TWI295731B - Rotation-type display panel inspecting apparatus and display panel inspecting method using the inspecting apparatus - Google Patents

Rotation-type display panel inspecting apparatus and display panel inspecting method using the inspecting apparatus Download PDF

Info

Publication number
TWI295731B
TWI295731B TW095119127A TW95119127A TWI295731B TW I295731 B TWI295731 B TW I295731B TW 095119127 A TW095119127 A TW 095119127A TW 95119127 A TW95119127 A TW 95119127A TW I295731 B TWI295731 B TW I295731B
Authority
TW
Taiwan
Prior art keywords
display panel
detecting
unit
turntable
detection
Prior art date
Application number
TW095119127A
Other languages
Chinese (zh)
Other versions
TW200643420A (en
Inventor
Yun-Kwang Cheon
Original Assignee
Phicom Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Phicom Corp filed Critical Phicom Corp
Publication of TW200643420A publication Critical patent/TW200643420A/en
Application granted granted Critical
Publication of TWI295731B publication Critical patent/TWI295731B/en

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)

Description

I29571c 九、發明說明: 【發明所屬之技術領域】 本發明針對於旋轉式顯示面板檢測裝置與使用此檢測 裝置檢測麻面板之方法。更具體^言,本發明是針對於 用於連續執行需要老化的小型顯示面板之照明試驗的旋轉 式顯示面板檢測裝置與使用此檢測裝置檢測顯示面板之方 法0I29571c IX. Description of the Invention: [Technical Field] The present invention is directed to a rotary display panel detecting device and a method of detecting a hemp panel using the detecting device. More specifically, the present invention is directed to a rotary display panel detecting device for continuously performing a lighting test of a small display panel requiring aging and a method for detecting a display panel using the detecting device.

【先前技術】 一般而言,平板顯示器的主要產品為薄膜電晶體液晶 顯不器(thin film t刪istor liquid吻如出物乂) (TFT-LCD),由於製造技術的進步與研究發展(r&d) 的結果,其傾向於更大的尺寸與更高的解析度。由於 TFT-L.CD的應用不僅擴展至筆記本電腦,且亦擴展到攜帶 型終端,其逐漸地取代單色齡器,意即,單魏顯示器。 因此,TFT-LCD在顯示器業界的地位日益重要。[Prior Art] In general, the main product of the flat panel display is a thin film transistor (thin film t istor liquid kiss like a material) (TFT-LCD), due to advances in manufacturing technology and research and development (r&amp As a result of ;d), it tends to be larger in size and higher in resolution. Since the application of TFT-L.CD has not only extended to notebook computers, but also extended to portable terminals, it has gradually replaced the monochrome age device, that is, the single-wei display. Therefore, TFT-LCD is increasingly important in the display industry.

