CN101566733A - Directivity inspecting method and directivity inspecting device applied to liquid crystal panel - Google Patents

Directivity inspecting method and directivity inspecting device applied to liquid crystal panel Download PDF

Info

Publication number
CN101566733A
CN101566733A CNA200810027629XA CN200810027629A CN101566733A CN 101566733 A CN101566733 A CN 101566733A CN A200810027629X A CNA200810027629X A CN A200810027629XA CN 200810027629 A CN200810027629 A CN 200810027629A CN 101566733 A CN101566733 A CN 101566733A
Authority
CN
China
Prior art keywords
mark
sensor
liquid crystal
crystal panel
directivity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CNA200810027629XA
Other languages
Chinese (zh)
Inventor
宋振奇
陈永丰
谢明宏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenchao Photoelectric Shenzhen Co Ltd
Original Assignee
Shenchao Photoelectric Shenzhen Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenchao Photoelectric Shenzhen Co Ltd filed Critical Shenchao Photoelectric Shenzhen Co Ltd
Priority to CNA200810027629XA priority Critical patent/CN101566733A/en
Publication of CN101566733A publication Critical patent/CN101566733A/en
Pending legal-status Critical Current

Links

Images

Landscapes

  • Liquid Crystal (AREA)

Abstract

The invention mainly relates to a directivity inspecting method and a directivity inspecting device applied to a liquid crystal panel, in particular to a directivity inspecting device which utilizes a sensor to identify the directivity and is applied to the liquid crystal panel. After grabbing a polarizing plate with a mark and a CF substrate or a TFT substrate by utilizing a loading base station, the device sends the polarizing plate and the CF substrate or the TFT substrate to a jointing area along a path, and at least one sensor arranged above or below the path can detect the mark, wherein the sensor is connected to an identifying device which is internally provided with a correct mark. The sensor retrieves the mark and sends the mark to the identifying device to judge, and if a judging result is correct, then subsequent jointing is carried; and if the judging result is not correct, then the jointing is stopped so as to realize the effects of confirming the direction of the polarizing plate, improving the integral yield of LCD products, and the like.

