JP4388035B2 - ディスプレイパネルの回転式検査装置及び方法 - Google Patents

ディスプレイパネルの回転式検査装置及び方法 Download PDF

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JP4388035B2
JP4388035B2 JP2006147195A JP2006147195A JP4388035B2 JP 4388035 B2 JP4388035 B2 JP 4388035B2 JP 2006147195 A JP2006147195 A JP 2006147195A JP 2006147195 A JP2006147195 A JP 2006147195A JP 4388035 B2 JP4388035 B2 JP 4388035B2
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display panel
inspection
unit
turntable
rotary
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JP2006147195A
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Japanese (ja)
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JP2006338009A (ja
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允光 千
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株式会社パイコム
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
JP2006147195A 2005-06-02 2006-05-26 ディスプレイパネルの回転式検査装置及び方法 Active JP4388035B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050047333A KR100732344B1 (ko) 2005-06-02 2005-06-02 디스플레이 패널의 회전식 검사 장비

Publications (2)

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JP2006338009A JP2006338009A (ja) 2006-12-14
JP4388035B2 true JP4388035B2 (ja) 2009-12-24

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Family Applications (1)

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JP2006147195A Active JP4388035B2 (ja) 2005-06-02 2006-05-26 ディスプレイパネルの回転式検査装置及び方法

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JP (1) JP4388035B2 (ko)
KR (1) KR100732344B1 (ko)
CN (1) CN100498888C (ko)
TW (1) TWI295731B (ko)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101169528B (zh) * 2007-11-28 2010-06-09 庄添财 液晶显示屏的在线检测方法及其制程设备
CN101320145B (zh) * 2008-07-21 2010-06-16 友达光电股份有限公司 面板抽验装置及方法
US8432540B2 (en) * 2010-03-31 2013-04-30 Cooper S.K. Kuo Support mechanism for inspection systems
KR101126687B1 (ko) 2011-12-21 2012-03-29 한동희 디스플레이용 패널의 검사장치
CN103149515B (zh) * 2013-03-05 2015-08-19 清华大学 一种用于电介质长期老化过程中的空间电荷测量装置
CN103196656B (zh) * 2013-03-13 2016-03-02 广东威创视讯科技股份有限公司 一种投影机测试平台
KR101362330B1 (ko) * 2013-08-21 2014-02-12 한동희 디스플레이용 패널의 검사장치
JP6229510B2 (ja) * 2014-01-24 2017-11-15 株式会社豊田自動織機 エージング装置
CN104700758B (zh) * 2015-01-28 2017-12-01 北京欣奕华科技有限公司 一种闪烁值写入机
CN104637427B (zh) * 2015-03-12 2017-05-24 合肥京东方光电科技有限公司 检测治具
CN106526922B (zh) * 2017-01-04 2019-12-06 京东方科技集团股份有限公司 基板修复方法及装置、按压机构、基板修复设备
CN107797317A (zh) * 2017-12-04 2018-03-13 苏州广林达电子科技有限公司 一种一对十的老化专用平台
JP2019158442A (ja) * 2018-03-09 2019-09-19 シャープ株式会社 表示パネル検査システムおよび表示パネル検査方法
CN109533822B (zh) * 2018-11-22 2020-04-07 苏州精濑光电有限公司 一种面板检测方法
KR101996937B1 (ko) 2019-02-01 2019-07-05 (주)제이스텍 디스플레이 패널용 검사선별 물류장치
CN110988558B (zh) * 2019-12-20 2022-06-07 京东方科技集团股份有限公司 一种触摸屏测试系统及方法
CN113851065B (zh) * 2020-06-09 2023-08-22 华为技术有限公司 显示面板测试装置及显示面板测试箱
CN112908175B (zh) * 2021-02-03 2022-07-12 武汉华星光电半导体显示技术有限公司 一种可卷曲柔性显示装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR19990026542A (ko) * 1997-09-25 1999-04-15 왕중일 칩 검사 장치
JP2000147045A (ja) 1998-11-05 2000-05-26 Kyoei Sangyo Kk プリント配線板検査装置
JP2000321545A (ja) 1999-03-05 2000-11-24 Ricoh Co Ltd 液晶パネル検査装置
JP2002277502A (ja) 2001-01-12 2002-09-25 Nidec-Read Corp 基板検査装置及び基板検査方法
KR100358322B1 (ko) * 2001-02-12 2002-10-25 주식회사 디이엔티 액정표시장치(ｌｃｄ) 테스트 핸들러

Also Published As

Publication number Publication date
CN100498888C (zh) 2009-06-10
CN1873744A (zh) 2006-12-06
TW200643420A (en) 2006-12-16
TWI295731B (en) 2008-04-11
JP2006338009A (ja) 2006-12-14
KR100732344B1 (ko) 2007-06-27
KR20060125336A (ko) 2006-12-06

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