在生產線的最終階段,LCD經受藉由在一特定測試哭 内的探針單元所進行的探針試驗。探針試驗包括lcd面板 之資料與閘極線的開路試驗(〇pen test)與呈色試驗(c— test)及使用顯微鏡的顯微試驗(mic騰叩 圖1說明用於處理與檢測需要老化之小型顯示面板之 装置、2。?。現將在下文描述使用裝置2。。的檢測方法。 當,作者將其上裝載有十二個顯示面板1〇之第一工 4室自第—替換位置移位至第—檢測位置時,置於第一檢 測位置的第二工作臺基座214移位至第三替換位置。在第 I2957l 10。=位置’操作者在老化顯示面板10之前說明顯示面板 示田老化顯不面板丨〇時,操作者收集十二個經檢測的顯 :面板10且在移動至第三替換位置之後裝載新的顯示面 德α作至基座214上。之後,在返回至第一檢測位置之 才呆作者檢測經老化顯示面板10的照明狀態。 令人遺憾的是,習知檢測裝置200具有以下缺點。首 由於在照明之後需要較長的時間來老化顯示面板10, 亦即使將其移位至檢測位置,暴頁示面才反10白勺連續檢測 面子在困難且因此不能提高檢測效率。其次,當許多顯示 板10同時被檢測時,檢測高度與寬度為巨大的且因此檢 者不能自各種角度檢測顯示面板10。第三,對於檢測更 =的顯示面板10,台的數目增加導致工時控制與空間的浪 貢。第四,由於同時檢測許多顯示面板10,背 ,與工作臺…4 (左右移動的板== ^檢測裝置變得更大。第五’由於在照明之後當顯示面 一 10被老化時供應與挑選顯示面板10,因此連續檢測顯 示面板10較為困難且因此不能提高檢測效率。 【發明内容】 本發明的示範性實施例針對於旋轉式顯示面板檢測裝 置與使用此檢測裝置檢測顯示面板之方法。在示範性實施 ,中’檢難置可包括基座;可旋轉地安裝於基座上的轉 臺;及安裝於轉臺上用於檢測顯示面板之檢測單元。 在另一示範性實施例中,檢測裝置可包括轉臺,轉表 包括用於檢咖示面板之檢測單元,轉臺旋轉以在替換^ 6 oc I29573〇Jpif.d 示面板之替換位置 測單元。 與檢測顯示面板的檢測位 置之間旋轉檢 在不祕實施例巾,檢測方 個檢測單元及旋轉轉臺以執行 測單元間’顯示面板在到達檢測單‘^ 位置中之-者的檢測單元處替換固 單元處進行顯示面㈣照明試驗。 位置的檢測 【實施方式】At the final stage of the line, the LCD is subjected to a probe test performed by a probe unit that is crying in a particular test. The probe test includes the data of the lcd panel and the open circuit test of the gate line (cpen test) and the color test (c-test) and the microscopic test using the microscope (the mic Trick 1 shows that the treatment and detection require aging). The device of the small display panel, 2, will now describe the detection method using the device 2. When the author replaces the first work room 4 with twelve display panels 1 When the position is shifted to the first detecting position, the second table base 214 placed at the first detecting position is shifted to the third replacement position. At the I2957l 10 == position 'the operator indicates the display before aging the display panel 10 When the panel field aging is not panel ,, the operator collects twelve detected display panels 10 and loads a new display surface α onto the pedestal 214 after moving to the third replacement position. Thereafter, The author who returns to the first detection position detects the illumination state of the aged display panel 10. Unfortunately, the conventional detection device 200 has the following disadvantages: First, it takes a long time to aging the display panel 10 after illumination. Even if it is shifted to the detection position, it is difficult to continuously detect the face in the reverse page and thus cannot improve the detection efficiency. Secondly, when many display panels 10 are simultaneously detected, the detection height and width are enormous. Therefore, the examiner cannot detect the display panel 10 from various angles. Thirdly, for the display panel 10 that detects more =, the number of stations increases, which leads to the control of the work hours and the space. Fourth, since many display panels 10 are simultaneously detected, Back, and workbench...4 (the board moved left and right == ^ The detection device becomes larger. The fifth 'continues to detect the display panel 10 since the display panel 10 is supplied and selected when the display surface 10 is aged after illumination The present invention is directed to a rotary display panel detecting device and a method of detecting a display panel using the same. In an exemplary implementation, The base includes a turntable rotatably mounted on the base, and a detecting unit mounted on the turntable for detecting the display panel. In an embodiment, the detecting device may include a turntable, the turntable includes a detecting unit for the check panel, and the turntable is rotated to replace the position measuring unit of the panel of the 6 oc I29573〇Jpif.d. The rotation between the detection positions is detected in the non-secret embodiment towel, and the detection unit and the rotary turret are detected to replace the solid unit at the detection unit of the display unit between the display panel and the arrival detection unit. Perform the display surface (4) illumination test. Position detection [Implementation]

現將參考附圖在下文中更全面地描 同的數字指代相同元件。 通扁相 圖2與圖3分別為根據本發明之旋轉式顯示面板檢测 裝置100的正視圖與俯視平面圖。檢測裝置1〇〇為用於藉 由探針單元對需要老化的小型檢測物件(在下文中稱^ ‘‘顯示面板10”)之每一資料線與每一閘極線執行開路試 驗與呈色試驗之顯微鏡檢測裝置。檢測裝置1〇〇連續測試 小型顯示面板100以提高良率。因此,檢測裝置1〇〇經組 態以旋轉其中顯示面板10被檢測的檢測單元120。 檢測裝置100包括基座102、轉臺110及四個檢測單 元 120 〇 轉臺可旋轉地安裝於基座102上。四個檢測單元12〇 傾斜地安裝於轉臺110上以向四個方向旋轉。包括四個檢 測單元120的轉臺110以90度間隔旋轉。即,檢測裝置 100在逐漸旋轉時自第一位置(替換位置)“a”經由第二 與第三位置(老化位置)“b”與“c”至第四位置(檢測 1295¾ if.doc 1295¾ if.docThe numbers that are more fully described hereinafter with reference to the attached drawings refer to the same elements. Fig. 2 and Fig. 3 are a front view and a top plan view, respectively, of the rotary display panel detecting device 100 according to the present invention. The detecting device 1 is an open circuit test and a color test for each data line and each gate line of a small detecting object (hereinafter referred to as a ''display panel 10') that needs to be aged by a probe unit. The microscope detecting device 1 〇〇 continuously tests the small display panel 100 to improve the yield. Therefore, the detecting device 1 is configured to rotate the detecting unit 120 in which the display panel 10 is detected. The detecting device 100 includes a pedestal 102. The turntable 110 and the four detecting units 120 are rotatably mounted on the base 102. The four detecting units 12 are obliquely mounted on the turntable 110 to rotate in four directions. The four detecting units 120 are included. The turntable 110 is rotated at intervals of 90 degrees. That is, the detecting device 100 is rotated from the first position (replacement position) "a" via the second and third positions (aging positions) "b" and "c" to the first Four positions (test 12953⁄4 if.doc 12953⁄4 if.doc