Description

Be applied to the directivity inspection method and the device thereof of liquid crystal panel
Technical field
The present invention relates generally to a kind of directivity inspection method and device that is applied to liquid crystal panel, refers in particular to a kind of directivity testing fixture that utilizes sensor identification directivity and be applied to liquid crystal panel.
Background technology
Display is the bridge of people and information transmission, need satisfy fastidious eyes,, image display effect be required to improve day by day no matter be portable product, information products or video product therefore, be the environment for use and the purposes that meet end product, required characteristic is also different.Aspect the visual angle, finally all wish omnibearingly to watch image, also be that LCD is made great efforts one of technology that promotes.Wide viewing angle (WV) has become the product performance of display necessity.
Present LCD (LCD) product nearly all is the Polarizer (Polarizing Sheet) that collocation has wide viewing angle (WV) characteristic.Polarizer or be called light polarizing film (Polarizing Film), it is the optical material that a selection allows the light of specific direction pass through, be of wide application, can be applicable to LCD (LCD) product, major function is the available light with non-polarization light, be converted into polarization light, after seeing through the turning to of liquid crystal, produce the development effect of bright attitude and dark attitude, every LCD panel need use up and down, and two polar biased directions are the vertical Polarizer of 90 degree, a slice allows backlight enter with specific direction light, another sheet is then looked the control of electric field to liquid crystal, to reach the effect that light penetrates or interdicts, to reach the power consumption that the light utilization ratio that improves backlight reduces LCD simultaneously, make liquid crystal panel reach high brightness, low power consumption and high meticulous product performance are one of important key part and component of LCD, directly influence the quality of LCD screen, account for LCD total cost of production about 6%.
If the extreme direction of two Polarizers is 180 degree up and down, optical characteristics such as light and shade can be opposite fully; The erroneous combination main cause of this Polarizer and CF, TFT is:
1. during charging, artificially place mistake.
2. the generation batch mixing causes CF, TFT Polarizer to be put back.
According to present existing making flow process, as checking out above-mentioned mistake, must wait until, when checking, sampling observation or lighting test just find, then must be with Polarizer and CF, TFT heavy industry, part Polarizer behind the heavy industry has damage, also this kind of heavy industry mode belong to indemnifying measure afterwards, be not preferable mode.The cost of the human cost when no matter being heavy industry, Polarizer damage, the loss that is caused are for the competitive strategy of low hair rate in the market.
For this reason, the invention provides a kind of directivity inspection method and device thereof that is applied to liquid crystal panel, before each sheet Polarizer and CF substrate or TFT baseplate-laminating, check whether the directivity of Polarizer is correct; The present invention can be applied in the inspection before CF substrate and the TFT baseplate-laminating equally, improves above-mentioned disappearance by this.
Summary of the invention
Fundamental purpose of the present invention is to provide a kind of directivity inspection method and device thereof that is applied to liquid crystal panel, and it is the mark that utilizes on the sensor inspection Polarizer, uses the direction of confirming Polarizer.
Another object of the present invention is to provide a kind of directivity inspection method and device thereof that is applied to liquid crystal panel, its set section is economized the heavy industry human cost of Polarizer and CF, TFT.
Another purpose of the present invention is to provide a kind of directivity inspection method and device thereof that is applied to liquid crystal panel, and it is the use yield that promotes Polarizer, and promotes the whole yield of LCD product.
In order to achieve the above object, the technical solution adopted in the present invention is: a directivity inspection method and a device thereof that is applied to liquid crystal panel is provided, it is after utilizing the extracting of carrying base station to have a Polarizer, CF substrate or the TFT substrate of a mark, with Polarizer, CF substrate or TFT substrate along a path, deliver to a conformable region, being provided with at least one sensor above or below the path is to detect mark, and sensor is connected to a device for identifying, has correct mark in the device for identifying.Device for identifying can judge that this marks whether correctly, and is correct as judged result system, then allows one of the interior baseplate-laminating of this Polarizer and this conformable region, is incorrect as judged result, then do not allow this Polarizer and this baseplate-laminating.
Beneficial effect of the present invention is: a directivity inspection method and a device thereof that is applied to liquid crystal panel is provided, it is after utilizing the extracting of carrying base station to have a Polarizer, CF substrate or the TFT substrate of a mark, with Polarizer, CF substrate or TFT substrate along a path, deliver to a conformable region, being provided with at least one sensor above or below the path is to detect mark, sensor is connected to a device for identifying, has correct mark in the device for identifying.Sensor captures mark, then transfers to device for identifying and judges, system is correct as judged result, carries out follow-up applying; As judged result is incorrect, then stops to fit; Use heavy industry human cost that reaches its direction of confirming Polarizer, saving Polarizer and CF, TFT and the use yield that promotes Polarizer, and promote the effect of the whole yield of LCD product.
Description of drawings
Fig. 1 is the present invention's enforcement synoptic diagram
Fig. 2 is the present invention's determinand and sensor and device for identifying synoptic diagram
Fig. 3 is the enforcement synoptic diagram of another embodiment of the present invention
Fig. 4 is the enforcement synoptic diagram of the present invention's a embodiment again
Fig. 5 is for being the enforcement synoptic diagram of the present invention's another embodiment
Fig. 6 is for being the enforcement synoptic diagram of the present invention's another embodiment
Fig. 7 is for being the enforcement synoptic diagram of the present invention's another embodiment
Fig. 8 is for being the enforcement synoptic diagram of the present invention's another embodiment
Embodiment
The TFT-LCD product needed is converted into polarization light with the available light of non-polarization light, see through the turning to of liquid crystal after, produce the development effect of bright attitude and dark attitude, two polar biased directions are the vertical Polarizer of 90 degree up and down, directly influence the quality of LCD screen.For guaranteeing the correctness of each sheet Polarizer direction when the contraposition, directivity inspection method that is applied to liquid crystal panel that the invention provides and device thereof can allow Polarizer and CF substrate, Polarizer and TFT substrate, CF substrate and TFT substrate, the travel direction inspection of going ahead of the rest before applying.
For describing the present invention in detail, below respectively the embodiment of Polarizer and CF orientation substrate, Polarizer and TFT orientation substrate, CF substrate and the inspection of TFT orientation substrate is done an explanation.
(please refer to shown in Figure 1) is the embodiment of Polarizer and the inspection of CF orientation substrate or Polarizer and the inspection of TFT orientation substrate.
The directivity testing fixture that is applied to liquid crystal panel comprises a carrying base station 12, on the carrying base station 12 vacuum cup 14 is arranged, vacuum cup 14 can be used for grasping a slice Polarizer 20 from microscope carrier 24, wherein Polarizer 20 is provided with a mark 22, mark 22, in the present embodiment, the mark on the Polarizer 20 22 is a circle.
Carrying base station 12 is to arrive a conformable region via the A path, is provided with a detection region 16 on the A path, after carrying base station 12 grasps a slice Polarizers 20, is to advance along the A path, and 20 of Polarizers are detected by detection region 16.Detection region 16 comprises at least one sensor 18, sensor 18 can be located at be positioned at the A path above or below, sensor 18 is the mark 22 that can detect on the Polarizer 20; Sensor 18 in the present embodiment comprises a Charged Coupled Device image sensor (CCD), after the Charged Coupled Device image sensor receives circular pattern, can and be sent to device for identifying 26 with circular pattern judges with mark 28, after (please refer to shown in Figure 2) device for identifying 26 judge marks 28 equaled mark 22, carrying base station 12 can continue to transport Polarizer 20 to one conformable regions and a slice liquid crystal panel (CF substrate or TFT substrate are all suitable) is fitted.
Can't detect mark 22 as sensor 18, mark 22 on (please refer to shown in Figure 3) Polarizer 20 obviously can't be detected by sensor 18, in other words device for identifying 26 does not have judgement sample, device for identifying 26 will be not equal to mark 22 by judge mark 28, and the directivity testing fixture that therefore is applied to liquid crystal panel can not allow Polarizer 20 to be sent to conformable region and liquid crystal panel applying.The directivity testing fixture that is applied to liquid crystal panel can send caution, and with the examine such as Polarizer 20 discharges of mistake.
The mark 28 that mark 30 on Polarizer and device for identifying 26 set is different, and shown in the 4th figure, the directivity testing fixture that is applied to liquid crystal panel can send caution, and with the examine such as Polarizer 20 discharges of mistake.
Pattern part about mark, flag settings is the multiple patterns such as figure of circle, rectangle, star or arbitrary polygon, the pattern of various marks system is used for separating the model of product in the actual production operation, behind the sensor 18 detecting marks, mark is passed to this device for identifying 26 judge.
