CN101320145B - Panel sampling inspection device and method - Google Patents
Panel sampling inspection device and method Download PDFInfo
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- CN101320145B CN101320145B CN200810131674XA CN200810131674A CN101320145B CN 101320145 B CN101320145 B CN 101320145B CN 200810131674X A CN200810131674X A CN 200810131674XA CN 200810131674 A CN200810131674 A CN 200810131674A CN 101320145 B CN101320145 B CN 101320145B
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Abstract
A panel sampling testing device and a method are applied to the conveying path of a conveying panel, can take out a panel on the panel conveying path to carry out testing on technics qualified rate without the influence on the panel conveying, and can continue to convey the test panel after testing and taking out the next panel on the conveying path for testing. The method comprises: providing a conveying path with a buffer channel to convey a plurality of panels forwards in an erection way; providing a buffering taking-out step to take out one panel from the conveying path through a receiving channel; providing a test step to test the panel by illuminating the panel from the back face with a straight optical wand through a testing frame; providing a buffer send-back step to send the tested panel back to the conveying path through a carrying channel to continue the conveying.
Description
Technical field
The present invention relates to a kind of panel sampling inspection device and method, relate in particular to a kind of panel sampling inspection device and method on the transfer path that is applied to delivery panel.
Background technology
The display panels of flat-panel screens mainly is made up of elements such as glass substrate, Polarizer, transparency electrode, alignment film and colored filters.In the manufacture process of display panels, what all can form bad point of part in the liquid crystal film because of technologic flaw takes place, and make flat-panel screens can form bright spot on showing, have a strong impact on the display quality of flat-panel screens.Therefore in the manufacturing process of display panels, must detect, with the fine ratio of product of control finished product to display panels.
Present manufacturing plant at display panels, normal check system by the artificial visually examine, display panels is detected, therefore must interrupt the production transport process of display panels, display panels is moved on the detection platform with back lighting device, by back lighting device from the back side of display panels the whole area irradiation light to display panels, again with the bad point on artificial visually examine's the mode test liquid LCD panel.
Because existing display panels detection mode must be interrupted the production transport process of panel, therefore can have influence on integral production efficient.When testing, must not use back light, and for the display panels of different size dimensions, back lighting device all provides the irradiation light of same area size, can cause the waste of available resources to the irradiation of whole area in artificial visually examine's mode.Therefore, existing display panels detection technique must be improved.
Summary of the invention
In view of this, the invention provides a kind of panel sampling inspection device and method, be applied on the transfer path of delivery panel, can be under the situation that does not influence the panel transmission, on the transfer path of panel, directly extract panel, carrying out the detection of technology yield, and continue to transmit the panel that detected, and next panel that extracts again on the transfer path detects in the detection back that finishes.
Panel sampling inspection device provided by the present invention comprises at least: buffer channel, accept passage, step motor and testing stand.Buffer channel is connected on transfer path, can the side direction shift-in and shift out this transfer path, and this transfer path advances in order to transmit a plurality of panels.Accepting passage is a side of being located at this buffer channel, energy side direction this transfer path of shift-in also is connected this transfer path to replace this buffer channel, and side direction shifts out this buffer channel, be transmitted this panel that advances on this transfer path in order to extract, and this panel that loopback detected is to this transfer path.Step motor is to connect this buffer channel to accept passage with this, provides to mobile synchronously this buffer channel of this transfer path side direction and this and accepts passage.Testing stand is to be located at this to accept on the passage, provides to accept this panel and provide the average light source that shines this panel to carry out the detection of this panel.
According to embodiments of the invention, above-mentioned panel sampling inspection device can comprise the transmission buffer zone in addition, is located at the position that is displaced sideways with respect to this buffer channel on this transfer path, provides cushion space to hold this buffer channel.By the driving of step motor, make and to accept channel side to this transfer path of shift-in and when being connected this transfer path that this buffer channel just moves into this transmission buffer zone when this.Accept passage and be connected this transfer path, be transmitted the panel that advances on this transfer path to accept.