安裳於轉臺110上的檢測單元⑽執行對四個顯示面 板10的照明試驗。在檢測單元120,自提供於在工作臺124 上裝載的顯示面板10背面的背光單元(光源)126照射光 以檢^在生產過程巾產生的顯示面板的光點及顯示面板 10的資料線與閘極線的開路狀態與顏色。 參看圖4與圖7,檢測單元120包括基座板122,其以 10 °背光單元126安裝於工作臺124的背面且經照明以照 冗裝載於個別工作臺124上的顯示面板10的背面。探針單 兀128安置於工作臺124的前方。探針單元128包括電連The detection unit (10) mounted on the turntable 110 performs an illumination test on the four display panels 10. In the detecting unit 120, the backlight unit (light source) 126 provided on the back surface of the display panel 10 mounted on the table 124 is irradiated with light to detect the light spot of the display panel produced by the production process towel and the data line of the display panel 10 and The open state and color of the gate line. Referring to Figures 4 and 7, the detection unit 120 includes a base plate 122 that is mounted to the back of the table 124 with a 10° backlight unit 126 and illuminate to circumvent the back of the display panel 10 mounted on the individual table 124. The probe unit 128 is placed in front of the table 124. Probe unit 128 includes electrical connections

位置)“d”。顯示面板1()在第—位置“a”被替換且在第 二與第三位置“b”與“C”被老化。在第四位置“d,,執行 對= 老化的顯示面板10的照明試驗。因此,可連續檢測顯 不面板10。可藉由習知的旋轉驅動器(未圖示;諸如安裝 於基座102内的電動機)進行轉臺10的旋轉。 、 大、、勺60度的角可移除地安裝於轉臺11〇上。四個工作臺 124安裝於基座板122的前表面以可移除地吸收顯示面板 接至女裝於工作臺124之顯示面板1〇的探針塊129。根據 顯示面板10的類型,背光單元並不用於檢測自身發光的顯 不面板0 在本發明中,安裝於轉臺110上的檢測單元120的數 目並不限於本發明的實施例。如圖8所說明,八個檢測單 元120可安裝於轉臺11()上或多於/少於八個的檢測單元 120可安裝於其上。圖8所說明的包括八個檢測單元120 的轉臺110以45度間隔旋轉。Location) "d". The display panel 1() is replaced at the first position "a" and aged at the second and third positions "b" and "C". In the fourth position "d, an illumination test of the = aging display panel 10 is performed. Therefore, the display panel 10 can be continuously detected. It can be by a conventional rotary drive (not shown; for example, mounted in the base 102) The motor is rotated by the turntable 10. The angle of 60 degrees of the scoop is removably mounted on the turntable 11A. The four stages 124 are mounted on the front surface of the base plate 122 to be removably The absorption display panel is connected to the probe block 129 of the display panel 1女装 of the workbench 124. According to the type of the display panel 10, the backlight unit is not used to detect the display panel 0 of the self-illumination. In the present invention, the installation is performed on the turn The number of detecting units 120 on the stage 110 is not limited to the embodiment of the present invention. As illustrated in Fig. 8, the eight detecting units 120 may be mounted on the turntable 11() or more/less than eight detecting units 120. It can be mounted thereon. The turret 110 including the eight detecting units 120 illustrated in Fig. 8 is rotated at intervals of 45 degrees.

I295H 第一與第二移動構件13〇與I% 後表面以沿y軸與X軸移動探針單:座板122的 構件130沿y軸(在圖 二70 。藉由第一移動 操作者自工探針單元128。當 針單元12_工作臺128的前方。移動構件13_探 就绪=:當探針單元128移位至其中顯示面板〗〇準備 ===的:測單元12°。藉由第-移域 128織Λ/Λ 置移動探針單元128。當探針 移動τ (由貫線表不)’替換顯示面板1〇。 越i圖=,當探針單*128移位至其中探針單元128 與顯不面板10電連接之位置時的檢測單元12〇 移動構件136在z軸方向上下移動探針單元128,日其與= 示面板10電連接或不電連接。 、 現將在下文中更詳細描述第一移動構件130與第二移 動構件136。第-移動構件⑽包括安裝於基座板122 : 後表面上的一移動板132以在y軸方向滑動。導執135安 ,於基座板122的後表面以導引移動板132的滑動。藉由 安裝於基座板122的後表面下端的兩個第一氣缸134移動 移動板132。第二移動構件136具有分別在四個角部分連 接至探針單元128之移動軸138。探針單元128藉由移動 軸138支撐。兩個共線安置的移動軸138藉由連接桿14〇 彼此連接。藉由安裝於移動板132的第二氣缸(驅動器部 件)142在z軸方向移動連接桿140。雖然氣缸被示範地描 l2957^P,d〇c 逑與說明為用於移動板132之移動與連接桿140之移動的 驅動裔部件,其僅為示範性的且可使用各種驅動器,諸如 凌珠螺桿與直線電動機。 現將在下文中詳細說明根據本發明使用旋轉式顯示面 板檢测裝置之檢測顯示面板之方法。 在第一位置“a” ,將顯示面板1〇放入/取出。在第二 ^第,二位置b’與“c”,老化顯示面板1〇。在第四位置 \ 進行對顯示面板1〇的照明試驗。即,在第一位位 ^ ,在替換之後,顯示面板1〇被放入檢測單元12〇 认四個工作堂124内。在第一位置“a”放入檢測單元 的顯示面板10經過第二與第二位置 =老化。在移動至第四位…後,在此進行;示面 板=的_試驗。當在第四位置“d”經受照賴驗的顯 :=〇返:ΛΓ位置之後,其由操作者取出。新的待 檢測的顯不面板10被放入檢測單元12〇内。 由第在第一位置“a”放/取顯示面板10。藉 由弟一驅動構件136在2軸 與顯示面板1〇(參見圖9)p^ J動抓針早几128以 件m在二^;開° =,藉由第_一驅動構 的前方。在此點’操作者自;:C10 10 124 10 ° 橫向移動以與顯示面板1〇電$ 才铋針單7〇12δ 照射。 ㈣電連接。因此,顯示面板Η)被 由於可在第一與第三位置 a與c放/取顯示面 I2957.M pif.doc 板10且在第二與第四位置“b”與“d”進行 目此麟侧㈣撕 有利地用於檢測無需老化的顯示面板1〇。因此, 試驗如第二與第四位置“b”肖“d”之兩個位置進行照明 "式驗’則檢測處理量可翻倍。 下優=、’,ΐ據本發明職献_面板檢測裝置具有以 ^ ”、百先,顯不面板被連續檢測以提高其檢測量。复 ί牲ί於與f知檢測裝置相比檢測裝置的尺寸減小很多i 试驗。3角’因此減輕了操作者的疲勞且精確地進行照明 加:良ΐ,’由於操作者的數目是可控制的,因此提高了 雖^結合關所綱之本發明之實_描述了本發 將顯二Γ月ί不限於所述實施例。對於熟習此·術者 直㈣f見’在不偏離本發明之範#與精神之情況下可對 /、做出各種代替、修改與改變。 【圖式簡單說明】 ® 1㈣-習知顯示面板檢測裝置。 置的根據本發明之實施狀旋轉式_面板檢測裝 图為圖2戶斤说明之檢測裝置的俯視平面圖。 圖4與圖5分別為圖2中所說明的檢測單元的前透視 圖與後透視圖。 j早㈣㈣視 ^ 6與圖7分料圖2所說_檢測單元的側視圖與 止視圖。 I29573〇Uc 圖8為包括八個區域單元 的俯視平面圖。 的旋轉式_ 不面板檢測裝置 面板準備就緒以供替 圖9說明當探針單元移位至顯示 換之位置時的檢測單元。 示面板電 、圖10說明當探針單元移位至探針單元與顯 連接之位置時的檢測單元。 ' ' 【主要元件符號說明】 1 〇 :顯示面板I295H first and second moving members 13〇 and I% rear surface to move the probe single along the y-axis and the X-axis: the member 130 of the seat plate 122 is along the y-axis (in Figure 2 70. By the first moving operator The probe unit 128. When the needle unit 12_ is in front of the table 128. The moving member 13_reads ready =: when the probe unit 128 is displaced to the display panel where the display panel is ready ===: the measuring unit 12°. The probe unit 128 is woven/positioned by the first-shifting field 128. When the probe moves τ (not indicated by the line), the display panel 1 is replaced. The more i-picture = when the probe single *128 is shifted to The detecting unit 12 〇 the moving member 136 in the position where the probe unit 128 is electrically connected to the display panel 10 moves the probe unit 128 up and down in the z-axis direction, and is electrically connected or not electrically connected to the display panel 10 . The first moving member 130 and the second moving member 136 will be described in more detail hereinafter. The first moving member (10) includes a moving plate 132 mounted on the rear surface of the base plate 122 to slide in the y-axis direction. On the rear surface of the base plate 122 to guide the sliding of the moving plate 132. By being mounted on the lower end of the rear surface of the base plate 122 The first cylinder 134 moves the moving plate 132. The second moving member 136 has a moving shaft 138 that is coupled to the probe unit 128 at each of the four corner portions. The probe unit 128 is supported by the moving shaft 138. Two collinearly disposed The moving shafts 138 are connected to each other by a connecting rod 14 。. The connecting rod 140 is moved in the z-axis direction by a second cylinder (driver member) 142 mounted on the moving plate 132. Although the cylinder is exemplarily depicted, 2,957, P, d〇c逑 逑 说明 驱动 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于 用于The invention uses a method of detecting a display panel of a rotary display panel detecting device. In the first position "a", the display panel 1 is placed/removed. In the second ^, second position b' and "c", aging The display panel 1〇. In the fourth position, the illumination test of the display panel 1〇 is performed. That is, after the replacement, the display panel 1〇 is placed in the detection unit 12 to recognize the four working halls 124. Inside A display panel 10 in which the position "a" is placed in the detecting unit passes through the second and second positions = aging. After moving to the fourth position, it is performed here; the panel = _ test. When in the fourth position "d" "Experienced by the inspection: = 〇 return: After the ΛΓ position, it is taken out by the operator. The new display panel 10 to be detected is placed in the detection unit 12 。. Placed in the first position "a" / Take the display panel 10. By the driving member 136 on the 2 axis and the display panel 1 〇 (see Fig. 9) p ^ J move the needle a few 128 times in pieces m in two; open ° =, by the _ The front of a drive structure. At this point 'operator from;; C10 10 124 10 ° laterally moved to illuminate the display panel 1 with a single needle 7 〇 12δ. (4) Electrical connection. Therefore, the display panel Η) is made possible by placing/receiving the display surface I2957.M pif.doc board 10 at the first and third positions a and c and at the second and fourth positions "b" and "d". The lining (four) tear is advantageously used to detect the display panel 1 无需 without aging. Therefore, the test can be doubled by performing illumination at the two positions of the second and fourth positions "b" and "d". According to the present invention, the panel detecting device has a panel that is continuously detected to improve the detection amount of the panel, and the panel is compared with the detecting device. The size is reduced by a lot of i tests. The 3 corners 'reduced the operator's fatigue and accurately performed the illumination plus: good, 'because the number of operators is controllable, so it improves the combination of The present invention describes that the present invention will not be limited to the embodiment described above. For those skilled in the art, the operator can directly (see) and do not deviate from the scope and spirit of the present invention. Various substitutions, modifications, and changes are made. [Simple Description of the Drawings] ® 1 (4) - Conventional Display Panel Detection Device. The rotary _ panel inspection assembly according to the embodiment of the present invention is a plan view of the detection device illustrated in Figure 2 Fig. 4 and Fig. 5 are front and rear perspective views, respectively, of the detecting unit illustrated in Fig. 2. j (4) (4) and Fig. 7 are divided into a side view and a stop view of the detecting unit I29573〇Uc Figure 8 is a plan view plane including eight area units The rotary _ non-panel detection device panel is ready for the detection unit when the probe unit is shifted to the display position for replacement. Figure 5 shows the operation of the probe unit to the probe. The detection unit when the unit is connected to the display position. ' ' [Main component symbol description] 1 〇: display panel

