JP4815273B2 - 被検光学素子回転保持装置 - Google Patents

被検光学素子回転保持装置 Download PDF

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Publication number
JP4815273B2
JP4815273B2 JP2006154609A JP2006154609A JP4815273B2 JP 4815273 B2 JP4815273 B2 JP 4815273B2 JP 2006154609 A JP2006154609 A JP 2006154609A JP 2006154609 A JP2006154609 A JP 2006154609A JP 4815273 B2 JP4815273 B2 JP 4815273B2
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JP
Japan
Prior art keywords
optical element
disk
holding
base
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2006154609A
Other languages
English (en)
Japanese (ja)
Other versions
JP2007322314A (ja
Inventor
萍 孫
重徳 大井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Corp
Original Assignee
Fujifilm Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujifilm Corp filed Critical Fujifilm Corp
Priority to JP2006154609A priority Critical patent/JP4815273B2/ja
Priority to KR1020070048831A priority patent/KR20070115624A/ko
Priority to TW096119268A priority patent/TW200745528A/zh
Priority to CN200710108749A priority patent/CN100592052C/zh
Publication of JP2007322314A publication Critical patent/JP2007322314A/ja
Application granted granted Critical
Publication of JP4815273B2 publication Critical patent/JP4815273B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/04—Optical benches therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/22—Devices for withdrawing samples in the gaseous state
    • G01N1/24—Suction devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/22—Devices for withdrawing samples in the gaseous state
    • G01N1/24—Suction devices
    • G01N2001/247—Syringes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/04—Chucks, fixtures, jaws, holders or anvils
    • G01N2203/0417—Chucks, fixtures, jaws, holders or anvils using vacuum

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Biomedical Technology (AREA)
  • Molecular Biology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)
  • Lens Barrels (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2006154609A 2006-06-02 2006-06-02 被検光学素子回転保持装置 Expired - Fee Related JP4815273B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2006154609A JP4815273B2 (ja) 2006-06-02 2006-06-02 被検光学素子回転保持装置
KR1020070048831A KR20070115624A (ko) 2006-06-02 2007-05-18 피검 광학 소자 회전 유지 장치
TW096119268A TW200745528A (en) 2006-06-02 2007-05-30 Rotation holding device of optical element to be tested
CN200710108749A CN100592052C (zh) 2006-06-02 2007-05-31 被检测光学元件旋转保持装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006154609A JP4815273B2 (ja) 2006-06-02 2006-06-02 被検光学素子回転保持装置

Publications (2)

Publication Number Publication Date
JP2007322314A JP2007322314A (ja) 2007-12-13
JP4815273B2 true JP4815273B2 (ja) 2011-11-16

Family

ID=38855266

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006154609A Expired - Fee Related JP4815273B2 (ja) 2006-06-02 2006-06-02 被検光学素子回転保持装置

Country Status (4)

Country Link
JP (1) JP4815273B2 (enExample)
KR (1) KR20070115624A (enExample)
CN (1) CN100592052C (enExample)
TW (1) TW200745528A (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5362431B2 (ja) * 2008-06-10 2013-12-11 富士フイルム株式会社 偏芯量測定方法
KR100956230B1 (ko) 2008-08-07 2010-05-04 삼성전기주식회사 렌즈 측정 장치 및 그 제어방법
US9366839B2 (en) * 2012-11-01 2016-06-14 Sharp Kabushiki Kaisha Position adjustment device and position adjustment method
JP2019015567A (ja) * 2017-07-05 2019-01-31 日本電産株式会社 レンズ偏芯測定治具およびレンズ偏芯測定装置
CN120404078B (zh) * 2025-07-02 2025-08-26 南京从人光电科技有限公司 一种大口径大范围角秒级强激光多光轴平行性测试机

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002148413A (ja) * 2000-11-10 2002-05-22 Matsushita Electric Ind Co Ltd レンズ接合装置及び接合方法
JP2004325307A (ja) * 2003-04-25 2004-11-18 Olympus Corp 偏心測定装置
JP2005055202A (ja) * 2003-08-06 2005-03-03 Mitsutoyo Corp 偏芯測定装置、レンズ取付方法およびレンズ偏芯検査方法
JP2005127839A (ja) * 2003-10-23 2005-05-19 Olympus Corp レンズ偏心測定装置
JP2005221471A (ja) * 2004-02-09 2005-08-18 Olympus Corp レンズ偏芯測定用治具及びこれを用いたレンズ偏芯測定装置並びにその測定方法

Also Published As

Publication number Publication date
CN100592052C (zh) 2010-02-24
CN101082538A (zh) 2007-12-05
JP2007322314A (ja) 2007-12-13
KR20070115624A (ko) 2007-12-06
TW200745528A (en) 2007-12-16
TWI338773B (enExample) 2011-03-11

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