JP4495919B2 - プラナリゼーション装置 - Google Patents

プラナリゼーション装置 Download PDF

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Publication number
JP4495919B2
JP4495919B2 JP2003119745A JP2003119745A JP4495919B2 JP 4495919 B2 JP4495919 B2 JP 4495919B2 JP 2003119745 A JP2003119745 A JP 2003119745A JP 2003119745 A JP2003119745 A JP 2003119745A JP 4495919 B2 JP4495919 B2 JP 4495919B2
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JP
Japan
Prior art keywords
planarization
optical target
flat surface
semiconductor
probe card
Prior art date
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Expired - Fee Related
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JP2003119745A
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English (en)
Japanese (ja)
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JP2003324133A (ja
JP2003324133A5 (enExample
Inventor
ナセル・アリ・ジャファリ
ケネス・ディーン・カークリン
ウィリアム・ティー・スプレイグ
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Verigy Singapore Pte Ltd
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Verigy Singapore Pte Ltd
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Publication date
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Publication of JP2003324133A publication Critical patent/JP2003324133A/ja
Publication of JP2003324133A5 publication Critical patent/JP2003324133A5/ja
Application granted granted Critical
Publication of JP4495919B2 publication Critical patent/JP4495919B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2003119745A 2002-04-26 2003-04-24 プラナリゼーション装置 Expired - Fee Related JP4495919B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/133165 2002-04-26
US10/133,165 US6794889B2 (en) 2002-04-26 2002-04-26 Unified apparatus and method to assure probe card-to-wafer parallelism in semiconductor automatic wafer test, probe card measurement systems, and probe card manufacturing

Publications (3)

Publication Number Publication Date
JP2003324133A JP2003324133A (ja) 2003-11-14
JP2003324133A5 JP2003324133A5 (enExample) 2006-06-15
JP4495919B2 true JP4495919B2 (ja) 2010-07-07

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003119745A Expired - Fee Related JP4495919B2 (ja) 2002-04-26 2003-04-24 プラナリゼーション装置

Country Status (4)

Country Link
US (1) US6794889B2 (enExample)
JP (1) JP4495919B2 (enExample)
IT (1) ITRM20030188A1 (enExample)
TW (1) TWI269346B (enExample)