100 :檢測裝置 102 :基座 110 :轉臺 120 :檢測單元 122 :基座板 124 :工作臺 126 :背光單元 128 :探針單元 129 :探針塊 130 :第一移動構件 132 :移動板 134 :第一氣缸 135 :導執 136 :第二移動構件 138 :移動轴 140 :連接桿 12 (pif.doc 142 :第二氣缸 200 :習知檢測裝置 212 :工作臺 214 :工作臺基座100: detecting device 102: base 110: turntable 120: detecting unit 122: base plate 124: table 126: backlight unit 128: probe unit 129: probe block 130: first moving member 132: moving plate 134 : first cylinder 135 : guide 136 : second moving member 138 : moving shaft 140 : connecting rod 12 (pif.doc 142 : second cylinder 200 : conventional detecting device 212 : table 214 : table base

Claims (1)

修正曰期:96年8月10曰Revision period: August 10, 96 1295731 爲桌95119127號中文專利範圍無劃線修正本 21000pif.doc 十、申請專利範圍: 1.一種旋轉式顯示面板檢測裝置,包括: 基座; 可旋轉地安裝於所述基座上之轉臺;以及 安裝於所述轉臺上用於檢測顯示面板之檢測單元,其 中所述檢測單元中之每一者包括: 傾斜地安裝於所述轉臺上之基座板; 安裝於所述基座板之前表面的至少一個背光單元; 工作臺,安置於所述背光單元的前方且具有前表面, 在所述前表面上裝載待檢測之所述顯示面板;以及 探針單元,包括與裝載於所述工作臺上之所述顯示面 板電連接之探針。 ' 2·如申請專利範圍第〗項所述之旋轉式顯示面板檢測 衣置,其中所述檢測單元中之每一者進一步包括: 第私動構件’用於在所述顯示面板的側方向内移動 置於,賴涵板前方的所述探針單元,以防止當自所述 工作:s:替換所述顯示面板時與所述探針單元衝突。 1申請專利範圍第2項所述之旋轉式顯示面板檢滅 衣置,其中所述第.一移動構件包括: 所述料元之機板,所舞峡安裝於 動板的後表面’以在所述基座板的—側方向内滑 14 I2957^iol〇〇pifd〇c 裝置二其中所述檢測單元中之每—者進_步包括: 面板分離 述探麵’驗上下移麟賴針單元,使得所 的所述探針與所述顯示面板接觸或自所述顯示 專利範圍第4項所述之旋轉式顯示面板檢須 衣置/、中所述第二移動構件包括: 所、’安裝於所述移動板上,且每—移動軸具有與 所述彳木針早兀相連接的一端; 連接桿,與所述移動軸之每一者之另一端相連接;以 及 第二驅動部件,安裝於所述移動板上,用於上 所述連接桿。 # 6·如申請專觀目第i項所述之旋轉式顯示面板檢測 裝置,其中所述轉臺以規則角度旋轉,且所述檢測單元以 所述個別規則角度圍繞所述轉臺之旋轉軸安裝。 7· —種旋轉式顯示面板檢測裝置,包括··1295731 is the Chinese patent scope of table 95119127. There is no slash correction. This 21000pif.doc X. Patent application scope: 1. A rotary display panel detecting device, comprising: a base; a turntable rotatably mounted on the base And a detecting unit mounted on the turntable for detecting the display panel, wherein each of the detecting units comprises: a base plate obliquely mounted on the turntable; mounted on the base plate At least one backlight unit of the front surface; a stage disposed in front of the backlight unit and having a front surface on which the display panel to be inspected is loaded; and a probe unit including and loaded in the A probe electrically connected to the display panel on the workbench. A rotary display panel detecting garment according to the above-mentioned claim, wherein each of the detecting units further comprises: a first movable member 'for use in a side direction of the display panel The probe unit placed in front of the slab is moved to prevent collision with the probe unit when the display panel is replaced from the operation: s:. The rotary display panel for detecting the clothes according to the second aspect of the invention, wherein the first moving member comprises: the machine plate of the material element, the dance gorge is mounted on the rear surface of the moving plate to The sliding direction of the base plate 14 I2957^iol〇〇pifd〇c device 2, wherein each of the detecting units includes: the panel separates the detecting surface Having the probe in contact with the display panel or the second moving member of the rotary display panel in the display of the fourth aspect of the invention, including: On the moving plate, and each of the moving shafts has one end connected to the eucalyptus needle; a connecting rod connected to the other end of each of the moving shafts; and a second driving member, Mounted on the moving plate for the upper connecting rod. [6] The rotary display panel detecting device according to the item i, wherein the turntable rotates at a regular angle, and the detecting unit surrounds the rotating shaft of the turntable at the individual regular angle installation. 