TWI338773B - - Google Patents

Download PDF

Info

Publication number
TWI338773B
TWI338773B TW096119268A TW96119268A TWI338773B TW I338773 B TWI338773 B TW I338773B TW 096119268 A TW096119268 A TW 096119268A TW 96119268 A TW96119268 A TW 96119268A TW I338773 B TWI338773 B TW I338773B
Authority
TW
Taiwan
Prior art keywords
disk
optical element
rotating body
detected
shaped rotating
Prior art date
Application number
TW096119268A
Other languages
English (en)
Chinese (zh)
Other versions
TW200745528A (en
Inventor
Sun Ping
Ooi Shigenori
Original Assignee
Fujinon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujinon Corp filed Critical Fujinon Corp
Publication of TW200745528A publication Critical patent/TW200745528A/zh
Application granted granted Critical
Publication of TWI338773B publication Critical patent/TWI338773B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/04—Optical benches therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/22—Devices for withdrawing samples in the gaseous state
    • G01N1/24—Suction devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/22—Devices for withdrawing samples in the gaseous state
    • G01N1/24—Suction devices
    • G01N2001/247—Syringes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/04—Chucks, fixtures, jaws, holders or anvils
    • G01N2203/0417—Chucks, fixtures, jaws, holders or anvils using vacuum

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Biomedical Technology (AREA)
  • Molecular Biology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)
  • Lens Barrels (AREA)
  • Length Measuring Devices By Optical Means (AREA)
TW096119268A 2006-06-02 2007-05-30 Rotation holding device of optical element to be tested TW200745528A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006154609A JP4815273B2 (ja) 2006-06-02 2006-06-02 被検光学素子回転保持装置

Publications (2)

Publication Number Publication Date
TW200745528A TW200745528A (en) 2007-12-16
TWI338773B true TWI338773B (enExample) 2011-03-11

Family

ID=38855266

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096119268A TW200745528A (en) 2006-06-02 2007-05-30 Rotation holding device of optical element to be tested

Country Status (4)

Country Link
JP (1) JP4815273B2 (enExample)
KR (1) KR20070115624A (enExample)
CN (1) CN100592052C (enExample)
TW (1) TW200745528A (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5362431B2 (ja) * 2008-06-10 2013-12-11 富士フイルム株式会社 偏芯量測定方法
KR100956230B1 (ko) 2008-08-07 2010-05-04 삼성전기주식회사 렌즈 측정 장치 및 그 제어방법
US9366839B2 (en) * 2012-11-01 2016-06-14 Sharp Kabushiki Kaisha Position adjustment device and position adjustment method
JP2019015567A (ja) * 2017-07-05 2019-01-31 日本電産株式会社 レンズ偏芯測定治具およびレンズ偏芯測定装置
CN120404078B (zh) * 2025-07-02 2025-08-26 南京从人光电科技有限公司 一种大口径大范围角秒级强激光多光轴平行性测试机

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002148413A (ja) * 2000-11-10 2002-05-22 Matsushita Electric Ind Co Ltd レンズ接合装置及び接合方法
JP2004325307A (ja) * 2003-04-25 2004-11-18 Olympus Corp 偏心測定装置
JP2005055202A (ja) * 2003-08-06 2005-03-03 Mitsutoyo Corp 偏芯測定装置、レンズ取付方法およびレンズ偏芯検査方法
JP2005127839A (ja) * 2003-10-23 2005-05-19 Olympus Corp レンズ偏心測定装置
JP2005221471A (ja) * 2004-02-09 2005-08-18 Olympus Corp レンズ偏芯測定用治具及びこれを用いたレンズ偏芯測定装置並びにその測定方法

Also Published As

Publication number Publication date
CN100592052C (zh) 2010-02-24
CN101082538A (zh) 2007-12-05
JP2007322314A (ja) 2007-12-13
KR20070115624A (ko) 2007-12-06
TW200745528A (en) 2007-12-16
JP4815273B2 (ja) 2011-11-16

Similar Documents

Publication Publication Date Title
TWI338773B (enExample)
JP4370064B2 (ja) レンズの心取り装置
JP6817139B2 (ja) 試料ホルダーユニット及び試料観察装置
JP2004012335A (ja) 被検体の傾き誤差調整支援方法
CN112764184B (zh) 光学装置及光学式测量机
JP4751156B2 (ja) オートコリメータ及びそれを用いた角度測定装置
JP2002244018A (ja) ミラーの距離、角度調整機構
JP7624589B2 (ja) 測定機の校正方法
KR20080014250A (ko) 렌즈 조립 편심 조정방법 및 렌즈경통
JP4138506B2 (ja) 表面性状測定器及び表面性状測定器用治具並びに調整方法
JP4093564B2 (ja) クランプ装置の傾き調整方法
JP7617384B2 (ja) 内面形状測定機、及び内面形状測定機のアライメント方法
JP3333245B2 (ja) レンズ心取機およびレンズ心取り方法
JP4718208B2 (ja) 偏心測定方法
JP3635324B2 (ja) 単結晶研磨加工面を所定の方位角に設定調整する方法ならびにこの方法を実施するのに用いられる研磨加工治具
JP2005055202A (ja) 偏芯測定装置、レンズ取付方法およびレンズ偏芯検査方法
JP3635606B2 (ja) コリメータセッティング装置
JP2007046971A (ja) レンズ偏心測定装置及びレンズ偏心測定方法
CN113551880B (zh) 透镜的偏心测试工装及偏心测试方法
JP2005221471A (ja) レンズ偏芯測定用治具及びこれを用いたレンズ偏芯測定装置並びにその測定方法
JP3901318B2 (ja) 光学部品の角度測定方法とその装置
JP7553816B2 (ja) 形状測定機及び形状測定機のアライメント方法
JP5850669B2 (ja) 検出手段保持装置およびそれを備えた光学装置
JP7317976B2 (ja) レンズ固定部および光学系におけるシリンドリカルレンズの位置合わせ方法
JP2005069697A (ja) 顕微干渉計装置によるフェルールの測定方法

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees