JP4861016B2 - 処理装置 - Google Patents
処理装置 Download PDFInfo
- Publication number
- JP4861016B2 JP4861016B2 JP2006013652A JP2006013652A JP4861016B2 JP 4861016 B2 JP4861016 B2 JP 4861016B2 JP 2006013652 A JP2006013652 A JP 2006013652A JP 2006013652 A JP2006013652 A JP 2006013652A JP 4861016 B2 JP4861016 B2 JP 4861016B2
- Authority
- JP
- Japan
- Prior art keywords
- fluid
- wall portion
- fluid passage
- processing chamber
- processed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
- B08B3/022—Cleaning travelling work
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T137/00—Fluid handling
- Y10T137/0318—Processes
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Cleaning By Liquid Or Steam (AREA)
Description
図2は、図1におけるA−A線方向断面図である。
図4は、処理室1への処理液供給系統の概略図である。
Claims (2)
- 被処理体を収容可能な処理室と、
前記処理室内で前記被処理体を直線的に移動させる移動機構と、
前記処理室内に設けられ、前記移動機構により移動させられる前記被処理体に対して蒸気を吐出するノズルと、
前記処理室を覆う壁部であって、前記被処理体の移動方向に沿って設けられ互いに対向する一対の側壁部と、前記処理室を上側から覆う上壁部と、を有する壁部と、
前記一対の側壁部の内部に設けられた流体通路と、
前記流体通路及び大気圧雰囲気に連通して前記上壁部に設けられた流体入口と、
前記流体通路に連通して前記一対の側壁部にそれぞれ設けられ、前記流体入口から流入して前記流体通路を通った空気が流出する流体出口と、
前記流体出口にそれぞれ設けられ、前記流体入口から空気を取り込み前記流体通路を介して前記流体出口から排出させるファンと、
を備えたことを特徴とする処理装置。 - 前記上壁部の内部にも、前記側壁部の内部に設けた流体通路と連通する流体通路を設けたことを特徴とする請求項1記載の処理装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006013652A JP4861016B2 (ja) | 2006-01-23 | 2006-01-23 | 処理装置 |
KR1020070006070A KR100809516B1 (ko) | 2006-01-23 | 2007-01-19 | 처리 장치 및 처리 방법 |
US11/625,592 US8517035B2 (en) | 2006-01-23 | 2007-01-22 | Processing apparatus and method |
TW96102494A TWI331363B (en) | 2006-01-23 | 2007-01-23 | Processing apparatus and method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006013652A JP4861016B2 (ja) | 2006-01-23 | 2006-01-23 | 処理装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007194546A JP2007194546A (ja) | 2007-08-02 |
JP4861016B2 true JP4861016B2 (ja) | 2012-01-25 |
Family
ID=38449975
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006013652A Active JP4861016B2 (ja) | 2006-01-23 | 2006-01-23 | 処理装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US8517035B2 (ja) |
JP (1) | JP4861016B2 (ja) |
KR (1) | KR100809516B1 (ja) |
TW (1) | TWI331363B (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101229694B1 (ko) * | 2008-06-02 | 2013-02-05 | 도쿄엘렉트론가부시키가이샤 | 유체 가열기 및 그 제조 방법과, 유체 가열기를 구비한 기판 처리 장치 및 기판 처리 방법 |
CN106415395B (zh) * | 2014-04-30 | 2018-06-22 | Asml荷兰有限公司 | 光刻设备及器件制造方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US1928099A (en) * | 1929-06-28 | 1933-09-26 | Gen Chemical Corp | Sulphur burner |
JPS61101410A (ja) * | 1984-10-24 | 1986-05-20 | Hiroshi Ishizuka | 多結晶珪素の製造法及びそのための装置 |
US4724160A (en) * | 1986-07-28 | 1988-02-09 | Dow Corning Corporation | Process for the production of semiconductor materials |
JPH04363022A (ja) * | 1991-06-06 | 1992-12-15 | Enya Syst:Kk | 貼付板洗浄装置 |
JP3042963B2 (ja) * | 1994-06-29 | 2000-05-22 | 大日本スクリーン製造株式会社 | 基板処理装置 |
JPH11329951A (ja) * | 1998-05-15 | 1999-11-30 | Canon Inc | 光源装置及び露光装置 |
JP2001250773A (ja) | 1999-08-12 | 2001-09-14 | Uct Kk | レジスト膜除去装置及びレジスト膜除去方法 |
US6610168B1 (en) * | 1999-08-12 | 2003-08-26 | Sipec Corporation | Resist film removal apparatus and resist film removal method |
KR100754342B1 (ko) * | 1999-10-18 | 2007-09-03 | 인터그레이티드 디자인즈 엘.피. | 유체 분배 방법 및 장치 |
JP2002169304A (ja) * | 2000-12-01 | 2002-06-14 | Dainippon Screen Mfg Co Ltd | 剥離装置及びレジスト膜の剥離方法 |
ATE535935T1 (de) * | 2003-03-31 | 2011-12-15 | Lam Res Corp | Eine kammer und ein verfahren zur waferherstellung |
-
2006
- 2006-01-23 JP JP2006013652A patent/JP4861016B2/ja active Active
-
2007
- 2007-01-19 KR KR1020070006070A patent/KR100809516B1/ko active IP Right Grant
- 2007-01-22 US US11/625,592 patent/US8517035B2/en active Active
- 2007-01-23 TW TW96102494A patent/TWI331363B/zh active
Also Published As
Publication number | Publication date |
---|---|
JP2007194546A (ja) | 2007-08-02 |
KR100809516B1 (ko) | 2008-03-04 |
KR20070077451A (ko) | 2007-07-26 |
US20070246097A1 (en) | 2007-10-25 |
US8517035B2 (en) | 2013-08-27 |
TWI331363B (en) | 2010-10-01 |
TW200741835A (en) | 2007-11-01 |
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