Testing stand comprises adjustable framework and vertical bar optical wand at least, wherein adjustable framework provides the bearing frame of adjusting according to the size of this panel, to carry and to fix this panel to be measured, the vertical bar optical wand is to be located at the opposite side that this testing stand is accepted this panel relatively, can freely adjust traversing on the long limit of this adjustable framework, so that the average light source of irradiation to this panel to be provided.Adjustable framework comprises straight fixed bar and adjustable cross bar at least, and wherein adjustable cross bar is perpendicular to straight fixed bar, and can move on straight fixed bar.Adjustable framework can be adjusted according to the size of this panel, to carry and to fix a panel to be measured, one side it is earlier with the straight fixed bar of aliging of this panel, adjusts the another side that adjustable cross bar removes align panel again.Testing stand can comprise yawing axis, provides testing stand specific deflection angle, in order to the detection that is carried out at this panel.
Panel sampling inspection method of the present invention comprises the following step at least: the transfer path with buffer channel is provided, transmits a plurality of panels in upright mode and advance; The buffering extraction step is provided, extracts this panel from this transfer path by accepting passage; The detection step is provided, detects this panel with the vertical bar optical wand from the back side to the mode of this panel irradiation light by testing stand; And buffering loopback step is provided, accept this panel that passage will detect by this and be recycled to this transfer path with the continuation transmission.
Above-mentioned buffering extraction step comprises the following step at least: suspend and transmit those panels, and this is accepted this transfer path of passage shift-in and this buffer channel is shifted out this transfer path; This is accepted passage is connected with this transfer path; Continue to transmit those panels, accept on the passage so that this panel of the next one on this transfer path is sent to this; And suspend and transmit those panels, and this is accepted passage oppositely shift out this transfer path and this buffer channel is retracted this transfer path.Above-mentioned buffering loopback step comprises the following step at least: suspend and transmit those panels, and this is accepted passage oppositely shift out this transfer path and this buffer channel is retracted this transfer path; This buffer channel is connected with this transfer path; And continuation transmits those panels.
According to panel sampling inspection method of the present invention, after buffering loopback step, can further comprise another buffering extraction step, it comprises the following step at least: suspend and transmit those panels, and this is accepted this transfer path of passage shift-in and this buffer channel is shifted out this transfer path; This is accepted passage is connected with this transfer path; Continue to transmit those panels, be sent on this transfer path and this panel of the next one on this transfer path is sent to this and accept on the passage this is accepted this panel on the passage; And suspend and transmit those panels, and this is accepted passage oppositely shift out this transfer path and this buffer channel is retracted this transfer path.
Can realize detecting automatically the technology yield of display panels by panel sampling inspection device of the present invention and method,, improve existing display panels detection technique to reduce the wasting of resources.
Description of drawings
Fig. 1 is a panel sampling inspection device synoptic diagram of the present invention.
Fig. 2 A to Fig. 2 C is the member action synoptic diagram of panel sampling inspection device of the present invention.
Fig. 3 A and Fig. 3 B are the testing stand synoptic diagram of panel sampling inspection device of the present invention.
Fig. 4 is the flow chart of steps of panel sampling inspection method of the present invention.
Fig. 5 is the flow chart of steps of the local flow process A in the panel sampling inspection method step of the present invention.
Fig. 6 is the flow chart of steps of the local flow process B in the panel sampling inspection method step of the present invention.
Fig. 7 is the flow chart of steps of the local flow process C in the panel sampling inspection method step of the present invention.
Wherein, description of reference numerals is as follows:
100: panel sampling inspection device
110: accept passage
111: testing stand
1110: adjustable framework
1111: straight fixed bar
1112: adjustable cross bar
1120: the vertical bar optical wand
1130: yawing axis
120: buffer channel
130: step motor
140: transmit buffer zone
200: panel
300: transfer path
400/410/420/430: method step
411/412/413/414/415: method step
431/432/433: method step
440/450/460/470/480: method step
Embodiment
The present invention is a kind of panel sampling inspection device and method.For making the present invention more clear and easy to understand, below will be to use the preferred embodiment of the technology of the present invention, example is described in detail in conjunction with the accompanying drawings.Right this accompanying drawing and detailed description are not in order to limit technology disclosed in this invention.
In conjunction with reference to Fig. 1, be panel sampling inspection device synoptic diagram of the present invention.As shown in Figure 1, panel sampling inspection device 100 proposed by the invention is to be located on the transfer path 300 of panel manufacturing process.Panel sampling inspection device 100 comprises at least accepts passage 110, buffer channel 120, step motor 130 and testing stand 111.Buffer channel 120 is connected on transfer path 300, can the side direction shift-in and shift out transfer path 300, and wherein transfer path 300 transmits a plurality of panels 200 in upright mode and advances.Accept passage 110 and be located at a side of buffer channel 120, energy side direction shift-in transfer path 300 also is connected transfer path 300 to replace buffer channel 120, and side direction shifts out buffer channel 120, be transmitted a panel 200 that advances on the transfer path 300 in order to extract, and the panel 200 that loopback detected is to transfer path 300.Step motor 130 connects buffer channels 120 and accepts passage 110, provides to transfer path 300 side direction with moved further buffer channel 120 and accept passage 110.Testing stand 111 is located at and is accepted on the passage 110, and in order to accepting panel 200, and testing stand 111 can provide the average light source of irradiation panel 200, to carry out the detection of panel 200.In addition, panel sampling inspection device 100 of the present invention can comprise transmission buffer zone 140, is located at the position that is displaced sideways with respect to buffer channel 120 on the transfer path 300, provides cushion space to hold from the buffer channel 120 that transmits side direction shift-in on the path 300, shifts out.
In conjunction with reference to Fig. 2 A to Fig. 2 C, it is member action synoptic diagram of panel sampling inspection device of the present invention.When on will using panel sampling inspection device 100 examination at random transfer paths 300 of the present invention, transmitting the panel 200 that advances, suspend the transmission of transfer path 300 earlier, by step motor 130 buffer channel 120 is shifted out transfer path 300, and what step motor 130 will be located at buffer channel 120 1 sides synchronously accepts passage 110 side direction shift-in transfer paths 300, may carry pass through panel 200 on the buffer channel 120 of a block transfer this moment on the buffer channel 120.When step motor 130 moves into transmission buffer zone 140 with buffer channel 120, accept passage 110 and just be attached on the transfer path 300, to replace the buffer channel 120 on the script transfer path 300, shown in Fig. 2 A.Then, transfer path 300 continues the transmission of panel 200 again, next panel 200 can be transmitted and pass through to accepting on the passage 110, shown in Fig. 2 B.At this moment, suspend the transmission of transfer path 300 again, to accept passage 110 side direction again by step motor 130 then shifts out transfer path 300 and accepts passage 110 simultaneously and carrying panel 200, and step motor 130 is retracted buffer channel 120 and be connected passback and is sent path 300 from transmitting buffer zone 140 synchronously, shown in Fig. 2 C.Treat that buffer channel 120 is connected passback and send after the path 300, the delivery panel 200 that can continue is once more desired to inspect by random samples the panel 200 that transmits on the transfer path 300 again up to next time on transfer path 300.Being accepted the panel 200 that passage 110 carries can check separately in transfer path 300 outsides, therefore can not influence the transmission flow process of transfer path 300 top panels.