Wherein, the above-mentioned sensor of mentioning 18 also can be an optical sensor or radio frequency identification interface.(please refer to shown in Figure 5) illustrates that optical sensor utilizes the embodiment of through characteristic detecting mark.When sensor was an optical sensor 32, mark 34 was one to have the mark of through characteristic, suppose optical sensor 32 these marks 34 of detecting after, utilize the penetrance of through characteristic on the mark 34 to obtain numerical value, and numerical value is passed to device for identifying 36 judge.Correct as judged result, then Polarizer 20 is delivered to conformable region, incorrect as judged result, then stop to fit, the directivity testing fixture that is applied to liquid crystal panel can send caution, and with the examine such as Polarizer 20 discharges of mistake.
(please refer to shown in Figure 6 again) optical sensor utilizes the embodiment of reflection characteristic detecting mark.When sensor was an optical sensor 38, mark 40 was one to have the mark of through characteristic, suppose optical sensor 38 detecting marks 40 after, utilize the reflectivity of reflection characteristic on the mark 40 to obtain numerical value, and numerical value is passed to device for identifying 42 judge.Correct as judged result, then Polarizer 20 is delivered to conformable region, incorrect as judged result, then stop to fit, the directivity testing fixture that is applied to liquid crystal panel can send caution, and with the examine such as Polarizer 20 discharges of mistake.
When sensor is radio frequency identification interface 44, please refer to the 7th figure.Radio frequency identification interface 44 is a reader, reader connects a device for identifying 46,50 of marks on the Polarizer 48 are a label, mark 50 on Polarizer 48 can be read by radio frequency identification interface 44, and after device for identifying 46 affirmations are errorless, then Polarizer 48 is delivered to conformable region, maybe can't read mark 50 as device for identifying 46 judged results are incorrect, then stop to fit, the directivity testing fixture that is applied to liquid crystal panel can send caution, and with the examine such as Polarizer 48 discharges of mistake.
Above embodiment is the embodiment that introduces Polarizer and CF substrate or the inspection of TFT orientation substrate, goes on to say the embodiment of CF substrate and the inspection of TFT orientation substrate again.
(please refer to shown in Figure 8) the present invention's the directivity testing fixture that is applied to liquid crystal panel comprises a carrying base station 52, on the carrying base station 52 vacuum cup 54 is arranged, vacuum cup 54 can be used for grasping a slice first substrate 60 from microscope carrier 64, first substrate 60 is CF substrate or TFT substrate, wherein first substrate 60 is provided with a mark 62, mark 62, in the present embodiment, the mark 62 on first substrate 60 is a circle.
Carrying base station 52 is to arrive a conformable region via the A path, is provided with a detection region 56 on the A path, after carrying base station 52 grasps a slice first substrates 60 (CF substrate/TFT substrate), is to advance along the A path, and 60 of first substrates are detected by detection region 56.Detection region 56 comprises at least one sensor 58, sensor 58 can be located at be positioned at the A path above or below, sensor 58 is the mark 62 that can detect on first substrate 60; Sensor 58 in the present embodiment comprises a Charged Coupled Device image sensor, after the Charged Coupled Device image sensor receives circular pattern, mark 62 can be sent to device for identifying 66 and judge with mark 68.After device for identifying 66 judge marks 68 equaled mark 62, carrying base station 52 can continue to transport first substrate, 70 to one conformable regions and a slice second substrate (TFT substrate/CF substrate) is fitted.Can't detect mark 62 as sensor 58, or device for identifying 66 judge marks 62 and mark 68 persons of not being inconsistent, then do not allow this first substrate 70 and baseplate-laminating.
Above embodiment is done an explanation to the embodiment of Polarizer and the inspection of CF orientation substrate, Polarizer and the inspection of TFT orientation substrate, CF substrate and the inspection of TFT orientation substrate respectively.
The present invention's the directivity testing fixture that is applied to liquid crystal panel, can utilize the mark on the various sensors inspection Polarizers, use the direction of confirming Polarizer, artificial placement mistake, batch mixing cause CF, TFT Polarizer to be put back when reducing the prior art charging, save the heavy industry human cost of Polarizer and CF, TFT, and the use yield of lifting Polarizer, to promote the whole yield and the LCD competitiveness of product in market of LCD product.
Only the above person only is the present invention's the non-claim scope that is used for limiting the present invention of better embodiment , And.Event is all according to impartial for it variation of the described shape of the present invention's claim scope, structure, feature and spirit institute or modification, all should be included in the present invention's the claim scope.