7·-Rolling display panel detection device, including ·· 含有用於檢測顯示面板之檢測單元的轉臺,其中所述 轉1疋可旋轉的,以在替換所述顯示面板的替換位置與檢 測所述顯示面板的檢測位置之間旋轉所述檢測單元,且 其中所述檢測單元中之每一者包括: 傾斜地安裝於所述轉臺上之基座板; 安裝於所述基座板之前表面的至少一個背光單元; 工作臺,安置於所述背光單元的前方且具有前表面, 在所述前表面上裝載待檢測之所述顯示面板;以及 15 21000pif.doc 1295731 叙針單儿,包括與裝載於所述工 板電連接之探針。 之所述顯示面 8.如申請專利範園第7項所述之旋 裝置,進一步包括: 〜不面板檢洌 =位置’置於所述替換位置與所述 其中當自所述替換位置至所述檢測位 $間, 示面板。 铃老化所述顯 9·一種檢測顯示面板之方法,包括: 向轉臺的周邊部分提供多個檢測 臺以執行檢測過程, 平几且紅轉所述轉 其=在到達所述檢測單元所到達之多個位 的檢测單域替軸示面板,且在顺$ 測單元處進行所述顯示面板的照明試驗,且、述檢 其中所述檢測單元中之每一者包括·· ,斜地安裝於所述轉臺上之基座板; 安衣於所34基座板之前表面的至少—個背光單元; 在所於所述背光單元的前方且具有前表面, 在所”上裝載待檢測之所述顯示面板;以及 板電包括與裂載於所述工作臺上之所述顯示面 10. ,申請專利範圍第9項所述之檢測顯示面板之方 :丄、中所遠顯示面板在到達另一 破老化。 11. 如申叫專利範圍第1〇項所述之檢測顯示面板之方 16 12957¾ Opif.doc 法,其中在多個位置進行對所述顯示面板的老化。a turntable including a detecting unit for detecting a display panel, wherein the turn is rotatable to rotate the detecting unit between an alternate position replacing the display panel and a detected position detecting the display panel, And wherein each of the detecting units comprises: a base plate obliquely mounted on the turntable; at least one backlight unit mounted on a front surface of the base plate; a work table disposed in the backlight unit In front of and having a front surface on which the display panel to be inspected is loaded; and 15 21000 pif.doc 1295731, including a probe electrically connected to the board. The display surface of the display device as described in claim 7, further comprising: a non-panel check = position 'positioned in the replacement position and the one from the replacement position to the The detection bit is between $ and the display panel. The invention relates to a method for detecting a display panel, comprising: providing a plurality of detection stations to a peripheral portion of the turntable to perform a detection process, and switching the red and the rotation to the arrival of the detection unit a plurality of bits of the detection single-domain sub-axis display panel, and the illumination test of the display panel is performed at the measurement unit, and the detection of each of the detection units includes: a base plate mounted on the turntable; at least one backlight unit mounted on a front surface of the 34 base plate; in front of the backlight unit and having a front surface, to be mounted on the The display panel; and the panel includes: the display surface of the display panel 10. The method for detecting the display panel according to claim 9 of the patent scope: 丄, 中中远显示面板The aging of the display panel is performed at a plurality of locations, as described in the method of the inspection display panel of the invention. 1717
TW095119127A 2005-06-02 2006-05-30 Rotation-type display panel inspecting apparatus and display panel inspecting method using the inspecting apparatus TWI295731B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050047333A KR100732344B1 (en) 2005-06-02 2005-06-02 Rotation inspecting apparatus of flat panel display