In conjunction with reference Fig. 3 A and Fig. 3 B, it is the testing stand synoptic diagram of panel sampling inspection device of the present invention.Shown in Fig. 3 A and Fig. 3 B, the testing stand 111 of panel sampling inspection device 100 of the present invention comprises adjustable framework 1110 and vertical bar optical wand 1120 at least.Adjustable framework 1110 provides the bearing frame of adjusting according to the size of panel 200, to carry and to fix a panel to be measured 200, adjustable framework 1110 comprises straight fixed bar 1111 and adjustable cross bar 1112 at least, wherein adjustable cross bar 1112 is perpendicular to straight fixed bar 1111, and can be displaced into up and down on the straight fixed bar 1111.Vertical bar optical wand 1120 is to be located at the opposite side that testing stand 111 is accepted panel 200 relatively, can freely adjust traversing on the long limit of adjustable framework 1110, so that the average light source of irradiation to panel 200 to be provided, as Fig. 3 B.Adjustable framework 1110 is when accepting panel 200, one side earlier with the straight fixed bar 1111 of aliging of panel 200, adjust the another side that adjustable cross bar 1112 removes align panel 200 again, to accept the marginal portion of panel 200, as shown in Figure 3A.In addition, shown in Fig. 3 B, testing stand 111 can be provided with yawing axis 1130, provides testing stand 111 specific deflection angle, is beneficial to the detection of panel 200.
Next, describe the steps flow chart of panel sampling inspection method of the present invention again in detail.In conjunction with reference to Fig. 4, it is the flow chart of steps of panel sampling inspection method of the present invention.According to panel sampling inspection method of the present invention, the transfer path 300 with buffer channel 120 at first is provided, transfer path 300 transmits a plurality of panels 200 in upright mode and advances, as step 400.Then, provide the buffering extraction step, extract a panel 200 by accepting passage 110 from transmitting path 300, as step 410.Then, detect step, detect panel 200 with vertical bar optical wand 1120 from the back side to the mode of panel 200 irradiation light by testing stand 111, as step 420.After waiting to finish panel 200 and detecting, cushion the loopback step again, be recycled to transfer path 300 with the continuation transmission, as step 430 by accepting the panel 200 that passage 110 will detect.
In conjunction with reference to Fig. 5, be the flow chart of steps of the local flow process A in the panel sampling inspection method step of the present invention.It is as follows that the buffering extraction step of abovementioned steps 410 comprises local flow process A: suspend earlier and transmit those panels, and will accept passage 110 shift-in transfer paths 300 and buffer channel 120 is shifted out transfer path 300, as step 411.Then, buffer channel 120 is moved into transmission buffer zone 140,, will accept passage 110 and be connected, as step 413 with transfer path 300 as step 412.Entertain connect road 110 and be attached to transfer path 300 after, continue again to transmit those panels, accept on the passage 110, so that the next panel on the transfer path 300 200 is sent to as step 414.Then, suspend and transmit those panels, and will accept passage 110 and oppositely shift out transfer path 300 and buffer channel 120 is retracted transfer path 300, as step 415.Promptly finish this local flow process A subsequently, then to enter step 420.
In conjunction with reference to Fig. 6, be the flow chart of steps of the local flow process B in the panel sampling inspection method step of the present invention.It is as follows that the buffering loopback step of abovementioned steps 430 comprises local flow process B, suspends earlier and transmit those panels, and will accept passage 110 and oppositely shift out transfer path 300 and buffer channel 120 is retracted transfer path 300, as step 431.Then, buffer channel 120 is connected with transfer path 300, as step 432.Then, continue to transmit those panels, as step 433.Promptly finish this local flow process B subsequently.
Yet, after the buffering loopback step of abovementioned steps 430, can further comprise the local flow process C of another buffering extraction step, to extract the next panel 200 from transmitting path 300 by accepting passage 110.In conjunction with reference to Fig. 7, it is the flow chart of steps of the local flow process C in the panel sampling inspection method step of the present invention.As shown in Figure 7, continue under the situation of delivery panel, suspend earlier and transmit those panels, and will accept passage 110 shift-in transfer paths 300 and buffer channel 120 is shifted out transfer path 300, as step 440 at transfer path 300.Then, buffer channel 120 is moved into this transmit buffer zone 140, as step 450, and will accept passage 110 and be connected, as step 460 with transfer path 300.Then, continue to transmit those panels, be sent on the transfer path 300 and the next panel on the transfer path 300 200 is sent to and accept on the passage 110, as step 470 will accept panel 200 on the passage 110.Then, suspend and transmit those panels, and will accept passage 110 and oppositely shift out transfer path 300 and buffer channel 120 is retracted transfer path 300, as step 480.At last, finish the steps flow chart of panel sampling inspection method of the present invention.