Claims (28)

1, a kind of directivity testing fixture that is applied to liquid crystal panel, it comprises: carrying base station, a sensor and a device for identifying is characterized in that, wherein should carry base station, system along a path, delivers to a conformable region with this Polarizer after grasping and having a Polarizer of a mark; Again, this sensor, be positioned at this path above or below, this sensor system can detect this mark; Again, this device for identifying is connected with this sensor, can judge that this marks whether correctly, and is correct as judged result system, then allows one of the interior baseplate-laminating of this Polarizer and this conformable region, is incorrect as judged result, then do not allow this Polarizer and this baseplate-laminating.
2, the directivity testing fixture that be applied to liquid crystal panel according to claim 1, wherein, this mark is the figure of circle, rectangle, star or arbitrary polygon, this sensor is a Charged Coupled Device image sensor, behind this mark of this sensor detecting, this mark is passed to this device for identifying judge.
3, the directivity testing fixture that be applied to liquid crystal panel according to claim 1, wherein, this sensor is that an optical sensor and this mark have reflection characteristic or through characteristic, after this optical sensor is detected this mark, utilize on this mark reflection characteristic or through characteristic to obtain a numerical value, and this this numerical value is passed to this device for identifying judge.
4, the directivity testing fixture that be applied to liquid crystal panel according to claim 1, wherein, this mark is a label, this sensor is a radio frequency identification interface.
5, the directivity testing fixture that be applied to liquid crystal panel according to claim 1, wherein, this mark system is used for identifying the model of different Polarizers.
6, the directivity testing fixture that be applied to liquid crystal panel according to claim 1, wherein this substrate is a CF substrate or a TFT substrate.
7, a kind of directivity testing fixture that is applied to liquid crystal panel, it comprises: carrying base station, a sensor and a device for identifying is characterized in that, wherein should carry base station, system along a path, delivers to a conformable region with this first substrate after grasping and having one first substrate of a mark; Again, this sensor, be positioned at this path on or below, this sensor system can detect this mark; Again, this device for identifying is connected with this sensor, can judge that this marks whether correctly, correct as judged result system, then allow one of interior second baseplate-laminating of this first substrate and this conformable region, as judged result is incorrect, does not then allow this Polarizer and this baseplate-laminating.
8, the directivity testing fixture that be applied to liquid crystal panel according to claim 7, wherein, this first substrate is a CF substrate, this second substrate is a TFT substrate.
9, the directivity testing fixture that be applied to liquid crystal panel according to claim 7, wherein, this first substrate is a TFT substrate, this second substrate is a CF substrate.
10, the directivity testing fixture that be applied to liquid crystal panel according to claim 7, wherein, this mark is the figure of circle, rectangle, star or arbitrary polygon, this sensor is a Charged Coupled Device image sensor, behind this mark of this sensor detecting, this mark is passed to this device for identifying judge.
11, the directivity testing fixture that be applied to liquid crystal panel according to claim 7, wherein, this sensor is that an optical sensor and this mark have reflection characteristic or through characteristic, after this optical sensor is detected this mark, utilize on this mark reflection characteristic or through characteristic to obtain a numerical value, and this this numerical value is passed to this device for identifying judge.
12, the directivity testing fixture that be applied to liquid crystal panel according to claim 7, wherein, this mark is a label, this sensor is a radio frequency identification interface.
13, the directivity testing fixture that be applied to liquid crystal panel according to claim 7, wherein, this mark system is used for identifying the model of different Polarizers.
14, a kind of directivity inspection method that is applied to liquid crystal panel, it is to comprise the following steps:
Utilize the mark on a sensor detecting one Polarizer;
Judge that this marks whether correctly; And
In this way, this Polarizer and a liquid crystal panel are fitted,, stop to fit as not.
15, the directivity inspection method that be applied to liquid crystal panel according to claim 14 wherein, is to utilize a device for identifying to judge that this marks whether correctly.
16, the directivity inspection method that be applied to liquid crystal panel according to claim 15, wherein, this mark is the figure of circle, rectangle, star or arbitrary polygon, this sensor is a Charged Coupled Device image sensor, behind this mark of this sensor detecting, this mark is passed to this device for identifying judge.
17, the directivity inspection method that be applied to liquid crystal panel according to claim 15, wherein, this sensor is that an optical sensor and this mark have reflection characteristic or through characteristic, after this optical sensor is detected this mark, utilize on this mark reflection characteristic or through characteristic to obtain a numerical value, and this this numerical value is passed to this device for identifying judge.
18, the directivity inspection method that be applied to liquid crystal panel according to claim 14, wherein, this mark is a label, this sensor is a radio frequency identification interface.
19, the directivity inspection method that be applied to liquid crystal panel according to claim 14, wherein, this mark system is used for identifying the model of different Polarizers.
20, the directivity inspection method that be applied to liquid crystal panel according to claim 14, wherein, this substrate is a CF substrate or a TFT substrate.
21, a kind of directivity inspection method that is applied to liquid crystal panel, it is to comprise the following steps:
Utilize the mark on a sensor detecting one first substrate;
Judge that this marks whether correctly; And
In this way, with this first substrate and one second baseplate-laminating,, stop to fit as not.
22, the directivity inspection method that be applied to liquid crystal panel according to claim 21, wherein, this is to utilize a device for identifying to judge that this marks whether correctly.
23, the directivity inspection method that be applied to liquid crystal panel according to claim 21, wherein, this first substrate is a CF substrate, this second substrate is a TFT substrate.
24, the directivity inspection method that be applied to liquid crystal panel according to claim 21, wherein, this first substrate is a TFT substrate, this second substrate is a CF substrate.
25, the directivity inspection method that be applied to liquid crystal panel according to claim 22, wherein, this mark is the figure of circle, rectangle, star or arbitrary polygon, this sensor is a Charged Coupled Device image sensor, behind this mark of this sensor detecting, this mark is passed to this device for identifying judge.
26, the directivity inspection method that be applied to liquid crystal panel according to claim 22, wherein, this sensor is that an optical sensor and this mark have reflection characteristic or through characteristic, after this optical sensor is detected this mark, utilize on this mark reflection characteristic or through characteristic to obtain a numerical value, and this this numerical value is passed to this device for identifying judge.
27, the directivity inspection method that be applied to liquid crystal panel according to claim 21, wherein, this mark is a label, this sensor is a radio frequency identification interface.
28, the directivity inspection method that be applied to liquid crystal panel according to claim 21, wherein, this mark system is used for identifying the model of different Polarizers.
CNA200810027629XA 2008-04-23 2008-04-23 Directivity inspecting method and directivity inspecting device applied to liquid crystal panel Pending CN101566733A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNA200810027629XA CN101566733A (en) 2008-04-23 2008-04-23 Directivity inspecting method and directivity inspecting device applied to liquid crystal panel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNA200810027629XA CN101566733A (en) 2008-04-23 2008-04-23 Directivity inspecting method and directivity inspecting device applied to liquid crystal panel

