JP2007086044A5 - - Google Patents

Download PDF

Info

Publication number
JP2007086044A5
JP2007086044A5 JP2005304993A JP2005304993A JP2007086044A5 JP 2007086044 A5 JP2007086044 A5 JP 2007086044A5 JP 2005304993 A JP2005304993 A JP 2005304993A JP 2005304993 A JP2005304993 A JP 2005304993A JP 2007086044 A5 JP2007086044 A5 JP 2007086044A5
Authority
JP
Japan
Prior art keywords
resin film
probe
vertical
hole
vertical probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2005304993A
Other languages
English (en)
Japanese (ja)
Other versions
JP4962929B2 (ja
JP2007086044A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2005304993A priority Critical patent/JP4962929B2/ja
Priority claimed from JP2005304993A external-priority patent/JP4962929B2/ja
Publication of JP2007086044A publication Critical patent/JP2007086044A/ja
Publication of JP2007086044A5 publication Critical patent/JP2007086044A5/ja
Application granted granted Critical
Publication of JP4962929B2 publication Critical patent/JP4962929B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2005304993A 2005-09-19 2005-09-19 プローバ装置及びこれに用いるプローブ組立体 Expired - Fee Related JP4962929B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2005304993A JP4962929B2 (ja) 2005-09-19 2005-09-19 プローバ装置及びこれに用いるプローブ組立体

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005304993A JP4962929B2 (ja) 2005-09-19 2005-09-19 プローバ装置及びこれに用いるプローブ組立体

Publications (3)

Publication Number Publication Date
JP2007086044A JP2007086044A (ja) 2007-04-05
JP2007086044A5 true JP2007086044A5 (enrdf_load_stackoverflow) 2008-12-04
JP4962929B2 JP4962929B2 (ja) 2012-06-27

Family

ID=37973153

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005304993A Expired - Fee Related JP4962929B2 (ja) 2005-09-19 2005-09-19 プローバ装置及びこれに用いるプローブ組立体

Country Status (1)

Country Link
JP (1) JP4962929B2 (enrdf_load_stackoverflow)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009025267A (ja) * 2007-07-24 2009-02-05 Micronics Japan Co Ltd 電気的接続装置
JP5240827B2 (ja) * 2008-04-15 2013-07-17 Ｎｅｃカシオモバイルコミュニケーションズ株式会社 フレキシブル配線基板、及び電子機器
CN103529252B (zh) * 2013-10-18 2016-09-28 上海华力微电子有限公司 直插式通用电气连接装置
CN110662972B (zh) * 2017-07-21 2021-12-14 吉佳蓝科技股份有限公司 探针卡用薄膜电阻器
CN114089068B (zh) * 2021-11-17 2024-07-02 歌尔科技有限公司 通讯模组、测试结构以及测试设备

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07105416B2 (ja) * 1987-10-21 1995-11-13 松下電器産業株式会社 測定装置
JP4323055B2 (ja) * 2000-03-22 2009-09-02 富士通マイクロエレクトロニクス株式会社 半導体装置試験用コンタクタ及びその製造方法
JP4391717B2 (ja) * 2002-01-09 2009-12-24 富士通マイクロエレクトロニクス株式会社 コンタクタ及びその製造方法並びにコンタクト方法
JP2004274010A (ja) * 2003-03-11 2004-09-30 Isao Kimoto プローバ装置

Similar Documents

Publication Publication Date Title
US7679385B2 (en) Probe card for inspecting electric properties of an object
CN100567995C (zh) 检查装置的插口
KR101471116B1 (ko) 고밀도 도전부를 가지는 테스트용 소켓
JP2009036745A5 (enrdf_load_stackoverflow)
KR102393083B1 (ko) 도전성 입자 및 이를 포함하는 검사용 소켓
KR101483757B1 (ko) 전기접속용 커넥터
JP2005300545A5 (enrdf_load_stackoverflow)
KR20150024063A (ko) 블록단위 결합용 프로브블록을 구비하는 프로브카드
JP2007086044A5 (enrdf_load_stackoverflow)
JP2009139298A (ja) プローブカード
KR101399542B1 (ko) 프로브 카드
KR101981522B1 (ko) Ｓ-타입 ｐｉｏｎ 핀, 및 이를 포함하는 테스트 소켓
KR101970695B1 (ko) 탄소 섬유를 이용한 양방향 도전성 핀 및 양방향 도전성 패턴 모듈
KR101882758B1 (ko) 더블 ｓ 와이어 콘택 구조의 테스트 소켓
JP2020094941A5 (enrdf_load_stackoverflow)
KR101778608B1 (ko) 전기 신호 연결용 마이크로 컨택터
JP2008224677A (ja) プローブカード
CN209640378U (zh) 测试治具的转接座结构
JP4962929B2 (ja) プローバ装置及びこれに用いるプローブ組立体
KR101817286B1 (ko) 검사용 소켓
KR20090073747A (ko) 프로브 유닛 및 프로브 카드
KR100519658B1 (ko) 프로브 카드
JP3159662U (ja) 非破壊性検査モジュール
JP2011180019A (ja) 半導体測定装置および半導体測定装置用ピッチ変換治具
TW200642175A (en) Method of testing ball grid array packed device in real system and test socket assembly therefor