Though the present invention with a preferred embodiment openly as above; right its is not in order to limit the present invention; any those of ordinary skills; without departing from the spirit and scope of the present invention; can make various changes and retouching, so protection scope of the present invention ought be as the criterion with the scope that the claim of enclosing is protected.
Claims (20)
1. panel sampling inspection method comprises the following step at least:
Transfer path with a buffer channel is provided, transmits a plurality of panels in upright mode and advance;
One buffering extraction step is provided, accepts passage by one and extract this panel from this transfer path;
Provide one to detect step, detect this panel with a vertical bar optical wand from the back side to the mode of this panel irradiation light by a testing stand; And
One buffering loopback step is provided, accepts this panel that passage will detect by this and be recycled to this transfer path with the continuation transmission.
2. panel sampling inspection method as claimed in claim 1, wherein this buffering extraction step comprises the following step:
Suspend and transmit those panels, and this is accepted this transfer path of passage shift-in and this buffer channel is shifted out this transfer path;
This is accepted passage is connected with this transfer path;
Continue to transmit those panels, accept on the passage so that this panel of the next one on this transfer path is sent to this; And
Suspend and transmit those panels, and this is accepted passage oppositely shift out this transfer path and this buffer channel is retracted this transfer path.
3. panel sampling inspection method as claimed in claim 1, wherein this buffering loopback step comprises the following step:
Suspend and transmit those panels, and this is accepted passage oppositely shift out this transfer path and this buffer channel is retracted this transfer path;
This buffer channel is connected with this transfer path; And
Continue to transmit those panels.
4. panel sampling inspection method as claimed in claim 1, wherein this accepts passage and this buffer channel is same moved further.
5. panel sampling inspection method as claimed in claim 1 is wherein accepted this this transfer path of passage shift-in and the step that this buffer channel shifts out this transfer path is comprised this buffer channel is moved into one transmit buffer zone.
6. panel sampling inspection method as claimed in claim 1 is wherein accepted this passage and the step that this transfer path is connected, and is to accept passage with this to replace the position of this buffer channel at this transfer path.
7. panel sampling inspection method as claimed in claim 1, wherein this to accept passage be to be located at a panel draw-out device.
8. panel sampling inspection method as claimed in claim 1, wherein this testing stand is to be located at this to accept on the passage, and by this testing stand to accept this panel.
9. panel sampling inspection method as claimed in claim 8, wherein this testing stand provides an adjustable framework, can adjust according to the size of this panel, to carry and to fix this panel to be measured, this adjustable framework comprises a fixed bar and an adjustable cross bar always at least, wherein this adjustable cross bar is perpendicular to this straight fixed bar, and is displaced on this straight fixed bar.
10. panel sampling inspection method as claimed in claim 9, wherein this testing stand comprises a vertical bar optical wand at least, be to be located at the opposite side that this testing stand is accepted this panel relatively, can freely adjust traversing on a long limit of this adjustable framework, so that the average light source of irradiation to this panel to be provided.
11. panel sampling inspection method as claimed in claim 8, wherein this testing stand comprises a yawing axis, provides this testing stand one specific deflection angle, in order to the detection of carrying out this panel.
12. described panel sampling inspection method as claimed in claim 1 also comprises: after this buffering loopback step, carry out another buffering extraction step, accept passage by this and extract the next panel from this transfer path.
13. panel sampling inspection method as claimed in claim 12, wherein this another buffering extraction step also comprises the following step:
Suspend and transmit those panels, and this is accepted this transfer path of passage shift-in and this buffer channel is shifted out this transfer path;
This is accepted passage is connected with this transfer path;
Continue to transmit those panels, be sent on this transfer path and this panel of the next one on this transfer path is sent to this and accept on the passage this is accepted this panel on the passage; And
Suspend and transmit those panels, and this is accepted passage oppositely shift out this transfer path and this buffer channel is retracted this transfer path.
