JP4397062B2 - 電圧発生回路および半導体記憶装置 - Google Patents
電圧発生回路および半導体記憶装置 Download PDFInfo
- Publication number
- JP4397062B2 JP4397062B2 JP33767798A JP33767798A JP4397062B2 JP 4397062 B2 JP4397062 B2 JP 4397062B2 JP 33767798 A JP33767798 A JP 33767798A JP 33767798 A JP33767798 A JP 33767798A JP 4397062 B2 JP4397062 B2 JP 4397062B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- output
- wiring
- generation circuit
- power supply
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title claims description 32
- 238000006243 chemical reaction Methods 0.000 claims description 67
- 230000004044 response Effects 0.000 claims description 30
- 230000015654 memory Effects 0.000 claims description 26
- 238000009499 grossing Methods 0.000 claims description 9
- 239000011159 matrix material Substances 0.000 claims description 3
- 230000003213 activating effect Effects 0.000 claims description 2
- 210000003165 abomasum Anatomy 0.000 claims 2
- 230000009849 deactivation Effects 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 22
- 239000003990 capacitor Substances 0.000 description 11
- 230000000694 effects Effects 0.000 description 11
- 230000014759 maintenance of location Effects 0.000 description 11
- 239000000758 substrate Substances 0.000 description 10
- 238000001514 detection method Methods 0.000 description 7
- 230000004043 responsiveness Effects 0.000 description 7
- 230000006641 stabilisation Effects 0.000 description 6
- 238000011105 stabilization Methods 0.000 description 6
- 230000007423 decrease Effects 0.000 description 5
- 238000007796 conventional method Methods 0.000 description 3
- 230000003321 amplification Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 210000000746 body region Anatomy 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 230000002779 inactivation Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of DC power input into DC power output
- H02M3/02—Conversion of DC power input into DC power output without intermediate conversion into AC
- H02M3/04—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters
- H02M3/06—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using resistors or capacitors, e.g. potential divider
- H02M3/07—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode, e.g. charge pumps
- H02M3/073—Charge pumps of the Schenkel-type
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/4074—Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/145—Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
- G11C5/146—Substrate bias generators
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M1/00—Details of apparatus for conversion
- H02M1/0083—Converters characterised by their input or output configuration
- H02M1/009—Converters characterised by their input or output configuration having two or more independently controlled outputs
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of DC power input into DC power output
- H02M3/02—Conversion of DC power input into DC power output without intermediate conversion into AC
- H02M3/04—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters
- H02M3/06—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using resistors or capacitors, e.g. potential divider
- H02M3/07—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode, e.g. charge pumps
- H02M3/071—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode, e.g. charge pumps adapted to generate a negative voltage output from a positive voltage source
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
- Static Random-Access Memory (AREA)
- Read Only Memory (AREA)
- Dc-Dc Converters (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP33767798A JP4397062B2 (ja) | 1998-11-27 | 1998-11-27 | 電圧発生回路および半導体記憶装置 |
| US09/321,884 US6246280B1 (en) | 1998-11-27 | 1999-05-28 | Negative voltage generating circuit with high control responsiveness which can be formed using transistor with low breakdown voltage and semiconductor memory device including the same |
