JP4571749B2 - 既知の良品デバイスを使用して期待する応答を生成するための集積回路デバイスの効率的な同時テスト - Google Patents

既知の良品デバイスを使用して期待する応答を生成するための集積回路デバイスの効率的な同時テスト Download PDF

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Publication number
JP4571749B2
JP4571749B2 JP2000602648A JP2000602648A JP4571749B2 JP 4571749 B2 JP4571749 B2 JP 4571749B2 JP 2000602648 A JP2000602648 A JP 2000602648A JP 2000602648 A JP2000602648 A JP 2000602648A JP 4571749 B2 JP4571749 B2 JP 4571749B2
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tester
dut
interface circuit
state
data
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Expired - Fee Related
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Japanese (ja)
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JP2002538464A5 (enExample
JP2002538464A (ja
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ロイ，リチャード，エス
ミラー，チャールズ，エイ
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フォームファクター， インコーポレイテッド
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2000602648A 1999-03-01 2000-02-24 既知の良品デバイスを使用して期待する応答を生成するための集積回路デバイスの効率的な同時テスト Expired - Fee Related JP4571749B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/260,460 US6452411B1 (en) 1999-03-01 1999-03-01 Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses
US09/260,460 1999-03-01
PCT/US2000/004864 WO2000052487A1 (en) 1999-03-01 2000-02-24 Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses

Publications (3)

Publication Number Publication Date
JP2002538464A JP2002538464A (ja) 2002-11-12
JP2002538464A5 JP2002538464A5 (enExample) 2007-04-12
JP4571749B2 true JP4571749B2 (ja) 2010-10-27

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JP2000602648A Expired - Fee Related JP4571749B2 (ja) 1999-03-01 2000-02-24 既知の良品デバイスを使用して期待する応答を生成するための集積回路デバイスの効率的な同時テスト

Country Status (8)

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US (2) US6452411B1 (enExample)
EP (1) EP1159629B1 (enExample)
JP (1) JP4571749B2 (enExample)
KR (1) KR100681363B1 (enExample)
AU (1) AU3245800A (enExample)
DE (1) DE60040212D1 (enExample)
TW (1) TW451379B (enExample)
WO (1) WO2000052487A1 (enExample)

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US20020175697A1 (en) 2002-11-28
AU3245800A (en) 2000-09-21
US6559671B2 (en) 2003-05-06
US6452411B1 (en) 2002-09-17
TW451379B (en) 2001-08-21
JP2002538464A (ja) 2002-11-12
DE60040212D1 (de) 2008-10-23
EP1159629B1 (en) 2008-09-10
WO2000052487A1 (en) 2000-09-08
EP1159629A1 (en) 2001-12-05

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