14. a panel sampling inspection device comprises:
One buffer channel is connected on a transfer path, can the side direction shift-in and shift out this transfer path, and wherein this transfer path transmits a plurality of panels in upright mode and advances;
One accepts passage, be located at a side of this buffer channel, energy side direction this transfer path of shift-in also is connected this transfer path to replace this buffer channel, and side direction shifts out this buffer channel, be transmitted this panel that advances on this transfer path in order to extract, and this panel that loopback detected is to this transfer path;
One step motor connects this buffer channel and this accepts passage, provides to mobile synchronously this buffer channel of this transfer path side direction and this and accepts passage; And
One testing stand is located at this and is accepted on the passage, provides to accept this panel and provide the average light source that shines this panel to carry out the detection of this panel.
15. panel sampling inspection device as claimed in claim 14 also comprises one and transmits buffer zone, is located at the position that is displaced sideways with respect to this buffer channel on this transfer path, provides a cushion space to hold this buffer channel.
16. panel sampling inspection device as claimed in claim 15 is wherein accepted channel side to this transfer path of shift-in and when being connected this transfer path when this, this buffer channel just moves into this transmission buffer zone.
17. panel sampling inspection device as claimed in claim 16, wherein this is accepted passage and is connected this transfer path, is transmitted a panel that advances on this transfer path to accept.
18. panel sampling inspection device as claimed in claim 14, wherein this testing stand comprises at least:
One adjustable framework, a bearing frame of adjusting according to the size of this panel is provided, and to carry and to fix this panel to be measured, this adjustable framework comprises a fixed bar and an adjustable cross bar always at least, wherein this adjustable cross bar is perpendicular to this straight fixed bar, and is displaced on this straight fixed bar; And
One vertical bar optical wand is located at the opposite side that this testing stand is accepted this panel relatively, can freely adjust traversing on a long limit of this adjustable framework, so that the average light source of irradiation to this panel to be provided.
19. panel sampling inspection device as claimed in claim 18, wherein this adjustable framework earlier with this straight fixed bar of one side alignment of this panel, is adjusted this adjustable cross bar go to align another side of this panel when accepting this panel again.
20. panel sampling inspection device as claimed in claim 14, wherein this testing stand comprises a yawing axis, provides this testing stand one specific deflection angle, in order to the detection of carrying out this panel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200810131674XA CN101320145B (en) | 2008-07-21 | 2008-07-21 | Panel sampling inspection device and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200810131674XA CN101320145B (en) | 2008-07-21 | 2008-07-21 | Panel sampling inspection device and method |
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| Publication Number | Publication Date |
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| CN101320145A CN101320145A (en) | 2008-12-10 |
| CN101320145B true CN101320145B (en) | 2010-06-16 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN200810131674XA Expired - Fee Related CN101320145B (en) | 2008-07-21 | 2008-07-21 | Panel sampling inspection device and method |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN204422430U (en) * | 2014-12-25 | 2015-06-24 | 日东电工株式会社 | Visual inspection apparatus |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1677178A (en) * | 2004-03-31 | 2005-10-05 | De&T株式会社 | Detector of flat-board display |
| CN1873744A (en) * | 2005-06-02 | 2006-12-06 | 飞而康公司 | Rotation-type display panel testing device and display panel testing method using the same |
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2008
- 2008-07-21 CN CN200810131674XA patent/CN101320145B/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1677178A (en) * | 2004-03-31 | 2005-10-05 | De&T株式会社 | Detector of flat-board display |
| CN1873744A (en) * | 2005-06-02 | 2006-12-06 | 飞而康公司 | Rotation-type display panel testing device and display panel testing method using the same |
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| CN101320145A (en) | 2008-12-10 |
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