CN100592052C - 被检测光学元件旋转保持装置 - Google Patents

被检测光学元件旋转保持装置 Download PDF

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Publication number
CN100592052C
CN100592052C CN200710108749A CN200710108749A CN100592052C CN 100592052 C CN100592052 C CN 100592052C CN 200710108749 A CN200710108749 A CN 200710108749A CN 200710108749 A CN200710108749 A CN 200710108749A CN 100592052 C CN100592052 C CN 100592052C
Authority
CN
China
Prior art keywords
mentioned
optical element
holding
optics element
suction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN200710108749A
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English (en)
Chinese (zh)
Other versions
CN101082538A (zh
Inventor
孙萍
大井重德
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujinon Corp
Original Assignee
Fujinon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujinon Corp filed Critical Fujinon Corp
Publication of CN101082538A publication Critical patent/CN101082538A/zh
Application granted granted Critical
Publication of CN100592052C publication Critical patent/CN100592052C/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/04—Optical benches therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/22—Devices for withdrawing samples in the gaseous state
    • G01N1/24—Suction devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/22—Devices for withdrawing samples in the gaseous state
    • G01N1/24—Suction devices
    • G01N2001/247—Syringes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/04—Chucks, fixtures, jaws, holders or anvils
    • G01N2203/0417—Chucks, fixtures, jaws, holders or anvils using vacuum

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Biomedical Technology (AREA)
  • Molecular Biology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)
  • Lens Barrels (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CN200710108749A 2006-06-02 2007-05-31 被检测光学元件旋转保持装置 Expired - Fee Related CN100592052C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006154609A JP4815273B2 (ja) 2006-06-02 2006-06-02 被検光学素子回転保持装置
JP2006154609 2006-06-02

Publications (2)

Publication Number Publication Date
CN101082538A CN101082538A (zh) 2007-12-05
CN100592052C true CN100592052C (zh) 2010-02-24

Family

ID=38855266

Family Applications (1)

Application Number Title Priority Date Filing Date
CN200710108749A Expired - Fee Related CN100592052C (zh) 2006-06-02 2007-05-31 被检测光学元件旋转保持装置

Country Status (4)

Country Link
JP (1) JP4815273B2 (enExample)
KR (1) KR20070115624A (enExample)
CN (1) CN100592052C (enExample)
TW (1) TW200745528A (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5362431B2 (ja) * 2008-06-10 2013-12-11 富士フイルム株式会社 偏芯量測定方法
KR100956230B1 (ko) 2008-08-07 2010-05-04 삼성전기주식회사 렌즈 측정 장치 및 그 제어방법
US9366839B2 (en) * 2012-11-01 2016-06-14 Sharp Kabushiki Kaisha Position adjustment device and position adjustment method
JP2019015567A (ja) * 2017-07-05 2019-01-31 日本電産株式会社 レンズ偏芯測定治具およびレンズ偏芯測定装置
CN120404078B (zh) * 2025-07-02 2025-08-26 南京从人光电科技有限公司 一种大口径大范围角秒级强激光多光轴平行性测试机

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002148413A (ja) * 2000-11-10 2002-05-22 Matsushita Electric Ind Co Ltd レンズ接合装置及び接合方法
JP2004325307A (ja) * 2003-04-25 2004-11-18 Olympus Corp 偏心測定装置
JP2005055202A (ja) * 2003-08-06 2005-03-03 Mitsutoyo Corp 偏芯測定装置、レンズ取付方法およびレンズ偏芯検査方法
JP2005127839A (ja) * 2003-10-23 2005-05-19 Olympus Corp レンズ偏心測定装置
JP2005221471A (ja) * 2004-02-09 2005-08-18 Olympus Corp レンズ偏芯測定用治具及びこれを用いたレンズ偏芯測定装置並びにその測定方法

Also Published As

Publication number Publication date
CN101082538A (zh) 2007-12-05
JP2007322314A (ja) 2007-12-13
KR20070115624A (ko) 2007-12-06
TW200745528A (en) 2007-12-16
TWI338773B (enExample) 2011-03-11
JP4815273B2 (ja) 2011-11-16

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PB01 Publication
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SE01 Entry into force of request for substantive examination
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GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20100224

Termination date: 20140531