JP4962929B2 - プローバ装置及びこれに用いるプローブ組立体 - Google Patents

プローバ装置及びこれに用いるプローブ組立体 Download PDF

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Publication number
JP4962929B2
JP4962929B2 JP2005304993A JP2005304993A JP4962929B2 JP 4962929 B2 JP4962929 B2 JP 4962929B2 JP 2005304993 A JP2005304993 A JP 2005304993A JP 2005304993 A JP2005304993 A JP 2005304993A JP 4962929 B2 JP4962929 B2 JP 4962929B2
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probe
resin film
vertical
vertical probe
hole
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JP2005304993A
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Japanese (ja)
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JP2007086044A (ja
JP2007086044A5 (enrdf_load_stackoverflow
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軍生 木本
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  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2005304993A 2005-09-19 2005-09-19 プローバ装置及びこれに用いるプローブ組立体 Expired - Fee Related JP4962929B2 (ja)

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JP2005304993A JP4962929B2 (ja) 2005-09-19 2005-09-19 プローバ装置及びこれに用いるプローブ組立体

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005304993A JP4962929B2 (ja) 2005-09-19 2005-09-19 プローバ装置及びこれに用いるプローブ組立体

Publications (3)

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JP2007086044A JP2007086044A (ja) 2007-04-05
JP2007086044A5 JP2007086044A5 (enrdf_load_stackoverflow) 2008-12-04
JP4962929B2 true JP4962929B2 (ja) 2012-06-27

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JP2005304993A Expired - Fee Related JP4962929B2 (ja) 2005-09-19 2005-09-19 プローバ装置及びこれに用いるプローブ組立体

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JP (1) JP4962929B2 (enrdf_load_stackoverflow)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009025267A (ja) * 2007-07-24 2009-02-05 Micronics Japan Co Ltd 電気的接続装置
JP5240827B2 (ja) * 2008-04-15 2013-07-17 Necカシオモバイルコミュニケーションズ株式会社 フレキシブル配線基板、及び電子機器
CN103529252B (zh) * 2013-10-18 2016-09-28 上海华力微电子有限公司 直插式通用电气连接装置
CN110662972B (zh) * 2017-07-21 2021-12-14 吉佳蓝科技股份有限公司 探针卡用薄膜电阻器
CN114089068B (zh) * 2021-11-17 2024-07-02 歌尔科技有限公司 通讯模组、测试结构以及测试设备

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07105416B2 (ja) * 1987-10-21 1995-11-13 松下電器産業株式会社 測定装置
JP4323055B2 (ja) * 2000-03-22 2009-09-02 富士通マイクロエレクトロニクス株式会社 半導体装置試験用コンタクタ及びその製造方法
JP4391717B2 (ja) * 2002-01-09 2009-12-24 富士通マイクロエレクトロニクス株式会社 コンタクタ及びその製造方法並びにコンタクト方法
JP2004274010A (ja) * 2003-03-11 2004-09-30 Isao Kimoto プローバ装置

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JP2007086044A (ja) 2007-04-05

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