JP4842793B2 - Ｔｃｐ試験装置及びｔｃｐ試験装置の段取方法 - Google Patents

Ｔｃｐ試験装置及びｔｃｐ試験装置の段取方法 Download PDF

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Publication number
JP4842793B2
JP4842793B2 JP2006343984A JP2006343984A JP4842793B2 JP 4842793 B2 JP4842793 B2 JP 4842793B2 JP 2006343984 A JP2006343984 A JP 2006343984A JP 2006343984 A JP2006343984 A JP 2006343984A JP 4842793 B2 JP4842793 B2 JP 4842793B2
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JP
Japan
Prior art keywords
carrier tape
tcp
start position
tape
test apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2006343984A
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English (en)
Japanese (ja)
Other versions
JP2008157657A (ja
Inventor
武士 大西
勝博 今泉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP2006343984A priority Critical patent/JP4842793B2/ja
Priority to TW096142808A priority patent/TW200837369A/zh
Priority to KR1020070134052A priority patent/KR100973164B1/ko
Priority to CNA2007101600370A priority patent/CN101206240A/zh
Publication of JP2008157657A publication Critical patent/JP2008157657A/ja
Application granted granted Critical
Publication of JP4842793B2 publication Critical patent/JP4842793B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Wire Bonding (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2006343984A 2006-12-21 2006-12-21 Ｔｃｐ試験装置及びｔｃｐ試験装置の段取方法 Expired - Fee Related JP4842793B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2006343984A JP4842793B2 (ja) 2006-12-21 2006-12-21 Ｔｃｐ試験装置及びｔｃｐ試験装置の段取方法
TW096142808A TW200837369A (en) 2006-12-21 2007-11-13 TCP testing apparatus and method for preparing TCP testing apparatus
KR1020070134052A KR100973164B1 (ko) 2006-12-21 2007-12-20 Ｔｃｐ 시험장치 및 ｔｃｐ 시험장치의 준비방법
CNA2007101600370A CN101206240A (zh) 2006-12-21 2007-12-21 Tcp试验装置以及tcp试验装置的安排方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006343984A JP4842793B2 (ja) 2006-12-21 2006-12-21 Ｔｃｐ試験装置及びｔｃｐ試験装置の段取方法

Publications (2)

Publication Number Publication Date
JP2008157657A JP2008157657A (ja) 2008-07-10
JP4842793B2 true JP4842793B2 (ja) 2011-12-21

Family

ID=39566600

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006343984A Expired - Fee Related JP4842793B2 (ja) 2006-12-21 2006-12-21 Ｔｃｐ試験装置及びｔｃｐ試験装置の段取方法

Country Status (4)

Country Link
JP (1) JP4842793B2 (ko)
KR (1) KR100973164B1 (ko)
CN (1) CN101206240A (ko)
TW (1) TW200837369A (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112238498A (zh) * 2019-11-22 2021-01-19 江苏上达电子有限公司 一种新型cof自动冲孔机

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01175748A (ja) * 1987-12-29 1989-07-12 Canon Inc 導電性接着膜の圧着装置および圧着方法
JP3336728B2 (ja) * 1994-02-28 2002-10-21 安藤電気株式会社 Ｔａｂ用オートハンドラ
JP3772995B2 (ja) * 1995-09-25 2006-05-10 横河電機株式会社 Ｔａｂハンドラ
JPH09191021A (ja) * 1996-01-11 1997-07-22 Toray Ind Inc Ｔａｂ工程における製品テープに接続されたリーダテープの検出方法およびその装置
JP2003045919A (ja) * 2001-07-31 2003-02-14 Ando Electric Co Ltd Ｔｃｐ用ハンドラ
JP4089193B2 (ja) * 2001-09-25 2008-05-28 横河電機株式会社 Ｔｃｐ用ハンドラ及び先頭ｔｃｐ検出方法
TW567570B (en) * 2001-11-26 2003-12-21 Ando Electric Handler for TCP and method for TCP illumination

Also Published As

Publication number Publication date
KR20080058222A (ko) 2008-06-25
KR100973164B1 (ko) 2010-07-30
CN101206240A (zh) 2008-06-25
TW200837369A (en) 2008-09-16
JP2008157657A (ja) 2008-07-10

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