| US09/843,691 US6385117B2 (en) | 1998-11-27 | 2001-04-30 | Negative voltage generating circuit with high control responsiveness which can be formed using transistor with low breakdown voltage and semiconductor memory device including the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP33767798A JP4397062B2 (ja) | 1998-11-27 | 1998-11-27 | 電圧発生回路および半導体記憶装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2000163964A JP2000163964A (ja) | 2000-06-16 |
| JP2000163964A5 JP2000163964A5 (https=) | 2006-01-12 |
| JP4397062B2 true JP4397062B2 (ja) | 2010-01-13 |
Family
ID=18310927
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP33767798A Expired - Fee Related JP4397062B2 (ja) | 1998-11-27 | 1998-11-27 | 電圧発生回路および半導体記憶装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (2) | US6246280B1 (https=) |
| JP (1) | JP4397062B2 (https=) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4576736B2 (ja) * | 2001-03-28 | 2010-11-10 | セイコーエプソン株式会社 | 電源回路、表示装置および電子機器 |
| US7336121B2 (en) * | 2001-05-04 | 2008-02-26 | Samsung Electronics Co., Ltd. | Negative voltage generator for a semiconductor memory device |
| US6891426B2 (en) * | 2001-10-19 | 2005-05-10 | Intel Corporation | Circuit for providing multiple voltage signals |
| JP3874247B2 (ja) * | 2001-12-25 | 2007-01-31 | 株式会社ルネサステクノロジ | 半導体集積回路装置 |
| US6784722B2 (en) * | 2002-10-09 | 2004-08-31 | Intel Corporation | Wide-range local bias generator for body bias grid |
| CN1307720C (zh) * | 2003-06-27 | 2007-03-28 | 富士通株式会社 | 半导体集成电路 |
| KR100572323B1 (ko) * | 2003-12-11 | 2006-04-19 | 삼성전자주식회사 | 멀티레벨 고전압 발생장치 |
| US7026843B1 (en) * | 2004-01-16 | 2006-04-11 | Spansion Llc | Flexible cascode amplifier circuit with high gain for flash memory cells |
| JP4965069B2 (ja) * | 2004-10-21 | 2012-07-04 | ラピスセミコンダクタ株式会社 | 半導体集積回路 |
| US8390146B2 (en) * | 2008-02-27 | 2013-03-05 | Panasonic Corporation | Semiconductor integrated circuit and various devices provided with the same |
| KR100956776B1 (ko) | 2008-04-18 | 2010-05-12 | 주식회사 하이닉스반도체 | 네거티브 전압 생성 장치 |
| US7733126B1 (en) * | 2009-03-31 | 2010-06-08 | Freescale Semiconductor, Inc. | Negative voltage generation |
| KR101131945B1 (ko) * | 2010-07-07 | 2012-03-29 | 주식회사 하이닉스반도체 | 비휘발성 메모리 장치 |
| KR101809105B1 (ko) * | 2010-08-06 | 2017-12-14 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 집적 회로 |
| JP5866964B2 (ja) * | 2011-10-25 | 2016-02-24 | 富士通株式会社 | 制御回路及びそれを用いた電子機器 |
| US8830776B1 (en) * | 2013-03-15 | 2014-09-09 | Freescale Semiconductor, Inc. | Negative charge pump regulation |
| JP2015170379A (ja) * | 2014-03-10 | 2015-09-28 | マイクロン テクノロジー, インク. | 半導体装置 |
| US10826388B2 (en) | 2018-12-11 | 2020-11-03 | Texas Instruments Incorporated | Charge pump circuits |
| US12205663B2 (en) * | 2019-07-09 | 2025-01-21 | Arm Limited | Regulated negative charge pump circuitry and methods |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3569310B2 (ja) * | 1993-10-14 | 2004-09-22 | 株式会社ルネサステクノロジ | 半導体記憶装置 |
| US5614815A (en) * | 1994-03-10 | 1997-03-25 | Fujitsu Limited | Constant voltage supplying circuit |
| KR0145758B1 (ko) * | 1994-08-24 | 1998-08-01 | 김주용 | 반도체 소자의 전압 조정 회로 |
| FR2735921B1 (fr) * | 1995-06-21 | 1997-08-22 | Sgs Thomson Microelectronics | Circuit generateur de phases pour circuit d'alimentation negative du type pompe de charge |
| FR2735922B1 (fr) * | 1995-06-21 | 1997-08-22 | Sgs Thomson Microelectronics | Circuit generateur de tension negative du type pompe de charge |
| JPH10261946A (ja) * | 1997-03-19 | 1998-09-29 | Mitsubishi Electric Corp | 半導体集積回路 |
| KR100293455B1 (ko) * | 1998-08-31 | 2001-07-12 | 김영환 | 반도체메모리소자의전압공급장치 |
-
1998
- 1998-11-27 JP JP33767798A patent/JP4397062B2/ja not_active Expired - Fee Related
-
1999
- 1999-05-28 US US09/321,884 patent/US6246280B1/en not_active Expired - Lifetime
-
2001
- 2001-04-30 US US09/843,691 patent/US6385117B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2000163964A (ja) | 2000-06-16 |
| US6246280B1 (en) | 2001-06-12 |
| US6385117B2 (en) | 2002-05-07 |
| US20010017812A1 (en) | 2001-08-30 |
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