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US9865484B1 (en) 2016-06-29 2018-01-09 Applied Materials, Inc. Selective etch using material modification and RF pulsing
US10629473B2 (en) 2016-09-09 2020-04-21 Applied Materials, Inc. Footing removal for nitride spacer
JP6832654B2 (ja) * 2016-09-09 2021-02-24 東京エレクトロン株式会社 検査システムの調整方法およびそれに用いる補助エレメント
US10546729B2 (en) 2016-10-04 2020-01-28 Applied Materials, Inc. Dual-channel showerhead with improved profile
US10163696B2 (en) 2016-11-11 2018-12-25 Applied Materials, Inc. Selective cobalt removal for bottom up gapfill
US10026621B2 (en) 2016-11-14 2018-07-17 Applied Materials, Inc. SiN spacer profile patterning
US10431429B2 (en) 2017-02-03 2019-10-01 Applied Materials, Inc. Systems and methods for radial and azimuthal control of plasma uniformity
US10943834B2 (en) 2017-03-13 2021-03-09 Applied Materials, Inc. Replacement contact process
US10761128B2 (en) * 2017-03-23 2020-09-01 Kla-Tencor Corporation Methods and systems for inline parts average testing and latent reliability defect detection
US11276590B2 (en) 2017-05-17 2022-03-15 Applied Materials, Inc. Multi-zone semiconductor substrate supports
US11276559B2 (en) 2017-05-17 2022-03-15 Applied Materials, Inc. Semiconductor processing chamber for multiple precursor flow
JP7176860B6 (ja) 2017-05-17 2022-12-16 アプライド マテリアルズ インコーポレイテッド 前駆体の流れを改善する半導体処理チャンバ
US10920320B2 (en) 2017-06-16 2021-02-16 Applied Materials, Inc. Plasma health determination in semiconductor substrate processing reactors
US10727080B2 (en) 2017-07-07 2020-07-28 Applied Materials, Inc. Tantalum-containing material removal
US10297458B2 (en) 2017-08-07 2019-05-21 Applied Materials, Inc. Process window widening using coated parts in plasma etch processes
KR102014334B1 (ko) * 2017-09-28 2019-08-26 한국생산기술연구원 기판 검사 카트리지 및 이의 제조 방법
US10903054B2 (en) 2017-12-19 2021-01-26 Applied Materials, Inc. Multi-zone gas distribution systems and methods
US11328909B2 (en) 2017-12-22 2022-05-10 Applied Materials, Inc. Chamber conditioning and removal processes
US10854426B2 (en) 2018-01-08 2020-12-01 Applied Materials, Inc. Metal recess for semiconductor structures
US10964512B2 (en) 2018-02-15 2021-03-30 Applied Materials, Inc. Semiconductor processing chamber multistage mixing apparatus and methods
US10679870B2 (en) 2018-02-15 2020-06-09 Applied Materials, Inc. Semiconductor processing chamber multistage mixing apparatus
TWI766433B (zh) 2018-02-28 2022-06-01 美商應用材料股份有限公司 形成氣隙的系統及方法
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US10699879B2 (en) 2018-04-17 2020-06-30 Applied Materials, Inc. Two piece electrode assembly with gap for plasma control
US10886137B2 (en) 2018-04-30 2021-01-05 Applied Materials, Inc. Selective nitride removal
US10755941B2 (en) 2018-07-06 2020-08-25 Applied Materials, Inc. Self-limiting selective etching systems and methods
US10872778B2 (en) 2018-07-06 2020-12-22 Applied Materials, Inc. Systems and methods utilizing solid-phase etchants
US10672642B2 (en) 2018-07-24 2020-06-02 Applied Materials, Inc. Systems and methods for pedestal configuration
US10892198B2 (en) 2018-09-14 2021-01-12 Applied Materials, Inc. Systems and methods for improved performance in semiconductor processing
US11049755B2 (en) 2018-09-14 2021-06-29 Applied Materials, Inc. Semiconductor substrate supports with embedded RF shield
US11062887B2 (en) 2018-09-17 2021-07-13 Applied Materials, Inc. High temperature RF heater pedestals
US11417534B2 (en) 2018-09-21 2022-08-16 Applied Materials, Inc. Selective material removal
US11682560B2 (en) 2018-10-11 2023-06-20 Applied Materials, Inc. Systems and methods for hafnium-containing film removal
US11121002B2 (en) 2018-10-24 2021-09-14 Applied Materials, Inc. Systems and methods for etching metals and metal derivatives
US11437242B2 (en) 2018-11-27 2022-09-06 Applied Materials, Inc. Selective removal of silicon-containing materials
US11721527B2 (en) 2019-01-07 2023-08-08 Applied Materials, Inc. Processing chamber mixing systems
US10920319B2 (en) 2019-01-11 2021-02-16 Applied Materials, Inc. Ceramic showerheads with conductive electrodes
US11022628B2 (en) 2019-09-13 2021-06-01 Reid-Ashman Manufacturing, Inc. Probe card support apparatus for automatic test equipment
CN114518472B (zh) * 2020-11-18 2025-04-25 致茂电子(苏州)有限公司 探针头连接方法
TWI771805B (zh) * 2020-11-18 2022-07-21 致茂電子股份有限公司 探針頭連接方法
US11747394B1 (en) * 2022-03-09 2023-09-05 Nanya Technology Corporation Probe apparatus with a track
US11668745B1 (en) * 2022-03-09 2023-06-06 Nanya Technology Corporation Probe apparatus having a track and wafer inspection method using the same
CN117438331B (zh) * 2023-12-20 2024-04-12 武汉芯极客软件技术有限公司 一种半导体cp测试程序的混版本兼容方法
TWI881779B (zh) * 2024-04-01 2025-04-21 黑澤科技股份有限公司 治具探針之水平高度測量方法

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US6043668A (en) * 1997-12-12 2000-03-28 Sony Corporation Planarity verification system for integrated circuit test probes
JP2000315711A (ja) * 1999-05-06 2000-11-14 Sony Corp 半導体測定装置
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Also Published As

Publication number Publication date
ITRM20030188A1 (it) 2003-10-27
TW200305913A (en) 2003-11-01
JP2003324133A (ja) 2003-11-14
TWI269346B (en) 2006-12-21
ITRM20030188A0 (it) 2003-04-24
US6794889B2 (en) 2004-09-21
US20030201764A1 (en) 2003-10-30

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