Publications (1)

Publication Number Publication Date
CN101566733A true CN101566733A (en) 2009-10-28

Family

ID=41282971

Family Applications (1)

Application Number Title Priority Date Filing Date
CNA200810027629XA Pending CN101566733A (en) 2008-04-23 2008-04-23 Directivity inspecting method and directivity inspecting device applied to liquid crystal panel

Country Status (1)

Country Link
CN (1) CN101566733A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103278946A (en) * 2013-05-09 2013-09-04 深圳市华星光电技术有限公司 Method for detecting front side and back side of polarized light plate
CN105589230A (en) * 2016-03-09 2016-05-18 深圳市华星光电技术有限公司 Panel mark detection method and Mura compensation method for panel mark area
WO2018113097A1 (en) * 2016-12-22 2018-06-28 惠科股份有限公司 Polarizer attachment device having mark checking function, and checking method
CN109959453A (en) * 2017-12-26 2019-07-02 上海微电子装备(集团)股份有限公司 A kind of wiregrating splicing caliberating device and method
CN111426470A (en) * 2018-12-24 2020-07-17 罗伯特·博世有限公司 Method and device for checking a drive belt for a continuously variable transmission
CN111693548A (en) * 2019-03-12 2020-09-22 株式会社斯库林集团 Inspection apparatus and inspection method
CN113129368A (en) * 2020-01-15 2021-07-16 惠州市成泰自动化科技有限公司 PCB direction identification method

