数における上記被測定スペクトラムの電力に対する上記除算値の比を雑音特性値として算出するステップと
を更に具え、上記積分値に代えて上記雑音特性値を用いて上記雑音特性を表示することを特徴とする請求項1記載の雑音特性表示方法。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005154746A JP5154741B2 (ja) | 2005-05-26 | 2005-05-26 | 雑音特性表示方法 |
US11/441,708 US7554338B2 (en) | 2005-05-26 | 2006-05-26 | Display for measuring phase noise characteristics |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005154746A JP5154741B2 (ja) | 2005-05-26 | 2005-05-26 | 雑音特性表示方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006329839A JP2006329839A (ja) | 2006-12-07 |
JP5154741B2 true JP5154741B2 (ja) | 2013-02-27 |
Family
ID=37525136
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005154746A Expired - Fee Related JP5154741B2 (ja) | 2005-05-26 | 2005-05-26 | 雑音特性表示方法 |
Country Status (2)
Country | Link |
---|---|
US (1) | US7554338B2 (ja) |
JP (1) | JP5154741B2 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101848751B1 (ko) * | 2016-11-23 | 2018-04-13 | (주)그린텍시스템 | 노이즈 상태 표시기능을 갖는 지능형 파이로트 램프 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI294730B (en) * | 2005-07-01 | 2008-03-11 | Benq Corp | Seamless wlan channel migration |
JP2009270896A (ja) * | 2008-05-02 | 2009-11-19 | Tektronix Japan Ltd | 信号分析装置及び周波数領域データ表示方法 |
KR101145267B1 (ko) * | 2010-04-21 | 2012-05-24 | 고려대학교 산학협력단 | 임피던스 및 잡음 특성 동시 측정 시스템, 방법, 및 상기 방법을 실행시키기 위한 컴퓨터 판독 가능한 프로그램을 기록한 매체 |
US8248297B1 (en) * | 2011-04-11 | 2012-08-21 | Advanced Testing Technologies, Inc. | Phase noise measurement system and method |
Family Cites Families (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2627501B2 (ja) * | 1987-03-06 | 1997-07-09 | アンリツ株式会社 | スペクトラムアナライザ |
JP2557118B2 (ja) * | 1990-01-29 | 1996-11-27 | 日本電信電話株式会社 | タイミングジッタの測定方法 |
US5093751A (en) * | 1990-03-21 | 1992-03-03 | Hitachi Electronics Engineering Co., Ltd. | Carry noise measuring system for magnetic recording medium |
US5072168A (en) * | 1990-11-09 | 1991-12-10 | Hewlett-Packard Company | Automatic scaling for display of modulation domain measurements |
US5073822A (en) * | 1990-11-19 | 1991-12-17 | Tektronix, Inc. | In-service cable television measurements |
JP2858483B2 (ja) * | 1991-01-08 | 1999-02-17 | 日本電気株式会社 | 受信モニタ装置 |
US5337014A (en) * | 1991-06-21 | 1994-08-09 | Harris Corporation | Phase noise measurements utilizing a frequency down conversion/multiplier, direct spectrum measurement technique |
JPH05249161A (ja) * | 1992-03-09 | 1993-09-28 | Toshiba Corp | ジッタ測定装置 |
JPH0783980A (ja) * | 1993-09-20 | 1995-03-31 | Advantest Corp | ジッタ/ワンダ解析装置 |
US5457585A (en) * | 1994-04-22 | 1995-10-10 | International Business Machines Corporation | Tape edge detector using off tape and on tape MR noise |
US6535560B1 (en) * | 1999-06-03 | 2003-03-18 | Ditrans Corporation | Coherent adaptive calibration system and method |
US7003414B1 (en) * | 1999-11-30 | 2006-02-21 | Agilent Technologies, Inc. | Monitoring system and method implementing failure time spectrum scan |
JP3921035B2 (ja) * | 2000-06-14 | 2007-05-30 | アンリツ株式会社 | 位相雑音伝達特性解析装置 |
WO2002041505A2 (en) * | 2000-11-16 | 2002-05-23 | Broadcom Corporation | Method and apparatus for detection and classification of impairments on an rf modulated network |
JP3947770B2 (ja) * | 2001-03-12 | 2007-07-25 | 直樹 末広 | 多種拡散系列を用いたcdma通信方式 |
JP2002341959A (ja) * | 2001-05-15 | 2002-11-29 | Rohm Co Ltd | クロック信号発生方法及び装置 |
US6424229B1 (en) * | 2001-06-04 | 2002-07-23 | Ericsson Inc. | Tunable voltage controlled oscillator circuit having aided acquisition and methods for operating the same |
JP3650818B2 (ja) * | 2001-10-02 | 2005-05-25 | 独立行政法人情報通信研究機構 | 光パルスレーザ装置 |
JP2003215179A (ja) * | 2001-12-25 | 2003-07-30 | Tektronix Internatl Sales Gmbh | 周波数変換処理方法及び回路 |
JP2004056339A (ja) * | 2002-07-18 | 2004-02-19 | Advantest Corp | 送信電波評価システム |
US6944432B2 (en) * | 2002-11-12 | 2005-09-13 | Nokia Corporation | Crystal-less oscillator transceiver |
JP2004254243A (ja) * | 2003-02-21 | 2004-09-09 | Fujitsu Ltd | 干渉測定評価システム |
US7164699B1 (en) * | 2003-05-30 | 2007-01-16 | Sarnoff Corporation | Compact, high-power, low-jitter, semiconductor modelocked laser module |