Publications (2)

Publication Number Publication Date
TW200643420A TW200643420A (en) 2006-12-16
TWI295731B true TWI295731B (en) 2008-04-11

Family

ID=37484204

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095119127A TWI295731B (en) 2005-06-02 2006-05-30 Rotation-type display panel inspecting apparatus and display panel inspecting method using the inspecting apparatus

Country Status (4)

Country Link
JP (1) JP4388035B2 (en)
KR (1) KR100732344B1 (en)
CN (1) CN100498888C (en)
TW (1) TWI295731B (en)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101169528B (en) * 2007-11-28 2010-06-09 庄添财 Liquid crystal display screen on-line manufacture process and its apparatus
CN101320145B (en) * 2008-07-21 2010-06-16 友达光电股份有限公司 Panel sampling inspection device and method
US8432540B2 (en) * 2010-03-31 2013-04-30 Cooper S.K. Kuo Support mechanism for inspection systems
KR101126687B1 (en) 2011-12-21 2012-03-29 한동희 Inspecting apparatus of pannel for display
CN103149515B (en) * 2013-03-05 2015-08-19 清华大学 A kind of for the space charge measurement device in dielectric long-term ageing process
CN103196656B (en) * 2013-03-13 2016-03-02 广东威创视讯科技股份有限公司 A kind of projector test platform
KR101362330B1 (en) * 2013-08-21 2014-02-12 한동희 Inspecting apparatus of pannel for display
JP6229510B2 (en) * 2014-01-24 2017-11-15 株式会社豊田自動織機 Aging equipment
CN104700758B (en) * 2015-01-28 2017-12-01 北京欣奕华科技有限公司 A kind of flicker value writing machine
CN104637427B (en) * 2015-03-12 2017-05-24 合肥京东方光电科技有限公司 Detection jig
CN106526922B (en) * 2017-01-04 2019-12-06 京东方科技集团股份有限公司 Substrate repairing method and device, pressing mechanism and substrate repairing equipment
CN107797317A (en) * 2017-12-04 2018-03-13 苏州广林达电子科技有限公司 A kind of a pair ten of aging dedicated platform
JP2019158442A (en) * 2018-03-09 2019-09-19 シャープ株式会社 Display panel inspection system and display panel inspection method
CN109533822B (en) * 2018-11-22 2020-04-07 苏州精濑光电有限公司 Panel detection method
KR101996937B1 (en) 2019-02-01 2019-07-05 (주)제이스텍 Logistics for display panel inspection machine
CN110988558B (en) * 2019-12-20 2022-06-07 京东方科技集团股份有限公司 Touch screen testing system and method
CN113851065B (en) * 2020-06-09 2023-08-22 华为技术有限公司 Display panel testing device and display panel testing box
CN112908175B (en) * 2021-02-03 2022-07-12 武汉华星光电半导体显示技术有限公司 Flexible display device can curl

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR19990026542A (en) * 1997-09-25 1999-04-15 왕중일 Chip inspection device
JP2000147045A (en) 1998-11-05 2000-05-26 Kyoei Sangyo Kk Inspection device for printed wiring board
JP2000321545A (en) 1999-03-05 2000-11-24 Ricoh Co Ltd Liquid crystal panel inspection apparatus
JP2002277502A (en) 2001-01-12 2002-09-25 Nidec-Read Corp Substrate inspection device and substrate inspection method
KR100358322B1 (en) * 2001-02-12 2002-10-25 주식회사 디이엔티 Handler for testing LCD

Also Published As

Publication number Publication date
JP2006338009A (en) 2006-12-14
CN100498888C (en) 2009-06-10
KR100732344B1 (en) 2007-06-27
TW200643420A (en) 2006-12-16
CN1873744A (en) 2006-12-06
JP4388035B2 (en) 2009-12-24
KR20060125336A (en) 2006-12-06

Similar Documents

Publication Publication Date Title
TWI295731B (en) Rotation-type display panel inspecting apparatus and display panel inspecting method using the inspecting apparatus
JP3745750B2 (en) Display panel inspection apparatus and inspection method
CN106841990B (en) Display screen detection device
KR100743427B1 (en) Apparatus for macro inspection of flat display panel
JP4700365B2 (en) Board inspection equipment
TW200946898A (en) Support for all size panel of worktable usingtesting device for display panel
JP2006200917A (en) Coordinates detecting device and test object inspecting device
TW201226940A (en) Array test apparatus
TW200540455A (en) Inspecting apparatus and inspecting method
KR100934014B1 (en) Probe Card Inspection System
CN207882563U (en) A kind of electronic switching filtering lens unit of rotating disc type
JPH0735645A (en) Apparatus for inspecting liquid crystal panel
KR20110032016A (en) Work table of display panel inspection system
CN115615673A (en) Angle resolution optical test system and angle resolution optical test method
JP2001296547A (en) Prober for liquid crystal substrate
TWI313351B (en) A test platform for light on test of lcd panels
KR100856727B1 (en) Eye inspection apparatus for flat panel display glass
JP4803940B2 (en) Holder mechanism
JP3907797B2 (en) Board inspection equipment
JP4136410B2 (en) Pin unit and board arrangement mechanism
TWM277104U (en) Hoisting mechanism applicable in die inspection apparatus
JP3165540U (en) Circuit board testing machine rotation test equipment
KR100504258B1 (en) Inspection equipment for flat display panel
KR200346867Y1 (en) A variable apparatus of surface defect inspect equipment of liquid crystal glass
KR101063417B1 (en) Board Inspection Device

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees