JP4743938B2 - 半導体集積回路装置 - Google Patents

半導体集積回路装置 Download PDF

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Publication number
JP4743938B2
JP4743938B2 JP2000174712A JP2000174712A JP4743938B2 JP 4743938 B2 JP4743938 B2 JP 4743938B2 JP 2000174712 A JP2000174712 A JP 2000174712A JP 2000174712 A JP2000174712 A JP 2000174712A JP 4743938 B2 JP4743938 B2 JP 4743938B2
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JP
Japan
Prior art keywords
circuit
switch
reference voltage
resistance
tuning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2000174712A
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English (en)
Japanese (ja)
Other versions
JP2001358299A (ja
JP2001358299A5 (enExample
Inventor
真子 小林
玄 森下
実邦子 秋山
恭彦 帯刀
彰 山崎
信行 藤井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Electronics Corp
Original Assignee
Renesas Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Electronics Corp filed Critical Renesas Electronics Corp
Priority to JP2000174712A priority Critical patent/JP4743938B2/ja
Priority to US09/758,273 priority patent/US6429729B2/en
Publication of JP2001358299A publication Critical patent/JP2001358299A/ja
Publication of JP2001358299A5 publication Critical patent/JP2001358299A5/ja
Application granted granted Critical
Publication of JP4743938B2 publication Critical patent/JP4743938B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current 
    • G05F1/46—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC
    • G05F1/462—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC as a function of the requirements of the load, e.g. delay, temperature, specific voltage/current characteristic
    • G05F1/465—Internal voltage generators for integrated circuits, e.g. step down generators

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Dram (AREA)
  • Control Of Electrical Variables (AREA)
  • Power Sources (AREA)
JP2000174712A 2000-06-12 2000-06-12 半導体集積回路装置 Expired - Fee Related JP4743938B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2000174712A JP4743938B2 (ja) 2000-06-12 2000-06-12 半導体集積回路装置
US09/758,273 US6429729B2 (en) 2000-06-12 2001-01-12 Semiconductor integrated circuit device having circuit generating reference voltage

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000174712A JP4743938B2 (ja) 2000-06-12 2000-06-12 半導体集積回路装置

Publications (3)

Publication Number Publication Date
JP2001358299A JP2001358299A (ja) 2001-12-26
JP2001358299A5 JP2001358299A5 (enExample) 2007-07-26
JP4743938B2 true JP4743938B2 (ja) 2011-08-10

Family

ID=18676698

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000174712A Expired - Fee Related JP4743938B2 (ja) 2000-06-12 2000-06-12 半導体集積回路装置

Country Status (2)

Country Link
US (1) US6429729B2 (enExample)
JP (1) JP4743938B2 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2819954B1 (fr) * 2001-01-24 2003-04-11 St Microelectronics Sa Dispositif de commande d'un circuit de generation de tensions de reference
JP3851791B2 (ja) * 2001-09-04 2006-11-29 株式会社東芝 半導体集積回路
JP3929289B2 (ja) * 2001-11-12 2007-06-13 株式会社ルネサステクノロジ 半導体装置
DE10356420A1 (de) * 2002-12-02 2004-06-24 Samsung Electronics Co., Ltd., Suwon Spannungsgeneratorschaltung
KR100596869B1 (ko) * 2003-02-10 2006-07-04 주식회사 하이닉스반도체 특성 조절 장치를 구비한 반도체 장치의 내부전압 발생장치
JP4632833B2 (ja) * 2005-03-25 2011-02-16 富士通株式会社 半導体装置
KR100721197B1 (ko) * 2005-06-29 2007-05-23 주식회사 하이닉스반도체 반도체 장치의 내부전압 발생회로
KR100902054B1 (ko) 2007-11-12 2009-06-12 주식회사 하이닉스반도체 반도체 메모리 장치의 기준 전압 공급 회로 및 방법
IT1400576B1 (it) * 2010-06-17 2013-06-14 St Microelectronics Grenoble 2 Circuito integrato con dispositivo per la variazione del valore di un parametro operativo di un circuito elettronico e con lo stesso circuito elettronico.
JP5498896B2 (ja) * 2010-08-26 2014-05-21 ルネサスエレクトロニクス株式会社 半導体チップ
US8476938B2 (en) * 2010-09-16 2013-07-02 Samsung Electro-Mechanics Co., Ltd. Device and method for generating three mode signal
JP2011146120A (ja) * 2011-03-18 2011-07-28 Renesas Electronics Corp 半導体装置

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3324160B2 (ja) * 1992-11-18 2002-09-17 松下電器産業株式会社 基準電圧発生回路
JPH06243678A (ja) * 1993-02-19 1994-09-02 Hitachi Ltd ダイナミック型ｒａｍとそのプレート電圧設定方法及び情報処理システム
JPH06324753A (ja) * 1993-05-13 1994-11-25 Fujitsu Ltd 定電圧発生回路及び半導体記憶装置
KR960011261B1 (ko) * 1993-06-11 1996-08-21 삼성전자 주식회사 반도체집적회로의회로소자값조정회로및방법
KR0146203B1 (ko) * 1995-06-26 1998-12-01 김광호 반도체 집적회로의 회로소자값 조정회로
JP3686176B2 (ja) * 1996-08-06 2005-08-24 株式会社ルネサステクノロジ 定電流発生回路及び内部電源電圧発生回路
US5838076A (en) * 1996-11-21 1998-11-17 Pacesetter, Inc. Digitally controlled trim circuit
JPH10229167A (ja) * 1996-12-11 1998-08-25 Akumosu Kk 基準電圧出力半導体装置、それを用いた水晶発振器及びその水晶発振器の製造方法
JP3963990B2 (ja) * 1997-01-07 2007-08-22 株式会社ルネサステクノロジ 内部電源電圧発生回路
JPH11194838A (ja) 1998-01-05 1999-07-21 Mitsubishi Electric Corp 内部降圧電源発生回路および当該内部降圧電源発生回路を備える半導体集積装置
JPH11232869A (ja) * 1998-02-16 1999-08-27 Mitsubishi Electric Corp 半導体回路装置
KR100321167B1 (ko) * 1998-06-30 2002-05-13 박종섭 앤티퓨즈로미세조정되는기준전압발생기
US6144248A (en) * 1998-07-16 2000-11-07 Ricoh Company, Ltd. Reference voltage generating circuit having a temperature characteristic correction circuit providing low temperature sensitivity to a reference voltage
KR100308186B1 (ko) * 1998-09-02 2001-11-30 윤종용 반도체집적회로장치의기준전압발생회로
JP2000155620A (ja) * 1998-11-20 2000-06-06 Mitsubishi Electric Corp 基準電圧発生回路
US6281734B1 (en) * 1999-12-31 2001-08-28 Stmicroelectronics, Inc. Reference voltage adjustment

Also Published As

Publication number Publication date
JP2001358299A (ja) 2001-12-26
US6429729B2 (en) 2002-08-06
US20010050590A1 (en) 2001-12-13

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