US20050057253A1 (en) * | 2003-09-03 | 2005-03-17 | Gee Edward C. | Digital phosphor spectrum analyzer |
JP2005308511A (ja) * | 2004-04-21 | 2005-11-04 | Agilent Technol Inc | 位相雑音を測定する方法および位相雑音測定装置 |
JP4618445B2 (ja) * | 2004-06-23 | 2011-01-26 | 日本電気株式会社 | 確率密度関数で重み付けした積分処理を用いた線形性評価方法と、それを用いた回路シミュレータ、評価装置、通信回路、およびプログラム |
US20060045198A1 (en) * | 2004-08-30 | 2006-03-02 | Magee David P | Single reference clock design for radios used in wireless MIMO communication systems |
US7123112B2 (en) * | 2004-09-15 | 2006-10-17 | Neoreach, Inc. | Complementary voltage controlled oscillator |
US7035743B1 (en) * | 2004-10-18 | 2006-04-25 | Agilent Technologies, Inc. | Phase noise compensation for phase noise measurements |
EP1703494A1 (en) * | 2005-03-17 | 2006-09-20 | Emma Mixed Signal C.V. | Listening device |
US7295937B2 (en) * | 2005-07-20 | 2007-11-13 | Texas Instruments Incorporated | Method and system for determining noise components of an analog-to-digital converter |
-
2005
- 2005-05-26 JP JP2005154746A patent/JP5154741B2/ja not_active Expired - Fee Related
-
2006
- 2006-05-26 US US11/441,708 patent/US7554338B2/en not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101848751B1 (ko) * | 2016-11-23 | 2018-04-13 | (주)그린텍시스템 | 노이즈 상태 표시기능을 갖는 지능형 파이로트 램프 |
Also Published As
Publication number | Publication date |
---|---|
US20060282260A1 (en) | 2006-12-14 |
JP2006329839A (ja) | 2006-12-07 |
US7554338B2 (en) | 2009-06-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5154741B2 (ja) | 雑音特性表示方法 | |
JP4762382B2 (ja) | スペクトルアナライザ | |
WO2008010608A2 (en) | Signal analyzer and method for signal analysis | |
JP2006333119A (ja) | クロック生成回路のテスト回路 | |
JP2002506525A5 (ja) | ||
JP5189767B2 (ja) | 周波数追跡を用いて電波干渉レベルを測定する方法および装置 | |
JP5328096B2 (ja) | ジッタ測定装置、ジッタ測定方法、試験装置、及び電子デバイス | |
JP5113368B2 (ja) | ジッタ測定装置、ジッタ測定方法、試験装置、及び電子デバイス | |
US7035743B1 (en) | Phase noise compensation for phase noise measurements | |
JP2006253889A (ja) | 信号測定装置及び信号分析装置 | |
JP4774546B2 (ja) | 測定装置、図形生成方法、プログラムおよび記録媒体 | |
US7315731B2 (en) | Method of measuring and calibrating frequency down converter | |
US7831413B2 (en) | Sound field measuring method and sound field measuring device | |
JP4704384B2 (ja) | スペクトラムアナライザ | |
JP3051039B2 (ja) | ジッタ伝達特性測定装置 | |
US10579845B2 (en) | Measurement device and method for a multidimensional signal analysis | |
US7759926B2 (en) | Dynamic phase offset measurement | |
JP2008107172A (ja) | スペクトラムアナライザ | |
JP2009177259A (ja) | Pll回路、無線端末装置、および周波数検出方法 | |
JP3719675B2 (ja) | Fmcwレーダ装置およびfmcwレーダ用信号処理方法 | |
US7627027B2 (en) | Method for measuring locking time and frequency error in RF receiver | |
JP3751611B2 (ja) | ジッタ測定装置 | |
JP2008028765A (ja) | キャリブレーション装置、試験装置、キャリブレーション方法、帯域測定装置、及び帯域測定方法 | |
KR101050668B1 (ko) | 개선된 tdd 시스템 신호 계측 장치 및 계측 방법 | |
JP2005214777A (ja) | 周波数スペクトル分析装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20070220 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20090223 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20090225 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20090427 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20100105 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100304 |
|
A711 | Notification of change in applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A711 Effective date: 20101022 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20110301 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20110630 |
|
A911 | Transfer to examiner for re-examination before appeal (zenchi) |
Free format text: JAPANESE INTERMEDIATE CODE: A911 Effective date: 20110707 |
|
RD02 | Notification of acceptance of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7422 Effective date: 20110906 |
|
A912 | Re-examination (zenchi) completed and case transferred to appeal board |
Free format text: JAPANESE INTERMEDIATE CODE: A912 Effective date: 20110930 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20121206 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20151214 Year of fee payment: 3 |
|
R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
LAPS | Cancellation because of no payment of annual fees |