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103278946A (en) * 2013-05-09 2013-09-04 深圳市华星光电技术有限公司 Method for detecting front side and back side of polarized light plate
WO2014180047A1 (en) * 2013-05-09 2014-11-13 深圳市华星光电技术有限公司 Detection method and detection apparatus for front and reverse surfaces of polarizer
CN105589230A (en) * 2016-03-09 2016-05-18 深圳市华星光电技术有限公司 Panel mark detection method and Mura compensation method for panel mark area
CN105589230B (en) * 2016-03-09 2018-10-26 深圳市华星光电技术有限公司 The Mura compensation methodes in face plate indicia method for detecting and face plate indicia region
WO2018113097A1 (en) * 2016-12-22 2018-06-28 惠科股份有限公司 Polarizer attachment device having mark checking function, and checking method
US20190391446A1 (en) * 2016-12-22 2019-12-26 HKC Corporation Limited Apparatus for attaching polarized plate with check mark and checking method therefor
CN109959453A (en) * 2017-12-26 2019-07-02 上海微电子装备(集团)股份有限公司 A kind of wiregrating splicing caliberating device and method
WO2019128916A1 (en) * 2017-12-26 2019-07-04 上海微电子装备(集团)股份有限公司 Wire grid splicing and calibration device and method
CN111426470A (en) * 2018-12-24 2020-07-17 罗伯特·博世有限公司 Method and device for checking a drive belt for a continuously variable transmission
CN111693548A (en) * 2019-03-12 2020-09-22 株式会社斯库林集团 Inspection apparatus and inspection method
CN111693548B (en) * 2019-03-12 2023-11-14 株式会社斯库林集团 Inspection device and inspection method
CN113129368A (en) * 2020-01-15 2021-07-16 惠州市成泰自动化科技有限公司 PCB direction identification method

Similar Documents

Publication Publication Date Title
CN101566733A (en) Directivity inspecting method and directivity inspecting device applied to liquid crystal panel
KR101068364B1 (en) inspection equipment of LCD and method for inspecting the same
KR101286534B1 (en) inspection apparatus of Liquid crystal display apparatus and inspection method using the same
JP5944165B2 (en) Film defect inspection apparatus and defect inspection method
CN100445811C (en) Apparatus for testing liquid crystal display panel
KR101057307B1 (en) System and method of continuously manufacturing a liquid crystal display panel
CN103439339B (en) Be pasted with defect detecting device and the defect inspection method of the liquid crystal panel of polaroid
CN103278946A (en) Method for detecting front side and back side of polarized light plate
CN106872881A (en) Circuit board testing device, method and system
CN100547374C (en) The detection system and the method that are used for a colored filter
CN108490662A (en) LCD panel detector and panel of LCD detection method
CN102017114B (en) Substrate quality tester
KR20110066052A (en) Method of fabricating alignment layer of liquid crystal display device and testing thereof
CN101408520A (en) Detection method and system for discriminating flaws of inner and outer layers
CN107167939A (en) Polarizer sheet sticking detection means and polaroid attaching device
KR20080001960A (en) Vision auto probe
KR20070006480A (en) Apparatus for detecting the badness of the seal line and method for detecting the badness of the seal line using the apparatus
KR101367922B1 (en) Method and Apparatus for Inspecting Substrate with High Efficiency Reflection and Transmission and Phase Shift of Transmission Light
CN208334822U (en) LCD panel detector
CN108195567B (en) A kind of quality detection device and detection method of sunglasses functional sheet
CN107024487A (en) ITO electro-conductive glass detecting system and its detection method
TWI379110B (en)
KR102229394B1 (en) Device and method for testing backlight unit of liquid crystal display module
CN215264287U (en) Incoming material electrical property detection system with silicon-based display
CN219872001U (en) Module laminating platform and testing arrangement

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication

Open date: 20091028